WO2003007354A1

WO2003007354A1 - Double-sided semiconductor structure

Info

Publication number: WO2003007354A1
Application number: PCT/US2002/015105
Authority: WO
Inventors: Paige M. Holm
Original assignee: Motorola, Inc. A Corporation Of The State Of Delaware
Priority date: 2001-07-10
Filing date: 2002-05-14
Publication date: 2003-01-23

Abstract

A semiconductor structure includes a monocrystalline silicon substrate (4102), a buffer or interfacial layer (4104) including an amorphous oxide material overlying the monocrystalline silicon substrate on a first side of the semiconductor structure and a monocrystalline perovskite oxide (4106) material overlying the amorphous oxide material on the first side of the semiconductor structure, and a monocrystalline compound semiconductor material (4108) overlying the monocrystalline perovskite oxide material on the first side of the semiconductor structure. The semiconductor structure further includes compound semiconductor devices (4122) formed in the monocrystalline compound semiconductor material on the first side of the semiconductor structure and silicon devices (4120) formed on a second side of the semiconductor structure.

Description

DOUBLE-SIDED SEMICONDUCTOR STRUCTURE

Field of the Invention

This invention relates generally to semiconductor structures and devices and to a method for their fabrication, and more specifically to semiconductor structures and devices and to the fabrication and use of semiconductor structures, devices, and integrated circuits that include a monocrystalline material layer comprised of semiconductor material, compound semiconductor material, and/or other types of material such as metals and non-metals.

Background of the Invention

Semiconductor devices often include multiple layers of conductive, insulating, and semiconductive layers. Often, the desirable properties of such layers improve with the crystallinity of the layer. For example, the electron mobility and band gap of semiconductive layers improves as the crystallinity of the layer increases. Similarly, the free electron concentration of conductive layers and the electron charge displacement and electron energy recoverability of insulative or dielectric films improves as the crystallinity of these layers increases.

For many years, attempts have been made to grow various monolithic thin films on a foreign substrate such as silicon (Si). To achieve optimal characteristics of the various monolithic layers, however, a monocrystalline film of high crystalline quality is desired. Attempts have been made, for example, to grow various monocrystalline layers on a substrate such as germanium, silicon, and various insulators. These attempts have generally been unsuccessful because lattice mismatches between the host crystal and the grown crystal have caused the resulting layer of monocrystalline material to be of low crystalline quality. If a large area thin film of high quality monocrystalline material was available at low cost, a variety of semiconductor devices could advantageously be fabricated in or using that film at a low cost compared to the cost of fabricating such devices beginning with a bulk wafer of semiconductor material or in an epitaxial film of such material on a bulk wafer of semiconductor material. In addition, if a thin film of high quality monocrystalline material could be realized beginning with a bulk wafer such as a silicon wafer, an integrated device structure could be achieved that took advantage of the best properties of both the silicon and the high quality monocrystalline material.

Further, previous semiconductor manufacturing has made use of only a single side of a semiconductor wafer. Presumably, the value to be obtained from processing the second side of a wafer has been insufficient to justify the added manufacturing cost when the same technology (e.g., silicon complementary metal-oxide-semiconductor or CMOS) is used on both sides of the wafer.

However, this situation would change with a fabrication technology that provides for growth of compound semiconductor materials on non-native silicon substrates and that allows mixed technologies on the same wafer.

Accordingly, a need exists for a semiconductor structure that provides a high quality monocrystalline film or layer over another monocrystalline material and for a process for making such a structure. Further, a need exists for a method for manufacturing and devices and circuits employing double sided mixed-technology semiconductor structures.

Brief Description of the Drawings

The present invention is illustrated by way of example and not limitation in the accompanying figures, in which like references indicate similar elements, and in which:

FIGS. 1, 2, and 3 illustrate schematically, in cross section, device structures in accordance with various embodiments of the invention; FIG. 4 illustrates graphically the relationship between maximum attainable film thickness and lattice mismatch between a host crystal and a grown crystalline overlayer;

FIG. 5 illustrates a high resolution Transmission Electron Micrograph of a structure including a monocrystalline accommodating buffer layer; FIG. 6 illustrates an x-ray diffraction spectrum of a structure including a monocrystalline accommodating buffer layer;

FIG. 7 illustrates a high resolution Transmission Electron Micrograph of a structure including an amorphous oxide layer;

FIG. 8 illustrates an x-ray diffraction spectrum of a structure including an amorphous oxide layer;

FIGS. 9-12 illustrate schematically, in cross-section, the formation of a device structure in accordance with another embodiment of the invention;

FIGS. 13-16 illustrate a probable molecular bonding structure of the device structures illustrated in FIGS. 9-12; FIGS. 17-20 illustrate schematically, in cross-section, the formation of a device structure in accordance with still another embodiment of the invention; and

FIGS. 21-23 illustrate schematically, in cross-section, the formation of yet another embodiment of a device structure in accordance with the invention.

FIGs. 24, 25 illustrate schematically, in cross section, device structures that can be used in accordance with various embodiments of the invention.

FIGs. 26-30 include illustrations of cross-sectional views of a portion of an integrated circuit that includes a compound semiconductor portion, a bipolar portion, and an MOS portion in accordance with what is shown herein.

FIGs. 31-37 include illustrations of cross-sectional views of a portion of another integrated circuit that includes a semiconductor laser and a MOS transistor in accordance with what is shown herein.

FIG. 38 is a cross sectional view of a semiconductor structure.

FIG. 39 is a cross sectional view of a semiconductor structure.

FIG. 40 is a cross sectional view of a semiconductor structure. FIG. 41 is a cross sectional view of a semiconductor structure.

Skilled artisans will appreciate that elements in the figures are illustrated for simplicity and clarity and have not necessarily been drawn to scale. For example, the dimensions of some of the elements in the figures may be exaggerated relative to other elements to help to improve understanding of embodiments of the present invention.

Detailed Description of the Drawings

FIG. 1 illustrates schematically, in cross section, a portion of a semiconductor structure 20 in accordance with an embodiment of the invention. Semiconductor structure 20 includes a monocrystalline substrate 22, accommodating buffer layer 24 comprising a monocrystalline material, and a monocrystalline material layer 26. In this context, the term "monocrystalline" shall have the meaning commonly used within the semiconductor industry. The term shall refer to materials that are a single crystal or that are substantially a single crystal and shall include those materials having a relatively small number of defects such as dislocations and the like as are commonly found in substrates of silicon or germanium or mixtures of silicon and germanium and epitaxial layers of such materials commonly found in the semiconductor industry. In accordance with one embodiment of the invention, structure 20 also includes an amorphous intermediate layer 28 positioned between substrate 22 and accommodating buffer layer 24. Structure 20 may also include a template layer 30 between the accommodating buffer layer and monocrystalline material layer 26. As will be explained more fully below, the template layer helps to initiate the growth of the monocrystalline material layer on the accommodating buffer layer. The amorphous intermediate layer helps to relieve the strain in the accommodating buffer layer and by doing so, aids in the growth of a high crystalline quality accommodating buffer layer.

Substrate 22, in accordance with an embodiment of the invention, is a monocrystalline semiconductor or compound semiconductor wafer, preferably of large diameter. The wafer can be of, for example, a material from Group IV of the periodic table. Examples of Group IV semiconductor materials include silicon, germanium, mixed silicon and germanium, mixed silicon and carbon, mixed silicon, germanium and carbon, and the like. Preferably substrate 22 is a wafer containing silicon or germanium, and most preferably is a high quality monocrystalline silicon wafer as used in the semiconductor industry. Accommodating buffer layer 24 is preferably a monocrystalline oxide or nitride material epitaxially grown on the underlying substrate. In accordance with one embodiment of the invention, amorphous intermediate layer 28 is grown on substrate 22 at the interface between substrate 22 and the growing accommodating buffer layer by the oxidation of substrate 22 during the growth of layer 24. The amorphous intermediate layer serves to relieve strain that might otherwise occur in the monocrystalline accommodating buffer layer as a result of differences in the lattice constants of the substrate and the buffer layer. As used herein, lattice constant refers to the distance between atoms of a cell measured in the plane of the surface. If such strain is not relieved by the amorphous intermediate layer, the strain may cause defects in the crystalline structure of the accommodating buffer layer. Defects in the crystalline structure of the accommodating buffer layer, in turn, would make it difficult to achieve a high quality crystalline structure in monocrystalline material layer 26 which may comprise a semiconductor material, a compound semiconductor material, or another type of material such as a metal or a non-metal.

Accommodating buffer layer 24 is preferably a monocrystalline oxide or nitride material selected for its crystalline compatibility with the underlying substrate and with the overlying material layer. For example, the material could be an oxide or nitride having a lattice structure closely matched to the substrate and to the subsequently applied monocrystalline material layer. Materials that are suitable for the accommodating buffer layer include metal oxides such as the alkaline earth metal titanates, alkaline earth metal zirconates, alkaline earth metal hafnates, alkaline earth metal tantalates, alkaline earth metal ruthenates, alkaline earth metal niobates, alkaline earth metal vanadates, alkaline earth metal tin-based perovskites, lanthanum aluminate, lanthanum scandium oxide, and gadolinium oxide. Additionally, various nitrides such as gallium nitride, aluminum nitride, and boron nitride may also be used for the accommodating buffer layer. Most of these materials are insulators, although strontium ruthenate, for example, is a conductor. Generally, these materials are metal oxides or metal nitrides, and more particularly, these metal oxide or nitrides typically include at least two different metallic elements. In some specific applications, the metal oxides or nitrides may include three or more different metallic elements.

Amorphous interface layer 28 is preferably an oxide formed by the oxidation of the surface of substrate 22, and more preferably is composed of a silicon oxide. The thickness of layer 28 is sufficient to relieve strain attributed to mismatches between the lattice constants of substrate 22 and accommodating buffer layer 24. Typically, layer 28 has a thickness in the range of approximately 0.5-5 nm.

The material for monocrystalline material layer 26 can be selected, as desired, for a particular structure or application. For example, the monocrystalline material of layer 26 may comprise a compound semiconductor which can be selected, as needed for a particular semiconductor structure, from any of the Group HIA and VA elements (III- V semiconductor compounds), mixed IQ-V compounds, Group II(A or B) and VIA elements (II- VI semiconductor compounds), and mixed II- VI compounds. Examples include gallium arsenide (GaAs), gallium indium arsenide (GalnAs), gallium aluminum arsenide (GaAlAs), indium phosphide (InP), cadmium sulfide (CdS), cadmium mercury telluride (CdHgTe), zinc selenide (ZnSe), zinc sulfur selenide (ZnSSe), and the like. However, monocrystalline material layer 26 may also comprise other semiconductor materials, metals, or non-metal materials which are used in the formation of semiconductor structures, devices and/or integrated circuits. Appropriate materials for template 30 are discussed below. Suitable template materials chemically bond to the surface of the accommodating buffer layer 24 at selected sites and provide sites for the nucleation of the epitaxial growth of monocrystalline material layer 26. When used, template layer 30 has a thickness ranging from about 1 to about 10 monolayers. FIG. 2 illustrates, in cross section, a portion of a semiconductor structure 40 in accordance with a further embodiment of the invention. Structure 40 is similar to the previously described semiconductor structure 20, except that an additional buffer layer 32 is positioned between accommodating buffer layer 24 and monocrystalline material layer 26. Specifically, the additional buffer layer is positioned between template layer 30 and the overlying layer of monocrystalline material. The additional buffer layer, formed of a semiconductor or compound semiconductor material when the monocrystalline material layer 26 comprises a semiconductor or compound semiconductor material, serves to provide a lattice compensation when the lattice constant of the accommodating buffer layer cannot be adequately matched to the overlying monocrystalline semiconductor or compound semiconductor material layer. FIG. 3 schematically illustrates, in cross section, a portion of a semiconductor structure 34 in accordance with another exemplary embodiment of the invention. Structure 34 is similar to structure 20, except that structure 34 includes an amorphous layer 36, rather than accommodating buffer layer 24 and amorphous interface layer 28, and an additional monocrystalline layer 38.

As explained in greater detail below, amorphous layer 36 may be formed by first forming an accommodating buffer layer and an amorphous interface layer in a similar manner to that described above. Monocrystalline layer 38 is then formed (by epitaxial growth) overlying the monocrystalline accommodating buffer layer. The accommodating buffer layer is then exposed to an anneal process to convert the monocrystalline accommodating buffer layer to an amorphous layer. Amorphous layer 36 formed in this manner comprises materials from both the accommodating buffer and interface layers, which amorphous layers may or may not amalgamate. Thus, layer 36 may comprise one or two amorphous layers. Formation of amorphous layer 36 between substrate 22 and additional monocrystalline layer 26 (subsequent to layer 38 formation) relieves stresses between layers 22 and 38 and provides a true compliant substrate for subsequent processing--e.g., monocrystalline material layer 26 formation. The processes previously described above in connection with FIGS. 1 and 2 are adequate for growing monocrystalline material layers over a monocrystalline substrate. However, the process described in connection with FIG. 3, which includes transforming a monocrystalline accommodating buffer layer to an amorphous oxide layer, may be better for growing monocrystalline material layers because it allows any strain in layer 26 to relax.

Additional monocrystalline layer 38 may include any of the materials described throughout this application in connection with either of monocrystalline material layer 26 or additional buffer layer 32. For example, when monocrystalline material layer 26 comprises a semiconductor or compound semiconductor material, layer 38 may include monocrystalline Group IV or monocrystalline compound semiconductor materials.

In accordance with one embodiment of the present invention, additional monocrystalline layer 38 serves as an anneal cap during layer 36 formation and as a template for subsequent monocrystalline layer 26 formation. Accordingly, layer 38 is preferably thick enough to provide a suitable template for layer 26 growth (at least one monolayer) and thin enough to allow layer 38 to form as a substantially defect free monocrystalline material.

