US491783A
(en)
*
|
|
1893-02-14 |
|
Bolster-plate |
US1337866A
(en)
|
1917-09-27 |
1920-04-20 |
Griffiths Ethel Grace |
System for protecting electric cables
|
US2143625A
(en)
*
|
1931-08-25 |
1939-01-10 |
Archie M Bovier |
Manifolding record
|
US2142625A
(en)
*
|
1932-07-06 |
1939-01-03 |
Hollandsche Draad En Kabelfab |
High tension cable
|
US2376101A
(en)
|
1942-04-01 |
1945-05-15 |
Ferris Instr Corp |
Electrical energy transmission
|
US2389668A
(en)
|
1943-03-04 |
1945-11-27 |
Barnes Drill Co |
Indexing mechanism for machine tables
|
US2545258A
(en)
|
1945-03-22 |
1951-03-13 |
Marcel L Cailloux |
Device for telecontrol of spatial movement
|
US2762234A
(en)
|
1952-09-08 |
1956-09-11 |
Dodd Roy Frank |
Search-track radar control
|
US2901696A
(en)
|
1953-11-25 |
1959-08-25 |
Ingeniors N Magnetic Ab Fa |
Arrangement for automatic and continuous measuring of the noise factor of an electric device
|
US2921276A
(en)
*
|
1955-08-30 |
1960-01-12 |
Cutler Hammer Inc |
Microwave circuits
|
US3193712A
(en)
|
1962-03-21 |
1965-07-06 |
Clarence A Harris |
High voltage cable
|
US3230299A
(en)
*
|
1962-07-18 |
1966-01-18 |
Gen Cable Corp |
Electrical cable with chemically bonded rubber layers
|
US3262593A
(en)
|
1963-07-10 |
1966-07-26 |
Gen Mills Inc |
Wall-mounted support structure
|
GB1031068A
(en)
|
1963-09-23 |
1966-05-25 |
George Vincent Grispo |
Improvements in or relating to motion reduction mechanisms
|
US3218584A
(en)
|
1964-01-02 |
1965-11-16 |
Sanders Associates Inc |
Strip line connection
|
US3401126A
(en)
|
1965-06-18 |
1968-09-10 |
Ibm |
Method of rendering noble metal conductive composition non-wettable by solder
|
US3429040A
(en)
*
|
1965-06-18 |
1969-02-25 |
Ibm |
Method of joining a component to a substrate
|
US3445770A
(en)
|
1965-12-27 |
1969-05-20 |
Philco Ford Corp |
Microelectronic test probe with defect marker access
|
US3484679A
(en)
|
1966-10-03 |
1969-12-16 |
North American Rockwell |
Electrical apparatus for changing the effective capacitance of a cable
|
US3573617A
(en)
|
1967-10-27 |
1971-04-06 |
Aai Corp |
Method and apparatus for testing packaged integrated circuits
|
GB1240866A
(en)
*
|
1968-08-22 |
1971-07-28 |
Amf Inc |
Control device
|
US3609539A
(en)
|
1968-09-28 |
1971-09-28 |
Ibm |
Self-aligning kelvin probe
|
US3541222A
(en)
|
1969-01-13 |
1970-11-17 |
Bunker Ramo |
Connector screen for interconnecting adjacent surfaces of laminar circuits and method of making
|
JPS497756B1
(en)
|
1969-01-24 |
1974-02-22 |
|
|
NL7003475A
(en)
*
|
1969-03-28 |
1970-09-30 |
|
|
US3648169A
(en)
|
1969-05-26 |
1972-03-07 |
Teledyne Inc |
Probe and head assembly
|
US3596228A
(en)
|
1969-05-29 |
1971-07-27 |
Ibm |
Fluid actuated contactor
|
US3611199A
(en)
|
1969-09-30 |
1971-10-05 |
Emerson Electric Co |
Digital electromagnetic wave phase shifter comprising switchable reflectively terminated power-dividing means
|
US3686624A
(en)
|
1969-12-15 |
1972-08-22 |
Rca Corp |
Coax line to strip line end launcher
|
US3654585A
(en)
|
1970-03-11 |
1972-04-04 |
Brooks Research And Mfg Inc |
Coordinate conversion for the testing of printed circuit boards
|
US3622915A
(en)
|
1970-03-16 |
1971-11-23 |
Meca Electronics Inc |
Electrical coupler
|
US3740900A
(en)
|
1970-07-01 |
1973-06-26 |
Signetics Corp |
Vacuum chuck assembly for semiconductor manufacture
