WO2011148251A1 - Method of making solar cells - Google Patents
Method of making solar cells Download PDFInfo
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- WO2011148251A1 WO2011148251A1 PCT/IB2011/001118 IB2011001118W WO2011148251A1 WO 2011148251 A1 WO2011148251 A1 WO 2011148251A1 IB 2011001118 W IB2011001118 W IB 2011001118W WO 2011148251 A1 WO2011148251 A1 WO 2011148251A1
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- Prior art keywords
- layer
- deposition
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- deposited
- approximately
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 7
- 230000008021 deposition Effects 0.000 claims abstract description 51
- 239000000758 substrate Substances 0.000 claims abstract description 43
- 238000000034 method Methods 0.000 claims abstract description 34
- 239000000203 mixture Substances 0.000 claims abstract description 20
- 239000000463 material Substances 0.000 claims description 44
- 239000007789 gas Substances 0.000 claims description 26
- 229910052802 copper Inorganic materials 0.000 claims description 11
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 8
- 239000001301 oxygen Substances 0.000 claims description 8
- 229910052760 oxygen Inorganic materials 0.000 claims description 8
- 229910052738 indium Inorganic materials 0.000 claims description 5
- 229910052711 selenium Inorganic materials 0.000 claims description 5
- 229910005543 GaSe Inorganic materials 0.000 claims description 4
- 229910052733 gallium Inorganic materials 0.000 claims description 4
- 230000004907 flux Effects 0.000 abstract description 5
- 229910052751 metal Inorganic materials 0.000 abstract description 4
- 239000002184 metal Substances 0.000 abstract description 4
- 150000003346 selenoethers Chemical class 0.000 abstract description 3
- 238000000151 deposition Methods 0.000 description 44
- 239000010949 copper Substances 0.000 description 26
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 8
- 238000002679 ablation Methods 0.000 description 8
- 239000004020 conductor Substances 0.000 description 8
- 239000011521 glass Substances 0.000 description 8
- 239000000843 powder Substances 0.000 description 7
- 239000003708 ampul Substances 0.000 description 6
- 229910052750 molybdenum Inorganic materials 0.000 description 6
- 229910052786 argon Inorganic materials 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 4
- 229910052799 carbon Inorganic materials 0.000 description 4
- 239000003989 dielectric material Substances 0.000 description 4
- 229910001220 stainless steel Inorganic materials 0.000 description 4
- 239000010935 stainless steel Substances 0.000 description 4
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 3
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 3
- 238000010276 construction Methods 0.000 description 3
- 238000004880 explosion Methods 0.000 description 3
- 239000010408 film Substances 0.000 description 3
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 3
- 239000011733 molybdenum Substances 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 239000007858 starting material Substances 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- 238000005137 deposition process Methods 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- 239000007769 metal material Substances 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 229910052698 phosphorus Inorganic materials 0.000 description 2
- 229910052709 silver Inorganic materials 0.000 description 2
- 239000013077 target material Substances 0.000 description 2
- 238000011282 treatment Methods 0.000 description 2
- RZVAJINKPMORJF-UHFFFAOYSA-N Acetaminophen Chemical compound CC(=O)NC1=CC=C(O)C=C1 RZVAJINKPMORJF-UHFFFAOYSA-N 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 239000012153 distilled water Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 239000002360 explosive Substances 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 239000008188 pellet Substances 0.000 description 1
- 238000005240 physical vapour deposition Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 238000005086 pumping Methods 0.000 description 1
- 239000005297 pyrex Substances 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 230000000452 restraining effect Effects 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
- IRPLSAGFWHCJIQ-UHFFFAOYSA-N selanylidenecopper Chemical compound [Se]=[Cu] IRPLSAGFWHCJIQ-UHFFFAOYSA-N 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 238000000859 sublimation Methods 0.000 description 1
- 230000008022 sublimation Effects 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 238000003786 synthesis reaction Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
- C23C14/28—Vacuum evaporation by wave energy or particle radiation
- C23C14/30—Vacuum evaporation by wave energy or particle radiation by electron bombardment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0256—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
- H01L31/0264—Inorganic materials
- H01L31/032—Inorganic materials including, apart from doping materials or other impurities, only compounds not provided for in groups H01L31/0272 - H01L31/0312
- H01L31/0322—Inorganic materials including, apart from doping materials or other impurities, only compounds not provided for in groups H01L31/0272 - H01L31/0312 comprising only AIBIIICVI chalcopyrite compounds, e.g. Cu In Se2, Cu Ga Se2, Cu In Ga Se2
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/541—CuInSe2 material PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Definitions
- the present invention is related to the method for the deposition of a material on a substrate, to the method of making a solar cell and to a solar cell.
- CIS(CIGS) becomes an ideal photoactive material for the construction of solar cells due to its suitable electron band gap of cca. 1.45 eV.
- the thin films of polycrystalline CIS(CIGS) can be deposited simply by different deposition processes (PVD, CVD, CSS, screen printing, spray methods, etc.).
- PVD physical vapor deposition
- CVD chemical vapor deposition
- CSS screen printing
- spray methods etc.
- the previously mentioned methods generally require a special post-deposition treatment to optimize the properties of the layers.
- the aim of this invention is to deliver a deposition method for a thin layer of a material, the method for a construction of a solar cell and a solar cell itself which permit to overcome at least partially the shortcomings of the state-of-the-art methods and are simultaneously simple and cheap to execute.
- FIG. 1 schematically illustrates a partial section of the device which can be employed by the method according to the present invention
- figure 2 schematically exhibits a different form of an embodiment of the device shown in figure 1 ;
- FIG. 3 shows a detail section of a product example according to the present invention.
