The present invention is a structure for probing an electronic device. The structure has a layer of elastomeric material having a first side and a second side; a plurality of electrical conductors extending from the first side to the second side; each of the electrical conductors has a first end and...http://www.google.ca/patents/US6062879?utm_source=gb-gplus-sharePatent US6062879 - High density test probe with rigid surface structure
