WO2004025698A3 - Circuit and method for accurately applying a voltage to a node of an integrated circuit - Google Patents

Circuit and method for accurately applying a voltage to a node of an integrated circuit Download PDF

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Publication number
WO2004025698A3
WO2004025698A3 PCT/US2003/024699 US0324699W WO2004025698A3 WO 2004025698 A3 WO2004025698 A3 WO 2004025698A3 US 0324699 W US0324699 W US 0324699W WO 2004025698 A3 WO2004025698 A3 WO 2004025698A3
Authority
WO
WIPO (PCT)
Prior art keywords
voltage
circuit
circuit node
periodic signal
node
Prior art date
Application number
PCT/US2003/024699
Other languages
French (fr)
Other versions
WO2004025698A2 (en
Inventor
Stephen K Sunter
Original Assignee
Logicvision Canada Inc
Stephen K Sunter
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Logicvision Canada Inc, Stephen K Sunter filed Critical Logicvision Canada Inc
Priority to AU2003258135A priority Critical patent/AU2003258135A1/en
Publication of WO2004025698A2 publication Critical patent/WO2004025698A2/en
Publication of WO2004025698A3 publication Critical patent/WO2004025698A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • G01R31/2841—Signal generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks

Abstract

A method for accurately delivering a voltage to a circuit node of an integrated circuit having analog buses and transmission gates selectively connecting the circuit node to the buses, comprises sensing the voltage on the circuit node via a first of the buses under control of a first periodic signal; applying a first stimulus voltage to the circuit node via a second bus under control of a second periodic signal; and applying a second stimulus voltage to the circuit node under control of a third periodic signal which is inverted with respect to the second periodic signal so that the circuit node is driven alternately to the first stimulus voltage and to the second stimulus voltage.
PCT/US2003/024699 2002-09-13 2003-08-08 Circuit and method for accurately applying a voltage to a node of an integrated circuit WO2004025698A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AU2003258135A AU2003258135A1 (en) 2002-09-13 2003-08-08 Circuit and method for accurately applying a voltage to a node of an integrated circuit

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US41027002P 2002-09-13 2002-09-13
US60/410,270 2002-09-13

Publications (2)

Publication Number Publication Date
WO2004025698A2 WO2004025698A2 (en) 2004-03-25
WO2004025698A3 true WO2004025698A3 (en) 2004-08-05

Family

ID=31994099

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2003/024699 WO2004025698A2 (en) 2002-09-13 2003-08-08 Circuit and method for accurately applying a voltage to a node of an integrated circuit

Country Status (3)

Country Link
US (1) US6885213B2 (en)
AU (1) AU2003258135A1 (en)
WO (1) WO2004025698A2 (en)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4177759B2 (en) * 2001-07-17 2008-11-05 株式会社アドバンテスト I / O circuit and test equipment
WO2003093848A1 (en) * 2002-05-03 2003-11-13 Mcgill University Method and device for use in dc parametric tests
US6879175B2 (en) * 2003-03-31 2005-04-12 Teradyne, Inc. Hybrid AC/DC-coupled channel for automatic test equipment
DE102004025984A1 (en) * 2004-05-26 2005-12-15 Sms Demag Ag Method and device for assembly and functional testing of rolling fittings in rolling mills or in rolling mills, such as tandem rolling mills
US7403030B2 (en) * 2004-12-17 2008-07-22 Teradyne, Inc. Using parametric measurement units as a source of power for a device under test
US7271610B2 (en) 2004-12-17 2007-09-18 Teradyne, Inc. Using a parametric measurement unit to sense a voltage at a device under test
US7135881B2 (en) * 2004-12-21 2006-11-14 Teradyne, Inc. Method and system for producing signals to test semiconductor devices
US7508228B2 (en) * 2004-12-21 2009-03-24 Teradyne, Inc. Method and system for monitoring test signals for semiconductor devices
US7256600B2 (en) * 2004-12-21 2007-08-14 Teradyne, Inc. Method and system for testing semiconductor devices
US7102375B2 (en) 2004-12-23 2006-09-05 Teradyne, Inc. Pin electronics with high voltage functionality
WO2007007658A1 (en) * 2005-07-07 2007-01-18 Advantest Corporation Testing apparatus
US7616036B1 (en) 2005-09-12 2009-11-10 Virage Logic Corporation Programmable strobe and clock generator
US7519888B2 (en) * 2005-09-12 2009-04-14 Virage Logic Corporation Input-output device testing
US7560947B2 (en) * 2005-09-28 2009-07-14 Teradyne, Inc. Pin electronics driver
US7279922B1 (en) * 2006-06-28 2007-10-09 Sun Microsystems, Inc. Sub-sampling of weakly-driven nodes
US7737715B2 (en) * 2006-07-31 2010-06-15 Marvell Israel (M.I.S.L) Ltd. Compensation for voltage drop in automatic test equipment
TWI310460B (en) * 2006-10-12 2009-06-01 Giga Byte Tech Co Ltd Detection device for chip
JP4711940B2 (en) * 2006-12-08 2011-06-29 株式会社東芝 Semiconductor integrated circuit and method for measuring termination resistance of semiconductor integrated circuit
US7884747B2 (en) * 2009-06-12 2011-02-08 Analog Devices, Inc. Digital to analog converters having circuit architectures to overcome switch losses
TWI468702B (en) * 2011-11-11 2015-01-11 Hon Hai Prec Ind Co Ltd Radiator apparatus
US11049386B2 (en) * 2018-06-14 2021-06-29 Eaton Intelligent Power Limited Switch with current and voltage collection