In accordance with another embodiment of the invention, additional monocrystalline layer 38 comprises monocrystalline material (e.g., a material discussed above in connection with monocrystalline layer 26) that is thick enough to form devices within layer 38. In this case, a semiconductor structure in accordance with the present invention does not include monocrystalline material layer 26. In other words, the semiconductor structure in accordance with this embodiment only includes one monocrystalline layer disposed above amorphous oxide layer 36. The following non-limiting, illustrative examples illustrate various combinations of materials useful in structures 20, 40, and 34 in accordance with various alternative embodiments of the invention. These examples are merely illustrative, and it is not intended that the invention be limited to these illustrative examples. Example 1

In accordance with one embodiment of the invention, monocrystalline substrate 22 is a silicon substrate oriented in the (100) direction. The silicon substrate can be, for example, a silicon substrate as is commonly used in making complementary metal oxide semiconductor (CMOS) integrated circuits having a diameter of about 200-300 mm. In accordance with this embodiment of the invention, accommodating buffer layer 24 is a monocrystalline layer of Sr_zBaι_-zTiO₃ where z ranges from 0 to 1 and the amorphous intermediate layer is a layer of silicon oxide (SiO_x) formed at the interface between the silicon substrate and the accommodating buffer layer. The value of z is selected to obtain one or more lattice constants closely matched to corresponding lattice constants of the subsequently formed layer 26. The accommodating buffer layer can have a thickness of about 2 to about 100 nanometers (nm) and preferably has a thickness of about 5 nm. In general, it is desired to have an accommodating buffer layer thick enough to isolate the monocrystalline material layer 26 from the substrate to obtain the desired electrical and optical properties. Layers thicker than 100 nm usually provide little additional benefit while increasing cost unnecessarily; however, thicker layers may be fabricated if needed. The amorphous intermediate layer of silicon oxide can have a thickness of about 0.5-5 nm, and preferably a thickness of about 1 to 2 nm. In accordance with this embodiment of the invention, monocrystalline material layer 26 is a compound semiconductor layer of gallium arsenide (GaAs) or aluminum gallium arsenide (AlGaAs) having a thickness of about 1 nm to about 100 micrometers (μm) and preferably a thickness of about 0.5 μm to 10 μm. The thickness generally depends on the application for which the layer is being prepared. To facilitate the epitaxial growth of the gallium arsenide or aluminum gallium arsenide on the monocrystalline oxide, a template layer is formed by capping the oxide layer. The template layer is preferably 1-10 monolayers of Ti-As, Sr-O-As, Sr-Ga-O, or Sr-Al-O. By way of a preferred example, 1-2 monolayers of Ti-As or Sr-Ga-O have been illustrated to successfully grow GaAs layers. Example 2

In accordance with a further embodiment of the invention, monocrystalline substrate 22 is a silicon substrate as described above. The accommodating buffer layer is a monocrystalline oxide of strontium or barium zirconate or hafnate in a cubic or orthorhombic phase with an amorphous intermediate layer of silicon oxide formed at the interface between the silicon substrate and the accommodating buffer layer. The accommodating buffer layer can have a thickness of about 2-100 nm and preferably has a thickness of at least 5 nm to ensure adequate crystalline and surface quality and is formed of a monocrystalline SrZrO₃, BaZrO₃, SrHfO₃, BaSnO₃ or BaHfO₃. For example, a monocrystalline oxide layer of BaZrO₃ can grow at a temperature of about 700 degrees C. The lattice structure of the resulting crystalline oxide exhibits a 45 degree rotation with respect to the substrate silicon lattice structure. An accommodating buffer layer formed of these zirconate or hafnate materials is suitable for the growth of a monocrystalline material layer which comprises compound semiconductor materials in the indium phosphide (InP) system. In this system, the compound semiconductor material can be, for example, indium phosphide (InP), indium gallium arsenide (InGaAs), aluminum indium arsenide, (AlInAs), or aluminum gallium indium arsenic phosphide (AlGalnAsP), having a thickness of about 1.0 nm to 10 μm. A suitable template for this structure is 1-10 monolayers of zirconium-arsenic (Zr-As), zirconium-phosphorus (Zr-P), hafnium-arsenic (Hf-As), hafnium-phosphorus (Hf-P), strontium-oxygen-arsenic (Sr-O-As), strontium-oxygen-phosphorus (Sr-O-P), barium-oxygen-arsenic (Ba-O-As), indium-strontium-oxygen (In-Sr-O), or barium- oxygen-phosphorus (Ba-O-P), and preferably 1-2 monolayers of one of these materials. By way of an example, for a barium zirconate accommodating buffer layer, the surface is terminated with 1-2 monolayers of zirconium followed by deposition of 1-2 monolayers of arsenic to form a Zr-As template. A monocrystalline layer of the compound semiconductor material from the indium phosphide system is then grown on the template layer. The resulting lattice structure of the compound semiconductor material exhibits a 45 degree rotation with respect to the accommodating buffer layer lattice structure and a lattice mismatch to (100) InP of less than 2.5%, and preferably less than about 1.0%.

Example 3

In accordance with a further embodiment of the invention, a structure is provided that is suitable for the growth of an epitaxial film of a monocrystalline material comprising a II-VI material overlying a silicon substrate. The substrate is preferably a silicon wafer as described above. A suitable accommodating buffer layer material is Sr_xBaι._xTiO , where x ranges from 0 to 1, having a thickness of about 2-100 nm and preferably a thickness of about 5-15 nm. Where the monocrystalline layer comprises a compound semiconductor material, the II-VI compound semiconductor material can be, for example, zinc selenide (ZnSe) or zinc sulfur selenide (ZnSSe). A suitable template for this material system includes 1-10 monolayers of zinc-oxygen (Zn- O) followed by 1-2 monolayers of an excess of zinc followed by the selenidation of zinc on the surface. Alternatively, a template can be, for example, 1-10 monolayers of strontium-sulfur (Sr-S) followed by the ZnSeS.

Example 4

This embodiment of the invention is an example of structure 40 illustrated in FIG. 2. Substrate 22, accommodating buffer layer 24, and monocrystalline material layer 26 can be similar to those described in example 1. In addition, an additional buffer layer 32 serves to alleviate any strains that might result from a mismatch of the crystal lattice of the accommodating buffer layer and the lattice of the monocrystalline material. Buffer layer 32 can be a layer of germanium or a GaAs, an aluminum gallium arsenide (AlGaAs), an indium gallium phosphide (InGaP), an aluminum gallium phosphide (AlGaP), an indium gallium arsenide (InGaAs), an aluminum indium phosphide (AllnP), a gallium arsenide phosphide (GaAsP), or an indium gallium phosphide (InGaP) strain compensated superlattice. In accordance with one aspect of this embodiment, buffer layer 32 includes a GaAs_xPι_-x superlattice, wherein the value of x ranges from 0 to 1. In accordance with another aspect, buffer layer 32 includes an In_yGaι._yP superlattice, wherein the value of y ranges from 0 to 1. By varying the value of x or y, as the case may be, the lattice constant is varied from bottom to top across the superlattice to create a match between lattice constants of the underlying oxide and the overlying monocrystalline material which in this example is a compound semiconductor material. The compositions of other compound semiconductor materials, such as those listed above, may also be similarly varied to manipulate the lattice constant of layer 32 in a like manner. The superlattice can have a thickness of about 50-500 nm and preferably has a thickness of about 100-200 nm. The template for this structure can be the same of that described in example 1. Alternatively, buffer layer 32 can be a layer of monocrystalline germanium having a thickness of 1 -50 nm and preferably having a thickness of about 2-20 nm. In using a germanium buffer layer, a template layer of either germanium-strontium (Ge-Sr) or germanium-titanium (Ge-Ti) having a thickness of about one monolayer can be used as a nucleating site for the subsequent growth of the monocrystalline material layer which in this example is a compound semiconductor material. The formation of the oxide layer is capped with either a monolayer of strontium or a monolayer of titanium to act as a nucleating site for the subsequent deposition of the monocrystalline germanium. The monolayer of strontium or titanium provides a nucleating site to which the first monolayer of germanium can bond.

Example 5

This example also illustrates materials useful in a structure 40 as illustrated in FIG. 2. Substrate material 22, accommodating buffer layer 24, monocrystalline material layer 26 and template layer 30 can be the same as those described above in example 2. In addition, additional buffer layer 32 is inserted between the accommodating buffer layer and the overlying monocrystalline material layer. The buffer layer, a further monocrystalline material which in this instance comprises a semiconductor material, can be, for example, a graded layer of indium gallium arsenide (InGaAs) or indium aluminum arsenide (InAlAs). In accordance with one aspect of this embodiment, additional buffer layer 32 includes InGaAs, in which the indium composition varies from 0 to about 50%. The additional buffer layer 32 preferably has a thickness of about 10-30 nm. Varying the composition of the buffer layer from GaAs to InGaAs serves to provide a lattice match between the underlying monocrystalline oxide material and the overlying layer of monocrystalline material which in this example is a compound semiconductor material. Such a buffer layer is especially advantageous if there is a lattice mismatch between accommodating buffer layer 24 and monocrystalline material layer 26.

Example 6

This example provides exemplary materials useful in structure 34, as illustrated in FIG. 3. Substrate material 22, template layer 30, and monocrystalline material layer 26 may be the same as those described above in connection with example 1. Amorphous layer 36 is an amorphous oxide layer which is suitably formed of a combination of amorphous intermediate layer materials (e.g., layer 28 materials as described above) and accommodating buffer layer materials (e.g., layer 24 materials as described above). For example, amorphous layer 36 may include a combination of SiO_x and Sr_zBaι._z TiO₃ (where z ranges from 0 to l),which combine or mix, at least partially, during an anneal process to form amorphous oxide layer 36.

The thickness of amorphous layer 36 may vary from application to application and may depend on such factors as desired insulating properties of layer 36, type of monocrystalline material comprising layer 26, and the like. In accordance with one exemplary aspect of the present embodiment, layer 36 thickness is about 2 nm to about 100 nm, preferably about 2-10 nm, and more preferably about 5-6 nm.

Layer 38 comprises a monocrystalline material that can be grown epitaxially over a monocrystalline oxide material such as material used to form accommodating buffer layer 24. In accordance with one embodiment of the invention, layer 38 includes the same materials as those comprising layer 26. For example, if layer 26 includes GaAs, layer 38 also includes GaAs. However, in accordance with other embodiments of the present invention, layer 38 may include materials different from those used to form layer 26. In accordance with one exemplary embodiment of the invention, layer 38 is about 1 monolayer to about 100 nm thick.

Referring again to FIGS. 1 - 3, substrate 22 is a monocrystalline substrate such as a monocrystalline silicon or gallium arsenide substrate. The crystalline structure of the monocrystalline substrate is characterized by a lattice constant and by a lattice orientation. In similar manner, accommodating buffer layer 24 is also a monocrystalline material and the lattice of that monocrystalline material is characterized by a lattice constant and a crystal orientation. The lattice constants of the accommodating buffer layer and the monocrystalline substrate must be closely matched or, alternatively, must be such that upon rotation of one crystal orientation with respect to the other crystal orientation, a substantial match in lattice constants is achieved. In this context the terms "substantially equal" and "substantially matched" mean that there is sufficient similarity between the lattice constants to permit the growth of a high quality crystalline layer on the underlying layer. FIG. 4 illustrates graphically the relationship of the achievable thickness of a grown crystal layer of high crystalline quality as a function of the mismatch between the lattice constants of the host crystal and the grown crystal. Curve 42 illustrates the boundary of high crystalline quality material. The area to the right of curve 42 represents layers that have a large number of defects. With no lattice mismatch, it is theoretically possible to grow an infinitely thick, high quality epitaxial layer on the host crystal. As the mismatch in lattice constants increases, the thickness of achievable, high quality crystalline layer decreases rapidly. As a reference point, for example, if the lattice constants between the host crystal and the grown layer are mismatched by more than about 2%, monocrystalline epitaxial layers in excess of about 20 nm cannot be achieved.

In accordance with one embodiment of the invention, substrate 22 is a (100) or (1 1 1) oriented monocrystalline silicon wafer and accommodating buffer layer 24 is a layer of strontium barium titanate. Substantial matching of lattice constants between these two materials is achieved by rotating the crystal orientation of the titanate material by 45° with respect to the crystal orientation of the silicon substrate wafer. The inclusion in the structure of amorphous interface layer 28, a silicon oxide layer in this example, if it is of sufficient thickness, serves to reduce strain in the titanate monocrystalline layer that might result from any mismatch in the lattice constants of the host silicon wafer and the grown titanate layer. As a result, in accordance with an embodiment of the invention, a high quality, thick, monocrystalline titanate layer is achievable.

Still referring to FIGS. 1 - 3, layer 26 is a layer of epitaxially grown monocrystalline material and that crystalline material is also characterized by a crystal lattice constant and a crystal orientation. In accordance with one embodiment of the invention, the lattice constant of layer 26 differs from the lattice constant of substrate 22. To achieve high crystalline quality in this epitaxially grown monocrystalline layer, the accommodating buffer layer must be of high crystalline quality. In addition, in order to achieve high crystalline quality in layer 26, substantial matching between the crystal lattice constant of the host crystal, in this case, the monocrystalline accommodating buffer layer, and the grown crystal is desired. With properly selected materials this substantial matching of lattice constants is achieved as a result of rotation of the crystal orientation of the grown crystal with respect to the orientation of the host crystal. For example, if the grown crystal is gallium arsenide, aluminum gallium arsenide, zinc selenide, or zinc sulfur selenide and the accommodating buffer layer is monocrystalline Sr_xBaι_-xTiO₃, substantial matching of crystal lattice constants of the two materials is achieved, wherein the crystal orientation of the grown layer is rotated by 45° with respect to the orientation of the host monocrystalline oxide. Similarly, if the host material is a strontium or barium zirconate or a strontium or barium hafnate or barium tin oxide and the compound semiconductor layer is indium phosphide or gallium indium arsenide or aluminum indium arsenide, substantial matching of crystal lattice constants can be achieved by rotating the orientation of the grown crystal layer by 45° with respect to the host oxide crystal. In some instances, a crystalline semiconductor buffer layer between the host oxide and the grown monocrystalline material layer can be used to reduce strain in the grown monocrystalline material layer that might result from small differences in lattice constants. Better crystalline quality in the grown monocrystalline material layer can thereby be achieved.

