WO2001008219A1 - Semiconductor module - Google Patents

Semiconductor module Download PDF

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Publication number
WO2001008219A1
WO2001008219A1 PCT/DE2000/002354 DE0002354W WO0108219A1 WO 2001008219 A1 WO2001008219 A1 WO 2001008219A1 DE 0002354 W DE0002354 W DE 0002354W WO 0108219 A1 WO0108219 A1 WO 0108219A1
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WO
WIPO (PCT)
Prior art keywords
semiconductor module
support plate
metal support
module according
substrates
Prior art date
Application number
PCT/DE2000/002354
Other languages
German (de)
French (fr)
Inventor
Manfred Loddenkötter
Original Assignee
eupec Europäische Gesellschaft für Leistungshalbleiter mbH & Co. KG
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Application filed by eupec Europäische Gesellschaft für Leistungshalbleiter mbH & Co. KG filed Critical eupec Europäische Gesellschaft für Leistungshalbleiter mbH & Co. KG
Publication of WO2001008219A1 publication Critical patent/WO2001008219A1/en

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/12Mountings, e.g. non-detachable insulating substrates
    • H01L23/13Mountings, e.g. non-detachable insulating substrates characterised by the shape
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0271Arrangements for reducing stress or warp in rigid printed circuit boards, e.g. caused by loads, vibrations or differences in thermal expansion
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • H05K1/0306Inorganic insulating substrates, e.g. ceramic, glass
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/14Structural association of two or more printed circuits
    • H05K1/142Arrangements of planar printed circuit boards in the same plane, e.g. auxiliary printed circuit insert mounted in a main printed circuit
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/09Shape and layout
    • H05K2201/09009Substrate related
    • H05K2201/09018Rigid curved substrate
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/09Shape and layout
    • H05K2201/09209Shape and layout details of conductors
    • H05K2201/09654Shape and layout details of conductors covering at least two types of conductors provided for in H05K2201/09218 - H05K2201/095
    • H05K2201/09745Recess in conductor, e.g. in pad or in metallic substrate
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/0058Laminating printed circuit boards onto other substrates, e.g. metallic substrates
    • H05K3/0061Laminating printed circuit boards onto other substrates, e.g. metallic substrates onto a metallic substrate, e.g. a heat sink
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/341Surface mounted components

