WO2005034149A2 - Kugel- oder kornförmiges halbleiterbauelement zur verwendung in solarzellen und verfahren zur herstellung; verfahren zur herstellung einer solarzelle mit halbleiterbauelement und solarzelle - Google Patents
Kugel- oder kornförmiges halbleiterbauelement zur verwendung in solarzellen und verfahren zur herstellung; verfahren zur herstellung einer solarzelle mit halbleiterbauelement und solarzelle Download PDFInfo
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- WO2005034149A2 WO2005034149A2 PCT/EP2004/010615 EP2004010615W WO2005034149A2 WO 2005034149 A2 WO2005034149 A2 WO 2005034149A2 EP 2004010615 W EP2004010615 W EP 2004010615W WO 2005034149 A2 WO2005034149 A2 WO 2005034149A2
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- WIPO (PCT)
- Prior art keywords
- layer
- semiconductor
- solar cell
- iii
- contact layer
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 178
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 27
- 150000001875 compounds Chemical class 0.000 claims abstract description 43
- 239000002243 precursor Substances 0.000 claims abstract description 31
- 239000000758 substrate Substances 0.000 claims abstract description 28
- 239000010410 layer Substances 0.000 claims description 258
- 238000000034 method Methods 0.000 claims description 73
- 239000011669 selenium Substances 0.000 claims description 18
- 229910052733 gallium Inorganic materials 0.000 claims description 17
- 239000010949 copper Substances 0.000 claims description 16
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 claims description 15
- 239000011593 sulfur Substances 0.000 claims description 15
- 229910052717 sulfur Inorganic materials 0.000 claims description 15
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 claims description 14
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 claims description 14
- 229910052711 selenium Inorganic materials 0.000 claims description 14
- 239000002245 particle Substances 0.000 claims description 13
- 238000006243 chemical reaction Methods 0.000 claims description 12
- 229910052802 copper Inorganic materials 0.000 claims description 11
- 239000000463 material Substances 0.000 claims description 11
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 10
- 229910052738 indium Inorganic materials 0.000 claims description 10
- 229920000642 polymer Polymers 0.000 claims description 10
- 239000002346 layers by function Substances 0.000 claims description 9
- 229910052750 molybdenum Inorganic materials 0.000 claims description 9
- 239000011733 molybdenum Substances 0.000 claims description 9
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 claims description 8
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 claims description 8
- 239000011521 glass Substances 0.000 claims description 7
- 229910052751 metal Inorganic materials 0.000 claims description 7
- 239000002184 metal Substances 0.000 claims description 7
- 239000004020 conductor Substances 0.000 claims description 6
- 239000000155 melt Substances 0.000 claims description 5
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims description 4
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 4
- 239000004642 Polyimide Substances 0.000 claims description 4
- 239000000919 ceramic Substances 0.000 claims description 4
- 238000000224 chemical solution deposition Methods 0.000 claims description 4
- 238000005229 chemical vapour deposition Methods 0.000 claims description 4
- LCUOIYYHNRBAFS-UHFFFAOYSA-N copper;sulfanylideneindium Chemical class [Cu].[In]=S LCUOIYYHNRBAFS-UHFFFAOYSA-N 0.000 claims description 4
- 238000005530 etching Methods 0.000 claims description 4
- 229920001721 polyimide Polymers 0.000 claims description 4
- 229920002635 polyurethane Polymers 0.000 claims description 4
- 239000004814 polyurethane Substances 0.000 claims description 4
- 150000003839 salts Chemical class 0.000 claims description 4
- 229920001940 conductive polymer Polymers 0.000 claims description 3
- CDZGJSREWGPJMG-UHFFFAOYSA-N copper gallium Chemical compound [Cu].[Ga] CDZGJSREWGPJMG-UHFFFAOYSA-N 0.000 claims description 3
- 238000010410 dusting Methods 0.000 claims description 3
- 238000000227 grinding Methods 0.000 claims description 3
- 238000010438 heat treatment Methods 0.000 claims description 3
- 150000002483 hydrogen compounds Chemical class 0.000 claims description 3
- 239000011159 matrix material Substances 0.000 claims description 3
- 238000005498 polishing Methods 0.000 claims description 3
- 229920000647 polyepoxide Polymers 0.000 claims description 3
- 238000003825 pressing Methods 0.000 claims description 3
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 2
- 229910018487 Ni—Cr Inorganic materials 0.000 claims description 2
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 2
