WO2002093202A3 - Improved apparatus, system and method for applying optical gradient forces - Google Patents

Improved apparatus, system and method for applying optical gradient forces Download PDF

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Publication number
WO2002093202A3
WO2002093202A3 PCT/US2002/015351 US0215351W WO02093202A3 WO 2002093202 A3 WO2002093202 A3 WO 2002093202A3 US 0215351 W US0215351 W US 0215351W WO 02093202 A3 WO02093202 A3 WO 02093202A3
Authority
WO
WIPO (PCT)
Prior art keywords
improved apparatus
applying optical
optical gradient
gradient forces
forces
Prior art date
Application number
PCT/US2002/015351
Other languages
French (fr)
Other versions
WO2002093202A2 (en
Inventor
David Grier
Ward Lopes
Eric Dufresne
Original Assignee
Arryx Inc
David Grier
Ward Lopes
Eric Dufresne
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Arryx Inc, David Grier, Ward Lopes, Eric Dufresne filed Critical Arryx Inc
Priority to JP2002589827A priority Critical patent/JP2004534661A/en
Priority to CA002447472A priority patent/CA2447472A1/en
Priority to EP02734431A priority patent/EP1395856A4/en
Publication of WO2002093202A2 publication Critical patent/WO2002093202A2/en
Publication of WO2002093202A3 publication Critical patent/WO2002093202A3/en
Priority to US10/701,324 priority patent/US7324282B2/en

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/32Micromanipulators structurally combined with microscopes

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
  • Diffracting Gratings Or Hologram Optical Elements (AREA)
  • Microscoopes, Condenser (AREA)
  • Micromachines (AREA)
  • Manipulator (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Abstract

An apparatus to produce and monitor at least two optical traps (1002, 1004) comprising a phase patterning element (12), a single transfer lens (L1), a beam splitter (51).
PCT/US2002/015351 2001-05-14 2002-05-14 Improved apparatus, system and method for applying optical gradient forces WO2002093202A2 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2002589827A JP2004534661A (en) 2001-05-14 2002-05-14 Improved apparatus, system and method for applying a light gradient force
CA002447472A CA2447472A1 (en) 2001-05-14 2002-05-14 Improved apparatus, system and method for applying optical gradient forces
EP02734431A EP1395856A4 (en) 2001-05-14 2002-05-14 Improved apparatus, system and method for applying optical gradient forces
US10/701,324 US7324282B2 (en) 2002-05-14 2003-11-04 Apparatus, system and method for applying optical gradient forces

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US85599501A 2001-05-14 2001-05-14
US09/855,995 2001-05-14

Related Child Applications (2)

Application Number Title Priority Date Filing Date
US10/701,324 Continuation US7324282B2 (en) 2002-05-14 2003-11-04 Apparatus, system and method for applying optical gradient forces
US10/701,324 Continuation-In-Part US7324282B2 (en) 2002-05-14 2003-11-04 Apparatus, system and method for applying optical gradient forces

Publications (2)

Publication Number Publication Date
WO2002093202A2 WO2002093202A2 (en) 2002-11-21
WO2002093202A3 true WO2002093202A3 (en) 2003-02-27

Family

ID=25322642

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2002/015351 WO2002093202A2 (en) 2001-05-14 2002-05-14 Improved apparatus, system and method for applying optical gradient forces

Country Status (5)

Country Link
EP (1) EP1395856A4 (en)
JP (2) JP2004534661A (en)
CN (1) CN100353188C (en)
CA (1) CA2447472A1 (en)
WO (1) WO2002093202A2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102240848A (en) * 2011-06-15 2011-11-16 中科中涵激光设备(福建)股份有限公司 Method for adjusting laser beam to generate dynamic transverse displacement

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BR0309112A (en) * 2002-04-10 2005-06-28 Arryx Inc Apparatus, system and method for generating and controlling optical traps for handling small particles.
WO2005023391A2 (en) * 2003-07-31 2005-03-17 Arryx, Inc. Multiple laminar flow-based particle and cellular separation with laser steering
GB0416498D0 (en) 2004-07-23 2004-08-25 Council Cent Lab Res Councils Optically controllable device
US20070160175A1 (en) * 2005-09-23 2007-07-12 Lang Matthew J Systems and methods for force-fluorescence microscopy
JP5686408B2 (en) * 2011-01-31 2015-03-18 独立行政法人産業技術総合研究所 Fine particle array method and apparatus
JP2013098262A (en) * 2011-10-28 2013-05-20 Canon Inc Optical device, position detection device, and microscope device
JP5979536B2 (en) * 2012-05-09 2016-08-24 国立研究開発法人産業技術総合研究所 Three-dimensional operation device for minute objects
US11392014B2 (en) 2017-12-15 2022-07-19 Nec Corporation Projection device, interface device, and projection method
CN110471187B (en) * 2019-08-20 2021-07-30 济南大学 Device and method for generating three-dimensional array bottle-shaped light beams in hexagonal close-packed distribution

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6055106A (en) * 1998-02-03 2000-04-25 Arch Development Corporation Apparatus for applying optical gradient forces
US6416190B1 (en) * 2001-04-27 2002-07-09 University Of Chicago Apparatus for using optical tweezers to manipulate materials

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4487324B2 (en) * 1998-08-31 2010-06-23 株式会社ニコン Microscope equipment
JP3102523B2 (en) * 1992-10-12 2000-10-23 日本電信電話株式会社 Fine particle array control method
JPH06160728A (en) * 1992-11-17 1994-06-07 Nikon Corp Microlaser equipment
JP3311083B2 (en) * 1993-05-26 2002-08-05 オリンパス光学工業株式会社 Fine adjustment device for microscope observation
US5445011A (en) * 1993-09-21 1995-08-29 Ghislain; Lucien P. Scanning force microscope using an optical trap
WO1995014299A1 (en) * 1993-11-19 1995-05-26 Sony Corporation Optical pickup apparatus
JP3489646B2 (en) * 1996-05-21 2004-01-26 日本電信電話株式会社 Measurement method of particle displacement by light radiation pressure
US5939716A (en) * 1997-04-02 1999-08-17 Sandia Corporation Three-dimensional light trap for reflective particles
JP3346374B2 (en) * 1999-06-23 2002-11-18 住友電気工業株式会社 Laser drilling machine

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6055106A (en) * 1998-02-03 2000-04-25 Arch Development Corporation Apparatus for applying optical gradient forces
US6416190B1 (en) * 2001-04-27 2002-07-09 University Of Chicago Apparatus for using optical tweezers to manipulate materials

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP1395856A4 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102240848A (en) * 2011-06-15 2011-11-16 中科中涵激光设备(福建)股份有限公司 Method for adjusting laser beam to generate dynamic transverse displacement

Also Published As

Publication number Publication date
JP2008229837A (en) 2008-10-02
JP2004534661A (en) 2004-11-18
CA2447472A1 (en) 2002-11-21
JP5134389B2 (en) 2013-01-30
CN1509415A (en) 2004-06-30
EP1395856A2 (en) 2004-03-10
EP1395856A4 (en) 2006-01-18
CN100353188C (en) 2007-12-05
WO2002093202A2 (en) 2002-11-21

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