The following example illustrates a process, in accordance with one embodiment of the invention, for fabricating a semiconductor structure such as the structures depicted in FIGS. 1 - 3. The process starts by providing a monocrystalline semiconductor substrate comprising silicon or germanium. In accordance with a preferred embodiment of the invention, the semiconductor substrate is a silicon wafer having a (100) orientation. The substrate is preferably oriented on axis or, at most, about 4° off axis. At least a portion of the semiconductor substrate has a bare surface, although other portions of the substrate, as described below, may encompass other structures. The term "bare" in this context means that the surface in the portion of the substrate has been cleaned to remove any oxides, contaminants, or other foreign material. As is well known, bare silicon is highly reactive and readily forms a native oxide. The term "bare" is intended to encompass such a native oxide. A thin silicon oxide may also be intentionally grown on the semiconductor substrate, although such a grown oxide is not essential to the process in accordance with the invention. In order to epitaxially grow a monocrystalline oxide layer overlying the monocrystalline substrate, the native oxide layer must first be removed to expose the crystalline structure of the underlying substrate. The following process is preferably carried out by molecular beam epitaxy (MBE), although other epitaxial processes may also be used in accordance with the present invention. The native oxide can be removed by first thermally depositing a thin layer of strontium, barium, a combination of strontium and barium, or other alkaline earth metals or combinations of alkaline earth metals in an MBE apparatus. In the case where strontium is used, the substrate is then heated to a temperature of about 850° C to cause the strontium to react with the native silicon oxide layer. The strontium serves to reduce the silicon oxide to leave a silicon oxide-free surface. The resultant surface, which exhibits an ordered 2x 1 structure, includes strontium, oxygen, and silicon. The ordered 2x1 structure forms a template for the ordered growth of an overlying layer of a monocrystalline oxide. The template provides the necessary chemical and physical properties to nucleate the crystalline growth of an overlying layer.

In accordance with an alternate embodiment of the invention, the native silicon oxide can be converted and the substrate surface can be prepared for the growth of a monocrystalline oxide layer by depositing an alkaline earth metal oxide, such as strontium oxide, strontium barium oxide, or barium oxide, onto the substrate surface by MBE at a low temperature and by subsequently heating the structure to a temperature of about 750°C. At this temperature a solid state reaction takes place between the strontium oxide and the native silicon oxide causing the reduction of the native silicon oxide and leaving an ordered 2x1 structure with strontium, oxygen, and silicon remaining on the substrate surface. Again, this forms a template for the subsequent growth of an ordered monocrystalline oxide layer. Following the removal of the silicon oxide from the surface of the substrate, in accordance with one embodiment of the invention, the substrate is cooled to a temperature in the range of about 200-800°C and a layer of strontium titanate is grown on the template layer by molecular beam epitaxy. The MBE process is initiated by opening shutters in the MBE apparatus to expose strontium, titanium and oxygen sources. The ratio of strontium and titanium is approximately 1:1. The partial pressure of oxygen is initially set at a minimum value to grow stoichiometric strontium titanate at a growth rate of about 0.3-0.5 nm per minute. After initiating growth of the strontium titanate, the partial pressure of oxygen is increased above the initial minimum value. The oveφressure of oxygen causes the growth of an amoφhous silicon oxide layer at the interface between the underlying substrate and the growing strontium titanate layer. The growth of the silicon oxide layer results from the diffusion of oxygen through the growing strontium titanate layer to the interface where the oxygen reacts with silicon at the surface of the underlying substrate. The strontium titanate grows as an ordered (100) monocrystal with the (100) crystalline orientation rotated by 45° with respect to the underlying substrate. Strain that otherwise might exist in the strontium titanate layer because of the small mismatch in lattice constant between the silicon substrate and the growing crystal is relieved in the amoφhous silicon oxide intermediate layer. After the strontium titanate layer has been grown to the desired thickness, the monocrystalline strontium titanate is capped by a template layer that is conducive to the subsequent growth of an epitaxial layer of a desired monocrystalline material. For example, for the subsequent growth of a monocrystalline compound semiconductor material layer of gallium arsenide, the MBE growth of the strontium titanate monocrystalline layer can be capped by terminating the growth with 1-2 monolayers of titanium, 1-2 monolayers of titanium-oxygen or with 1-2 monolayers of strontium- oxygen. Following the formation of this capping layer, arsenic is deposited to form a Ti-As bond, a Ti-O-As bond or a Sr-O-As. Any of these form an appropriate template for deposition and formation of a gallium arsenide monocrystalline layer. Following the formation of the template, gallium is subsequently introduced to the reaction with the arsenic and gallium arsenide forms. Alternatively, gallium can be deposited on the capping layer to form a Sr-O-Ga bond, and arsenic is subsequently introduced with the gallium to form the GaAs. FIG. 5 is a high resolution Transmission Electron Micrograph (TEM) of semiconductor material manufactured in accordance with one embodiment of the present invention. Single crystal SrTiO₃ accommodating buffer layer 24 was grown epitaxially on silicon substrate 22. During this growth process, amoφhous interfacial layer 28 is formed which relieves strain due to lattice mismatch. GaAs compound semiconductor layer 26 was then grown epitaxially using template layer 30.

FIG. 6 illustrates an x-ray diffraction spectrum taken on a structure including GaAs monocrystalline layer 26 comprising GaAs grown on silicon substrate 22 using accommodating buffer layer 24. The peaks in the spectrum indicate that both the accommodating buffer layer 24 and GaAs compound semiconductor layer 26 are single crystal and (100) orientated.

The structure illustrated in FIG. 2 can be formed by the process discussed above with the addition of an additional buffer layer deposition step. The additional buffer layer 32 is formed overlying the template layer before the deposition of the monocrystalline material layer. If the buffer layer is a monocrystalline material comprising a compound semiconductor superlattice, such a superlattice can be deposited, by MBE for example, on the template described above. If instead the buffer layer is a monocrystalline material layer comprising a layer of germanium, the process above is modified to cap the strontium titanate monocrystalline layer with a final layer of either strontium or titanium and then by depositing germanium to react with the strontium or titanium. The germanium buffer layer can then be deposited directly on this template.

Structure 34, illustrated in FIG. 3, may be formed by growing an accommodating buffer layer, forming an amoφhous oxide layer over substrate 22, and growing semiconductor layer 38 over the accommodating buffer layer, as described above. The accommodating buffer layer and the amoφhous oxide layer are then exposed to an anneal process sufficient to change the crystalline structure of the accommodating buffer layer from monocrystalline to amoφhous, thereby forming an amoφhous layer such that the combination of the amoφhous oxide layer and the now amoφhous accommodating buffer layer form a single amoφhous oxide layer 36. Layer 26 is then subsequently grown over layer 38. Alternatively, the anneal process may be carried out subsequent to growth of layer 26.

In accordance with one aspect of this embodiment, layer 36 is formed by exposing substrate 22, the accommodating buffer layer, the amoφhous oxide layer, and monocrystalline layer 38 to a rapid thermal anneal process with a peak temperature of about 700°C to about 1000°C and a process time of about 5 seconds to about 10 minutes. However, other suitable anneal processes may be employed to convert the accommodating buffer layer to an amoφhous layer in accordance with the present invention. For example, laser annealing, electron beam annealing, or "conventional" thermal annealing processes (in the proper environment) may be used to form layer 36. When conventional thermal annealing is employed to form layer 36, an oveφressure of one or more constituents of layer 30 may be required to prevent degradation of layer 38 during the anneal process. For example, when layer 38 includes GaAs, the anneal environment preferably includes an oveφressure of arsenic to mitigate degradation of layer 38.

As noted above, layer 38 of structure 34 may include any materials suitable for either of layers 32 or 26. Accordingly, any deposition or growth methods described in connection with either layer 32 or 26, may be employed to deposit layer 38.

FIG. 7 is a high resolution TEM of semiconductor material manufactured in accordance with the embodiment of the invention illustrated in FIG. 3. In accordance with this embodiment, a single crystal SrTiO₃ accommodating buffer layer was grown epitaxially on silicon substrate 22. During this growth process, an amoφhous interfacial layer forms as described above. Next, additional monocrystalline layer 38 comprising a compound semiconductor layer of GaAs is formed above the accommodating buffer layer and the accommodating buffer layer is exposed to an anneal process to form amoφhous oxide layer 36.

FIG. 8 illustrates an x-ray diffraction spectrum taken on a structure including additional monocrystalline layer 38 comprising a GaAs compound semiconductor layer and amoφhous oxide layer 36 formed on silicon substrate 22. The peaks in the spectrum indicate that GaAs compound semiconductor layer 38 is single crystal and (100) orientated and the lack of peaks around 40 to 50 degrees indicates that layer 36 is amoφhous.

The process described above illustrates a process for forming a semiconductor structure including a silicon substrate, an overlying oxide layer, and a monocrystalline material layer comprising a gallium arsenide compound semiconductor layer by the process of molecular beam epitaxy. The process can also be carried out by the process of chemical vapor deposition (CVD), metal organic chemical vapor deposition (MOCVD), migration enhanced epitaxy (MEE), atomic layer epitaxy (ALE), physical vapor deposition (PVD), chemical solution deposition (CSD), pulsed laser deposition (PLD), or the like. Further, by a similar process, other monocrystalline accommodating buffer layers such as alkaline earth metal titanates, zirconates, hafnates, tantalates, vanadates, ruthenates, and niobates, alkaline earth metal tin-based perovskites, lanthanum aluminate, lanthanum scandium oxide, and gadolinium oxide can also be grown. Further, by a similar process such as MBE, other monocrystalline material layers comprising other DT-V and II-VI monocrystalline compound semiconductors, semiconductors, metals and non-metals can be deposited overlying the monocrystalline oxide accommodating buffer layer.

Each of the variations of monocrystalline material layer and monocrystalline oxide accommodating buffer layer uses an appropriate template for initiating the growth of the monocrystalline material layer. For example, if the accommodating buffer layer is an alkaline earth metal zirconate, the oxide can be capped by a thin layer of zirconium. The deposition of zirconium can be followed by the deposition of arsenic or phosphorus to react with the zirconium as a precursor to depositing indium gallium arsenide, indium aluminum arsenide, or indium phosphide respectively. Similarly, if the monocrystalline oxide accommodating buffer layer is an alkaline earth metal hafnate, the oxide layer can be capped by a thin layer of hafnium. The deposition of hafnium is followed by the deposition of arsenic or phosphorous to react with the hafnium as a precursor to the growth of an indium gallium arsenide, indium aluminum arsenide, or indium phosphide layer, respectively. In a similar manner, strontium titanate can be capped with a layer of strontium or strontium and oxygen and barium titanate can be capped with a layer of barium or barium and oxygen. Each of these depositions can be followed by the deposition of arsenic or phosphorus to react with the capping material to form a template for the deposition of a monocrystalline material layer comprising compound semiconductors such as indium gallium arsenide, indium aluminum arsenide, or indium phosphide.

The formation of a device structure in accordance with another embodiment of the invention is illustrated schematically in cross-section in FIGS. 9-12. Like the previously described embodiments referred to in FIGS. 1-3, this embodiment of the invention involves the process of forming a compliant substrate utilizing the epitaxial growth of single crystal oxides, such as the formation of accommodating buffer layer 24 previously described with reference to FIGS. 1 and 2 and amoφhous layer 36 previously described with reference to FIG. 3, and the formation of a template layer 30. However, the embodiment illustrated in FIGS. 9-12 utilizes a template that includes a surfactant to facilitate layer-by-layer monocrystalline material growth.

Turning now to FIG. 9, an amoφhous intermediate layer 58 is grown on substrate 52 at the interface between substrate 52 and a growing accommodating buffer layer 54, which is preferably a monocrystalline crystal oxide layer, by the oxidation of substrate 52 during the growth of layer 54. Layer 54 is preferably a monocrystalline oxide material such as a monocrystalline layer of Sr₂Baι_-zTiO₃ where z ranges from 0 to 1. However, layer 54 may also comprise any of those compounds previously described with reference layer 24 in FIGS. 1-2 and any of those compounds previously described with reference to layer 36 in FIG. 3 which is formed from layers 24 and 28 referenced in FIGS. 1 and 2.

Layer 54 is grown with a strontium (Sr) terminated surface represented in FIG. 9 by hatched line 55 which is followed by the addition of a template layer 60 which includes a surfactant layer 61 and capping layer 63 as illustrated in FIGS. 10 and 1 1. Surfactant layer 61 may comprise, but is not limited to, elements such as Al, In and Ga, but will be dependent upon the composition of layer 54 and the overlying layer of monocrystalline material for optimal results. In one exemplary embodiment, aluminum (Al) is used for surfactant layer 61 and functions to modify the surface and surface energy of layer 54. Preferably, surfactant layer 61 is epitaxially grown, to a thickness of one to two monolayers, over layer 54 as illustrated in FIG. 10 by way of molecular beam epitaxy (MBE), although other epitaxial processes may also be performed including chemical vapor deposition (CVD), metal organic chemical vapor deposition (MOCVD), migration enhanced epitaxy (MEE), atomic layer epitaxy (ALE), physical vapor deposition (PVD), chemical solution deposition (CSD), pulsed laser deposition (PLD), or the like.