- 239000000956 alloy Substances 0.000 claims description 2
- 229910045601 alloy Inorganic materials 0.000 claims description 2
- 229910052782 aluminium Inorganic materials 0.000 claims description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical group [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 2
- 229910052799 carbon Inorganic materials 0.000 claims description 2
- VNNRSPGTAMTISX-UHFFFAOYSA-N chromium nickel Chemical compound [Cr].[Ni] VNNRSPGTAMTISX-UHFFFAOYSA-N 0.000 claims description 2
- 239000003822 epoxy resin Substances 0.000 claims description 2
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 claims description 2
- 229910052742 iron Inorganic materials 0.000 claims description 2
- 229910052759 nickel Inorganic materials 0.000 claims description 2
- 229920000515 polycarbonate Polymers 0.000 claims description 2
- 239000004417 polycarbonate Substances 0.000 claims description 2
- 229920000728 polyester Polymers 0.000 claims description 2
- SBIBMFFZSBJNJF-UHFFFAOYSA-N selenium;zinc Chemical compound [Se]=[Zn] SBIBMFFZSBJNJF-UHFFFAOYSA-N 0.000 claims description 2
- 229910052709 silver Inorganic materials 0.000 claims description 2
- 239000004332 silver Substances 0.000 claims description 2
- 239000005361 soda-lime glass Substances 0.000 claims description 2
- -1 copper indium gallium sulfides Chemical class 0.000 claims 3
- PKLGPLDEALFDSB-UHFFFAOYSA-N [SeH-]=[Se].[In+3].[Cu+2].[SeH-]=[Se].[SeH-]=[Se].[SeH-]=[Se].[SeH-]=[Se] Chemical class [SeH-]=[Se].[In+3].[Cu+2].[SeH-]=[Se].[SeH-]=[Se].[SeH-]=[Se].[SeH-]=[Se] PKLGPLDEALFDSB-UHFFFAOYSA-N 0.000 claims 2
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 claims 1
- 150000002118 epoxides Chemical class 0.000 claims 1
- NMHFBDQVKIZULJ-UHFFFAOYSA-N selanylideneindium Chemical class [In]=[Se] NMHFBDQVKIZULJ-UHFFFAOYSA-N 0.000 claims 1
- GKCNVZWZCYIBPR-UHFFFAOYSA-N sulfanylideneindium Chemical class [In]=S GKCNVZWZCYIBPR-UHFFFAOYSA-N 0.000 claims 1
- 239000012815 thermoplastic material Substances 0.000 claims 1
- 238000005987 sulfurization reaction Methods 0.000 abstract description 8
- 238000005240 physical vapour deposition Methods 0.000 description 8
- HVMJUDPAXRRVQO-UHFFFAOYSA-N copper indium Chemical compound [Cu].[In] HVMJUDPAXRRVQO-UHFFFAOYSA-N 0.000 description 7
- 238000000151 deposition Methods 0.000 description 4
- 238000004544 sputter deposition Methods 0.000 description 4
- UCKMPCXJQFINFW-UHFFFAOYSA-N Sulphide Chemical compound [S-2] UCKMPCXJQFINFW-UHFFFAOYSA-N 0.000 description 3
- KTSFMFGEAAANTF-UHFFFAOYSA-N [Cu].[Se].[Se].[In] Chemical compound [Cu].[Se].[Se].[In] KTSFMFGEAAANTF-UHFFFAOYSA-N 0.000 description 3
- 230000008021 deposition Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 150000002739 metals Chemical class 0.000 description 3
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 230000018109 developmental process Effects 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 229910052708 sodium Inorganic materials 0.000 description 2
- 239000011734 sodium Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 239000002344 surface layer Substances 0.000 description 2
- 229920001169 thermoplastic Polymers 0.000 description 2
- 230000007704 transition Effects 0.000 description 2
- 238000007740 vapor deposition Methods 0.000 description 2
- 240000005636 Dryobalanops aromatica Species 0.000 description 1
- 239000004593 Epoxy Substances 0.000 description 1
- 229910005543 GaSe Inorganic materials 0.000 description 1
- 239000011149 active material Substances 0.000 description 1
- 239000002318 adhesion promoter Substances 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000001680 brushing effect Effects 0.000 description 1
- BWFPGXWASODCHM-UHFFFAOYSA-N copper monosulfide Chemical class [Cu]=S BWFPGXWASODCHM-UHFFFAOYSA-N 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- ZZEMEJKDTZOXOI-UHFFFAOYSA-N digallium;selenium(2-) Chemical compound [Ga+3].[Ga+3].[Se-2].[Se-2].[Se-2] ZZEMEJKDTZOXOI-UHFFFAOYSA-N 0.000 description 1
- 125000003700 epoxy group Chemical group 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 238000010348 incorporation Methods 0.000 description 1
- 150000002471 indium Chemical class 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 230000000873 masking effect Effects 0.000 description 1
- 238000010297 mechanical methods and process Methods 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 150000003346 selenoethers Chemical class 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 239000004416 thermosoftening plastic Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 229910052720 vanadium Inorganic materials 0.000 description 1
- GPPXJZIENCGNKB-UHFFFAOYSA-N vanadium Chemical compound [V]#[V] GPPXJZIENCGNKB-UHFFFAOYSA-N 0.000 description 1
