WO2008024825A3 - Scatter attenuation tomography - Google Patents

Scatter attenuation tomography Download PDF

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Publication number
WO2008024825A3
WO2008024825A3 PCT/US2007/076497 US2007076497W WO2008024825A3 WO 2008024825 A3 WO2008024825 A3 WO 2008024825A3 US 2007076497 W US2007076497 W US 2007076497W WO 2008024825 A3 WO2008024825 A3 WO 2008024825A3
Authority
WO
WIPO (PCT)
Prior art keywords
penetrating radiation
attenuation
voxels
characterizing
incident beam
Prior art date
Application number
PCT/US2007/076497
Other languages
French (fr)
Other versions
WO2008024825A2 (en
Inventor
Peter J Rothschild
Original Assignee
American Science & Eng Inc
Peter J Rothschild
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by American Science & Eng Inc, Peter J Rothschild filed Critical American Science & Eng Inc
Priority to JP2009525755A priority Critical patent/JP2010501860A/en
Priority to EP07841193.1A priority patent/EP2054741B1/en
Priority to MX2009001939A priority patent/MX2009001939A/en
Priority to CN2007800312478A priority patent/CN101506688B/en
Publication of WO2008024825A2 publication Critical patent/WO2008024825A2/en
Publication of WO2008024825A3 publication Critical patent/WO2008024825A3/en
Priority to IL196756A priority patent/IL196756A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/12—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a flowing fluid or a flowing granular solid
    • G01V5/222—

Abstract

Methods for characterizing an inspected object on the basis of attenuation determined from pair- wise illuminated voxels. A beam of penetrating radiation characterized by a propagation direction and an energy distribution is scanned across an object, while scatter detectors with collimated fields-of-view detect radiation scattered by each voxel of the inspected object that is intercepted by the incident beam of penetrating radiation. By calculating the attenuation of penetrating radiation between pairs of voxels of incidence of the incident beam, a tomographic image is obtained characterizing the three-dimensional distribution of attenuation in the object of one or more energies of penetrating radiation, and thus of various material characteristics.
PCT/US2007/076497 2006-08-23 2007-08-22 Scatter attenuation tomography WO2008024825A2 (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2009525755A JP2010501860A (en) 2006-08-23 2007-08-22 Scattering tomography
EP07841193.1A EP2054741B1 (en) 2006-08-23 2007-08-22 Scatter attenuation tomography
MX2009001939A MX2009001939A (en) 2006-08-23 2007-08-22 Scatter attenuation tomography.
CN2007800312478A CN101506688B (en) 2006-08-23 2007-08-22 scatter attenuation tomography
IL196756A IL196756A (en) 2006-08-23 2009-01-27 Scatter attenuation tomography

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US82332806P 2006-08-23 2006-08-23
US60/823,328 2006-08-23

Publications (2)

Publication Number Publication Date
WO2008024825A2 WO2008024825A2 (en) 2008-02-28
WO2008024825A3 true WO2008024825A3 (en) 2008-10-02

Family

ID=39107624

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2007/076497 WO2008024825A2 (en) 2006-08-23 2007-08-22 Scatter attenuation tomography

Country Status (10)

Country Link
US (1) US7551718B2 (en)
EP (1) EP2054741B1 (en)
JP (1) JP2010501860A (en)
KR (1) KR20090046849A (en)
CN (1) CN101506688B (en)
IL (1) IL196756A (en)
MX (1) MX2009001939A (en)
MY (1) MY144438A (en)
RU (1) RU2428680C2 (en)
WO (1) WO2008024825A2 (en)

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Also Published As

Publication number Publication date
JP2010501860A (en) 2010-01-21
EP2054741B1 (en) 2017-01-11
US7551718B2 (en) 2009-06-23
MX2009001939A (en) 2009-03-05
CN101506688B (en) 2011-12-21
MY144438A (en) 2011-09-15
EP2054741A2 (en) 2009-05-06
IL196756A (en) 2012-06-28
RU2428680C2 (en) 2011-09-10
RU2009110284A (en) 2010-09-27
WO2008024825A2 (en) 2008-02-28
KR20090046849A (en) 2009-05-11
CN101506688A (en) 2009-08-12
US20080049899A1 (en) 2008-02-28
IL196756A0 (en) 2009-11-18

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