|
US3700998A
(en)
|
1970-08-20 |
1972-10-24 |
Computer Test Corp |
Sample and hold circuit with switching isolation
|
US3714572A
(en)
*
|
1970-08-21 |
1973-01-30 |
Rca Corp |
Alignment and test fixture apparatus
|
US4009456A
(en)
*
|
1970-10-07 |
1977-02-22 |
General Microwave Corporation |
Variable microwave attenuator
|
US3680037A
(en)
|
1970-11-05 |
1972-07-25 |
Tech Wire Prod Inc |
Electrical interconnector
|
US3662318A
(en)
|
1970-12-23 |
1972-05-09 |
Comp Generale Electricite |
Transition device between coaxial and microstrip lines
|
US3710251A
(en)
*
|
1971-04-07 |
1973-01-09 |
Collins Radio Co |
Microelectric heat exchanger pedestal
|
US3705379A
(en)
|
1971-05-14 |
1972-12-05 |
Amp Inc |
Connector for interconnection of symmetrical and asymmetrical transmission lines
|
US3766470A
(en)
|
1971-05-24 |
1973-10-16 |
Unit Process Assemblies |
Apparatus for testing the integrity of a thru-hole plating in circuit board workpieces or the like by measuring the effective thickness thereof
|
US3725829A
(en)
|
1971-07-14 |
1973-04-03 |
Itek Corp |
Electrical connector
|
GB1387587A
(en)
*
|
1971-07-22 |
1975-03-19 |
Plessey Co Ltd |
Electrical interconnectors and connector assemblies
|
US3810016A
(en)
|
1971-12-17 |
1974-05-07 |
Western Electric Co |
Test probe for semiconductor devices
|
US3829076A
(en)
|
1972-06-08 |
1974-08-13 |
H Sofy |
Dial index machine
|
US3858212A
(en)
|
1972-08-29 |
1974-12-31 |
L Tompkins |
Multi-purpose information gathering and distribution system
|
US3952156A
(en)
|
1972-09-07 |
1976-04-20 |
Xerox Corporation |
Signal processing system
|
CA970849A
(en)
*
|
1972-09-18 |
1975-07-08 |
Malcolm P. Macmartin |
Low leakage isolating transformer for electromedical apparatus
|
US3806801A
(en)
|
1972-12-26 |
1974-04-23 |
Ibm |
Probe contactor having buckling beam probes
|
US3839672A
(en)
|
1973-02-05 |
1974-10-01 |
Belden Corp |
Method and apparatus for measuring the effectiveness of the shield in a coaxial cable
|
US3867698A
(en)
*
|
1973-03-01 |
1975-02-18 |
Western Electric Co |
Test probe for integrated circuit chips
|
US3833852A
(en)
|
1973-08-16 |
1974-09-03 |
Owens Illinois Inc |
Inspection head mounting apparatus
|
US3849728A
(en)
|
1973-08-21 |
1974-11-19 |
Wentworth Labor Inc |
Fixed point probe card and an assembly and repair fixture therefor
|
US3930809A
(en)
*
|
1973-08-21 |
1976-01-06 |
Wentworth Laboratories, Inc. |
Assembly fixture for fixed point probe card
|
US4001685A
(en)
*
|
1974-03-04 |
1977-01-04 |
Electroglas, Inc. |
Micro-circuit test probe
|
US3936743A
(en)
*
|
1974-03-05 |
1976-02-03 |
Electroglas, Inc. |
High speed precision chuck assembly
|
US3971610A
(en)
|
1974-05-10 |
1976-07-27 |
Technical Wire Products, Inc. |
Conductive elastomeric contacts and connectors
|
US3976959A
(en)
|
1974-07-22 |
1976-08-24 |
Gaspari Russell A |
Planar balun
|
US3970934A
(en)
|
1974-08-12 |
1976-07-20 |
Akin Aksu |
Printed circuit board testing means
|
US4038599A
(en)
|
1974-12-30 |
1977-07-26 |
International Business Machines Corporation |
High density wafer contacting and test system
|
US4123706A
(en)
|
1975-03-03 |
1978-10-31 |
Electroglas, Inc. |
Probe construction
|
US4038894A
(en)
|
1975-07-18 |
1977-08-02 |
Springfield Tool And Die, Inc. |
Piercing apparatus
|
SE407115B
(en)
*
|
1975-10-06 |
1979-03-12 |