Definitions

  • the invention relates to a semiconductor module consisting of a metal carrier plate with an upper surface and a lower surface, a heat sink on which the metal carrier plate is fastened via its lower surface, at least one heat-conducting and electrically insulating substrate which fastens on the upper surface of the metal carrier plate is, as well as several semiconductor components that are applied to the substrate.
  • Such semiconductor modules are generally known. In order to protect semiconductor modules from being destroyed by the resulting heat loss, good heat-conductive contact between the metal carrier plates and the heat sinks is required.
  • the metal support plate of the semiconductor module is designed in relation to the flat surface of the heat sink as a convexly curved surface, preferably as a spherical surface, so that when the metal support plate is fixed to the side of the heat sink in question, the metal support plate is pressed and fixed to the heat sink under mechanical tension becomes.
  • this convex design of the metal support plate has proven to be advantageous.
  • a known method for convex deformation of the metal support plate is e.g. described in DE 39 40 933 AI
  • metal support plates made of copper with a base area of up to 60 x 120 mm can still be formed with a thickness of 3 mm. Contours and recesses required in the metal carrier plate are punched. Convex surface profiles are produced by bending dies.
  • this object is achieved by a semiconductor module of the type mentioned at the outset, which is characterized in that one or more recesses are made in the metal carrier plate.
  • the mechanical stresses between the ceramic substrate and the metal support plate are drastically reduced when mounted on the heat sink.
  • the segments formed by the recesses can be individually convexly deformed, so that there is no danger that the ceramic substrates located in the modules will be destroyed by different coefficients of thermal expansion. This makes it possible to manufacture semiconductor modules that have a very inexpensive transition resistance.
  • the size of the segments can be determined by a corresponding number of recesses, so that the size of the metal support plate can, in principle, be of any size.
  • Another advantage of the invention consists in cost-effective manufacturing processes and materials.
  • a plurality of substrates which are preferably metallized on both sides, on the one hand to facilitate assembly on the metal support plate and on the other hand to be able to apply the semiconductor components in a structured manner, are fastened to the upper surface of the metal support plate.
  • the attachment is preferably carried out via a soft solder layer.
  • ⁇ X ⁇ x ⁇ T x 1
  • ⁇ X denotes the difference of the linear expansion and ⁇ the difference of the linear expansion coefficients of the ceramic substrate and the metal support plate
  • ⁇ T the temperature difference of the arrangement between the melting temperature of the solder and the room temperature and 1 die Long of the ceramic substrate to be applied
  • a solder In order to keep the difference in temperature as low as possible during the soldering process and after the arrangement has cooled, a solder must be used which has a low melting temperature, but on the other hand is not so low that the heat of loss which occurs later when the semiconductor module is in operation dissolves the solder melts. Melting temperatures of approx. 180 ° C are common. However, this measure is no longer sufficient if larger ceramic substrates are to be used, since the ceramic substrate lengths 1 likewise enter into the relationship for the difference in the linear expansion of two different materials. It is therefore very convenient to use several smaller ceramic substrates instead of a single large ceramic substrate in order to dimension the length 1 as desired.
  • the size of the ceramic substrates is advantageously adapted to the size or shape of the segments formed by the recess.
  • Gaps are then typically provided between the individual ceramic substrates.
  • the individual ceramic substrates it is also conceivable for the individual ceramic substrates to be soldered onto the metal carrier plate in abutting fashion.
  • the configurations of the segments are adapted to the arrangement of the holes in the metal support plate for attachment to the heat sink.
  • a screw is provided adjacent to opposite edges of the metal carrier plate between two recesses and / or between a recess and the adjacent, parallel edge.
  • FIG. 1 shows a schematic illustration of a section through a semiconductor module according to the present invention
  • FIG. 2 shows a plan view of the semiconductor module according to FIG. 1,
  • Figure 3 is a plan view of an alternative semiconductor module
  • Figure 4 is a plan view of a further semiconductor module.
  • the basic structure of a semiconductor module 1 shown in FIG. 1 consists of a metal carrier plate 2
  • the metal carrier plate 2 is divided into three segments I, II, III by means of two recesses 12 (shown in broken lines). In the present example, each segment I, II, III carries a substrate 4.
  • the metal carrier plate 2 has an upper surface 11 and a lower surface 10.
  • the metal support plate 2 rests with its lower surface 10 on a heat sink 8 and is screwed (not shown) onto the cooling element. screwed on by 8.
  • Each segment I, II, III of the metal support plate 2 has a lower surface 10 which is convex with respect to the heat sink 8.
  • On the upper surface 11 there are the three thermally highly conductive, electrically insulating substrates 4, between which there are gaps 13 s.
  • the substrates 4 are connected to the upper surface 11 of the metal support plate 2 by a soft solder layer 3.
  • Semiconductor components 6 are in turn fastened on the upper side of the substrate 6 via soft solder layers 5. These can be connected to housing connections (not shown).
  • the top sides of the semiconductor components 6 are typically connected to one another via bond connections (not shown).
  • the recesses 12 in the metal support plate 2 By introducing the recesses 12 in the metal support plate 2, the mechanical stresses between the ceramic substrates 4 and the metal support plate 2 are significantly reduced during assembly on the heat sink 8. At the same time, good thermal properties are guaranteed.
  • the recesses can accommodate excess thermal paste, so that a further improvement in the transition resistance can be achieved.
  • the corresponding number and size of recesses can in principle be used to make the metal support plate any size without mechanical stresses occurring.
  • the thickness of the metal support plate can be chosen to be small (eg 3 mm), regardless of the size, since there is no need for exciting machining to produce the convex surface. It is therefore a considerable material and compared to the prior art for a large metal support plate Cost savings possible because the metal carrier plate with common manufacturing processes for large series, z. B. can be produced by stamping and shaping.
  • a segment of the metal support plate 2 has a much greater length than its width, a convex deformation in the longitudinal direction may not suffice.
  • a convex deformation in both the longitudinal and transverse directions is very advantageous.
  • a segment typically has the shape of a spherical cap.
  • FIG. 2 shows a plan view of the semiconductor module according to the invention according to FIG. 1.
  • the recesses 12 divide the area of the metal support plate 2 into three segments I, II, III of approximately the same size.
  • Each segment has two bores 7 lying adjacent to the edges 13b, 13d.
  • the bores 7 are advantageously arranged centrally in the respective segment with respect to the segment edge.
  • each segment contains only one substrate 4. However, it is also conceivable that one segment accommodates several substrates.
  • FIG. 3 shows a further exemplary embodiment of a top view of the semiconductor module according to the invention.
  • 7 recesses 12 are provided which divide the surface of the metal support plate 2 into six segments I ... VI of approximately the same size.
  • the recesses 12 are designed as elongated slots which are introduced in the longitudinal and transverse directions, ie approximately parallel to the edges of the metal carrier plate.
  • the recesses end adjacent to the edges 13a ... 13d.
  • Defined elastic points A are thus created along the edges.
  • Such elastic points B are likewise in the interior of the metal carrier plate 2 formed the intersection of the imaginary extensions of the recesses 12.
  • the arrangement of the bores 7 is chosen in accordance with FIG. 2.
  • FIG. 4 shows a further exemplary embodiment in which the bores 7 are placed adjacent to the corner points of the ceramic.
  • larger substrates can be used in the respective segments compared to FIG. 3 without changing the external dimensions of the metal carrier plate.
  • eight holes are provided, three substrates being applied in each segment.
  • the metal carrier plate 2 has a length of 162 mm and a width of 122 mm. Its thickness is 3 mm.
  • two recesses at a distance of 54 mm from one another then run symmetrically on the lower surface of the metal carrier plate in the transverse direction. The recesses end a few millimeters in front of the respective edges of the metal carrier plate.
  • Such a metal support plate is then attached to the heat sink, for example by six screws.
  • the exemplary embodiments shown in the figures are usually used in a plastic housing. This is filled with a casting compound in order to ensure mechanical stability of bond connections of the semiconductor components and to increase the insulation capability.
  • the plastic frame is advantageously designed such that struts (on the plastic frame) cover the recesses.