- the method for the deposition of the first material of the composition Cu(lni -y Gay)(Sei- zS z )2+x where 0 ⁇ x ⁇ 0,25, 0 ⁇ y ⁇ 0,75, 0 ⁇ z ⁇ 1 on a substrate, is provided according to a first aspect of the present invention; the deposition is performed using the Pulsed Plasma Deposition (PPD).
- PPD Pulsed Plasma Deposition
- homogeneous layer is obtained (only small amount of the material is lost); moreover, such layer does not require further finishing treatments.
- the complete apparatus for the deposition of a material by PPD is indicated by number 1.
- the apparatus comprises a device 2 for plasma generation (i.e. an ionization at least partial of the rarefied gas) and guiding an electron flux towards the target 3 which contains (specifically is composed of) the given material in the way that at least part of the given material is separated from the target 3 and is deposited on a support (or substrate) 4.
- the given material can be composed of one homogeneous compound or of the combination of different compounds.
- the target 3 is grounded. In this way the target does not repulse (on the contrary - attracts) the electron flux even if the electrons already hit the target 3.
- the device 2 comprise a hollow element 5 which acts as a hollow cathode and has a cavity 6; and a main electrode 7, which comprises (especially is composed of) metallic conducting material and is placed inside the cavity of an ampoule 8 made of the dielectric material (for example glass or ceramics).
- the main electrode 7 extends through a wall of ampoule 8.
- the device 2 comprises an electronic device 9 with the function of a switch discharging to ground with adjustable frequency.
- a rarefied gas is present inside the cavity 6 (and the ampoule 8).
- the cavity 6 (and the ampoule 8) contains the rarefied gas at the pressure lower than or equal to 10 "2 mbar.
- the rarefied gas contained inside the cavity 6 (and the ampoule 8) exhibits a pressure form 10 ⁇ 2 mbar to 10 "6 mbar.
- the device 2 comprise a gas-feeding system (per se known and not shown) to feed the dry gas (non-restrictive examples of such gas are:
- the pumping system contains a vacuum pump for the gas rarefaction in the cavity 6 (in other words, to lower the gas pressure inside the cavity 6).
- the same conditions (described in the case of the cavity 6) are substantially maintained in a chamber 10, inside which is placed the target 3 and the substrate 4.
- the hollow element 5 comprises (especially, is composed of) a metallic conducting material and is connected to the power supply 12, which is designed to deliver a potential difference (up to cca. 20 kV) between the hollow element 5 and annular element 13, which acts as an anode.
- the hollow element 5 and the annular element 13 are connected through a capacitor 14.
- the apparatus 1 furthermore, comprises of a tubular element 15 (capillary) which extends from the hollow element 5 through the annular element 13.
- the tubular element 15 is made of dielectric material (especially glass or ceramics) and has a diameter from cca 5 mm to cca. 7 mm.
- the lumen of the tubular element 15 has a diameter from cca. 2 mm to cca. 4 mm.
- the apparatus 1 has been described for the purpose of an example, only.
- the device for the deposition by the PPD method can have the different structure and different working principle.
- the apparatus 1 could follow the one described in the patent application number PCT/IB2010/000644.
- the deposition of the material of target 3 on the substrate is made substantially according to the following manner.
- the plasma and the electrons are generated between the main electrode 7 and the hollow element 5.
- the electrons and the plasma generated near to hollow element 5 are taken away and accelerated by the potential difference (up to 20 kV) between the hollow element 5 and the annular element 3.
- the electrons and plasma enter the tubular element 15 and then pass the equipotential space between annular element 13 (anode) and the target 3.
- the energy of the electron packet is transferred to the target material through the electron packet impact on the target 3 surface and induces it's ablation, in other words, the explosion of the surface in the form of a plasma of the target 3 material (defined also as a "plum") propagates in the direction of the substrate 4 where it is deposited.
- the ionic conductivity of the rarefied gas ensures the electrostatic screening of the space charge generated by the electrons. Consequently to this effect, the self-sustained electron and plasma beams with high energy density and power can be accelerated and directed against the target 3 which is kept at the ground potential. In such a way the beams create the explosions under the target 3 surface, which explosions generate the expulsion of the target material (the ablation process or "the explosive sublimation") forming the "plum" which propagates from the target 3 surface.
- the ablation depth is determined by the beam energy density, the impulse life-time, the specific heat of evaporation and thermal conductivity of the target 3 material and by the density of the target itself.
- the plum material interacts with the low pressure (from 10 "6 mbar up to 10 "2 mbar) gas carrier present in the chamber 10 during its passage from the target 3 surface to the substrate 4 and can be partially (or totally) oxidised (in the case the gas carrier is or contains or is oxygen), partially (or totally) reduced (for example in the case of argon or hydrogen as the gas carrier), or doped (for example the nitrogen present in the deposition chamber is ionised through the interaction with the "plum” and can substitute the oxygen in the structure of the metallic oxides changing the valence state of the metal) or it remains unchanged. It has been shown recently [Krasik Ya. E., Gleizer S., Chirko K., Gleizer J.
- the deposition rate of the material can be controlled through the electron packet generation frequency (repetition rate); through the corresponding average electrical current (cca. 3 - 50 mA); through the distance between the target 3 and the substrate 4; and through the
- the target 3 is made by powder material pressing.
- the powder material is compressed inside a die applying the force of approx. 15 tons for ca. 30 min.
- the target 3 obtained by such process exhibits the diameter from ca. 28 mm up to ca. 36 mm (in particular, ca. 32 mm) and a thickness from ca. 5 mm up to ca. 6mm.