Surfactant layer 61 is then exposed to a Group V element such as arsenic, for example, to form capping layer 63 as illustrated in FIG. 11. Surfactant layer 61 may be exposed to a number of materials to create capping layer 63 such as elements which include, but are not limited to, As, P, Sb and N. Surfactant layer 61 and capping layer 63 combine to form template layer 60.

Monocrystalline material layer 66, which in this example is a compound semiconductor such as GaAs, is then deposited via MBE, CVD, MOCVD, MEE, ALE, PVD, CSD, PLD, and the like to form the final structure illustrated in FIG. 12. FIGS. 13-16 illustrate possible molecular bond structures for a specific example of a compound semiconductor structure formed in accordance with the embodiment of the invention illustrated in FIGS. 9-12. More specifically, FIGS. 13-16 illustrate the growth of GaAs (layer 66) on the strontium terminated surface of a strontium titanate monocrystalline oxide (layer 54) using a surfactant containing template (layer 60). The growth of a monocrystalline material layer 66 such as GaAs on an accommodating buffer layer 54 such as a strontium titanium oxide over amoφhous interface layer 58 and substrate layer 52, both of which may comprise materials previously described with reference to layers 28 and 22, respectively in FIGS. 1 and 2, illustrates a critical thickness of about 1000 Angstroms where the two-dimensional (2D) and three-dimensional (3D) growth shifts because of the surface energies involved. In order to maintain a true layer by layer growth (Frank Van der Mere growth), the following relationship must be satisfied:

"STO ^> "INT ⁺ ^GaAs ' where the surface energy of the monocrystalline oxide layer 54 must be greater than the surface energy of the amoφhous interface layer 58 added to the surface energy of the GaAs layer 66. Since it is impracticable to satisfy this equation, a surfactant containing template was used, as described above with reference to FIGS. 10-12, to increase the surface energy of the monocrystalline oxide layer 54 and also to shift the crystalline structure of the template to a diamond-like structure that is in compliance with the original GaAs layer.

FIG. 13 illustrates the molecular bond structure of a strontium terminated surface of a strontium titanate monocrystalline oxide layer. An aluminum surfactant layer is deposited on top of the strontium terminated surface and bonds with that surface as illustrated in FIG. 14, which reacts to form a capping layer comprising a monolayer of Al₂Sr having the molecular bond structure illustrated in FIG. 14 which forms a diamond-like structure with an sp hybrid terminated surface that is compliant with compound semiconductors such as GaAs. The structure is then exposed to As to form a layer of AlAs as shown in FIG. 15. GaAs is then deposited to complete the molecular bond structure illustrated in FIG. 16 which has been obtained by 2D growth. The GaAs can be grown to any thickness for forming other semiconductor structures, devices, or integrated circuits. Alkaline earth metals such as those in Group ILA are those elements preferably used to form the capping surface of the monocrystalline oxide layer 54 because they are capable of forming a desired molecular structure with aluminum. In this embodiment, a surfactant containing template layer aids in the formation of a compliant substrate for the monolithic integration of various material layers including those comprised of Group III-V compounds to form high quality semiconductor structures, devices and integrated circuits. For example, a surfactant containing template may be used for the monolithic integration of a monocrystalline material layer such as a layer comprising Germanium (Ge), for example, to form high efficiency photocells.

Turning now to FIGS. 17-20, the formation of a device structure in accordance with still another embodiment of the invention is illustrated in cross-section. This embodiment utilizes the formation of a compliant substrate which relies on the epitaxial growth of single crystal oxides on silicon followed by the epitaxial growth of single crystal silicon onto the oxide.

An accommodating buffer layer 74 such as a monocrystalline oxide layer is first grown on a substrate layer 72, such as silicon, with an amoφhous interface layer 78 as illustrated in FIG. 17. Monocrystalline oxide layer 74 may be comprised of any of those materials previously discussed with reference to layer 24 in FIGS. 1 and 2, while amoφhous interface layer 78 is preferably comprised of any of those materials previously described with reference to the layer 28 illustrated in FIGS. 1 and 2. Substrate 72, although preferably silicon, may also comprise any of those materials previously described with reference to substrate 22 in FIGS. 1-3.

Next, a silicon layer 81 is deposited over monocrystalline oxide layer 74 via MBE, CVD, MOCVD, MEE, ALE, PVD, CSD, PLD, and the like as illustrated in FIG. 18 with a thickness of a few hundred Angstroms but preferably with a thickness of about 50 Angstroms. Monocrystalline oxide layer 74 preferably has a thickness of about 20 to 100 Angstroms.

Rapid thermal annealing is then conducted in the presence of a carbon source such as acetylene or methane, for example at a temperature within a range of about 800°C to 1000°C to form capping layer 82 and silicate amoφhous layer 86. However, other suitable carbon sources may be used as long as the rapid thermal annealing step functions to amoφhize the monocrystalline oxide layer74 into a silicate amoφhous layer 86 and carbonize the top silicon layer 81 to form capping layer 82 which in this example would be a silicon carbide (SiC) layer as illustrated in FIG. 19. The formation of amoφhous layer 86 is similar to the formation of layer 36 illustrated in FIG. 3 and may comprise any of those materials described with reference to layer 36 in FIG. 3 but the preferable material will be dependent upon the capping layer 82 used for silicon layer 81.

Finally, a compound semiconductor layer 96, such as gallium nitride (GaN) is grown over the SiC surface by way of MBE, CVD, MOCVD, MEE, ALE, PVD, CSD, PLD, or the like to form a high quality compound semiconductor material for device formation. More specifically, the deposition of GaN and GaN based systems such as GalnN and AlGaN will result in the formation of dislocation nets confined at the silicon/amoφhous region. The resulting nitride containing compound semiconductor material may comprise elements from groups HI, TV and V of the periodic table and is defect free.

Although GaN has been grown on SiC substrate in the past, this embodiment of the invention possesses a one step formation of the compliant substrate containing a SiC top surface and an amoφhous layer on a Si surface. More specifically, this embodiment of the invention uses an intermediate single crystal oxide layer that is amoφhosized to form a silicate layer which adsorbs the strain between the layers. Moreover, unlike past use of a SiC substrate, this embodiment of the invention is not limited by wafer size which is usually less than 50mm in diameter for prior art SiC substrates.

The monolithic integration of nitride containing semiconductor compounds containing group EH-V nitrides and silicon devices can be used for high temperature RF applications and optoelectronics. GaN systems have particular use in the photonic industry for the blue/green and UV light sources and detection. High brightness light emitting diodes (LEDs) and lasers may also be formed within the GaN system.

FIGS. 21-23 schematically illustrate, in cross-section, the formation of another embodiment of a device structure in accordance with the invention. This embodiment includes a compliant layer that functions as a transition layer that uses clathrate or Zintl type bonding. More specifically, this embodiment utilizes an intermetallic template layer to reduce the surface energy of the interface between material layers thereby allowing for two dimensional layer by layer growth. The structure illustrated in FIG. 21 includes a monocrystalline substrate 102, an amoφhous interface layer 108 and an accommodating buffer layer 104. Amoφhous intermediate layer 108 is formed on substrate 102 at the interface between substrate 102 and accommodating buffer layer 104 as previously described with reference to FIGS. 1 and 2. Amoφhous interface layer 108 may comprise any of those materials previously described with reference to amoφhous interface layer 28 in FIGS. 1 and 2. Substrate 102 is preferably silicon but may also comprise any of those materials previously described with reference to substrate 22 in FIGS. 1-3.

A template layer 130 is deposited over accommodating buffer layer 104 as illustrated in FIG. 22 and preferably comprises a thin layer of Zintl type phase material composed of metals and metalloids having a great deal of ionic character. As in previously described embodiments, template layer 130 is deposited by way of MBE, CVD, MOCVD, MEE, ALE, PVD, CSD, PLD, or the like to achieve a thickness of one monolayer. Template layer 130 functions as a "soft" layer with non-directional bonding but high crystallinity which absorbs stress build up between layers having lattice mismatch. Materials for template 130 may include, but are not limited to, materials containing Si, Ga, In, and Sb such as, for example, AlSr₂, (MgCaYb)Ga₂, (Ca,Sr,Eu,Yb)In₂, BaGe₂As, and SrSn₂As₂

A monocrystalline material layer 126 is epitaxially grown over template layer 130 to achieve the final structure illustrated in FIG. 23. As a specific example, an SrAl₂ layer may be used as template layer 130 and an appropriate monocrystalline material layer 126 such as a compound semiconductor material GaAs is grown over the SrAl . The Al-Ti (from the accommodating buffer layer of layer of Sr_zBaι._zTiO where z ranges from 0 to 1) bond is mostly metallic while the Al-As (from the GaAs layer) bond is weakly covalent. The Sr participates in two distinct types of bonding with part of its electric charge going to the oxygen atoms in the lower accommodating buffer layer 104 comprising Sr_zBa_1-zTiO₃ to participate in ionic bonding and the other part of its valence charge being donated to Al in a way that is typically carried out with Zintl phase materials. The amount of the charge transfer depends on the relative electronegativity of elements comprising the template layer 130 as well as on the interatomic distance. In this example, Al assumes an sp³ hybridization and can readily form bonds with monocrystalline material layer 126, which in this example, comprises compound semiconductor material GaAs.

The compliant substrate produced by use of the Zintl type template layer used in this embodiment can absorb a large strain without a significant energy cost. In the above example, the bond strength of the Al is adjusted by changing the volume of the SrAl₂ layer thereby making the device tunable for specific applications which include the monolithic integration of HI-V and Si devices and the monolithic integration of high-k dielectric materials for CMOS technology. Clearly, those embodiments specifically describing structures having compound semiconductor portions and Group IV semiconductor portions, are meant to illustrate embodiments of the present invention and not limit the present invention. There are a multiplicity of other combinations and other embodiments of the present invention. For example, the present invention includes structures and methods for fabricating material layers which form semiconductor structures, devices and integrated circuits including other layers such as metal and non-metal layers. More specifically, the invention includes structures and methods for forming a compliant substrate which is used in the fabrication of semiconductor structures, devices and integrated circuits and the material layers suitable for fabricating those structures, devices, and integrated circuits. By using embodiments of the present invention, it is now simpler to integrate devices that include monocrystalline layers comprising semiconductor and compound semiconductor materials as well as other material layers that are used to form those devices with other components that work better or are easily and/or inexpensively formed within semiconductor or compound semiconductor materials. This allows a device to be shrunk, the manufacturing costs to decrease, and yield and reliability to increase.

In accordance with one embodiment of this invention, a monocrystalline semiconductor or compound semiconductor wafer can be used in forming monocrystalline material layers over the wafer. In this manner, the wafer is essentially a "handle" wafer used during the fabrication of semiconductor electrical components within a monocrystalline layer overlying the wafer. Therefore, electrical components can be formed within semiconductor materials over a wafer of at least approximately 200 millimeters in diameter and possibly at least approximately 300 millimeters. By the use of this type of substrate, a relatively inexpensive "handle" wafer overcomes the fragile nature of compound semiconductor or other monocrystalline material wafers by placing them over a relatively more durable and easy to fabricate base material. Therefore, an integrated circuit can be formed such that all electrical components, and particularly all active electronic devices, can be formed within or using the monocrystalline material layer even though the substrate itself may include a monocrystalline semiconductor material. Fabrication costs for compound semiconductor devices and other devices employing non-silicon monocrystalline materials should decrease because larger substrates can be processed more economically and more readily compared to the relatively smaller and more fragile substrates (e.g. conventional compound semiconductor wafers).

FIG. 24 illustrates schematically, in cross section, a device structure 50 in accordance with a further embodiment. Device structure 50 includes a monocrystalline semiconductor substrate 52, preferably a monocrystalline silicon wafer. Monocrystalline semiconductor substrate 52 includes two regions, 53 and 57. An electrical semiconductor component generally indicated by the dashed line 56 is formed, at least partially, in region 53. Electrical component 56 can be a resistor, a capacitor, an active semiconductor component such as a diode or a transistor or an integrated circuit such as a CMOS integrated circuit. For example, electrical semiconductor component 56 can be a CMOS integrated circuit configured to perform digital signal processing or another function for which silicon integrated circuits are well suited. The electrical semiconductor component in region 53 can be formed by conventional semiconductor processing as well known and widely practiced in the semiconductor industry. A layer of insulating material 59 such as a layer of silicon dioxide or the like may overlie electrical semiconductor component 56.