- 235000012431 wafers Nutrition 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/06—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier
- H01L31/072—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier the potential barriers being only of the PN heterojunction type
- H01L31/0749—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier the potential barriers being only of the PN heterojunction type including a AIBIIICVI compound, e.g. CdS/CulnSe2 [CIS] heterojunction solar cells
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0256—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
- H01L31/0264—Inorganic materials
- H01L31/032—Inorganic materials including, apart from doping materials or other impurities, only compounds not provided for in groups H01L31/0272 - H01L31/0312
- H01L31/0322—Inorganic materials including, apart from doping materials or other impurities, only compounds not provided for in groups H01L31/0272 - H01L31/0312 comprising only AIBIIICVI chalcopyrite compounds, e.g. Cu In Se2, Cu Ga Se2, Cu In Ga Se2
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0352—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions
- H01L31/035272—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions characterised by at least one potential jump barrier or surface barrier
- H01L31/035281—Shape of the body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/541—CuInSe2 material PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Definitions
- Spherical or grain-shaped semiconductor component for use in solar cells and method of manufacture; Method for producing a solar cell with a semiconductor component and a solar cell
- the invention relates to a spherical or granular semiconductor component for use in solar cells and a method for producing this semiconductor component.
- the invention further relates to a solar cell with integrated spherical or conformal semiconductor components and a method for producing this solar cell.
- the invention further relates to a photovoltaic module with at least one solar cell with integrated semiconductor components.
- solar radiation energy is converted into electrical energy by using the photovoltaic effect.
- Solar cells used for this purpose are mainly made from planar wafers in which a conventional p / n transition is realized.
- the application of semiconductor material in spherical or granular form has proven to be expedient for producing a p / n junction and further functional layers, since this has various advantages.
- BESTATIGUNGSKOPIE For example, for the manufacture of electronic devices, it has long been known to introduce electronically active material as particles into a layer in order to increase the activity of the material. This is described, for example, in US Pat. No. 3,736,476.
- a core and a layer surrounding the core are formed in such a way that a p / n transition results.
- Several of the particles produced in this way are introduced into an insulating carrier layer such that they protrude from the surface on both sides of the layer and can be contacted by further layers.
- German Offenlegungsschrift DE 100 52 914 AI describes a semiconductor device which is formed from a layer structure which consists of an electrically conductive carrier layer, an insulating layer, semiconductor particles and an electrically conductive cover layer, the semiconductor particles being introduced into the insulating layer and they both touch the underlying carrier layer and the top layer above.
- the semiconductor particles can consist, for example, of silicon or I-III-VI semiconductor particles which are coated with II-VI compounds.
- I-III-VI compound semiconductors such as copper indium diselenide, copper indium sulfide, copper indium gallium sulfide and copper indium gallium diesel selenide is represented, for example, by US Pat. Nos. 4,335,266 (Mickelsen et al) and 4,581,108 (Kapur), in which this semiconductor type and
- I-III-VI compound semiconductors are also referred to below as chalcopyrites or CIS or CIGS semiconductors. It is also known to form independent spherical semiconductor components which represent complete semiconductors including the required electrodes. For example, it is from the European
- Patent application EP 0 940 860 AI known to form a spherical core by masking, etching steps and the application of different material layers to form a spherical semiconductor component.
- Semiconductor components of this type can be used as solar cells if the p / n junction is selected such that it can convert incident light into energy. If the p / n junction is designed so that it can convert an applied voltage into light, the semiconductor component can be used as a light-emitting element.