Kabi Ab |
PROCEDURES AND METAL ELECTRODES FOR THE STUDY OF ENZYMATIC AND OTHER BIOCHEMICAL REACTIONS
|
US4035723A
(en)
|
1975-10-16 |
1977-07-12 |
Xynetics, Inc. |
Probe arm
|
US3992073A
(en)
|
1975-11-24 |
1976-11-16 |
Technical Wire Products, Inc. |
Multi-conductor probe
|
US4116523A
(en)
|
1976-01-23 |
1978-09-26 |
James M. Foster |
High frequency probe
|
US4049252A
(en)
|
1976-02-04 |
1977-09-20 |
Bell Theodore F |
Index table
|
US4008900A
(en)
*
|
1976-03-15 |
1977-02-22 |
John Freedom |
Indexing chuck
|
US4063195A
(en)
|
1976-03-26 |
1977-12-13 |
Hughes Aircraft Company |
Parametric frequency converter
|
US4099120A
(en)
|
1976-04-19 |
1978-07-04 |
Akin Aksu |
Probe head for testing printed circuit boards
|
US4027935A
(en)
|
1976-06-21 |
1977-06-07 |
International Business Machines Corporation |
Contact for an electrical contactor assembly
|
US4074201A
(en)
*
|
1976-07-26 |
1978-02-14 |
Gte Sylvania Incorporated |
Signal analyzer with noise estimation and signal to noise readout
|
US4115735A
(en)
|
1976-10-14 |
1978-09-19 |
Faultfinders, Inc. |
Test fixture employing plural platens for advancing some or all of the probes of the test fixture
|
US4093988A
(en)
|
1976-11-08 |
1978-06-06 |
General Electric Company |
High speed frequency response measurement
|
US4124787A
(en)
|
1977-03-11 |
1978-11-07 |
Atari, Inc. |
Joystick controller mechanism operating one or plural switches sequentially or simultaneously
|
US4151465A
(en)
|
1977-05-16 |
1979-04-24 |
Lenz Seymour S |
Variable flexure test probe for microelectronic circuits
|
US4161692A
(en)
|
1977-07-18 |
1979-07-17 |
Cerprobe Corporation |
Probe device for integrated circuit wafers
|
US4312117A
(en)
*
|
1977-09-01 |
1982-01-26 |
Raytheon Company |
Integrated test and assembly device
|
US4184729A
(en)
*
|
1977-10-13 |
1980-01-22 |
Bunker Ramo Corporation |
Flexible connector cable
|
US4135131A
(en)
*
|
1977-10-14 |
1979-01-16 |
The United States Of America As Represented By The Secretary Of The Army |
Microwave time delay spectroscopic methods and apparatus for remote interrogation of biological targets
|
US4184133A
(en)
*
|
1977-11-28 |
1980-01-15 |
Rockwell International Corporation |
Assembly of microwave integrated circuits having a structurally continuous ground plane
|
US4216467A
(en)
|
1977-12-22 |
1980-08-05 |
Westinghouse Electric Corp. |
Hand controller
|
US4232398A
(en)
|
1978-02-09 |
1980-11-04 |
Motorola, Inc. |
Radio receiver alignment indicator
|
US4177421A
(en)
|
1978-02-27 |
1979-12-04 |
Xerox Corporation |
Capacitive transducer
|
US4302146A
(en)
|
1978-08-23 |
1981-11-24 |
Westinghouse Electric Corp. |
Probe positioner
|
US4225819A
(en)
|
1978-10-12 |
1980-09-30 |
Bell Telephone Laboratories, Incorporated |
Circuit board contact contamination probe
|
US4306235A
(en)
|
1978-11-02 |
1981-12-15 |
Cbc Corporation |
Multiple frequency microwave antenna
|
DE2849119A1
(en)
|
1978-11-13 |
1980-05-14 |
Siemens Ag |
METHOD AND CIRCUIT FOR DAMPING MEASUREMENT, ESPECIALLY FOR DETERMINING THE DAMPING AND / OR GROUP DISTANCE DISTORTION OF A MEASURED OBJECT
|
US4251772A
(en)
*
|
1978-12-26 |
1981-02-17 |
Pacific Western Systems Inc. |
Probe head for an automatic semiconductive wafer prober
|
US4280112A
(en)
|
1979-02-21 |
1981-07-21 |
Eisenhart Robert L |
Electrical coupler
|