Insulating material 59 and any other layers that may have been formed or deposited during the processing of semiconductor component 56 in region 53 are removed from the surface of region 57 to provide a bare silicon surface in that region. As is well known, bare silicon surfaces are highly reactive and a native silicon oxide layer can quickly form on the bare surface. A layer of barium or barium and oxygen is deposited onto the native oxide layer on the surface of region 57 and is reacted with the oxidized surface to form a first template layer (not shown). In accordance with one embodiment, a monocrystalline oxide layer is formed overlying the template layer by a process of molecular beam epitaxy. Reactants including barium, titanium and oxygen are deposited onto the template layer to form the monocrystalline oxide layer. Initially during the deposition the partial pressure of oxygen is kept near the minimum necessary to fully react with the barium and titanium to form monocrystalline barium titanate layer. The partial pressure of oxygen is then increased to provide an oveφressure of oxygen and to allow oxygen to diffuse through the growing monocrystalline oxide layer. The oxygen diffusing through the barium titanate reacts with silicon at the surface of region 57 to form an amoφhous layer of silicon oxide 62 on second region 57 and at the interface between silicon substrate 52 and the monocrystalline oxide layer 65. Layers 65 and 62 may be subject to an annealing process as described above in connection with FIG. 3 to form a single amoφhous accommodating layer. In accordance with an embodiment, the step of depositing the monocrystalline oxide layer 65 is terminated by depositing a second template layer 64, which can be 1- 10 monolayers of titanium, barium, barium and oxygen, or titanium and oxygen. A layer 66 of a monocrystalline compound semiconductor material is then deposited overlying second template layer 64 by a process of molecular beam epitaxy. The deposition of layer 66 is initiated by depositing a layer of arsenic onto template 64. This initial step is followed by depositing gallium and arsenic to form monocrystalline gallium arsenide 66. Alternatively, strontium can be substituted for barium in the above example. In accordance with a further embodiment, a semiconductor component, generally indicated by a dashed line 68 is formed in compound semiconductor layer 66. Semiconductor component 68 can be formed by processing steps conventionally used in the fabrication of gallium arsenide or other ETI-V compound semiconductor material devices. Semiconductor component 68 can be any active or passive component, and preferably is a semiconductor laser, light emitting diode, photodetector, heteroj unction bipolar transistor (HBT), high frequency MESFET, or other component that utilizes and takes advantage of the physical properties of compound semiconductor materials. A metallic conductor schematically indicated by the line 70 can be formed to electrically couple device 68 and device 56, thus implementing an integrated device that includes at least one component formed in silicon substrate 52 and one device formed in monocrystalline compound semiconductor material layer 66. Although illustrative structure 50 has been described as a structure formed on a silicon substrate 52 and having a barium (or strontium) titanate layer 65 and a gallium arsenide layer 66, similar devices can be fabricated using other substrates, monocrystalline oxide layers and other compound semiconductor layers as described elsewhere in this disclosure.

FIG. 25 illustrates a semiconductor structure 71 in accordance with a further embodiment. Structure 71 includes a monocrystalline semiconductor substrate 73 such as a monocrystalline silicon wafer that includes a region 75 and a region 76. An electrical component schematically illustrated by the dashed line 79 is formed in region 75 using conventional silicon device processing techniques commonly used in the semiconductor industry. Using process steps similar to those described above, a monocrystalline oxide layer 80 and an intermediate amoφhous silicon oxide layer 83 are formed overlying region 76 of substrate 73. A template layer 84 and subsequently a monocrystalline semiconductor layer 87 are formed overlying monocrystalline oxide layer 80. In accordance with a further embodiment, an additional monocrystalline oxide layer 88 is formed overlying layer 87 by process steps similar to those used to form layer 80, and an additional monocrystalline semiconductor layer 90 is formed overlying monocrystalline oxide layer 88 by process steps similar to those used to form layer 87. In accordance with one embodiment, at least one of layers 87 and 90 are formed from a compound semiconductor material. Layers 80 and 83 may be subject to an annealing process as described above in connection with FIG. 3 to form a single amoφhous accommodating layer.

A semiconductor component generally indicated by a dashed line 92 is formed at least partially in monocrystalline semiconductor layer 87. In accordance with one embodiment, semiconductor component 92 may include a field effect transistor having a gate dielectric formed, in part, by monocrystalline oxide layer 88. In addition, monocrystalline semiconductor layer 90 can be used to implement the gate electrode of that field effect transistor. In accordance with one embodiment, monocrystalline semiconductor layer 87 is formed from a group Hl-V compound and semiconductor component 92 is a radio frequency amplifier that takes advantage of the high mobility characteristic of group ETI-V component materials. In accordance with yet a further embodiment, an electrical interconnection schematically illustrated by the line 94 electrically interconnects component 79 and component 92. Structure 71 thus integrates components that take advantage of the unique properties of the two monocrystalline semiconductor materials.

Attention is now directed to a method for forming exemplary portions of illustrative composite semiconductor structures or composite integrated circuits like 50 or 71. In particular, the illustrative composite semiconductor structure or integrated circuit 103 shown in FIGs. 26-30 includes a compound semiconductor portion 1022, a bipolar portion 1024, and a MOS portion 1026. In FIG. 26, a p-type doped, monocrystalline silicon substrate 1 10 is provided having a compound semiconductor portion 1022, a bipolar portion 1024, and an MOS portion 1026. Within bipolar portion 1024, the monocrystalline silicon substrate 110 is doped to form an N⁺ buried region 1 102. A lightly p-type doped epitaxial monocrystalline silicon layer 1 104 is then formed over the buried region 1102 and the substrate 110. A doping step is then performed to create a lightly n-type doped drift region 1117 above the N⁺ buried region 1102. The doping step converts the dopant type of the lightly p-type epitaxial layer within a section of the bipolar region 1024 to a lightly n-type monocrystalline silicon region. A field isolation region 1 106 is then formed between and around the bipolar portion 1024 and the MOS portion 1026. A gate dielectric layer 1110 is formed over a portion of the epitaxial layer 1104 within MOS portion 1026, and the gate electrode 1 112 is then formed over the gate dielectric layer 1 110. Sidewall spacers 1 1 15 are formed along vertical sides of the gate electrode 1 1 12 and gate dielectric layer 11 10. A p-type dopant is introduced into the drift region 1 1 17 to form an active or intrinsic base region 1114. An n-type, deep collector region 1 108 is then formed within the bipolar portion 1024 to allow electrical connection to the buried region 1102. Selective n-type doping is performed to form N⁺ doped regions 1116 and the emitter region 1120. N⁺ doped regions 11 16 are formed within layer 1 104 along adjacent sides of the gate electrode 1 112 and are source, drain, or source/drain regions for the MOS transistor. The N⁺ doped regions 1116 and emitter region 1 120 have a doping concentration of at least 1E19 atoms per cubic centimeter to allow ohmic contacts to be formed. A p-type doped region is formed to create the inactive or extrinsic base region 11 18 which is a P⁺ doped region (doping concentration of at least 1E19 atoms per cubic centimeter).

In the embodiment described, several processing steps have been performed but are not illustrated or further described, such as the formation of well regions, threshold adjusting implants, channel punchthrough prevention implants, field punchthrough prevention implants, as well as a variety of masking layers. The formation of the device up to this point in the process is performed using conventional steps. As illustrated, a standard N-channel MOS transistor has been formed within the MOS region 1026, and a vertical NPN bipolar transistor has been formed within the bipolar portion 1024. Although illustrated with a NPN bipolar transistor and a N-channel MOS transistor, device structures and circuits in accordance with various embodiments may additionally or alternatively include other electronic devices formed using the silicon substrate. As of this point, no circuitry has been formed within the compound semiconductor portion 1022. After the silicon devices are formed in regions 1024 and 1026, a protective layer

1 122 is formed overlying devices in regions 1024 and 1026 to protect devices in regions 1024 and 1026 from potential damage resulting from device formation in region 1022. Layer 1 122 may be formed of, for example, an insulating material such as silicon oxide or silicon nitride. All of the layers that have been formed during the processing of the bipolar and

MOS portions of the integrated circuit, except for epitaxial layer 1104 but including protective layer 1122, are now removed from the surface of compound semiconductor portion 1022. A bare silicon surface is thus provided for the subsequent processing of this portion, for example in the manner set forth above. An accommodating buffer layer 124 is then formed over the substrate 1 10 as illustrated in FIG. 27. The accommodating buffer layer will form as a monocrystalline layer over the properly prepared (i.e., having the appropriate template layer) bare silicon surface in portion 1022. The portion of layer 124 that forms over portions 1024 and 1026, however, may be polycrystalline or amoφhous because it is formed over a material that is not monocrystalline, and therefore, does not nucleate monocrystalline growth. The accommodating buffer layer 124 typically is a monocrystalline metal oxide or nitride layer and typically has a thickness in a range of approximately 2-100 nanometers. In one particular embodiment, the accommodating buffer layer is approximately 5-15 nm thick. During the formation of the accommodating buffer layer, an amoφhous intermediate layer 122 is formed along the uppermost silicon surfaces of the integrated circuit 103. This amoφhous intermediate layer 122 typically includes an oxide of silicon and has a thickness and range of approximately 1-5 nm. In one particular embodiment, the thickness is approximately 2 nm. Following the formation of the accommodating buffer layer 124 and the amoφhous intermediate layer 122, a template layer 125 is then formed and has a thickness in a range of approximately one to ten monolayers of a material. In one particular embodiment, the material includes titanium-arsenic, strontium-oxygen-arsenic, or other similar materials as previously described with respect to FIGS. 1-5. A monocrystalline compound semiconductor layer 132 is then epitaxially grown overlying the monocrystalline portion of accommodating buffer layer 124 as shown in FIG. 28. The portion of layer 132 that is grown over portions of layer 124 that are not monocrystalline may be polycrystalline or amoφhous. The compound semiconductor layer can be formed by a number of methods and typically includes a material such as gallium arsenide, aluminum gallium arsenide, indium phosphide, or other compound semiconductor materials as previously mentioned. The thickness of the layer is in a range of approximately 1-5,000 nm, and more preferably 100-2000 nm. Furthermore, additional monocrystalline layers may be formed above layer 132, as discussed in more detail below in connection with FIGS. 31-32. In this particular embodiment, each of the elements within the template layer are also present in the accommodating buffer layer 124, the monocrystalline compound semiconductor material 132, or both. Therefore, the delineation between the template layer 125 and its two immediately adjacent layers disappears during processing. Therefore, when a transmission electron microscopy (TEM) photograph is taken, an interface between the accommodating buffer layer 124 and the monocrystalline compound semiconductor layer 132 is seen.

After at least a portion of layer 132 is formed in region 1022, layers 122 and 124 may be subject to an annealing process as described above in connection with FIG. 3 to form a single amoφhous accommodating layer. If only a portion of layer 132 is formed prior to the anneal process, the remaining portion may be deposited onto structure 103 prior to further processing.

At this point in time, sections of the compound semiconductor layer 132 and the accommodating buffer layer 124 (or of the amoφhous accommodating layer if the annealing process described above has been carried out) are removed from portions overlying the bipolar portion 1024 and the MOS portion 1026 as shown in FIG. 29. After the section of the compound semiconductor layer and the accommodating buffer layer 124 are removed, an insulating layer 142 is formed over protective layer 1122. The insulating layer 142 can include a number of materials such as oxides, nitrides, oxynitrides, low-k dielectrics, or the like. As used herein, low-k is a material having a dielectric constant no higher than approximately 3.5. After the insulating layer 142 has been deposited, it is then polished or etched to remove portions of the insulating layer 142 that overlie monocrystalline compound semiconductor layer 132.

A transistor 144 is then formed within the monocrystalline compound semiconductor portion 1022. A gate electrode 148 is then formed on the monocrystalline compound semiconductor layer 132. Doped regions 146 are then formed within the monocrystalline compound semiconductor layer 132. In this embodiment, the transistor 144 is a metal-semiconductor field-effect transistor (MESFET). If the MESFET is an n-type MESFET, the doped regions 146 and at least a portion of monocrystalline compound semiconductor layer 132 are also n-type doped. If a p-type MESFET were to be formed, then the doped regions 146 and at least a portion of monocrystalline compound semiconductor layer 132 would have just the opposite doping type. The heavier doped (N⁺) regions 146 allow ohmic contacts to be made to the monocrystalline compound semiconductor layer 132. At this point in time, the active devices within the integrated circuit have been formed. Although not illustrated in the drawing figures, additional processing steps such as formation of well regions, threshold adjusting implants, channel punchthrough prevention implants, field punchthrough prevention implants, and the like may be performed in accordance with the present invention. This particular embodiment includes an n-type MESFET, a vertical NPN bipolar transistor, and a planar n-channel MOS transistor. Many other types of transistors, including P-channel MOS transistors, p-type vertical bipolar transistors, p-type MESFETs, and combinations of vertical and planar transistors, can be used. Also, other electrical components, such as resistors, capacitors, diodes, and the like, may be formed in one or more of the portions 1022, 1024, and 1026. Processing continues to form a substantially completed integrated circuit 103 as illustrated in FIG. 30. An insulating layer 152 is formed over the substrate 1 10. The insulating layer 152 may include an etch-stop or polish-stop region that is not illustrated in FIG. 30. A second insulating layer 154 is then formed over the first insulating layer 152. Portions of layers 154, 152, 142, 124, and 1122 are removed to define contact openings where the devices are to be interconnected. Interconnect trenches are formed within insulating layer 154 to provide the lateral connections between the contacts. As illustrated in FIG. 30, interconnect 1562 connects a source or drain region of the n-type MESFET within portion 1022 to the deep collector region 1108 of the NPN transistor within the bipolar portion 1024. The emitter region 1120 of the NPN transistor is connected to one of the doped regions 1116 of the n-channel MOS transistor within the MOS portion 1026. The other doped region 1116 is electrically connected to other portions of the integrated circuit that are not shown. Similar electrical connections are also formed to couple regions 1 118 and 1 112 to other regions of the integrated circuit. A passivation layer 156 is formed over the interconnects 1562, 1564, and 1566 and insulating layer 154. Other electrical connections are made to the transistors as illustrated as well as to other electrical or electronic components within the integrated circuit 103 but are not illustrated in the FIGS. Further, additional insulating layers and interconnects may be formed as necessary to form the proper interconnections between the various components within the integrated circuit 103.