- the elements Due to the diverse intended areas of application of such semiconductor components, the elements must represent completely independent components with electrode connections, which can be installed in other applications. This requires a high level of complexity of the semiconductor components and the required manufacturing processes. Due to the small dimensions of the spherical shapes used of a few millimeters, the manufacture of the spherical components with all
- the object of the invention is to provide a semiconductor device with high activity, which is flexible
- Another object of the invention is to provide an efficient method for producing a semiconductor component for use in solar cells.
- Another object of the invention is to provide a method for introducing a semiconductor component into a solar cell.
- the object is achieved by a spherical or conformal semiconductor component for use in a solar cell.
- the method for producing such a semiconductor component is by applying a conductive back-contact layer to a spherical or conformal substrate core, applying a first precursor layer made of copper or copper gallium, applying a second precursor layer made of indium and reacting the precursor layers with sulfur and / or selenium marked to an I-III-VI compound semiconductor.
- the precursor layers are reacted in the presence of selenium and / or sulfur and are referred to as selenization or sulfurization.
- selenization or sulfurization can be carried out in various ways with parameters that are matched to the respective process.
- parameters include temperature, time, atmosphere and pressure.
- the selenization or sulfurization can take place, for example, in steam, melts or salt melts of the respective reaction element or salt melts with admixtures of sulfur and / or selenium.
- Elements of sulfur and selenium can be used both simultaneously and in succession for the reaction.
- the reaction takes place in hydrogen compounds of selenium or sulfur.
- the substrate core to be coated consists of glass, in particular of soda-lime glass, since this represents a good source of sodium for the layer structure.
- the main component of the conductive back contact layer is preferably molybdenum.
- the back contact layer contains up to 20% by weight gallium to improve the adhesion.
- the individual layers can each be applied by PVD processes such as sputtering or vapor deposition or CVD processes.
- the precursor layers can be alloyed at temperatures of typically> 220 ° C. before being converted into an I-III-VI compound semiconductor. After the precursor layer system has been converted into an I-III-VI compound semiconductor, further processing steps or coatings can be carried out.
- This includes, for example, treatment with a KCN solution (for example 10% KCN solution in an alkaline 0.5% KOH solution) to remove disruptive surface layers such as copper-sulfur compounds.
- a KCN solution for example 10% KCN solution in an alkaline 0.5% KOH solution
- a buffer layer, a high-resistance and a low-resistance ZnO layer can also be deposited.
- the spherical or granular semiconductor component according to the invention for use in solar cells thus has a spherical or conformal substrate core which is coated at least with a back contact layer and an I-III-VI compound semiconductor.
- the substrate core is preferably made of glass, metal or ceramic and the diameter of the substrate core is of the order of magnitude
- the I-III-VI compound semiconductor layer consists, for example, of copper indium diselenide, copper indium sulfide,
- Copper indium gallium sulfide or copper indium gallium diselenide is on the order of 1-
- Spherical or granular semiconductor components produced using the described method steps represent elements for further use in the production of solar cells.
- the advantages of such semiconductor components for use in solar cells lies in the fact that an I-III-VI compound semiconductor can be produced which is suitable for incorporation into different solar cells. Among other things, this includes different dimensions of solar cells.
- Flat solar cells with I-III-VI compound semiconductors are conventionally produced in reactors which, in order to adhere to certain parameters, have to be adapted precisely to the size of the desired solar cells. Large-area solar cell structures therefore also require correspondingly large reactors, in which large total masses have to be heated and cooled again, for example when they are converted under the influence of heat. This leads to a high energy requirement.
- the production of spherical or conformal semiconductor components for later processing in solar cells requires far less energy, since comparatively small volumes have to be implemented in the corresponding reactors.
- Another advantage is the higher flexibility in the production. For example, with conventional
- Thin-film modules are therefore limited by the equipment used to manufacture the semiconductor layer.
- an existing reactor can be supplemented by additional ones by the necessary amount of
- the required thickness of the deposited layers is less. This makes it possible, for example, to use a back contact layer made of molybdenum-gallium layer without the resistance of the layer becoming too high, as is the case with flat structures.
- semiconductor components are further processed in a solar cell.
- the method provides for the introduction of spherical semiconductor components into an insulating carrier layer, the semiconductor components protruding from the surface of the carrier layer on at least one side of the carrier layer, and the spherical or conformal semiconductor components each consisting of a substrate core which has at least one conductive back contact layer and an I-III-VI compound semiconductor layer is coated. Parts of the semiconductor components are removed on one side of the carrier layer, so that a surface of the back contact layer of several components is preferably exposed. A back contact layer can then be applied to this side of the carrier layer, which is in contact with the free back contact surfaces of the semiconductor components. A front contact layer is applied to the other side of the carrier layer. In addition to the Additional functional layers can be deposited on the front contact layer and the back contact layer.
