WO2010045124A3 - A method for estimating temperature at a critical point - Google Patents

A method for estimating temperature at a critical point Download PDF

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Publication number
WO2010045124A3
WO2010045124A3 PCT/US2009/060253 US2009060253W WO2010045124A3 WO 2010045124 A3 WO2010045124 A3 WO 2010045124A3 US 2009060253 W US2009060253 W US 2009060253W WO 2010045124 A3 WO2010045124 A3 WO 2010045124A3
Authority
WO
WIPO (PCT)
Prior art keywords
thermal model
critical points
temperature
temperature portion
critical point
Prior art date
Application number
PCT/US2009/060253
Other languages
French (fr)
Other versions
WO2010045124A2 (en
Inventor
Keith Cox
Gaurav Kapoor
Vaughn Arnold
Original Assignee
Apple Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Apple Inc. filed Critical Apple Inc.
Publication of WO2010045124A2 publication Critical patent/WO2010045124A2/en
Publication of WO2010045124A3 publication Critical patent/WO2010045124A3/en

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Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/26—Power supply means, e.g. regulation thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/42—Circuits effecting compensation of thermal inertia; Circuits for predicting the stationary value of a temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/42—Circuits effecting compensation of thermal inertia; Circuits for predicting the stationary value of a temperature
    • G01K7/425—Thermal management of integrated systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/42—Circuits effecting compensation of thermal inertia; Circuits for predicting the stationary value of a temperature
    • G01K7/427—Temperature calculation based on spatial modeling, e.g. spatial inter- or extrapolation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/16—Constructional details or arrangements
    • G06F1/20—Cooling means
    • G06F1/206—Cooling means comprising thermal management
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K1/00—Details of thermometers not specially adapted for particular types of thermometer
    • G01K1/20—Compensating for effects of temperature changes other than those to be measured, e.g. changes in ambient temperature

Abstract

Methods and apparatuses are disclosed to estimate temperature at one or more critical points in a data processing system comprising modeling a steady state temperature portion of a thermal model at the one or more critical points using regression analysis; modeling the transient temperature portion of the thermal model at the one or more critical points using a filtering algorithm; and generating a thermal model at the one or more critical points by combining the steady state temperature portion of the thermal model with the transient temperature portion of the thermal model. The thermal model may then be used to estimate an instantaneous temperature at the one or more critical points or to predict a future temperature at the one or more critical points.
PCT/US2009/060253 2008-10-13 2009-10-09 A method for estimating temperature at a critical point WO2010045124A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12/250,498 US8306772B2 (en) 2008-10-13 2008-10-13 Method for estimating temperature at a critical point
US12/250,498 2008-10-13

Publications (2)

Publication Number Publication Date
WO2010045124A2 WO2010045124A2 (en) 2010-04-22
WO2010045124A3 true WO2010045124A3 (en) 2011-01-06

Family

ID=42099677

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2009/060253 WO2010045124A2 (en) 2008-10-13 2009-10-09 A method for estimating temperature at a critical point

Country Status (2)

Country Link
US (3) US8306772B2 (en)
WO (1) WO2010045124A2 (en)

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US8306772B2 (en) 2012-11-06
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US9546914B2 (en) 2017-01-17
US20130060510A1 (en) 2013-03-07

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