As can be seen from the previous embodiment, active devices for both compound semiconductor and Group IV semiconductor materials can be integrated into a single integrated circuit. Because there is some difficulty in incoφorating both bipolar transistors and MOS transistors within a same integrated circuit, it may be possible to move some of the components within bipolar portion 1024 into the compound semiconductor portion 1022 or the MOS portion 1026. Therefore, the requirement of special fabricating steps solely used for making a bipolar transistor can be eliminated. Therefore, there would only be a compound semiconductor portion and a MOS portion to the integrated circuit. In still another embodiment, an integrated circuit can be formed such that it includes an optical laser in a compound semiconductor portion and an optical interconnect (waveguide) to a MOS transistor within a Group IV semiconductor region of the same integrated circuit. FIGs. 31-37 include illustrations of one embodiment. FIG. 31 includes an illustration of a cross-section view of a portion of an integrated circuit 160 that includes a monocrystalline silicon wafer 161. An amoφhous intermediate layer 162 and an accommodating buffer layer 164, similar to those previously described, have been formed over wafer 161. Layers 162 and 164 may be subject to an annealing process as described above in connection with FIG. 3 to form a single amoφhous accommodating layer. In this specific embodiment, the layers needed to form the optical laser will be formed first, followed by the layers needed for the MOS transistor. In FIG. 31, the lower mirror layer 166 includes alternating layers of compound semiconductor materials. For example, the first, third, and fifth films within the optical laser may include a material such as gallium arsenide, and the second, fourth, and sixth films within the lower mirror layer 166 may include aluminum gallium arsenide or vice versa. Layer 168 includes the active region that will be used for photon generation. Upper mirror layer 170 is formed in a similar manner to the lower mirror layer 166 and includes alternating films of compound semiconductor materials. In one particular embodiment, the upper mirror layer 170 may be p-type doped compound semiconductor materials, and the lower mirror layer 166 may be n-type doped compound semiconductor materials.

Another accommodating buffer layer 172, similar to the accommodating buffer layer 164, is formed over the upper mirror layer 170. In an alternative embodiment, the accommodating buffer layers 164 and 172 may include different materials. However, their function is essentially the same in that each is used for making a transition between a compound semiconductor layer and a monocrystalline Group IV semiconductor layer. Layer 172 may be subject to an annealing process as described above in connection with FIG. 3 to form an amoφhous accommodating layer. A monocrystalline Group IV semiconductor layer 174 is formed over the accommodating buffer layer 172. In one particular embodiment, the monocrystalline Group IV semiconductor layer 174 includes germanium, silicon germanium, silicon germanium carbide, or the like.

In FIG. 32, the MOS portion is processed to form electrical components within this upper monocrystalline Group IV semiconductor layer 174. As illustrated in FIG. 32, a field isolation region 171 is formed from a portion of layer 174. A gate dielectric layer 173 is formed over the layer 174, and a gate electrode 175 is formed over the gate dielectric layer 173. Doped regions 177 are source, drain, or source/drain regions for the transistor 181, as shown. Sidewall spacers 179 are formed adjacent to the vertical sides of the gate electrode 175. Other components can be made within at least a part of layer 174. These other components include other transistors (n-channel or p-channel), capacitors, transistors, diodes, and the like.

A monocrystalline Group IV semiconductor layer is epitaxially grown over one of the doped regions 177. An upper portion 184 is P+ doped, and a lower portion 182 remains substantially intrinsic (undoped) as illustrated in FIG. 32. The layer can be formed using a selective epitaxial process. In one embodiment, an insulating layer (not shown) is formed over the transistor 181 and the field isolation region 171. The insulating layer is patterned to define an opening that exposes one of the doped regions 177. At least initially, the selective epitaxial layer is formed without dopants. The entire selective epitaxial layer may be intrinsic, or a p-type dopant can be added near the end of the formation of the selective epitaxial layer. If the selective epitaxial layer is intrinsic, as formed, a doping step may be formed by implantation or by furnace doping. Regardless how the P+ upper portion 184 is formed, the insulating layer is then removed to form the resulting structure shown in FIG. 32. The next set of steps is performed to define the optical laser 180 as illustrated in

FIG. 33. The field isolation region 171 and the accommodating buffer layer 172 are removed over the compound semiconductor portion of the integrated circuit. Additional steps are performed to define the upper mirror layer 170 and active layer 168 of the optical laser 180. The sides of the upper mirror layer 170 and active layer 168 are substantially coterminous.

Contacts 186 and 188 are formed for making electrical contact to the upper mirror layer 170 and the lower mirror layer 166, respectively, as shown in FIG. 33. Contact 186 has an annular shape to allow light (photons) to pass out of the upper mirror layer 170 into a subsequently formed optical waveguide.

An insulating layer 190 is then formed and patterned to define optical openings extending to the contact layer 186 and one of the doped regions 177 as shown in FIG. 34. The insulating material can be any number of different materials, including an oxide, nitride, oxynitride, low-k dielectric, or any combination thereof. After defining the openings 192, a higher refractive index material 202 is then formed within the openings to fill them and to deposit the layer over the insulating layer 190 as illustrated in FIG. 35. With respect to the higher refractive index material 202, "higher" is in relation to the material of the insulating layer 190 (i.e., material 202 has a higher refractive index compared to the insulating layer 190). Optionally, a relatively thin lower refractive index film (not shown) could be formed before forming the higher refractive index material 202. A hard mask layer 204 is then formed over the high refractive index layer 202. Portions of the hard mask layer 204, and high refractive index layer 202 are removed from portions overlying the opening and to areas closer to the sides of FIG. 35.

The balance of the formation of the optical waveguide, which is an optical interconnect, is completed as illustrated in FIG. 36. A deposition procedure (possibly a dep-etch process) is performed to effectively create sidewalls sections 212. In this embodiment, the sidewall sections 212 are made of the same material as material 202. The hard mask layer 204 is then removed, and a low refractive index layer 214 (low relative to material 202 and layer 212) is formed over the higher refractive index material 212 and 202 and exposed portions of the insulating layer 190. The dash lines in FIG. 36 illustrate the border between the high refractive index materials 202 and 212. This designation is used to identify that both are made of the same material but are formed at different times.

Processing is continued to form a substantially completed integrated circuit as illustrated in FIG. 37. A passivation layer 220 is then formed over the optical laser 180 and MOSFET transistor 181. Although not shown, other electrical or optical connections are made to the components within the integrated circuit but are not illustrated in FIG. 37. These interconnects can include other optical waveguides or may include metallic interconnects.

In other embodiments, other types of lasers can be formed. For example, another type of laser can emit light (photons) horizontally instead of vertically. If light is emitted horizontally, the MOSFET transistor could be formed within the substrate 161, and the optical waveguide would be reconfigured, so that the laser is properly coupled (optically connected) to the transistor. In one specific embodiment, the optical waveguide can include at least a portion of the accommodating buffer layer. Other configurations are possible.

Clearly, these embodiments of integrated circuits having compound semiconductor portions and Group IV semiconductor portions, are meant to illustrate what can be done and are not intended to be exhaustive of all possibilities or to limit what can be done. There is a multiplicity of other possible combinations and embodiments. For example, the compound semiconductor portion may include light emitting diodes, photodetectors, diodes, or the like, and the Group IV semiconductor can include digital logic, memory arrays, and most structures that can be formed in conventional MOS integrated circuits. By using what is shown and described herein, it is now simpler to integrate devices that work better in compound semiconductor materials with other components that work better in Group IV semiconductor materials. This allows a device to be shrunk, the manufacturing costs to decrease, and yield and reliability to increase.

Although not illustrated, a monocrystalline Group IV wafer can be used in forming only compound semiconductor electrical components over the wafer. In this manner, the wafer is essentially a "handle" wafer used during the fabrication of the compound semiconductor electrical components within a monocrystalline compound semiconductor layer overlying the wafer. Therefore, electrical components can be formed within EI-V or II- VI semiconductor materials over a wafer of at least approximately 200 millimeters in diameter and possibly at least approximately 300 millimeters.

By the use of this type of substrate, a relatively inexpensive "handle" wafer overcomes the fragile nature of the compound semiconductor wafers by placing them over a relatively more durable and easy to fabricate base material. Therefore, an integrated circuit can be formed such that all electrical components, and particularly all active electronic devices, can be formed within the compound semiconductor material even though the substrate itself may include a Group IV semiconductor material. Fabrication costs for compound semiconductor devices should decrease because larger substrates can be processed more economically and more readily, compared to the relatively smaller and more fragile, conventional compound semiconductor wafers.

A composite integrated circuit may include components that provide electrical isolation when electrical signals are applied to the composite integrated circuit. The composite integrated circuit may include a pair of optical components, such as an optical source component and an optical detector component. An optical source component may be a light generating semiconductor device, such as an optical laser (e.g., the optical laser illustrated in FIG. 33), a photo emitter, a diode, etc. An optical detector component may be a light-sensitive semiconductor junction device, such as a photodetector, a photodiode, a bipolar junction, a transistor, etc.

A composite integrated circuit may include processing circuitry that is formed at least partly in the Group IV semiconductor portion of the composite integrated circuit. The processing circuitry is configured to communicate with circuitry external to the composite integrated circuit. The processing circuitry may be electronic circuitry, such as a microprocessor, RAM, logic device, decoder, etc. For the processing circuitry to communicate with external electronic circuitry, the composite integrated circuit may be provided with electrical signal connections with the external electronic circuitry. The composite integrated circuit may have internal optical communications connections for connecting the processing circuitry in the composite integrated circuit to the electrical connections with the external circuitry. Optical components in the composite integrated circuit may provide the optical communications connections which may electrically isolate the electrical signals in the communications connections from the processing circuitry. Together, the electrical and optical communications connections may be for communicating information, such as data, control, timing, etc.

A pair of optical components (an optical source component and an optical detector component) in the composite integrated circuit may be configured to pass information. Information that is received or transmitted between the optical pair may be from or for the electrical communications connection between the external circuitry and the composite integrated circuit. The optical components and the electrical communications connection may form a communications connection between the processing circuitry and the external circuitry while providing electrical isolation for the processing circuitry. If desired, a plurality of optical component pairs may be included in the composite integrated circuit for providing a plurality of communications connections and for providing isolation. For example, a composite integrated circuit receiving a plurality of data bits may include a pair of optical components for communication of each data bit.

In operation, for example, an optical source component in a pair of components may be configured to generate light (e.g., photons) based on receiving electrical signals from an electrical signal connection with the external circuitry. An optical detector component in the pair of components may be optically connected to the source component to generate electrical signals based on detecting light generated by the optical source component. Information that is communicated between the source and detector components may be digital or analog. If desired the reverse of this configuration may be used. An optical source component that is responsive to the on-board processing circuitry may be coupled to an optical detector component to have the optical source component generate an electrical signal for use in communications with external circuitry. A plurality of such optical component pair structures may be used for providing two-way connections. In some applications where synchronization is desired, a first pair of optical components may be coupled to provide data communications and a second pair may be coupled for communicating synchronization information.

For clarity and brevity, optical detector components that are discussed below are discussed primarily in the context of optical detector components that have been formed in a compound semiconductor portion of a composite integrated circuit. In application, the optical detector component may be formed in many suitable ways (e.g., formed from silicon, etc.).

A composite integrated circuit will typically have an electric connection for a power supply and a ground connection. The power and ground connections are in addition to the communications connections that are discussed above. Processing circuitry in a composite integrated circuit may include electrically isolated communications connections and include electrical connections for power and ground. In most known applications, power supply and ground connections are usually well- protected by circuitry to prevent harmful external signals from reaching the composite integrated circuit. A communications ground may be isolated from the ground signal in communications connections that use a ground communications signal.

FIG. 38 is a cross sectional view of a semiconductor structure 3800. The semiconductor structure 3800 permits combination of silicon devices and compound semiconductor devices on a single structure such as a monolithic integrated circuit. The semiconductor structure 3800 may be manufactured, for example, in accordance with any of the embodiments described herein. In one exemplary embodiment, however, the semiconductor structure 3800 is formed starting with a monocrystalline silicon substrate 3802. An interfacial or buffer layer 3804 overlies the silicon substrate 3802. An amoφhous oxide material overlies the monocrystalline silicon substrate and a monocrystalline perovskite oxide material overlies the amoφhous oxide material. A monocrystalline compound semiconductor material 3806 overlies the monocrystalline perovskite oxide material. In some embodiments, portions of the silicon substrate 3802 may be exposed and an additional layer of monocrystalline silicon may be formed so as to be generally coplanar with the monocrystalline compound semiconductor material 3806. In one embodiment, expitaxial monocrystalline silicon is grown. The monocrystalline compound semiconductor material 3806 and the monocrystalline silicon may be patterned using conventional photolithographic techniques to define devices such as a transistor 3810 including source/drain regions 3812, 3814. Materials such as metal 3816 and polysilicon may be deposited and patterned to form gates for the transistors and interconnect materials such as metal 3818 may be further deposited to connect associated devices and circuits.

In accordance with additional embodiments, FIGs. 39, 40, and 41 illustrate semiconductor structures using both a first side and a second side of a low cost semiconductor substrate such as a silicon wafer for manufacturing devices. Manufacturing techniques described above in conjunction with any of the embodiments disclosed above may be employed for manufacturing embodiments of FIGs. 39-41. FIG. 39 is a cross-sectional view of a semiconductor structure illustrating compound semiconductor technology integrated with silicon complimentary metal- oxide-semiconductor (CMOS) technology. This embodiment allows combination of high performance compound semiconductor electronic devices with high functionality silicon technology. In FIG. 39, a semiconductor structure 3900 includes a monocrystalline silicon substrate 3902, interfacial layers 3904 and a monocrystalline compound semiconductor layer 3906 formed on a first side 3908 of the semiconductor structure 3900. On a second side 3910 of the semiconductor structure 3900, silicon material 3912 includes silicon devices. The silicon material 3912 may be a portion of the silicon substrate 3902 or the silicon material 3912 may be grown epitaxially or may be formed in any other manner. The semiconductor structure 3900 is preferably a portion of a silicon wafer processed according to conventional silicon processing technology. On the first side 3908, the interfacial layer includes an amoφhous oxide material overlying the monocrystalline silicon substrate 3902. A monocrystalline perovskite oxide material overlies the amoφhous oxide material. A monocrystalline compound semiconductor material forms the layer 3906 overlying the monocrystalline perovskite oxide material of the interfacial layer 3904. On the second side 3910 of the semiconductor structure 3900, the silicon material 3912 may be processed to include one or more silicon devices. Thus, in the embodiment of FIG. 39, compound semiconductor devices may be formed on the first side 3908 of the semiconductor structure 3900. Electrical components on the second side 3910 of the semiconductor structure 3900 are associated with compound semiconductor devices on the first side of the semiconductor structure 3900. The electrical components may include one or more silicon devices including active devices such as transistors and passive devices such as capacitors, inductors and resistors. The electrical components on the second side 3910 preferably complement the compound semiconductor components on the first side 3908. For example, the second side devices may form a control circuit for the first side devices. Alternatively, the second side devices may implement one portion of a signal path, such as a modulator circuit, and the first side devices may implement a second portion of the signal path, such as a power amplifier. Alternatively, only a single device such as a large value metal-oxide-semiconductor (MOS) capacitor may be implemented on the second side in silicon for biasing a circuit such as a filter made of compound semiconductor devices on the first side. In the semiconductor structure 3900, a gallium arsenide field effect transistor

3914 has been formed. The source, gate and drain of the transistor 3914 are labeled S, G, and D respectively in FIG. 39. Other compound semiconductor devices such as power amplifiers, combiners, couplers, or heteroj unction bipolar transistors and other devices could be included as well. In addition to gallium arsenide, other compound semiconductor materials such indium phosphide may be used for the compound semiconductor material of the layer 3906. In addition, optical devices, such as lasers, including vertical cavity surface emitting lasers, light emitting diodes, photodetectors and other known devices may also be formed on the first side 3908 of the semiconductor structure 3900 in the monocrystalline compound semiconductor material. Any of the embodiments described herein may be implemented.

