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The Test of Insufficient Variance (TIVA): A New Tool for the Detection ...
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30 déc. 2014 - One approach is to examine published research results for evidence of questionable research practices (see Schimmack, 2014, for a discussion of existing tests). This blog post introduces a new test of bias in reported research findings, namely the Test of Insufficient Variance (TIVA). TIVA is applicable to ...Thermal laser stimulation - Wikipedia
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Thermally induced voltage alteration (TIVA) is an imaging technique which uses a laser beam to pinpoint the location of electrical shorts on a device. The laser induces local thermal gradients in the device, which result in changes to the amount of power that the device uses. A laser is scanned over the surface of the device ...Thermally induced voltage alteration (TIVA) - GlobalSino
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Such resistance changes are captured when monitoring the voltage changes (ΔVISTFA 2013: Proceedings from the 39th International Symposium for ...
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ASM International - 2013 - Electronic apparatus and appliances
LIVA/TIVA uses a raster-scanning laser stimulus while the device is under DC bias by a constant current source [5]. The voltage change in power consumption (Istfa 2001: Proceedings of the 27Th International Symposium for ...
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ASM International - 2001 - Technology & Engineering
The types of faults detected are determined by the detailed physics of the laser interaction. The table in Figure 1 summarizes the capabilities of each technique. Sensing Techniques The original LIVA and TIVA approach utilized a constant-ISTFA 2010: Conference Proceedings from the 36th International ...
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2010 - Technology & Engineering
While in the UV LEDs, the observed voltage signals are most likely the result of both TIVA (thermal heating) and LIVA (photo-current effect due to electron-hole pair generation). In both green and UV LEDs, the intensity of TIVA/LIVA signals is strongly bias-dependent, with no defect signals observed at currents greater thanGetting Started with Tiva ARM Cortex M4 Microcontrollers: A Lab ...
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Dhananjay V. Gadre, Sarthak Gupta - 2017 - Technology & Engineering
Light intensity can be sensed on the PadmaBoard by either using LDR (Light Dependent Resistor) or LED in reverse bias using the jumpersJP7 and JP8 as depicted in Fig. 6. LED can be connected in reverse bias and forward bias as per jumper (JP7) position. When LDR is selected jumper JP7 and jumper JP8 is placed.[PDF]thermal laser stimulation - NXP Semiconductors
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method consists in scanning an. IR laser beam on surface of a biased or unbiased IC. Optical power is converted in thermal budget on conductive material and induces their resistivity variations. -OBIRCh method corresponds to current variations measurements when a constant voltage is applied. -TIVA method: a constant.[PDF]TLS / OBIRCH / TIVA - eufanet
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TLS System Requirements. • Laser scanning microscope (LSM). – Gaussian laser of λ > 1,1µm. • Acquisition and imaging system. • Biasing and amplification scheme : Techniques Inventor. Bias. OBIRCH. CC-OBIRCH. TIVA. TBIP. XIVA. Nikawa. Nikawa. Cole. Palaniappan. Falk. V. I. V. SEI. Cole. Amplifier. I / None. I. V. V. V.[PDF]Use Conditions for 5-V Tolerant GPIOs on Tiva C ... - Texas Instruments
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Use Conditions for 5-V Tolerant GPIOs on Tiva™ C Series. TM4C123x Microcontrollers. Gabriel Gomez and Ashish Ahuja. ABSTRACT. The Tiva C Series TM4C123x family of ARM®. Cortex™–M4 microcontrollers features highly ..... As a result, there is no forward-biased diode current when VIN > VDD + 0.6 V is applied as ...