In one embodiment, the present invention provides a platform of hardware and/or software that enables the complete access and reliable testing of multiple integrated circuit (IC) devices within a package. This platform may include a testing component (e.g., test circuits, test pads, shared pads, etc.),...http://www.google.ca/patents/US7444575?utm_source=gb-gplus-sharePatent US7444575 - Architecture and method for testing of an integrated circuit device
