Systems and methods for sensing obstructions associated with electrical testing of microfeature workpieces are disclosed. An apparatus in accordance with one embodiment includes a first support member configured to releasably carry a microfeature workpiece, a second support member positioned proximate...http://www.google.ca/patents/US7268574?utm_source=gb-gplus-sharePatent US7268574 - Systems and methods for sensing obstructions associated with electrical testing of microfeature workpieces