Any appropriate circuits or devices may be implemented on the second side 3910, using known silicon technology and circuit design techniques. In the illustrated embodiment, a portion of a CMOS logic gate is shown. The CMOS logic gate includes a p-channel transistor 3916 and an n-channel transistor 3918. The p-channel transistor 3916 is formed by forming an n-well 3920 in the monocrystalline silicon substrate 3902 and forming a p-well 3922 in the monocrystalline silicon substrate 3902. Source and drain regions are appropriately doped for the p-channel transistor 3916 and the n- channel 3918. In subsequent steps, polysilicon is deposited, patterned and doped to define gates of the transistors 3916, 3918. Metallization is performed by depositing metal to interconnect the transistors 3916, 3918 and other circuits of the silicon side, first side 3908.

To permit electrical communication between the first side 3908 and second side 3910, FIG. 39 shows a via 3924 formed in a semiconductor structure 3900. The via is formed in any suitable manner, such as by etching a hole 3926 in the semiconductor structure 3900, and subsequently depositing metal on at least a portion of the compound semiconductor layer 3906 on the first side 3908 and at least a portion of the silicon layer 3912 on the second side 3910. In the illustrated embodiment, an insulating dielectric 3932 has been formed on an inner surface 3930 of the hole 3926. A conductive material such as metal 3928 is formed on the dielectric, electrically coupling metallization 3934 of the first side 3908 and metallization 3936 of the second side 3910. The dielectric in this embodiment insulates the metal 3928 from the silicon substrate 3902. The dielectric 3932 may be an insulating layer such as silicon dioxide or silicon nitride or a combination of such layers. This structure creates a plated through via 3924. The etching of the hole for the via may take place starting from either side of the semiconductor structure 3900. The semiconductor structure may include any number of vias 3924 for communication of power and ground signals along with time varying signals. The embodiment of FIG. 39 is beneficial because blanket epitaxial layers may be grown separately on respective sides of the wafer or semiconductor structure 3900. Epitaxial silicon may be grown on the second side 3910 of the wafer or semiconductor structure 3900 and an epitaxial layer of compound semiconductor material may be grown on the first side 3908 of the semiconductor structure 3900. This eliminates the need for selective epitaxy, which can be challenging to form, can be low yielding and can be more unreliable than blanket film growth. In the embodiment of FIG. 39, a bare wafer surface is available for blanket material growth on either or both sides of the wafer. The end result is a planar starting surface on each side of the wafer amenable to definition of lithographic geometries typically required for high performance devices. In addition, optimum processing can be employed separately for each of the technologies on its own surface. An exception is that both sides will likely be exposed to all thermal cycles during each process. Finally, die size and costs are reduced as all of the available surface area of the wafer is effectively and efficiently utilized. In an alternative embodiment, a layer of monocrystalline compound semiconductor material is formed on the second side 3910 of the semiconductor structure 3900 as well. In this embodiment, the first side 3908 and the second side 3910 of the wafer are processed in a generally similar fashion. That is, starting with the monocrystalline silicon substrate 3902, an amoφhous oxide material is formed overlying the monocrystalline silicon substrate and a monocrystalline perovskite oxide material is formed overlying the amoφhous oxide material to define interfacial layers on both surfaces of the wafer. Compound semiconductor portions of a monocrystalline compound semiconductor material such as gallium arsenide or indium phosphide are formed overlying the monocrystalline perovskite oxide material. The monocrystalline compound semiconductor material may be patterned through selective epitaxy and formed on the monocrystalline perovskite oxide material. Silicon portions of silicon material may be used to form silicon devices. It is envisioned that the monocrystalline compound semiconductor material will appear as islands in the sea of silicon material, although the relative proportions of the two materials will vary. This may be done on one or both sides 3908, 3910 of the semiconductor structure 3900. This patterning defines a silicon portion including one or more silicon sections separate from the compound semiconductor portion formed on the surface of the semiconductor structure.

This embodiment allows high performance compound semiconductor devices such as gallium arsenide or indium phosphide based field effect transistors or bipolar transistors, or any of the other devices described above, including optical devices, to be combined with silicon-based devices which could be used for forming signal processing, control and logic functions. For communication between the first side 3908 and the second side 3910 of the semiconductor structure 3900, vias such as the via 3924 illustrated in FIG. 39 may be formed. FIG. 40 is a cross-section of a semiconductor structure 4000. FIG. 40 illustrates implementation of a multiple cascade junction solar polar cell using double sided wafer integration.

The semiconductor structure 4000 may be manufactured according to any of the embodiments described above. In one embodiment, the semiconductor structure 4000 includes a monocrystalline silicon substrate 4002, interfacial layers 4004, 4006 formed on the monocrystalline silicon substrate and monocrystalline compound semiconductor material layers 4008, 4010 formed on the interfacial layers. The interfacial layers 4004, 4006, are formed on the respective sides of the semiconductor structure 4000. The first interfacial layer 4004 is formed on a first side 4012 of the semiconductor structure 4000. The second interfacial layer 4006 is formed on a second side 4014 of the semiconductor structure 4000. In a typical embodiment, the semiconductor structure 4000 is formed on a silicon wafer. The embodiment illustrated in FIG. 40 shows a cross-section of all or a portion of a silicon wafer. The interfacial layers 4004, 4006 may be formed using any of the techniques described above. In one embodiment, an amoφhous oxide material overlies the monocrystalline silicon substrate 4002 and the monocrystalline perovskite oxide material overlies the amoφhous oxide material to form the respective interfacial layers 4004.

The monocrystalline compound semiconductor layers 4008, 4010 are formed on the interfacial layers 4004, 4006, respectively, one per side 4012, 4014 of the semiconductor structure. The monocrystalline compound semiconductor material used may be any suitable materials, including those described above in connection with other embodiments. In one embodiment, the monocrystalline compound semiconductor material overlies the monocrystalline perovskite oxide material of the respective interfacial layers 4004, 4006 on each side 4012, 4014 of the semiconductor structure. In accordance with the present embodiment, a relatively wide bandgap monocrystalline compound semiconductor material is chosen for the compound semiconductor layer 4008 of the first side 4012 of the semiconductor structure 4000. A relatively narrow bandgap monocrystalline compound semiconductor material is chosen for the compound semiconductor material 4010 of the second side 4014 of the semiconductor structure 4000.

A relatively wide bandgap semiconductor material has a bandgap wider than the bandgap of the material forming the substrate 4002, in this case silicon. Silicon has a bandgap of 1.12 eV. Examples are aluminum gallium arsenide and gallium arsenide. A relatively narrow bandgap semiconductor material has a bandgap which is narrower than that of the substrate 4002 in this case silicon. Examples of a suitable relatively narrow bandgap semiconductor material are indium phosphide or germanium.

The relatively wide bandgap semiconductor material 4008 includes layers of doped semiconductor material. A first layer 4020 is doped p-type. A second layer 4022 is doped n-type. A third layer 4024 is doped p-type. Thus, there is a p-n junction 4026 between the p-type layer 4024 and the n-type layer 4022. A tunnel junction 4028 is formed between the n-type layer 4022 and the p-type layer 4020. A layer 4030 of metal is formed on the p-type layer 4024 and patterned to define metal contacts 4032 to the relatively wide bandgap semiconductor material 4008. The relatively narrow bandgap semiconductor layer 4010 also includes three layers. A first layer 4040 is doped n-type. A second layer 4042 is doped p-type. A third layer 4044 is doped n-type. Thus, a p-n junction 4046 is formed between the p- type layer 4042 and the n-type layer 4044. A tunnel junction 4048 is formed between the n-type layer 4040 and the p-type layer 4042. A layer 4050 of metal is deposited on the n-type semiconductor layer 4044. The metal layer 4050 forms an electrical contact with relatively narrow bandgap semiconductor layer 4010.

The semiconductor structure 4000 forms a stacked triple junction solar cell. This application for a double sided semiconductor structure leverages the differing photoresponses of p-n junctions fabricated in three different materials, each with a different bandgap. The overall energy conversion efficiency of a solar cell can be increased by cascading p-n junctions of different bandgaps arranged with larger bandgaps in front of the series and smaller bandgaps at the back. Each stage of the cascade captures a portion of the incident spectrum and converts it to electrical energy. The larger bandgaps pick off the higher energy photons at shorter wavelengths and pass the longer wavelength flux onto the subsequent junctions. The improvements in efficiency come from the higher voltage generated by cascading of multiple p-n junctions. In general, the more stages, the greater the potential efficiency of the solar cell. The embodiments described above, together with double sided wafer integration of semiconductor materials, allow implementation of the triple junction, cascaded solar cell illustrated in FIG. 40. The p-n junction 4026 in the relatively wide bandgap semiconductor material 4008 is grown on the first side 4012 of the silicon substrate 4002. The first side 4012 is the incident side of the solar cell, as illustrated by the arrows in FIG. 40. A p-n junction 4046 is formed in the relatively narrow bandgap semiconductor layer 4010 on the second side 4014 of the semiconductor structure 4000. The silicon substrate 4002 contains a third p-n junction 4052. The junctions 4026, 4046, 4052 are all oriented in the same direction, meaning that the junctions are all generally normal to the incident light and the p-type layer is proximate the incident side 4012 of the semiconductor structure. The tunnel junctions 4028, 4048 are highly doped and are required between the selection junctions to allow current to flow readily through the series of junctions. These tunnel junctions may be located entirely in the silicon substrate 4002 or entirely in the monocrystalline compound semiconductor layers 4008, 4010, as shown in the embodiment of FIG. 40, or a combination of these two. The metalization is patterned with metal contacts 4032 on the incident side 4012 to allow the incident flux to pass through. A full-surface metal contact 4050 may be used on the back side 4014.

FIG. 41 is a cross-sectional view of a semiconductor structure 4100. The semiconductor structure may be manufactured according to any of the embodiments described above. In one embodiment, the semiconductor structure includes a monocrystalline silicon substrate 4102, interfacial layers 4104, 4106 formed on a first side 41 12 and a second side 4114 of the semiconductor structure 4100. The interfacial layers 4104, 4106 include an amoφhous oxide material overlying the monocrystalline silicon substrate and a monocrystalline perovskite oxide material overlying the amoφhous oxide material. On the first side 41 12, a layers 4108 of monocrystalline compound semiconductor material overlies the monocrystalline perovskite oxide material of the interfacial layer 4104. Layers 4108 comprise an active layer having cladding layers on either side. Similarly, the second side 41 14 of the semiconductor structure 4100, a layer 4110 of monocystalline compound semiconductor material overlies the monocrystalline perovskite oxide material of the interfacial layer 4106. As noted, other embodiments consistent with those described above may be substituted to form the semiconductor structure 4100.

On the right hand side of FIG. 41 , a vertical cavity surface emitting laser (VCSEL) 4120 is formed in part using the monocrystalline compound semiconductor material layer 4110. Typically, other layers besides a compound semiconductor layer such as layer 41 10 are required for forming a VCSEL. The design and fabrication of such a device are well within the purview of those ordinarily skilled in the art. In the illustrated embodiment, layer 4110 comprises compound semiconductor epitaxially formed on the interfacial layer 4106. As indicated in the figure, the VCSEL 4120 emits light through the semiconductor structure 4100 in the direction of the first side 4112. At the wavelengths of interest, the semiconductor structure 4100 is transparent to the emitted light. Disposed on the first side 4112 of a semiconductor structure 4100 is a photo- pumped semiconductor optical amplifier (SOA) 4122. The SOA 4122 is formed in the layer 4108 of monocrystalline compound semiconductor material of the first side 4112. The SOA 4122 responds to the light emitted by the VCSEL 4120 by amplifying the light and producing an optical output as indicated in FIG. 41. On the left hand side of FIG. 41, a VCSEL 4124 is formed in the layer 41 10 of monocrystalline compound semiconductor material on the second side 41 14 of the semiconductor structure 4100. The VCSEL 4124 emits light through the semiconductor structure 4100. On the first side 4112, a photo-pumped micro-disk laser 4126 has been formed in the layer 4108 of monocrystalline compound semiconductor material on the first side 41 12 of the semiconductor structure 4100. The light emitted by the VCSEL 4124 passes through the silicon substrate 4102 and in incident on the laser 4126.

