WO2004038362A3 - Method and device for the polarimetric analysis of the three-dimensional infrared scattering from an object using a parabolic mirror assembly - Google Patents

Method and device for the polarimetric analysis of the three-dimensional infrared scattering from an object using a parabolic mirror assembly Download PDF

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Publication number
WO2004038362A3
WO2004038362A3 PCT/FR2003/050100 FR0350100W WO2004038362A3 WO 2004038362 A3 WO2004038362 A3 WO 2004038362A3 FR 0350100 W FR0350100 W FR 0350100W WO 2004038362 A3 WO2004038362 A3 WO 2004038362A3
Authority
WO
WIPO (PCT)
Prior art keywords
radiation
angle
scattering
scattered
dimensional infrared
Prior art date
Application number
PCT/FR2003/050100
Other languages
French (fr)
Other versions
WO2004038362A2 (en
Inventor
Stephane Mainguy
Thomas Lanternier
Original Assignee
Commissariat Energie Atomique
Stephane Mainguy
Thomas Lanternier
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat Energie Atomique, Stephane Mainguy, Thomas Lanternier filed Critical Commissariat Energie Atomique
Publication of WO2004038362A2 publication Critical patent/WO2004038362A2/en
Publication of WO2004038362A3 publication Critical patent/WO2004038362A3/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties

Abstract

The invention relates to a method and a device for the polarimetric analysis of the three-dimensional infrared scattering from an object using a parabolic mirror assembly. The object (2) is illuminated by incident infrared radiation (32) by means of the mirror (30) using a determined angle of incidence. The mirror reflects the radiation towards the object as well as the radiation (36) scattered by said object. The inventive method consists in measuring the radiation scattered along a determined scattering angle and varying the scattering angle and, optionally, the angle of incidence. According to the invention, the incident radiation and scattered radiation are polarised and, in order to analyse the three-dimensional infrared scattering from the object, the polarisations are also varied. The scattered radiation is measured according to the values of the incident radiation polarisation, the scattered radiation polarisation, the scattering angle and, optionally, the angle of incidence, and the measurements are processed in order to obtain the desired properties of the object. The invention is particularly suitable for characterising materials.
PCT/FR2003/050100 2002-10-23 2003-10-21 Method and device for the polarimetric analysis of the three-dimensional infrared scattering from an object using a parabolic mirror assembly WO2004038362A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR02/13224 2002-10-23
FR0213224A FR2846417B1 (en) 2002-10-23 2002-10-23 METHOD AND APPARATUS FOR POLARIMETRIC ANALYSIS OF THREE-DIMENSIONAL INFRARED DIFFUSION OF AN OBJECT USING A PARABOLIC MIRROR MOUNT

Publications (2)

Publication Number Publication Date
WO2004038362A2 WO2004038362A2 (en) 2004-05-06
WO2004038362A3 true WO2004038362A3 (en) 2004-06-17

Family

ID=32088199

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/FR2003/050100 WO2004038362A2 (en) 2002-10-23 2003-10-21 Method and device for the polarimetric analysis of the three-dimensional infrared scattering from an object using a parabolic mirror assembly

Country Status (2)

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FR (1) FR2846417B1 (en)
WO (1) WO2004038362A2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104266968B (en) * 2014-09-05 2017-07-11 中国地质大学（武汉） High accuracy polarization two is to reflection automatic measuring instrument
CN112924480B (en) * 2021-01-27 2023-04-07 中国科学院上海高等研究院 Measuring device for synchronous radiation X-ray and asynchronous infrared light combined use

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5426506A (en) * 1993-03-22 1995-06-20 The University Of Chicago Optical method and apparatus for detection of surface and near-subsurface defects in dense ceramics
US6433877B2 (en) * 1998-04-03 2002-08-13 Advantest Corporation Surface inspection using the ratio of intensities of s- and p-polarized light components of a laser beam reflected a rough surface

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5426506A (en) * 1993-03-22 1995-06-20 The University Of Chicago Optical method and apparatus for detection of surface and near-subsurface defects in dense ceramics
US6433877B2 (en) * 1998-04-03 2002-08-13 Advantest Corporation Surface inspection using the ratio of intensities of s- and p-polarized light components of a laser beam reflected a rough surface

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
BJUGGREN M, ET AL: "QUALITY ASSESSMENT OF ENGINEERING SURFACES BY INFRARED SCATTERING", SPIE CONFERENCE ON OPTICAL MANUFACTURING AND TESTING, vol. 2536, 1995, San Diego, pages 327 - 336, XP009007623 *
MAINGUY S ET AL: "DESCRIPTION AND CALIBRATION OF A FULLY AUTOMATED INFRARED SCATTEROMETER", SPIE CONFERENCE ON OPTICAL SCATTER: APPLICATIONS, MEASUREMENT AND THEORY, vol. 1530, 1991, pages 269 - 282, XP009007577 *
MAINGUY S ET POULIGNY B: "COHERENT AND INCOHERENT SCATTERING FROM ROUGH SURFACES: INFLUENCE OF THE ANGLE OF INCIDENCE", SPIE CONFERENCE ON SCATTERING AND SURFACE ROUGHNESS, vol. 3784, 1999, pages 249 - 260, XP009007175 *
PERSSON U: "MEASUREMENT OF SURFACE ROUGHNESS USING INFRARED SCATTERING", MEASUREMENT, INSTITUTE OF MEASUREMENT AND CONTROL. LONDON, GB, vol. 18, no. 2, 1 June 1996 (1996-06-01), pages 109 - 116, XP000635666, ISSN: 0263-2241 *

Also Published As

Publication number Publication date
FR2846417B1 (en) 2005-10-21
WO2004038362A2 (en) 2004-05-06
FR2846417A1 (en) 2004-04-30

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