- the target 3 (during the ablation end the deposition) is rotated with the frequency from ca. 0,8 up to ca.1 ,2 Hz (specifically, ca. 1 Hz).
- the target 3 (during the ablation end the deposition) is heated up to the temperature of 950 °C.
- the device 2 is operated at a frequency (number of discharges in the time unit) from ca. 2 Hz up to ca. 100 Hz and a potential difference (between cathode and anode) from ca. 9 kV up to ca. 18 kV.
- the substrate 4 is rotated (specifically, at the frequency of ca. 0,5 Hz).
- the substrate 4 is heated up to the
- the chamber 10 contains the gas mixture composed of Argon and, possibly, oxygen in the amount from 0 % up to 10 % (in volume with respect to the total gas volume).
- the chamber 10 contains the gas mixture composed of Argon and up to 1 % (in volume with respect to the total gas volume) of some further gas selected from the group of H 2 , He, N 2 .
- the chamber 10 contains the gas at the pressure from ca. 1 * 10 " * mbar up to ca. 4 * 10 "3 mbar (in particular, ca.1 * 10 '3 mbar).
- a single target 3 is used which consists of the first material.
- the first material is deposited by means of at least two pulsed electron fluxes which hit at least two targets, respectively.
- the targets have two different compositions.
- the particular targets can be prepared and/or have the properties and/or be treated according to the description of the target 3.
- the pulsed electron fluxes are generated by two or more guns which demonstrates the structure and/or operation analogous to the device 2.
- two different targets are employed. In other case.s three different targets (with different composition each) are used. In some even more different cases, four different targets (with different composition each) are employed.
- figure 2 shows schematically an apparatus 1 which comprises two devices 2 and 2' for plasma generation, two targets 3 and 3' of different composition and only one substrate 4.
- P and P' show schematically the "plumes" which are generated at the surfaces of the targets 3 and 3', respectively.
- At least one (specifically, any of) target is composed of one starting material selected from the group: Cu 2 Se, CuSe, GaSe, ln 2 Se 3 , Cu 2 S, CuS, GaS, ln 2 S 3 .
- the first target is composed of CuSe (and/or Cu 2 Se) and the second target is composed of ln 2 Se 3 .
- a first target is composed of CuSe (and/or Cu 2 Se) and a second target is composed of ln 2 Se 3 and the third target is composed of GaSe.
- the first target is composed of (Cu 2 Se)i -n (CuSe) n wherein 0 ⁇ n ⁇ 0,25 (more in particular, n is ca. 0.02).
- the first target is composed of CuS (end/or Cu 2 S) and the second target is composed of ln 2 S 3 .
- the first target is composed of CuS (and/or Cu 2 S) and the second target is composed of ln 2 S 3 and the third target is composed of GaS.
- the first target is composed of (Cu 2 S)i- n (CuS) n where 0 ⁇ n ⁇ 0,25 (more in particular, n is ca. 0.02).
- at least one (especially, each) target is composed of one of the components of the first material in the elementary form.
- At least one (especially, each) target is composed of the element selected from the group: Cu, In, Ga, Se, S.
- at least one (in particular, each) target is composed of the element selected from the group: Cu, In, Ga, Se.
- at least one (especially, each) target is composed of the element selected from the group: Cu, In, Se.
- the first material has the composition Cu (lr>i- y Gay)Se 2+ x.
- the first material has the composition Cu lnSe 2+x .
- the first material has the composition Cu(lni- yGa y )S 2+ x. Specifically, the first material exhibits the composition CulnS 2+x .
- the first layer (of the first material) is made - this layer shows a thickness of up to 8 ⁇ (in particular, from ca. 1 pm to ca. 8pm).
- the first layer shows a thickness of 2 m to 6 ⁇ (in particular, ca. 4pm).
- the substrate is of an essentially dielectric material (for example glass).
- the substrate can be covered with one layer of ITO (Indium Tin Oxide).
- the substrate is of a metallic material (for example Copper, Molybdenum, stainless steel or a combination of those).
- a method for production of a solar cell comprises an application step, during which a plurality of layers is deposited on a substrate and which comprises a first step of deposition, which is defined as the deposition as described in accordance with the first aspect of the present invention.
- the application step comprises a second deposition step (which can precede or succeed the first deposition step) which is performed by pulsed plasma (Pulsed Plasma Deposition - PPD) and during which ZnO is deposited, producing a second layer showing a thickness of less than or equal to ca. 150nm.
- a second deposition step which can precede or succeed the first deposition step
- PPD Pulsed Plasma Deposition - PPD
- the second layer shows a thickness of more than or equal to 80nm. It should be noted that it has been experimentally observed that with a second layer of the thickness indicated above it is surprisingly possible to obtain particularly efficient solar cells.
- the conditions under which the second deposition phase is performed are such that allow the second layer (formed by ZnO) to be essentially isolating (specifically, it shows a resistivity of more than 1 x10 3 0hm - advantageously, more than 1 x10 5 Ohm).
- the second layer shows a resistivity of more than 1x10m 10 Ohm.
- ZnO is deposited in the chamber 10 which contains gas containing at least
- the application step comprises a third deposition step, which is between the first and the second, and during which a third layer containing (in particular, composed of) CdS is deposited.
- the third deposition phase is carried out through
- Pulsed Plasma Deposition The third layer enables the creation of a p-n transition separating the electronic holes and the electrons at the interface.
- the third layer has a thickness of up to 150nm
- the substrate is rotated.
- the first layer is deposited directly on (in contact with) the substrate.