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4646299A (en) * 1983-08-01 1987-02-24 Fairchild Semiconductor Corporation Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits
US5617035A (en) * 1993-11-01 1997-04-01 Motorola, Inc. Method for testing integrated devices
US5673277A (en) * 1993-09-16 1997-09-30 Quality Semiconductor, Inc. Scan test circuit using fast transmission gate switch
US20010013790A1 (en) * 2000-02-10 2001-08-16 Matsushita Electric Industrial Co., Ltd. Semiconductor device having a connection inspecting circuit for inspecting connections of power source terminals and grounding terminals, and inspection method for the same
USRE37500E1 (en) * 1989-12-19 2002-01-08 North American Philips Corporation System for partitioning and testing submodule circuits of an integrated circuit

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Publication number Priority date Publication date Assignee Title
US5059889A (en) 1990-03-08 1991-10-22 Texas Instruments Incorporated Parametric measurement unit/device power supply for semiconductor test system
GB2278689B (en) 1993-06-02 1997-03-19 Ford Motor Co Method and apparatus for testing integrated circuits
US5428626A (en) 1993-10-18 1995-06-27 Tektronix, Inc. Timing analyzer for embedded testing
US5610530A (en) 1994-10-26 1997-03-11 Texas Instruments Incorporated Analog interconnect testing
DE69630730T2 (en) 1995-05-31 2004-09-30 Texas Instruments Inc., Dallas Analogabtastpfadzelle
US6404220B1 (en) * 1997-11-20 2002-06-11 Advantest Corporation IC testing method and IC testing device using the same
JP3392029B2 (en) * 1997-12-12 2003-03-31 株式会社アドバンテスト IC tester voltage applied current measuring circuit
US6313657B1 (en) * 1998-12-24 2001-11-06 Advantest Corporation IC testing apparatus and testing method using same
US6397361B1 (en) 1999-04-02 2002-05-28 International Business Machines Corporation Reduced-pin integrated circuit I/O test
US6492798B2 (en) 2001-04-27 2002-12-10 Logicvision, Inc. Method and circuit for testing high frequency mixed signal circuits with low frequency signals

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4646299A (en) * 1983-08-01 1987-02-24 Fairchild Semiconductor Corporation Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits
USRE37500E1 (en) * 1989-12-19 2002-01-08 North American Philips Corporation System for partitioning and testing submodule circuits of an integrated circuit
US5673277A (en) * 1993-09-16 1997-09-30 Quality Semiconductor, Inc. Scan test circuit using fast transmission gate switch
US5617035A (en) * 1993-11-01 1997-04-01 Motorola, Inc. Method for testing integrated devices
US20010013790A1 (en) * 2000-02-10 2001-08-16 Matsushita Electric Industrial Co., Ltd. Semiconductor device having a connection inspecting circuit for inspecting connections of power source terminals and grounding terminals, and inspection method for the same

Also Published As

Publication number Publication date
AU2003258135A1 (en) 2004-04-30
AU2003258135A8 (en) 2004-04-30
US6885213B2 (en) 2005-04-26
US20040051551A1 (en) 2004-03-18
WO2004025698A2 (en) 2004-03-25

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