- the semiconductor components are applied to the carrier layer by scattering, dusting and / or printing and then pressed into the carrier layer so that they are embedded to a certain degree in the carrier layer.
- the carrier layer is a thermoplastic film that is placed on a soft substrate, the semiconductor components can be pressed, for example, so deeply into the layer that they penetrate into the soft substrate and thus protrude on both sides of the carrier layer.
- the carrier layer can also be designed as a matrix with cutouts into which the semiconductor components are introduced and, if appropriate, fastened. This can be done for example by a heating and / or pressing process.
- a part of the carrier layer can also be removed.
- the removal can take place, for example, by grinding, polishing, etching, thermal energy input or photolithographic processes, while the back contact layer and the front contact layer can each be deposited by PVD or CVD processes. If, for example, conductive polymers are used as the back contact or front contact layer, methods such as brushing or
- the solar cell according to the invention with integrated spherical or conformal semiconductor components thus has an insulating carrier layer into which the semiconductor components are introduced, the semiconductor components at least on one side of the
- the layer Protrude from the layer. It also has a front contact layer on one side and a back contact layer on the other side. On the side of the back contact layer, several semiconductor components have a surface that is free from I-III-VI compound semiconductors and thus the back contact layer of the
- the carrier layer consists of an insulating material such as a polymer.
- the spherical semiconductor components were preferably produced by the method according to the invention, and the front contact layer consists, for example, of a TCO (Transparent Conductive Oxide).
- the back contact layer consists of a conductive material such as a metal, a TCO or a polymer with conductive particles.
- the solar cell can have further functional layers.
- a solar cell with integrated semiconductor components is produced, which has various advantages, in particular compared to planar semiconductor structures.
- the main advantage in addition to the simplified manufacture lies in the curved surfaces of the semiconductor components, onto which incident light is independent of the direction of incidence can hit. This means that diffuse light can also be better used to generate electricity.
- FIG. 1 shows a particularly preferred exemplary embodiment of a layer structure for producing a spherical semiconductor component in FIG. (A) and a semiconductor component produced using the method according to the invention in FIG. and
- FIG. 1 shows a particularly preferred exemplary embodiment of a layer structure 10 for producing a spherical or conformal semiconductor component 11 in FIG. (A).
- the layer structure 10 is also as
- Precursor layer structure for later conversion to an I-III-VI compound semiconductor In the first step of the method according to the invention for producing a spherical semiconductor component 11, a spherical substrate core 20 is coated with a back contact 30.
- the spherical substrate is preferably made of glass, but it can also be other materials such as metals or ceramics. For example, when using glass Lime-soda glass can be used, which is a good source of sodium for later layer build-up. Other glass compositions can also be used.
- the substrate is essentially spherical, but the shape can also differ from the pure spherical shape. Depending on the manufacturing process, the resulting spheres can also be described as granular. Hollow bodies made of the materials mentioned can also be used.
- the diameter of the balls is of the order of 0.05-1 mm, a diameter of approximately 0.2 mm preferably being selected.
- the back contact 30 is applied to the spherical substrate in such a way that the entire surface of the sphere is coated.
- the material for the back contact is preferably molybdenum, but other suitable conductive materials such as tungsten or vanadium can also be used.
- the substrate core 20 can be coated by PVD methods such as sputtering or vapor deposition. CVD methods can also be used, it being possible to determine that sputtering a large number of small substrate balls is a very time-consuming process, which is less suitable than other methods in terms of the possible throughput.
- the thickness of the back contact layer is of the order of 0.1-l ⁇ m.
- a gallium layer can be applied to the molybdenum layer.
- the gallium is introduced into the molybdenum layer to increase the adhesion.
- This can include a gallium content of up to 20% by weight.
- gallium-molybdenum layer has proven to be advantageous for the production of the semiconductor components according to the invention, since thinner layers can be realized than with flat semiconductors, the increased resistance of which does not entail any serious disadvantages.
- an I-III-VI compound semiconductor is selected as the semiconductor compound.
- semiconductors also known as chalcopyrites, include, for example, copper indium diselenide, copper indium sulfide,
- precursor layers made of copper, gallium and / or indium are first applied, which are converted into the desired semiconductor in a subsequent selenization or sulfurization process.
- the precursor layers can be applied using the same methods as the back contact, so that here too PVD methods such as sputtering and evaporation or CVD methods are used
- the spherical substrate is coated with copper as the first precursor layer 40.