- the substrate is of metallic material (for example Copper, Molybdenum, stainless steel or a combination of those).
- the third layer is deposited (on contact), on which third layer the second layer is deposited (on contact).
- a layer of an essentially conductive material (having a resistivity of less than IxlO ⁇ Ohm) is deposited (on contact). Carbon paste is deposited on(in contact) the essentially conductive material.
- the essentially conductive material shows a resistivity of less than 1x10 " 3 Om (specifically, less than 1x10 "5 Om).
- the essentially conductive material is ZnO that is deposited in an oxygen-free atmosphere through PPD starting from one ZnO target.
- the second layer is deposited (directly on contact) upon the substrate.
- the substrate is from an essentially dielectric material (for example glass).
- the substrate can be covered with one layer of ITO (Indium Tin Oxide).
- ITO Indium Tin Oxide
- the third layer is deposited (on contact), on which the first layer is deposited (on contact).
- a metallic contact for example Copper, Silver, Aluminum, Gold, Molybdenum or a
- a solar cell comprising of substrate and a first layer.
- the solar cell includes a second layer.
- the solar cell includes a third layer (deposited on contact between the first and the second layer).
- the solar cell includes an essentially conductive material layer, a metallic contact and/or a carbon contact.
- the first and/or the second and/or the third layer are defined in accordance with the first and/or second aspect of the present invention.
- the substrate, the essentially conductive material, the metallic contact and/or the carbon contact are defined in accordance with the first and/or second aspect of the present invention.
- the layers of the first material were deposited from single targets of Cu, In, Ga and Se using deposition system and four independently controlled PPD guns. All the targets were prepared from starting materials (source: Sigma-Aldrich, purity 99.9+ or 99.99%) in powder form. All the powders were pressed under vacuum in a die of 32 mm diameter applying force of 15 tons for ca. 30 minutes.
- the thickness of so obtained pellets is ca. 5-6 mm.
- the targets rotated during the ablation with the frequency of 1 Hz.
- the plumes produced by the ablation of different targets were directed towards a substrate (which can be heated to different stabilized temperatures up to 950°C) so as to overlap homogeneously upon surface of 5.08cm diameter.
- the substrate rotated with the frequency of ca. 0.5Hz during the deposition.
- the work atmosphere in the deposition chamber was constituted by Ar (or Ar + x% 0 2 0% > x > 10%, Ar + 1 % H 2 , He and/or N 2 ), held under pressure of ca. 1x10 "3 mbar.
- the layers of CIS (CIGS) were deposited on glass substrates (Pyrex, "Alcali-free” glass, quartz) or metal (Cu, Mo, stainless steel) heated to various temperatures T (25°C > T > 700°C, preferably 300°C).
- the substrate temperature was controlled using an IR-thermometer, the thickness observed by using a laser thickness monitor.
- Targets were produced from starting materials (Cu 2 Se, CuSe, GaSe, ln 2 Se 3 , source:
- Flexible solar cells were constructed on metallic substrates (Cu, Mo and/or stainless steel). These substrates were cleaned by the same procedure as described in the previous example. On the cleaned substrates placed in the CdS/CIS (CIGS) deposition chamber first a thin layer of the first material was deposited (thickness between 1 and 8 ⁇ , specifically 4 ⁇ ) and upon this layer a CdS film was applied (thickness ca. 80nm).
- CdS/CIS CdS/CIS
- an electric contact was created by applying a carbon paste.
Abstract
Method of making solar cells, the method provides that on a substrate (4) there are deposited: a substantially isolating layer (17) of ZnO of approximately 100nm, a layer (18) of CdS of approximately 100µm, a layer (19) of mixed selenides, and metal layer (20) by means of a Pulsed Plasma Deposition (PPD); the deposition of the mixed selenides takes place by hitting targets (3, 3') of different compositions at the same time by means of a plurality of fluxes of electrons.
Description
Method of making solar cells
Technical field The present invention is related to the method for the deposition of a material on a substrate, to the method of making a solar cell and to a solar cell.
Background of the invention CIS(CIGS)
becomes an ideal photoactive material for the construction of solar cells due to its suitable electron band gap of cca. 1.45 eV. The thin films of polycrystalline CIS(CIGS) can be deposited simply by different deposition processes (PVD, CVD, CSS, screen printing, spray methods, etc.). However, the previously mentioned methods generally require a special post-deposition treatment to optimize the properties of the layers.
Moreover, the known methods require to deposit a material in excess, the employment of costly substrates and relatively high temperatures and deposition energies.
It should be noted, moreover, that solar cells obtained through mentioned methods are relatively inefficient and expensive.
The aim of this invention is to deliver a deposition method for a thin layer of a material, the method for a construction of a solar cell and a solar cell itself which permit to overcome at least partially the shortcomings of the state-of-the-art methods and are simultaneously simple and cheap to execute. Summary
According to the present invention are delivered a method for the deposition of a layer of a material, the method for the construction of a solar cell and a solar cell itself as it is
presented in subsequent independent claims and, preferably, in any of the claims dependent directly or indirectly on independent claims.
Brief description of the drawings
The invention will be subsequently described referring to attached figures which illustrate some examples of embodiments non-restraining, from which:
- figure 1 schematically illustrates a partial section of the device which can be employed by the method according to the present invention;
- figure 2 schematically exhibits a different form of an embodiment of the device shown in figure 1 ; and
- figure 3 shows a detail section of a product example according to the present invention.
