WO2012012163A3 - Apparatus, system, and method for increasing measurement accuracy in a particle imaging device - Google Patents

Apparatus, system, and method for increasing measurement accuracy in a particle imaging device Download PDF

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Publication number
WO2012012163A3
WO2012012163A3 PCT/US2011/042317 US2011042317W WO2012012163A3 WO 2012012163 A3 WO2012012163 A3 WO 2012012163A3 US 2011042317 W US2011042317 W US 2011042317W WO 2012012163 A3 WO2012012163 A3 WO 2012012163A3
Authority
WO
WIPO (PCT)
Prior art keywords
particle
light
measurement accuracy
contribution
imaging device
Prior art date
Application number
PCT/US2011/042317
Other languages
French (fr)
Other versions
WO2012012163A2 (en
Inventor
Wayne Dennis Roth
Matthew S. Fisher
Original Assignee
Luminex Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Luminex Corporation filed Critical Luminex Corporation
Priority to CN201180031245.5A priority Critical patent/CN103003660B/en
Priority to JP2013518628A priority patent/JP5736453B2/en
Priority to CA2803607A priority patent/CA2803607C/en
Priority to AU2011280055A priority patent/AU2011280055B2/en
Priority to EP19197554.9A priority patent/EP3611462B1/en
Priority to EP23201211.2A priority patent/EP4339590A2/en
Priority to EP11810118.7A priority patent/EP2588835B1/en
Publication of WO2012012163A2 publication Critical patent/WO2012012163A2/en
Publication of WO2012012163A3 publication Critical patent/WO2012012163A3/en

Links

Classifications

    • G01N15/1433—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Electro-optical investigation, e.g. flow cytometers
    • G01N15/1456—Electro-optical investigation, e.g. flow cytometers without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/20—Image enhancement or restoration by the use of local operators
    • G06T5/73—
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/40—Extraction of image or video features
    • G06V10/42—Global feature extraction by analysis of the whole pattern, e.g. using frequency domain transformations or autocorrelation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V20/00—Scenes; Scene-specific elements
    • G06V20/60—Type of objects
    • G06V20/69—Microscopic objects, e.g. biological cells or cellular parts
    • G06V20/693—Acquisition
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N2015/1006—Investigating individual particles for cytology
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Electro-optical investigation, e.g. flow cytometers
    • G01N15/1456—Electro-optical investigation, e.g. flow cytometers without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals
    • G01N2015/1461—Coincidence detecting; Circuits therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10024—Color image
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10056—Microscopic image
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30004—Biomedical image processing
    • G06T2207/30024—Cell structures in vitro; Tissue sections in vitro

Abstract

An apparatus, system, and method for increasing measurement accuracy in imaging cytometry. The system may include a light detector configured to measure light emitted by a first particle and light emitted by a second particle, where the measured light from the second particle at least partially overlaps the measured light from the first particle in an overlap region. Additionally, the system may include a processor coupled to the light detector, where the processor is configured to determine a contribution of light from the first particle in the overlap region and determine a contribution of light from the second particle in the overlap region. The processor may also be configured to subtract the contribution of light from the second particle from the contribution of light from the first particle and determine the intensity of light emitted by the first particle.
PCT/US2011/042317 2010-06-30 2011-06-29 Apparatus, system, and method for increasing measurement accuracy in a particle imaging device WO2012012163A2 (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
CN201180031245.5A CN103003660B (en) 2010-06-30 2011-06-29 For improving device, the system and method for the accuracy of measurement in particle imaging device
JP2013518628A JP5736453B2 (en) 2010-06-30 2011-06-29 Apparatus, system and method for increasing measurement accuracy in particle imaging device
CA2803607A CA2803607C (en) 2010-06-30 2011-06-29 Apparatus, system, and method for increasing measurement accuracy in a particle imaging device
AU2011280055A AU2011280055B2 (en) 2010-06-30 2011-06-29 Apparatus, system, and method for increasing measurement accuracy in a particle imaging device
EP19197554.9A EP3611462B1 (en) 2010-06-30 2011-06-29 Apparatus, system, and method for increasing measurement accuracy in a particle imaging device
EP23201211.2A EP4339590A2 (en) 2010-06-30 2011-06-29 Apparatus, system, and method for increasing measurement accuracy in a particle imaging device
EP11810118.7A EP2588835B1 (en) 2010-06-30 2011-06-29 Apparatus, system, and method for increasing measurement accuracy in a particle imaging device

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12/827,800 US8274656B2 (en) 2010-06-30 2010-06-30 Apparatus, system, and method for increasing measurement accuracy in a particle imaging device
US12/827,800 2010-06-30

Publications (2)

Publication Number Publication Date
WO2012012163A2 WO2012012163A2 (en) 2012-01-26
WO2012012163A3 true WO2012012163A3 (en) 2012-04-19

Family

ID=45399500

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2011/042317 WO2012012163A2 (en) 2010-06-30 2011-06-29 Apparatus, system, and method for increasing measurement accuracy in a particle imaging device

Country Status (7)

Country Link
US (1) US8274656B2 (en)
EP (3) EP4339590A2 (en)
JP (2) JP5736453B2 (en)
CN (1) CN103003660B (en)
AU (1) AU2011280055B2 (en)
CA (2) CA3010426C (en)
WO (1) WO2012012163A2 (en)

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US8767069B2 (en) 2010-06-30 2014-07-01 Luminex Corporation Apparatus, system, and method for increasing measurement accuracy in a particle imaging device using light distribution
EP2861969B1 (en) 2012-06-15 2022-08-03 Luminex Corporation Method for image normalization using a gaussian residual of fit selection criteria
JP2014062822A (en) * 2012-09-21 2014-04-10 Sony Corp Fine particle analyzer and fine particle analyzing method
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CA2946869A1 (en) 2014-04-24 2015-10-29 Immusant, Inc. Methods for diagnosing celiac disease using circulating cytokines/chemokines
WO2016081869A2 (en) 2014-11-21 2016-05-26 Immusant, Inc. Peptides for use in treatment and diagnosis of type 1 diabetes
IT201800003984A1 (en) * 2018-03-27 2019-09-27 Crestoptics S P A SUPER LOCALIZATION DISPERSION ASSISTED MICROSCOPY METHOD AND RELATIVE APPARATUS
TWI719490B (en) * 2019-05-28 2021-02-21 國立中正大學 Image grid line removing method and system thereof
US11709124B2 (en) 2020-07-13 2023-07-25 Honeywell International Inc. Particle sensor sample area qualification without a physical slit

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Also Published As

Publication number Publication date
EP4339590A2 (en) 2024-03-20
US20120002194A1 (en) 2012-01-05
JP2015096869A (en) 2015-05-21
CN103003660A (en) 2013-03-27
JP2013533975A (en) 2013-08-29
AU2011280055B2 (en) 2014-11-13
AU2011280055A1 (en) 2013-02-07
CN103003660B (en) 2016-03-09
JP5736453B2 (en) 2015-06-17
CA2803607A1 (en) 2012-01-26
CA3010426C (en) 2021-10-12
EP2588835B1 (en) 2019-09-18
EP2588835A2 (en) 2013-05-08
EP2588835A4 (en) 2018-06-13
EP3611462B1 (en) 2023-10-04
US8274656B2 (en) 2012-09-25
CA2803607C (en) 2018-08-14
JP6018232B2 (en) 2016-11-02
EP3611462A1 (en) 2020-02-19
CA3010426A1 (en) 2012-01-26
WO2012012163A2 (en) 2012-01-26

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