The semiconductor structure 4100 thus forms a photonic integrated circuit. Photonic integrated circuits use beams of light (photons) to process information and signals in a manner analogous to the way electrons are used in electronic circuits. Photonic integrated circuits can be fabricated from a variety of materials. In many embodiments, the preferred material is indium phosphide and related materials. Many of the critical operations are performed by passive elements such as waveguides, splitters, combiners, resonators, and so forth. In order to expand the capabilities and complexities of photonic integrated circuits, active optical devices are required. One such active device is the semiconductor optical amplifier, such as the SOA 4122 of FIG. 41.

The SOA amplifies an optical signal via a single pass through the active section of a waveguide. The SOA may be electrically driven, such as via a p-n junction diode or optically pumped with a laser diode. Use of a vertical cavity surface emitting laser (VCSEL) to pump an SOA promises improved linearity and more uniform spectral response.

FIG. 41 illustrates integration of an SOA and its photo-pumping VCSEL. In the embodiment of FIG. 41, the front side 4112 of the semiconductor structure includes the photonic integrated circuit components, including SOAs such as SOA 4122. Devices such as this may be fabricated in material systems such as indium phosphide grown on a silicon substrate, as illustrated in FIG. 41. Such photonic devices could operate at a wavelength of 1.5 micrometers. On the back or second side 4114, one or more VCSELs such as the VSCEL 4120 could be grown and fabricated, as illustrated in FIG. 41. In order for the VCSEL emission to be transmitted through the silicon substrate 4102 without absoφtion, the wavelength of the emission must be graded at about 1.2 micrometers. 1.3 micrometer emitting VCSEL with an active layer of indium gallium arsenide nitride and a mirror structure of a material combining gallium arsenide and aluminum gallium arsenide has been developed. The double-sided integration approach allows two critical optical elements, the

SOA 4122 and the VCSEL 4120 to be aligned to a high degree of accuracy. This ensures optimum performance of the system. This further eliminates the labor intensive process of aligning and attaching separately fabricated VCSELs through the device including SOAs, as have been required in the past. SOAs are not the only active optical devices that could be pumped in this manner. As illustrated in FIG. 41, other devices such as photo-pumped micro-disk or ring lasers or micro-cavity lasers may also be optically pumped in place of electrical excitation.

From the foregoing, it can be seen that the present embodiments provide an improved semiconductor structure and method performing such a semiconductor structure. The previously unused back side of a silicon wafer may now be used for forming active devices which may be in electrical communication with devices on the front side of the wafer. Moreover, in accordance with the illustrated embodiments, differing technologies, such as silicon with its high levels of integration and functionality, may be combined with a compound semiconductor materials, such as Group HI - V materials. This allows materials and devices having particular properties to be optimally combined in a single structure. .

In the foregoing specification, the invention has been described with reference to specific embodiments. However, one of ordinary skill in the art appreciates that various modifications and changes can be made without departing from the scope of the present invention as set forth in the claims below. Accordingly, the specification and figures are to be regarded in an illustrative rather than a restrictive sense, and all such modifications are intended to be included within the scope of present invention. Benefits, other advantages, and solutions to problems have been described above with regard to specific embodiments. However, the benefits, advantages, solutions to problems, and any element(s) that may cause any benefit, advantage, or solution to occur or become more pronounced are not to be construed as a critical, required, or essential features or elements of any or all the claims. As used herein, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus.

Claims

1. A semiconductor structure comprising: a monocrystalline silicon substrate; an amoφhous oxide material overlying the monocrystalline silicon substrate on a first side of the semiconductor structure; a monocrystalline perovskite oxide material overlying the amoφhous oxide material on the first side of the semiconductor structure; a monocrystalline compound semiconductor material overlying the monocrystalline perovskite oxide material on the first side of the semiconductor structure; and compound semiconductor devices formed in the monocrystalline compound semiconductor material on the first side of the semiconductor structure and silicon devices formed on a second side of the semiconductor structure.

2. The semiconductor structure of claim 1 further comprising: epitaxial silicon formed on the second side of the semiconductor structure.

3. The semiconductor structure of claim 2 further comprising: a compound semiconductor device on the first side of the semiconductor structure; electrical components associated with the compound semiconductor device formed on the second side of the semiconductor structure, the electrical components including one or more silicon devices.

4. The semiconductor structure of claim 3 wherein the compound semiconductor device comprises gallium arsenide field effect transistors.

5. The semiconductor structure of claim 3 wherein the compound semiconductor device comprises one of a gallium arsenide field effect transistor, a vertical cavity surface emitting laser (VCSEL), a light emitting diode (LED) and a photo-detecting diode.

6. The semiconductor structure of claim 4 wherein the electrical components a complementary metal-oxide-semiconductor (CMOS) circuit.

7. The semiconductor structure of claim 1 further comprising an electrical via through the semiconductor structure coupling at least one compound semiconductor device and at least one silicon device.

8. The semiconductor structure of claim 1 further comprising: first interconnecting metallization formed on the first side of the semiconductor structure and second interconnecting metallization formed on the second side of the semiconductor structure; and one or more electrically conducting vias formed through the semiconductor structure between the first interconnecting metallization and the second interconnecting metallization.

9. The semiconductor structure of claim 1 further comprising: silicon devices formed in a silicon portion of the first side of the semiconductor structure; and compound semiconductor devices formed in the monocrystalline compound semiconductor material of the first side of the semiconductor structure.

10. A semiconductor structure comprising: a monocrystalline silicon substrate; an amoφhous oxide material overlying the monocrystalline silicon substrate on a first side of the semiconductor structure and on a second side of the semiconductor structure; a monocrystalline perovskite oxide material overlying the amoφhous oxide material on the first side of the semiconductor structure and on the second side of the semiconductor structure; and a monocrystalline compound semiconductor material overlying the monocrystalline perovskite oxide material on the first side of the semiconductor structure and on the second side of the semiconductor structure.

1 1. The semiconductor structure of claim 10 further comprising: silicon devices formed in a silicon portion of the first side and a silicon portion of the second side of the silicon structure; and compound semiconductor devices formed in a compound semiconductor portion of the first side and a compound semiconductor portion of the second side of the silicon structure.

12. The semiconductor structure of claim 10 further comprising: on the first side of the semiconductor structure, a first silicon portion including one or more silicon sections and a first compound semiconductor portion formed of the monocrystalline compound semiconductor material; and on the second side of the semiconductor structure, a second silicon portion including one or more silicon sections and a second compound semiconductor portion formed of the monocrystalline compound semiconductor material.

13. The semiconductor structure of claim 12 further comprising: on the first side of the semiconductor structure, one or more active silicon devices formed in the first silicon portion and one or more compound semiconductor devices formed in the first compound semiconductor portion; on the second side of the semiconductor structure, one or more active silicon devices formed in the second silicon portion and one or more compound semiconductor devices formed in the second compound semiconductor portion.

14. The semiconductor structure of claim 10 further comprising: first interconnecting metallization formed on the first side of the semiconductor structure and second interconnecting metallization formed on the second side of the semiconductor structure; and one or more electrically conducting vias formed through the semiconductor structure between the first interconnecting metallization and the second interconnecting metallization.

15. The semiconductor structure of claim 10 further comprising: one or more photonic devices formed on the first side of the semiconductor structure; one or more photonic devices formed on the second side of the semiconductor structure; and an optical via through the semiconductor structure for communication between first side photonic devices and second side photonic devices.

16. A semiconductor structure comprising: a monocrystalline silicon substrate; an amoφhous oxide material overlying the monocrystalline silicon substrate on a first side of the semiconductor structure and on a second side of the semiconductor structure; a monocrystalline perovskite oxide material overlying the amoφhous oxide material on the first side of the semiconductor structure and on the second side of the semiconductor structure; and a first monocrystalline compound semiconductor material overlying the monocrystalline perovskite oxide material on the first side of the semiconductor structure and a second monocrystalline compound semiconductor material overlying the monocrystalline perovskite oxide material on the second side of the semiconductor structure, the first monocrystalline compound semiconductor material being different from the second monocrystalline compound semiconductor material.

17. The semiconductor structure of claim 16 further comprising: silicon devices formed in a silicon portion of the first side of the semiconductor structure; and first technology semiconductor devices formed in the first monocrystalline compound semiconductor material of the first side of the semiconductor structure.

18. The semiconductor structure of claim 17 further comprising: silicon devices formed in a silicon portion of the second side of the semiconductor structure; and second technology semiconductor devices formed in the second monocrystalline compound semiconductor material of the second side of the semiconductor structure.

19. The semiconductor structure of claim 16 further comprising: one or more electrical vias between the first side and the second side of the semiconductor structure.

20. A semiconductor structure comprising: a monocrystalline silicon substrate; an amoφhous oxide material overlying the monocrystalline silicon substrate on a first side and a second side of the semiconductor structure; a monocrystalline perovskite oxide material overlying the amoφhous oxide material on the first side and the second side of the semiconductor structure; a relatively wide bandgap monocrystalline semiconductor material overlying the monocrystalline perovskite oxide material on the first side of the semiconductor structure; and a relatively narrow bandgap monocrystalline semiconductor material overlying the monocrystalline perovskite oxide material on the second side of the semiconductor structure.

21. The semiconductor structure of claim 20 wherein the a relatively wide bandgap monocrystalline semiconductor material has a bandgap wider than a bandgap of silicon.

22. The semiconductor structure of claim 21 wherein the a relatively wide bandgap monocrystalline semiconductor material comprises one of gallium arsenide and aluminum gallium arsenide.

23. The semiconductor structure of claim 21 wherein the a relatively narrow bandgap monocrystalline semiconductor material has a bandgap narrower than the bandgap of silicon.

24. The semiconductor structure of claim 22 wherein the a relatively narrow bandgap monocrystalline semiconductor material comprises one of indium phosphide and germanium.

25. The semiconductor structure of claim 20 further comprising: a first p-n junction in the relatively wide bandgap monocrystalline semiconductor material; a second p-n junction in the relatively narrow bandgap monocrystalline semiconductor material; and a third p-n junction in the monocrystalline silicon substrate, the first p-n junction, the second p-n junction and the third p-n junction having a common orientation.

26. The semiconductor structure of claim 25 further comprising: a first tunnel junction between the first p-n junction and the third p-n junction; and a second tunnel junction between the second p-n junction and the third p-n junction.

27. The semiconductor structure of claim 20 further comprising: first metallization in electrical contact with the relatively wide bandgap monocrystalline semiconductor material; and second metallization in electrical contact with the relatively narrow bandgap monocrystalline semiconductor material.

28. A semiconductor structure comprising: a monocrystalline silicon substrate; amoφhous oxide material overlying the monocrystalline silicon substrate on a first side and a second side of the semiconductor structure; monocrystalline perovskite oxide material overlying the amoφhous oxide material on the first side and the second side of the semiconductor structure; monocrystalline compound semiconductor material overlying the monocrystalline perovskite oxide material on the first side and the second side of the semiconductor structure; a photo-pumped semiconductor optical amplifier (SOA) formed of the monocrystalline compound semiconductor material of the second side; and a vertical cavity surface emitting laser (VCSEL) formed of the monocrystalline compound semiconductor material of the first side, the VCSEL configured to emit light to pump the SOA through the semiconductor structure substantially without absoφtion of the light in the semiconductor structure,

29. The semiconductor structure of claim 28 wherein the monocrystalline compound semiconductor material of the second side of the semiconductor structure comprises indium phosphide.

30. A semiconductor structure comprising: a monocrystalline silicon substrate; amoφhous oxide material overlying the monocrystalline silicon substrate on a first side and a second side of the semiconductor structure; monocrystalline perovskite oxide material overlying the amoφhous oxide material on the first side and the second side of the semiconductor structure; monocrystalline compound semiconductor material overlying the monocrystalline perovskite oxide material on the first side and the second side of the semiconductor structure; a photo pumped laser formed of the monocrystalline compound semiconductor material of the second side; and a vertical cavity surface emitting laser (VCSEL) formed of the monocrystalline compound semiconductor material of the first side, the VCSEL configured to emit light to pump the laser through the semiconductor structure substantially without absoφtion of the light in the semiconductor structure,

31. A process for fabricating a semiconductor structure, the process comprising: providing a monocrystalline silicon substrate having a first side and a second side; depositing on the first side of the monocrystalline silicon substrate a monocrystalline perovskite oxide film overlying the monocrystalline silicon substrate, the film having a thickness less than a thickness of the material that would result in strain-induced defects; forming on the first side of the monocrystalline silicon substrate an amoφhous oxide interface layer containing at least silicon and oxygen at an interface between the monocrystalline perovskite oxide film and the monocrystalline silicon substrate; epitaxially forming on the first side of the monocrystalline silicon substrate a monocrystalline compound semiconductor layer overlying the monocrystalline perovskite oxide film; and epitaxially forming on the second side of the monocrystalline silicon substrate a monocrystalline silicon layer.

32. The process of claim 31 further comprising: etching a hole through the semiconductor structure; and depositing metal: on at least a portion of the monocrystalline compound semiconductor layer on the first side of the semiconductor structure, on at least a portion of the monocrystalline silicon layer on the second side of the semiconductor structure and on an inner surface of the hole.

33. A process for fabricating a semiconductor structure, the process comprising: providing a monocrystalline silicon substrate having a first side and a second side; depositing on the first side and the second side of the monocrystalline silicon substrate a monocrystalline perovskite oxide film overlying the monocrystalline silicon substrate, the film having a thickness less than a thickness of the material that would result in strain-induced defects; forming on the first side and the second side of the monocrystalline silicon substrate an amoφhous oxide interface layer containing at least silicon and oxygen at an interface between the monocrystalline perovskite oxide film and the monocrystalline silicon substrate; and epitaxially forming on the first side and the second side of the monocrystalline silicon substrate a monocrystalline compound semiconductor layer overlying the monocrystalline perovskite oxide film.