Embodiments of the present invention
The method for the deposition of the first material of the composition Cu(lni-yGay)(Sei- zSz)2+x where 0≤x≤0,25, 0≤y≤0,75, 0≤z≤1 on a substrate, is provided according to a first aspect of the present invention; the deposition is performed using the Pulsed Plasma Deposition (PPD).
It should be noted that depositing the first material using PPD a first particularly
homogeneous layer is obtained (only small amount of the material is lost); moreover, such layer does not require further finishing treatments.
In the figure 1 the complete apparatus for the deposition of a material by PPD is indicated by number 1. The apparatus comprises a device 2 for plasma generation (i.e. an ionization at least partial of the rarefied gas) and guiding an electron flux towards the target 3 which contains (specifically is composed of) the given material in the way that at least part of the given material is separated from the target 3 and is deposited on a support (or substrate) 4.
According to alternative embodiments, the given material can be composed of one homogeneous compound or of the combination of different compounds.
Advantageously, the target 3 is grounded. In this way the target does not repulse (on the contrary - attracts) the electron flux even if the electrons already hit the target 3.
The device 2 comprise a hollow element 5 which acts as a hollow cathode and has a cavity 6; and a main electrode 7, which comprises (especially is composed of) metallic conducting material and is placed inside the cavity of an ampoule 8 made of the dielectric material (for example glass or ceramics).
According to the embodiment illustrated in figure 1 , the main electrode 7 extends through a wall of ampoule 8.
The device 2 comprises an electronic device 9 with the function of a switch discharging to ground with adjustable frequency.
A rarefied gas is present inside the cavity 6 (and the ampoule 8). According to some embodiments, the cavity 6 (and the ampoule 8) contains the rarefied gas at the pressure lower than or equal to 10"2 mbar. Advantageously, the rarefied gas contained inside the cavity 6 (and the ampoule 8) exhibits a pressure form 10~2 mbar to 10"6 mbar.
In this regard, it should be noted that the device 2 comprise a gas-feeding system (per se known and not shown) to feed the dry gas (non-restrictive examples of such gas are:
oxygen, nitrogen, argon, helium, xenon ecc.) inside the cavity 6 (and the ampoule 8); and the pumping system (per se known and not shown) contains a vacuum pump for the gas rarefaction in the cavity 6 (in other words, to lower the gas pressure inside the cavity 6). The same conditions (described in the case of the cavity 6) are substantially maintained in a chamber 10, inside which is placed the target 3 and the substrate 4.
The hollow element 5 comprises (especially, is composed of) a metallic conducting material and is connected to the power supply 12, which is designed to deliver a potential difference (up to cca. 20 kV) between the hollow element 5 and annular element 13, which acts as an anode. The hollow element 5 and the annular element 13 are connected through a capacitor 14.
The apparatus 1 , furthermore, comprises of a tubular element 15 (capillary) which extends from the hollow element 5 through the annular element 13. The tubular element 15 is made of dielectric material (especially glass or ceramics) and has a diameter from cca 5 mm to cca. 7 mm. The lumen of the tubular element 15 has a diameter from cca. 2 mm to cca. 4 mm.
The deposition of the given material on the substrate is performed in an analogous way to the process described in the patent application with the publication number
WO2006/105955.
The apparatus 1 has been described for the purpose of an example, only. The device for the deposition by the PPD method can have the different structure and different working principle.
For example, according to the further embodiments, the apparatus 1 could follow the one described in the patent application number PCT/IB2010/000644.
The deposition of the material of target 3 on the substrate is made substantially according to the following manner. At the event of the main electrode discharge to the ground, the plasma and the electrons are generated between the main electrode 7 and the hollow element 5. The electrons and the plasma generated near to hollow element 5 are taken away and accelerated by the potential difference (up to 20 kV) between the hollow element 5 and the annular element 3. The electrons and plasma enter the tubular element 15 and then pass the equipotential space between annular element 13 (anode) and the target 3. The energy of the electron packet (impulse) is transferred to the target material through the electron packet impact on the target 3 surface and induces it's ablation, in other words, the explosion of the surface in the form of a plasma of the target 3 material (defined also as a "plum") propagates in the direction of the substrate 4 where it is deposited.
The ionic conductivity of the rarefied gas ensures the electrostatic screening of the space charge generated by the electrons. Consequently to this effect, the self-sustained electron and plasma beams with high energy density and power can be accelerated and directed against the target 3 which is kept at the ground potential. In such a way the beams create
the explosions under the target 3 surface, which explosions generate the expulsion of the target material (the ablation process or "the explosive sublimation") forming the "plum" which propagates from the target 3 surface.
The ablation depth is determined by the beam energy density, the impulse life-time, the specific heat of evaporation and thermal conductivity of the target 3 material and by the density of the target itself.
The plum material interacts with the low pressure (from 10"6 mbar up to 10"2 mbar) gas carrier present in the chamber 10 during its passage from the target 3 surface to the substrate 4 and can be partially (or totally) oxidised (in the case the gas carrier is or contains or is oxygen), partially (or totally) reduced (for example in the case of argon or hydrogen as the gas carrier), or doped (for example the nitrogen present in the deposition chamber is ionised through the interaction with the "plum" and can substitute the oxygen in the structure of the metallic oxides changing the valence state of the metal) or it remains unchanged. It has been shown recently [Krasik Ya. E., Gleizer S., Chirko K., Gleizer J. Z., Felsteiner J., Bemshtam V., Matacotta F. C, J. Appl. Phys., 99, 063303, (2006)] that only small part (cca. 1%) of the electrons is accelerated by the full potential difference between the cathode (hollow element 5) and the anode (annular element 13). The energy of the main part of electrons does not exceed 500 eV. The deposition rate of the material (the growth rate of the film) can be controlled through the electron packet generation frequency (repetition rate); through the corresponding average electrical current (cca. 3 - 50 mA); through the distance between the target 3 and the substrate 4; and through the
temperature of the substrate.