- a thin copper In order to improve the adhesion between this first layer and the back contact, a thin copper
- Gallium layer can be applied as an adhesion promoter.
- a second precursor layer 50 in the form of indium is deposited on the copper layer.
- An alternating application of Cu / In layer packs (eg Cu / In / Cu / In) is also possible.
- the CU / In layers are then sulfurized to CuInS with sulfur and a so-called CIS layer is formed.
- the CIS layer 60 resulting from the precursors and the sulfurization process is shown on the semiconductor component 11 in the illustration (b).
- the precursor layer system made of copper and indium can optionally be alloyed before the sulfurization at an elevated temperature of typically T> 220 °, which is advantageous for the adhesion and subsequent reaction with selenium and / or sulfur. However, this step is not mandatory.
- the layer thicknesses of the Cu and In layers are determined by the desired layer thickness of the CIS semiconductor.
- the layer thickness of the CIS layer 60 is preferably of the order of magnitude of 1-3 ⁇ m. It has proven to be expedient for this that the atomic ratio Cu / In is of the order of 1-2. Atomic ratios of copper to indium between 1.2-1.8 are particularly preferred.
- a copper or a copper-gallium layer is applied to the back contact layer 30 as the first precursor layer 40.
- This first precursor layer is in turn followed by a second precursor 50 in the form of an indium layer, the two layers then being selected to CuIn / GaSe 2 and forming a CIGS layer.
- the copper indium / gallium layer system can also optionally be alloyed at an elevated temperature of typically T> 220 °.
- the layer thicknesses are also dependent on the desired Cu / (In + Ga) atomic ratio after the selenization. It has proven expedient that this ratio is ⁇ 1.
- the layer thickness of the CIGS layer after the selenization is preferably in the order of magnitude of 1-3 ⁇ m. It has been found that the copper content of the finished CIGS layer can be set lower than the stoichiometrically necessary level.
- the spheres coated with the precursors can be converted by selenization with selenium and / or sulfurization with sulfur. Different methods can be used.
- the balls are vacuum or under atmospheric pressure with a vapor of the respective
- Elementes (Se and / or S) implemented. This implementation takes place with certain parameters such as temperature, time, process duration, pressure and partial pressure. The reaction can also take place in a melt of the elements. Another possibility for implementation is the molten salt, which contains S and / or Se.
- the spheres are converted into hydrogen compounds of sulfur and / or selenium. This can take place, for example, under atmospheric pressure or at a pressure below atmospheric pressure. Both sulfur and selenium can be used in succession or simultaneously in the reaction.
- the next process step after the spheres have been implemented are disadvantageously acting surface layers away.
- these can be CuS compounds that have arisen during the implementation process.
- One way to remove such layers is to treat them with KCN solution. If sulfurization has been carried out, this treatment step is necessary, whereas after selenization it can be considered optional.
- a buffer layer is deposited on the CIS or CIGS semiconductor in the next step.
- CdS, ZnS, ZnSe, ZnO or CdZnS can be used as layer materials. Other possible materials can be seen in In-Se compounds or In-S compounds.
- These buffer layers can be deposited by coating methods such as CVD, PVD, wet chemical (chemical bath deposition) or other suitable methods. Chemical bath deposition has proven to be particularly advantageous.
- the thickness of the buffer layer is preferably of the order of 10 to 200 nm.
- high-resistance ZnO i-ZnO
- i-ZnO high-resistance ZnO
- Methods such as PVD (reactive or ceramic), CVD or chemical bath deposition can be used to deposit this layer.
- the thickness of the layer is preferably of the order of 10-100 nm.
- a further layer of low-resistance ZnO (ZnO: Al) is deposited in a particularly preferred exemplary embodiment of the invention.
- ZnO low-resistance ZnO
- the same deposition methods can be used here as used for high-resistance ZnO.
- the thickness of this layer (TCO) is of the order of 0.1-2 ⁇ m.
- Spherical semiconductor components produced using the method steps described represent elements for further use in the production of solar cells.
- the semiconductor components according to the invention can be further processed in solar cells in various ways.
- the spherical semiconductor components are embedded in a solar cell, as shown in FIGS. (A) - (d) in FIG. 2.
- the carrier layer preferably consists of a thermoplastic polymer, which can be, for example, a polymer from the group of the polycarbonates or polyester. Prepolymerized resins from the group of epoxies, polyurethanes, polyacrylics and / or polyimides can also be used. Furthermore, a liquid polymer can be used, into which the balls are pressed and which then hardens.
