An integrated circuit memory device has a plurality of nonvolatile programmable elements which are used to store a pass/fail status bit at selected milestones in a test sequence. At selected points in the test process an element may be programmed to indicate that the device has passed the tests associated...http://www.google.ca/patents/US6194738?utm_source=gb-gplus-sharePatent US6194738 - Method and apparatus for storage of test results within an integrated circuit