US4287473A
(en)
|
1979-05-25 |
1981-09-01 |
The United States Of America As Represented By The United States Department Of Energy |
Nondestructive method for detecting defects in photodetector and solar cell devices
|
FI58719C
(en)
*
|
1979-06-01 |
1981-04-10 |
Instrumentarium Oy |
DIAGNOSTISERINGSANORDNING FOER BROESTKANCER
|
US4277741A
(en)
|
1979-06-25 |
1981-07-07 |
General Motors Corporation |
Microwave acoustic spectrometer
|
US4327180A
(en)
|
1979-09-14 |
1982-04-27 |
Board Of Governors, Wayne State Univ. |
Method and apparatus for electromagnetic radiation of biological material
|
US4284033A
(en)
|
1979-10-31 |
1981-08-18 |
Rca Corporation |
Means to orbit and rotate target wafers supported on planet member
|
US4330783A
(en)
|
1979-11-23 |
1982-05-18 |
Toia Michael J |
Coaxially fed dipole antenna
|
US4284682A
(en)
|
1980-04-30 |
1981-08-18 |
Nasa |
Heat sealable, flame and abrasion resistant coated fabric
|
US4340860A
(en)
|
1980-05-19 |
1982-07-20 |
Trigon |
Integrated circuit carrier package test probe
|
US4357575A
(en)
|
1980-06-17 |
1982-11-02 |
Dit-Mco International Corporation |
Apparatus for use in testing printed circuit process boards having means for positioning such boards in proper juxtaposition with electrical contacting assemblies
|
US4346355A
(en)
|
1980-11-17 |
1982-08-24 |
Raytheon Company |
Radio frequency energy launcher
|
DE3267983D1
(en)
*
|
1981-04-25 |
1986-01-30 |
Toshiba Kk |
Apparatus for measuring noise factor and available gain
|
US4425395A
(en)
*
|
1981-04-30 |
1984-01-10 |
Fujikura Rubber Works, Ltd. |
Base fabrics for polyurethane-coated fabrics, polyurethane-coated fabrics and processes for their production
|
JPS5943091B2
(en)
*
|
1981-06-03 |
1984-10-19 |
義栄 長谷川 |
Fixed probe board
|
US4567436A
(en)
*
|
1982-01-21 |
1986-01-28 |
Linda Koch |
Magnetic thickness gauge with adjustable probe
|
US4502028A
(en)
*
|
1982-06-15 |
1985-02-26 |
Raytheon Company |
Programmable two-port microwave network
|
GB2133649A
(en)
*
|
1982-12-23 |
1984-07-25 |
Philips Electronic Associated |
Microwave oscillator
|
JPS60136006U
(en)
*
|
1984-02-20 |
1985-09-10 |
株式会社 潤工社 |
flat cable
|
US4646005A
(en)
*
|
1984-03-16 |
1987-02-24 |
Motorola, Inc. |
Signal probe
|
US4722846A
(en)
*
|
1984-04-18 |
1988-02-02 |
Kikkoman Corporation |
Novel variant and process for producing light colored soy sauce using such variant
|
US4636722A
(en)
*
|
1984-05-21 |
1987-01-13 |
Probe-Rite, Inc. |
High density probe-head with isolated and shielded transmission lines
|
DE3428087A1
(en)
*
|
1984-07-30 |
1986-01-30 |
Kraftwerk Union AG, 4330 Mülheim |
CONCENTRIC THREE-WIRE CABLE
|
JPS61164338A
(en)
*
|
1985-01-17 |
1986-07-25 |
Riken Denshi Kk |
Multiplex arithmetic type digital-analog converter
|
DE3531893A1
(en)
*
|
1985-09-06 |
1987-03-19 |
Siemens Ag |
METHOD FOR DETERMINING THE DISTRIBUTION OF DIELECTRICITY CONSTANTS IN AN EXAMINATION BODY, AND MEASURING ARRANGEMENT FOR IMPLEMENTING THE METHOD
|
JPH0326643Y2
(en)
*
|
1985-09-30 |
1991-06-10 |
|
|
US4727319A
(en)
*
|
1985-12-24 |
1988-02-23 |
Hughes Aircraft Company |
Apparatus for on-wafer testing of electrical circuits
|
EP0442543B1
(en)
*
|
1986-01-24 |
1997-11-19 |
Fuji Photo Film Co., Ltd. |
Device for loading sheet films
|
JP2609232B2
(en)
*
|
1986-09-04 |
1997-05-14 |
日本ヒューレット・パッカード株式会社 |