- a thermoplastic polymer which can be, for example, a polymer from the group of the polycarbonates or polyester.
- Prepolymerized resins from the group of epoxies, polyurethanes, polyacrylics and / or polyimides can also be used.
- a liquid polymer can be used, into which the balls are pressed and which then hardens.
- the semiconductor components 11 are preferably introduced into the carrier layer 70 such that they protrude from the surface of the layer on at least one side of the carrier layer.
- the particles can do this, for example
- Scattering, dusting and / or printing are applied and then pressed in.
- the latter can be heated, for example.
- the particles are introduced into a prefabricated matrix of a carrier layer, in which there are recesses into which the particles are inserted. A heating and / or pressing process can be carried out to fasten the bodies to the carrier layer.
- the carrier layer can stick to the
- parts of the semiconductor components are removed on one side of the carrier layer as the next step. Parts of the carrier layer can also be removed. This is shown in Figure (b) of Fig. 2 by an arrow.
- the carrier layer 70 is preferably removed up to a layer thickness in which parts of the introduced bodies are also removed. In the exemplary embodiment shown, removal occurs except for the back contact layer 30 of the dotted line
- Semiconductor component 11 If the semiconductor components have been introduced into the carrier layer such that they protrude on both sides of the layer, it is also possible to process the semiconductor components on one side without additional removal of the carrier layer, so that the
- semiconductor components either protrude further from the carrier layer or close off with it.
- the removal of the semiconductor body or the carrier layer can also take place at other times which are before the application of a later back contact 80 on this side.
- the semiconductor components and / or the carrier layer can be removed by mechanical methods such as grinding or
- Polishing, etching, thermal energy input for example by laser or radiation or photolithographic processes.
- Back contact layer 80 applied to the side with the removed semiconductor components.
- substances from various polymer classes can be used as the conductive material for this back contact.
- Epoxy resins, polyurethanes and / or polyimides which are provided with suitable conductive particles such as carbon, indium, nickel, molybdenum, iron, nickel chromium, silver, aluminum and / or corresponding alloys or oxides are particularly suitable.
- Another possibility is represented by intrinsic conductive polymers. These include, for example, polymers from the PANis group. Materials such as TCOs or suitable metals can also be used.
- the back contact can be applied to TCOs and metals with PVD or CVD processes.
- a conductive front contact layer 90 is applied to the side of the carrier layer, on which no semiconductor components have been removed. This can also be done using methods such as PVD or CVD. For example, various TCOs (Transparent Conductive Oxides) can be used as the conductive material of the front contact. Additional functional layers can be deposited before or after the deposition of a front and a rear contact. The choice of the additional functional layers depends in particular on the semiconductor components used. Functional layers such as
- Buffer layers that have already been deposited on the semiconductor bodies may no longer have to be deposited in order to produce the solar cell with integrated semiconductor components.
- a solar cell has been created from which a photovoltaic module can be produced.
- One or more of the solar cells can, for example, be connected in series and combined to form a module from which the generated electricity is tapped.
- First precursor layer 50 Second precursor layer 60 I-III-VI compound semiconductor, CIS or CIGS layer
Abstract
Description
Claims
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
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EP04765485A EP1671336A2 (de) | 2003-10-02 | 2004-09-22 | Kugel- oder kornf rmiges halbleiterbauelement zur verwendung in solarzellen und verfahren zur herstellung; verfahren zur herstellung einer solarzelle mit halbleiterbauelement und solarzelle |