Advantageously, in the first material 0,01≤x≤0,03 (in particular, x=0,02) and 0<y≤0,25 (in particular, y=0,25). According to some embodiments, z=0. According to alternative embodiments, z=1.
According to some embodiments, the target 3 is made by powder material pressing. In particular, the powder material is compressed inside a die applying the force of approx. 15 tons for ca. 30 min. The target 3 obtained by such process exhibits the diameter from ca.
28 mm up to ca. 36 mm (in particular, ca. 32 mm) and a thickness from ca. 5 mm up to ca. 6mm.
Advantageously, the target 3 (during the ablation end the deposition) is rotated with the frequency from ca. 0,8 up to ca.1 ,2 Hz (specifically, ca. 1 Hz). The target 3 (during the ablation end the deposition) is heated up to the temperature of 950 °C.
According to some embodiments, the device 2 is operated at a frequency (number of discharges in the time unit) from ca. 2 Hz up to ca. 100 Hz and a potential difference (between cathode and anode) from ca. 9 kV up to ca. 18 kV.
Advantageously, (to facilitate the homogeneous deposition) the substrate 4 is rotated (specifically, at the frequency of ca. 0,5 Hz). The substrate 4 is heated up to the
temperature from ca. 25 °C up to ca. 700 °C (advantageously, from ca 250 °C up to ca. 350 °C; particularly, at ca. 300 °C).
According to some embodiments, the chamber 10 contains the gas mixture composed of Argon and, possibly, oxygen in the amount from 0 % up to 10 % (in volume with respect to the total gas volume). Alternatively, the chamber 10 contains the gas mixture composed of Argon and up to 1 % (in volume with respect to the total gas volume) of some further gas selected from the group of H2, He, N2.
Advantageously, the chamber 10 contains the gas at the pressure from ca. 1*10"* mbar up to ca. 4*10"3 mbar (in particular, ca.1 *10'3 mbar).
According to some embodiments, a single target 3 is used which consists of the first material.
According to some embodiments, the first material is deposited by means of at least two pulsed electron fluxes which hit at least two targets, respectively. The targets have two different compositions. The particular targets can be prepared and/or have the properties and/or be treated according to the description of the target 3. Advantageously, the pulsed electron fluxes are generated by two or more guns which demonstrates the structure and/or operation analogous to the device 2.
In some cases, two different targets (with different composition each) are employed. In
other case.s three different targets (with different composition each) are used. In some even more different cases, four different targets (with different composition each) are employed.
For the purpose of example only, figure 2 shows schematically an apparatus 1 which comprises two devices 2 and 2' for plasma generation, two targets 3 and 3' of different composition and only one substrate 4. P and P' show schematically the "plumes" which are generated at the surfaces of the targets 3 and 3', respectively.
It should be noted that the "plumes" produced at different targets are combined
surprisingly in the way which permits the reaction among different components and to create at the substrate 4 the mentioned first material. In such a way it is possible to omit (or substantially simplify) the preparation of the target 3. Moreover, it is possible in this way to change very easily the composition of the first material changing the different
operational parameters.
According to some particular embodiments, at least one (specifically, any of) target is composed of one starting material selected from the group: Cu2Se, CuSe, GaSe, ln2Se3, Cu2S, CuS, GaS, ln2S3.
According to a specific embodiment, the first target is composed of CuSe (and/or Cu2Se) and the second target is composed of ln2Se3.
According to a specific embodiment ,a first target is composed of CuSe (and/or Cu2Se) and a second target is composed of ln2Se3 and the third target is composed of GaSe. In particular, the first target is composed of (Cu2Se)i-n(CuSe)n wherein 0≤n<0,25 (more in particular, n is ca. 0.02).
According to a specific embodiment ,the first target is composed of CuS (end/or Cu2S) and the second target is composed of ln2S3.
According to a specific embodiment the first target is composed of CuS (and/or Cu2S) and the second target is composed of ln2S3 and the third target is composed of GaS. In particular, the first target is composed of (Cu2S)i-n(CuS)n where 0<n≤0,25 (more in particular, n is ca. 0.02).
According to one version, at least one (especially, each) target is composed of one of the components of the first material in the elementary form. According to a specific
embodiments, at least one (especially, each) target is composed of the element selected from the group: Cu, In, Ga, Se, S. In particular, at least one (in particular, each) target is composed of the element selected from the group: Cu, In, Ga, Se. According to a some embodiments, at least one (especially, each) target is composed of the element selected from the group: Cu, In, Se.
According to a some embodiments, the first material has the composition Cu (lr>i- yGay)Se2+x. In particular, the first material has the composition Cu lnSe2+x.
According to alternative embodiments, the first material has the composition Cu(lni- yGay)S2+x. Specifically, the first material exhibits the composition CulnS2+x.
During the deposition the first layer (of the first material) is made - this layer shows a thickness of up to 8μπι (in particular, from ca. 1 pm to ca. 8pm). Advantageously, the first layer shows a thickness of 2 m to 6μηι (in particular, ca. 4pm).
It should be noted that by applying the deposition method according to the present invention a surprisingly efficient deposition is achieved, using the quantity necessarily needed of the first material and low cost substrates.
According to some embodiments, the substrate is of an essentially dielectric material (for example glass). In some cases the substrate can be covered with one layer of ITO (Indium Tin Oxide).