Floating drive circuit
|
US4904933A
(en)
*
|
1986-09-08 |
1990-02-27 |
Tektronix, Inc. |
Integrated circuit probe station
|
FR2606887B1
(en)
*
|
1986-11-18 |
1989-01-13 |
Thomson Semiconducteurs |
CIRCUIT FOR MEASURING THE DYNAMIC CHARACTERISTICS OF A BOX FOR A FAST INTEGRATED CIRCUIT, AND METHOD FOR MEASURING THESE DYNAMIC CHARACTERISTICS
|
US5082627A
(en)
*
|
1987-05-01 |
1992-01-21 |
Biotronic Systems Corporation |
Three dimensional binding site array for interfering with an electrical field
|
US4894612A
(en)
*
|
1987-08-13 |
1990-01-16 |
Hypres, Incorporated |
Soft probe for providing high speed on-wafer connections to a circuit
|
US5084671A
(en)
*
|
1987-09-02 |
1992-01-28 |
Tokyo Electron Limited |
Electric probing-test machine having a cooling system
|
JP2554669Y2
(en)
*
|
1987-11-10 |
1997-11-17 |
博 寺町 |
Rotary positioning device
|
US4891584A
(en)
*
|
1988-03-21 |
1990-01-02 |
Semitest, Inc. |
Apparatus for making surface photovoltage measurements of a semiconductor
|
JPH01133701U
(en)
*
|
1988-03-07 |
1989-09-12 |
|
|
US4988062A
(en)
*
|
1988-03-10 |
1991-01-29 |
London Robert A |
Apparatus, system and method for organizing and maintaining a plurality of medical catheters and the like
|
US4983910A
(en)
*
|
1988-05-20 |
1991-01-08 |
Stanford University |
Millimeter-wave active probe
|
US4987100A
(en)
*
|
1988-05-26 |
1991-01-22 |
International Business Machines Corporation |
Flexible carrier for an electronic device
|
US4991290A
(en)
*
|
1988-07-21 |
1991-02-12 |
Microelectronics And Computer Technology |
Flexible electrical interconnect and method of making
|
US4893914A
(en)
*
|
1988-10-12 |
1990-01-16 |
The Micromanipulator Company, Inc. |
Test station
|
US4904935A
(en)
*
|
1988-11-14 |
1990-02-27 |
Eaton Corporation |
Electrical circuit board text fixture having movable platens
|
US5089774A
(en)
*
|
1989-12-26 |
1992-02-18 |
Sharp Kabushiki Kaisha |
Apparatus and a method for checking a semiconductor
|
JPH03209737A
(en)
*
|
1990-01-11 |
1991-09-12 |
Tokyo Electron Ltd |
Probe equipment
|
US5091732A
(en)
*
|
1990-09-07 |
1992-02-25 |
The United States Of America As Represented By The Secretary Of The Navy |
Lightweight deployable antenna system
|
DE69130205T2
(en)
*
|
1990-12-25 |
1999-03-25 |
Ngk Insulators Ltd |
Semiconductor wafer heater and method of manufacturing the same
|
US5487999A
(en)
*
|
1991-06-04 |
1996-01-30 |
Micron Technology, Inc. |
Method for fabricating a penetration limited contact having a rough textured surface
|
US5177438A
(en)
*
|
1991-08-02 |
1993-01-05 |
Motorola, Inc. |
Low resistance probe for semiconductor
|
US5180977A
(en)
*
|
1991-12-02 |
1993-01-19 |
Hoya Corporation Usa |
Membrane probe contact bump compliancy system
|
US5281364A
(en)
*
|
1992-05-22 |
1994-01-25 |
Finch Limited |
Liquid metal electrical contact compositions
|
US5371654A
(en)
*
|
1992-10-19 |
1994-12-06 |
International Business Machines Corporation |
Three dimensional high performance interconnection package
|
US5383787A
(en)
*
|
1993-04-27 |
1995-01-24 |
Aptix Corporation |
Integrated circuit package with direct access to internal signals
|
JP3346838B2
(en)
*
|
1993-06-29 |
2002-11-18 |
有限会社創造庵 |
Rotary movement mechanism
|
US5594358A
(en)
*
|
1993-09-02 |
1997-01-14 |
Matsushita Electric Industrial Co., Ltd. |