US10/574,633 US20070089782A1 (en) | 2003-10-02 | 2004-09-22 | Spherical or grain-shaped semiconductor element for use in solar cells and method for producing the same; method for producing a solar cell comprising said semiconductor element and solar cell |
KR1020067006281A KR101168260B1 (ko) | 2003-10-02 | 2004-09-22 | 태양 전지용 구형상 또는 입상의 반도체 소자 및 그 제조방법, 상기 반도체 소자를 포함하는 태양 전지를 제조하는방법 및 태양 전지 |
CA2540723A CA2540723C (en) | 2003-10-02 | 2004-09-22 | Spherical or grain-shaped semiconductor element for use in solar cells and method for producing the same; method for producing a solar cell comprising said semiconductor element and solar cell |
JP2006530005A JP2007507867A (ja) | 2003-10-02 | 2004-09-22 | 太陽電池に利用される球状、又は、粒状の半導体素子、その生産方法、その半導体素子を含む太陽電池の生産方法、及び、太陽電池 |
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EP03022301A EP1521308A1 (de) | 2003-10-02 | 2003-10-02 | Kugel- oder kornförmiges Halbleiterbauelement zur Verwendung in Solarzellen und Verfahren zur Herstellung; Verfahren zur Herstellung einer Solarzelle mit Halbleiterbauelement und Solarzelle |
EP03022301.0 | 2003-10-02 |
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WO2005034149A2 true WO2005034149A2 (de) | 2005-04-14 |
WO2005034149A3 WO2005034149A3 (de) | 2005-05-26 |
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PCT/EP2004/010615 WO2005034149A2 (de) | 2003-10-02 | 2004-09-22 | Kugel- oder kornförmiges halbleiterbauelement zur verwendung in solarzellen und verfahren zur herstellung; verfahren zur herstellung einer solarzelle mit halbleiterbauelement und solarzelle |
Country Status (7)
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US (1) | US20070089782A1 (de) |
EP (3) | EP1521308A1 (de) |
JP (2) | JP2007507867A (de) |
KR (2) | KR20120034826A (de) |
CN (1) | CN100517764C (de) |
CA (1) | CA2540723C (de) |
WO (1) | WO2005034149A2 (de) |
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US7535019B1 (en) | 2003-02-18 | 2009-05-19 | Nanosolar, Inc. | Optoelectronic fiber |
JP2011216923A (ja) * | 2003-10-02 | 2011-10-27 | Scheuten Glasgroep | 太陽電池に利用される球状、又は、粒状の半導体素子、その生産方法、その半導体素子を含む太陽電池の生産方法、及び、太陽電池 |
US7196262B2 (en) | 2005-06-20 | 2007-03-27 | Solyndra, Inc. | Bifacial elongated solar cell devices |
US8344238B2 (en) | 2005-07-19 | 2013-01-01 | Solyndra Llc | Self-cleaning protective coatings for use with photovoltaic cells |
US7394016B2 (en) | 2005-10-11 | 2008-07-01 | Solyndra, Inc. | Bifacial elongated solar cell devices with internal reflectors |
US8067688B2 (en) | 2006-01-09 | 2011-11-29 | Solyndra Llc | Interconnects for solar cell devices |
US7259322B2 (en) | 2006-01-09 | 2007-08-21 | Solyndra, Inc. | Interconnects for solar cell devices |
US8742252B2 (en) | 2006-03-18 | 2014-06-03 | Solyndra, Llc | Elongated photovoltaic cells in casings with a filling layer |
US7879685B2 (en) | 2006-08-04 | 2011-02-01 | Solyndra, Inc. | System and method for creating electric isolation between layers comprising solar cells |
US8183458B2 (en) | 2007-03-13 | 2012-05-22 | Solyndra Llc | Photovoltaic apparatus having a filler layer and method for making the same |
US8674213B2 (en) | 2007-03-13 | 2014-03-18 | Solyndra, Llc | Photovoltaic apparatus having a filler layer and method for making the same |
DE102008030652A1 (de) | 2008-06-27 | 2009-12-31 | Dracowo Forschungs- Und Entwicklungs Gmbh | Stoffe und Verfahren zur Herstellung Photovoltaik aktiver Fassadenelemente |
DE102008049374A1 (de) | 2008-09-27 | 2010-04-01 | JODLAUK, Jörg | Halbleiterfaserstrukturen als Energieerzeuger |
RU2491681C1 (ru) * | 2012-03-11 | 2013-08-27 | Государственное Научное Учреждение "Институт Физики Имени Б.И. Степанова Национальной Академии Наук Беларуси" | Фотоэлемент |
Also Published As
Publication number | Publication date |
---|---|
CA2540723A1 (en) | 2005-04-14 |
KR101168260B1 (ko) | 2012-07-30 |
KR20060115994A (ko) | 2006-11-13 |
CN100517764C (zh) | 2009-07-22 |
WO2005034149A3 (de) | 2005-05-26 |
US20070089782A1 (en) | 2007-04-26 |
CN1860617A (zh) | 2006-11-08 |
EP1521308A1 (de) | 2005-04-06 |
JP2011216923A (ja) | 2011-10-27 |
JP2007507867A (ja) | 2007-03-29 |
EP2341550A1 (de) | 2011-07-06 |
CA2540723C (en) | 2014-08-05 |
KR20120034826A (ko) | 2012-04-12 |
EP1671336A2 (de) | 2006-06-21 |
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