According to some embodiments, the substrate is of a metallic material (for example Copper, Molybdenum, stainless steel or a combination of those).
In accordance with a second aspect of the present invention, a method for production of a solar cell is provided. The method comprises an application step, during which a plurality of layers is deposited on a substrate and which comprises a first step of deposition, which is defined as the deposition as described in accordance with the first aspect of the present invention.
Furthermore, the application step comprises a second deposition step (which can precede
or succeed the first deposition step) which is performed by pulsed plasma (Pulsed Plasma Deposition - PPD) and during which ZnO is deposited, producing a second layer showing a thickness of less than or equal to ca. 150nm.
Advantageously, the second layer shows a thickness of more than or equal to 80nm. It should be noted that it has been experimentally observed that with a second layer of the thickness indicated above it is surprisingly possible to obtain particularly efficient solar cells.
The conditions under which the second deposition phase is performed are such that allow the second layer (formed by ZnO) to be essentially isolating (specifically, it shows a resistivity of more than 1 x1030hm - advantageously, more than 1 x105Ohm).
Advantageously, the second layer shows a resistivity of more than 1x10m10Ohm.
In particular, ZnO is deposited in the chamber 10 which contains gas containing at least
25% (of volume in respect to the total volume of gas) of oxygen.
Advantageously, the application step comprises a third deposition step, which is between the first and the second, and during which a third layer containing (in particular, composed of) CdS is deposited. Advantageously, the third deposition phase is carried out through
Pulsed Plasma Deposition (PPD). The third layer enables the creation of a p-n transition separating the electronic holes and the electrons at the interface.
According to some embodiments, the third layer has a thickness of up to 150nm
(specifically, from ca. 80nm up to 150nm).
Advantageously, during the application step the substrate is rotated. Thus, it is possible to obtain essentially homogeneous depositions.
According to some embodiments, the first layer is deposited directly on (in contact with) the substrate. In particular, in this case the substrate is of metallic material (for example Copper, Molybdenum, stainless steel or a combination of those). Thus, on the first layer the third layer is deposited (on contact), on which third layer the second layer is deposited (on contact). Thus, on the second layer a layer of an essentially conductive material (having a resistivity of less than IxlO^Ohm) is deposited (on contact). Carbon paste is
deposited on(in contact) the essentially conductive material.
Advantageously, the essentially conductive material shows a resistivity of less than 1x10" 3Om (specifically, less than 1x10"5Om). According to some embodiments, the essentially conductive material is ZnO that is deposited in an oxygen-free atmosphere through PPD starting from one ZnO target.
According to some embodiments, the second layer is deposited (directly on contact) upon the substrate. In particular, in this case, the substrate is from an essentially dielectric material (for example glass). In some cases, the substrate can be covered with one layer of ITO (Indium Tin Oxide). Thus, on the second layer the third layer is deposited (on contact), on which the first layer is deposited (on contact). Thus, on the first layer a metallic contact (for example Copper, Silver, Aluminum, Gold, Molybdenum or a
combination of those) is deposited (preferably through PPD).
In accordance with a third aspect of the present invention, a solar cell comprising of substrate and a first layer is provided. According to some embodiments, the solar cell includes a second layer. Advantageously, the solar cell includes a third layer (deposited on contact between the first and the second layer). Advantageously, the solar cell includes an essentially conductive material layer, a metallic contact and/or a carbon contact.
The first and/or the second and/or the third layer are defined in accordance with the first and/or second aspect of the present invention.
The substrate, the essentially conductive material, the metallic contact and/or the carbon contact are defined in accordance with the first and/or second aspect of the present invention.
Unless the opposite is explicitly stated, the content of the references (articles, books, patent applications etc.) cited in this text is referred to in its entirety. In particular, the references listed are herein incorporated by reference.
Further characteristics of the present invention will emerge from the following description of two merely illustrative, not limiting examples.
Example 1
Deposition of single elements The layers of the first material were deposited from single targets of Cu, In, Ga and Se using deposition system and four independently controlled PPD guns. All the targets were prepared from starting materials (source: Sigma-Aldrich, purity 99.9+ or 99.99%) in powder form. All the powders were pressed under vacuum in a die of 32 mm diameter applying force of 15 tons for ca. 30 minutes.
The thickness of so obtained pellets is ca. 5-6 mm. The targets rotated during the ablation with the frequency of 1 Hz.
The ablation velocity of different materials varies substantially (vCu > vin >VG3 = vse), thus, the efficiency of the PPD guns was adjusted through control of the discharge frequency f (2Hz≥ f > 100Hz) acceleration voltage V (9Kv > V > 18Kv) of each cannon according to the material of its target so that the resulting film would manifest the correct stoichiometry. The plumes produced by the ablation of different targets were directed towards a substrate (which can be heated to different stabilized temperatures up to 950°C) so as to overlap homogeneously upon surface of 5.08cm diameter. The substrate rotated with the frequency of ca. 0.5Hz during the deposition. The work atmosphere in the deposition chamber was constituted by Ar (or Ar + x% 02 0% > x > 10%, Ar + 1 % H2, He and/or N2), held under pressure of ca. 1x10"3 mbar. The layers of CIS (CIGS) were deposited on glass substrates (Pyrex, "Alcali-free" glass, quartz) or metal (Cu, Mo, stainless steel) heated to various temperatures T (25°C > T > 700°C, preferably 300°C). The substrate temperature was controlled using an IR-thermometer, the thickness observed by using a laser thickness monitor.