Radio frequency probe and probe card including a signal needle and grounding needle coupled to a microstrip transmission line
|
US7064566B2
(en)
*
|
1993-11-16 |
2006-06-20 |
Formfactor, Inc. |
Probe card assembly and kit
|
US6836962B2
(en)
*
|
1993-11-16 |
2005-01-04 |
Formfactor, Inc. |
Method and apparatus for shaping spring elements
|
US6023103A
(en)
*
|
1994-11-15 |
2000-02-08 |
Formfactor, Inc. |
Chip-scale carrier for semiconductor devices including mounted spring contacts
|
US20020011859A1
(en)
*
|
1993-12-23 |
2002-01-31 |
Kenneth R. Smith |
Method for forming conductive bumps for the purpose of contrructing a fine pitch test device
|
US5704355A
(en)
*
|
1994-07-01 |
1998-01-06 |
Bridges; Jack E. |
Non-invasive system for breast cancer detection
|
GB9417450D0
(en)
*
|
1994-08-25 |
1994-10-19 |
Symmetricom Inc |
An antenna
|
US5481196A
(en)
*
|
1994-11-08 |
1996-01-02 |
Nebraska Electronics, Inc. |
Process and apparatus for microwave diagnostics and therapy
|
US6002109A
(en)
*
|
1995-07-10 |
1999-12-14 |
Mattson Technology, Inc. |
System and method for thermal processing of a semiconductor substrate
|
JP3838381B2
(en)
*
|
1995-11-22 |
2006-10-25 |
株式会社アドバンテスト |
Probe card
|
US5889410A
(en)
*
|
1996-05-22 |
1999-03-30 |
International Business Machines Corporation |
Floating gate interlevel defect monitor and method
|
US6181149B1
(en)
*
|
1996-09-26 |
2001-01-30 |
Delaware Capital Formation, Inc. |
Grid array package test contactor
|
JPH1130649A
(en)
*
|
1997-07-10 |
1999-02-02 |
Mitsubishi Electric Corp |
Semiconductor circuit testing method and testing device
|
US5977813A
(en)
*
|
1997-10-03 |
1999-11-02 |
International Business Machines Corporation |
Temperature monitor/compensation circuit for integrated circuits
|
US6013586A
(en)
*
|
1997-10-09 |
2000-01-11 |
Dimension Polyant Sailcloth, Inc. |
Tent material product and method of making tent material product
|
US6287776B1
(en)
*
|
1998-02-02 |
2001-09-11 |
Signature Bioscience, Inc. |
Method for detecting and classifying nucleic acid hybridization
|
US6181144B1
(en)
*
|
1998-02-25 |
2001-01-30 |
Micron Technology, Inc. |
Semiconductor probe card having resistance measuring circuitry and method fabrication
|
FR2775832B1
(en)
*
|
1998-03-05 |
2000-05-05 |
St Microelectronics Sa |
SEMICONDUCTOR TEST SYSTEM CARRIED OUT IN A CUTTING PATH OF A SEMICONDUCTOR WAFER
|
US6181416B1
(en)
*
|
1998-04-14 |
2001-01-30 |
Optometrix, Inc. |
Schlieren method for imaging semiconductor device properties
|
US6720501B1
(en)
*
|
1998-04-14 |
2004-04-13 |
Formfactor, Inc. |
PC board having clustered blind vias
|
TW440699B
(en)
*
|
1998-06-09 |
2001-06-16 |
Advantest Corp |
Test apparatus for electronic parts
|
GB2342148B
(en)
*
|
1998-10-01 |
2000-12-20 |
Nippon Kokan Kk |
Method and apparatus for preventing snow from melting and for packing snow in artificial ski facility
|
US6175228B1
(en)
*
|
1998-10-30 |
2001-01-16 |
Agilent Technologies |
Electronic probe for measuring high impedance tri-state logic circuits
|
US6169410B1
(en)
*
|
1998-11-09 |
2001-01-02 |
Anritsu Company |
Wafer probe with built in RF frequency conversion module
|
US6672875B1
(en)
*
|
1998-12-02 |
2004-01-06 |
Formfactor, Inc. |
Spring interconnect structures
|
US6335625B1
(en)
*
|
1999-02-22 |
2002-01-01 |
Paul Bryant |
Programmable active microwave ultrafine resonance spectrometer (PAMURS) method and systems
|
US6539531B2
(en)
*
|
1999-02-25 |
2003-03-25 |
Formfactor, Inc. |
Method of designing, fabricating, testing and interconnecting an IC to external circuit nodes
|
US6448865B1
(en)
*
|
1999-02-25 |
2002-09-10 |
Formfactor, Inc. |
Integrated circuit interconnect system
|
US6499121B1
(en)
*
|
1999-03-01 |
2002-12-24 |
Formfactor, Inc. |
Distributed interface for parallel testing of multiple devices using a single tester channel
|
US6400166B2
(en)
*
|
1999-04-15 |
2002-06-04 |
International Business Machines Corporation |
Micro probe and method of fabricating same
|
US6340895B1
(en)
*
|
1999-07-14 |
2002-01-22 |
Aehr Test Systems, Inc. |
Wafer-level burn-in and test cartridge
|
US6339338B1
(en)
*
|
2000-01-18 |
2002-01-15 |
Formfactor, Inc. |
Apparatus for reducing power supply noise in an integrated circuit
|
US6509751B1
(en)
*
|
2000-03-17 |
2003-01-21 |
Formfactor, Inc. |
Planarizer for a semiconductor contactor
|
US6677744B1
(en)
*
|
2000-04-13 |
2004-01-13 |
Formfactor, Inc. |
System for measuring signal path resistance for an integrated circuit tester interconnect structure
|
DE10028145C2
(en)
*
|
2000-06-07 |
2002-04-18 |
Infineon Technologies Ag |
Integrated circuit arrangement for testing transistors and semiconductor wafer with such a circuit arrangement
|
US6379130B1
(en)
*
|
2000-06-09 |
2002-04-30 |
Tecumseh Products Company |
Motor cover retention
|
JP2002022775A
(en)
*
|
2000-07-05 |
2002-01-23 |
Ando Electric Co Ltd |
Electro-optical probe and magneto-optical probe
|
JP2002039091A
(en)
*
|
2000-07-21 |
2002-02-06 |
Minebea Co Ltd |
Blower
|
GB2371618B
(en)
*
|
2001-01-30 |
2004-11-17 |
Teraprobe Ltd |
A probe, apparatus and method for examining a sample
|
US6512482B1
(en)
*
|
2001-03-20 |
2003-01-28 |
Xilinx, Inc. |
Method and apparatus using a semiconductor die integrated antenna structure
|
CA2353024C
(en)
*
|
2001-07-12 |
2005-12-06 |
Ibm Canada Limited-Ibm Canada Limitee |
Anti-vibration and anti-tilt microscope stand
|
US6678876B2
(en)
*
|
2001-08-24 |
2004-01-13 |
Formfactor, Inc. |
Process and apparatus for finding paths through a routing space
|
EP1509776A4
(en)
*
|
2002-05-23 |
2010-08-18 |
Cascade Microtech Inc |
Probe for testing a device under test
|
US7343185B2
(en)
*
|
2002-06-21 |
2008-03-11 |
Nir Diagnostics Inc. |
Measurement of body compounds
|
US6987483B2
(en)
*
|
2003-02-21 |
2006-01-17 |
Kyocera Wireless Corp. |
Effectively balanced dipole microstrip antenna
|
US6838885B2
(en)
*
|
2003-03-05 |
2005-01-04 |
Murata Manufacturing Co., Ltd. |
Method of correcting measurement error and electronic component characteristic measurement apparatus
|
US7319335B2
(en)
*
|
2004-02-12 |
2008-01-15 |
Applied Materials, Inc. |
Configurable prober for TFT LCD array testing
|
TWI228597B
(en)
*
|
2004-02-25 |
2005-03-01 |
Nat Applied Res Laboratories |
Device monitor for RF and DC measurements
|
US7148716B2
(en)
*
|
2004-06-10 |
2006-12-12 |
Texas Instruments Incorporated |
System and method for the probing of a wafer
|
JP2006237378A
(en)
*
|
2005-02-25 |
2006-09-07 |
Elpida Memory Inc |
Wafer prober and method of testing wafer
|
JP4611788B2
(en)
*
|
2005-04-12 |
2011-01-12 |
サンテック株式会社 |
Optical deflection probe and optical deflection probe apparatus
|