Example 2
Selenides deposition
Targets were produced from starting materials (Cu2Se, CuSe, GaSe, ln2Se3, source:
Sigma-Aldrich) in powder form. All the powders were pressed under vacuum in a die of 32 mm diameter applying force of 15 tons for ca. 30 minutes. The composition of the target from Copper selenide was varied in the following limits: (Cu2Se)i-x(CuSe)x where 0≥ x≥ 0.25. The thin layer deposition procedure took place following the procedure described in example 1. Example 3
Deposition from single target
For this deposition process various targets with already the desired composition were prepared from the first material through solid state synthesis using reactions between the powders at elevated temperatures in closed environment. The group of targets can be described with the formula: CulnS2+x where 0 > x > 0.25 and with the formula Cu(lni- yGay)S2+x where 0 > x≥ 0.25, 0 > y > 0.75. The thin layer deposition procedure took place following the procedure described in example 1.
Example 4
Solar cells deposited on glass layer For the production of these cells it has been used the "alcali-free" glass with a layer of ITO (Indium Tin Oxides) already pre-deposited. The substrates 16 (figure 3) were cleaned through chemic methods (bath in solvents and bi-distilled water) and then treated in DC plasma from Ar (power of 25W) for two minutes. Subsequently, the substrates were moved
into the ZnO deposition chamber and a layer 17 of (ca. 100nm) isolating ZnO was deposited in oxygen atmosphere (gas pressure p = 4x10"3 mbar). At this point the substrates were moved in the CdS/CIS (CIGS) deposition chamber and a layer 18 of CdS (ca. 80nm) was deposited on the ZnO surface and subsequently a layer 19 of the first material was grown (thickness between 1 and 8 μιη, specifically 4 m). On the layer 19 of the first material the metallic contact 20 was prepared (with magnetron "sputtering" of Cu, Ag, Al, Au or Mo). Figure 3 illustrates schematically what was obtained.
Example 5
Solar cells deposited on metal layer
Flexible solar cells were constructed on metallic substrates (Cu, Mo and/or stainless steel). These substrates were cleaned by the same procedure as described in the previous example. On the cleaned substrates placed in the CdS/CIS (CIGS) deposition chamber first a thin layer of the first material was deposited (thickness between 1 and 8 μιτι, specifically 4 μηη) and upon this layer a CdS film was applied (thickness ca. 80nm).
Subsequently, the substrates were moved into the ZnO deposition chamber and a layer of (ca. 100nm) isolating ZnO was deposited in oxygen atmosphere (gas pressure p = 4x10"3 mbar). Subsequently, the device was moved into the ZnO deposition chamber and a ZnO layer (thickness ca. 10nm) was deposited in atmosphere of oygen (gas pressure p = 4x10" 3 mbar) and thus conductive (thickness ca. 200-300 nm). Finally, upon the ZnO surface an electric contact was created by applying a carbon paste.
Claims
1. - Method of making a solar cell; the method comprising an application step, during which a plurality of layers are deposited on a substrate and which comprises a first deposition step of a first material having composition Cu(ln1-yGay)(Sei-zSz)2+x wherein 0< x ≤0.25, 0≤ y <0.75, 0< z < 1 ; the method being characterised in that the first deposition step is carried out by means of Pulsed Plasma Deposition (PPD).
2. - Method according to claim 1 , wherein the first material is deposited directing at least two pulsed flows of electrons each against a respective target having a different composition.
3. - Method according to claim 1 or 2, wherein at least a target is made of a material selected in a group consisting of: Cu2Se, CuSe, GaSe, ln2Se3, Cu2S, CuS, GaS, ln2S3.
4. - Method according to claim 1 or 2, wherein at least a target is made of one of the components of the first material in elementary form.
5.- Method according to Claim 4, wherein the first material has a composition
Cu(lni.yGay)Se2+x; at least a target is made of an element selected in the group consisting of: Cu, In, Ga, Se.
6. - Method according to one of the preceding claims, wherein during the first deposition step a first layer, which first layer has a thickness from approximately 1 μιτι to approximately δμητι, is prepared.
7. - Method according to one of the preceding claims, wherein the application step comprises a second deposition step (which can be before or after the first deposition step), which is carried out by means of Pulsed Plasma Deposition (PPD) in the presence of oxygen and during which ZnO is deposited so as to obtain a second layer having a thickness smaller than or equal to approximately 150nm.
8. - Method according to claim 7, wherein the second layer has a thickness greater than or equal to 80nm.
9. - Method according to claim 7 or 8, wherein the application step comprises a third deposition step, which is between the first and the second deposition steps and during which a third layer, which consists of CdS and has a thickness from approximately 80nm to approximately 150nm, is deposited.
10.- Method according to one of the preceding claims, wherein the substrate is made to rotate during the application step.
11.- Solar cell comprising a substrate and a first layer having a thickness smaller than or equal to 8μτη and having a composition Cu(ln -yGay)(Sei-zSz)2+x wherein 0< X <0.25, 0< y <0.75, 0< z < 1.
12. - Solar cell according to claim 1 1 , and comprising a second layer of ZnO substantially isolating and having a thickness smaller than or equal to approximately 150nm.
13. - Solar cell according to claim 12, wherein the first layer has a thickness greater than or equal to 1μτη and the second layer has a thickness greater than or equal to 80nm.
14. - Solar cell according to one of claims from 1 1 to 13, and comprising a third layer located between the first and the second layer, which consists of CdS and has a thickness from approximately 80nm to approximately 150nm.
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WO2013186697A2 (en) | 2012-06-11 | 2013-12-19 | Noivion S.R.L. | Device for generating plasma and directing an electron beam towards a target |
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