Abstract

The invention relates to semiconductor modules (1) consisting of a metal support plate (2), a cooling body (8), at least one ceramic substrate (4) and several semiconductor components (6). Mechanical tensions between the ceramic substrates and the metal support plate during assembly on the cooling body are substantially reduced with the insertion of defined elastic points by making recesses in the metal support plate (2) with the purpose of forming small segments. This makes it possible to use large metal support plates having a small thickness.

Description

Beschreibungdescription
HalbleitermodulSemiconductor module
Die Erfindung betrifft ein Halbleitermodul bestehend aus einer Metalltragerplatte mit einer oberen Oberflache und einer unteren Oberflache, einem Kühlkörper, auf dem die Metalltragerplatte über ihre untere Oberflache befestigt ist, zumindest einem wärmeleitenden und elektrisch isolierenden Sub- strat, das auf die obere Oberflache der Metalltragerplatte befestigt ist, sowie mehreren Halbleiterbauelementen, die auf das Substrat aufgebracht sind.The invention relates to a semiconductor module consisting of a metal carrier plate with an upper surface and a lower surface, a heat sink on which the metal carrier plate is fastened via its lower surface, at least one heat-conducting and electrically insulating substrate which fastens on the upper surface of the metal carrier plate is, as well as several semiconductor components that are applied to the substrate.
Solche Halbleitermodule sind allgemein bekannt. Um Halbleitermodule vor Zerstörung durch entstehende Verlustwarme zu schützen, ist ein guter warmeleitfahiger Kontakt der Metalltragerplatten zu den Kühlkörpern erforderlich.Such semiconductor modules are generally known. In order to protect semiconductor modules from being destroyed by the resulting heat loss, good heat-conductive contact between the metal carrier plates and the heat sinks is required.
Typischerweise ist die Metalltragerplatte des Halbleitermo- duls bezogen auf die ebene Oberflache des Kühlkörpers als konvex gewölbte Flache -vorzugsweise als Kugeloberflache- ausgebildet, so daß bei seitlicher Fixierung der Metalltragerplatte auf den betreffenden Kühlkörper die Metalltragerplatte unter mechanischer Spannung an den Kühlkörper ange- preßt und fixiert wird. Zur Reduzierung des Ubergangswarmewi- derstandes zwischen der Metalltragerplatte und dem Kühlkörper hat sich diese konvexe Ausbildung der Metalltragerplatte als vorteilhaft erwiesen. Ein bekanntes Verfahren zur konvexen Verformung der Metalltragerplatte ist z.B. in der DE 39 40 933 AI beschriebenTypically, the metal support plate of the semiconductor module is designed in relation to the flat surface of the heat sink as a convexly curved surface, preferably as a spherical surface, so that when the metal support plate is fixed to the side of the heat sink in question, the metal support plate is pressed and fixed to the heat sink under mechanical tension becomes. In order to reduce the transition heat resistance between the metal support plate and the heat sink, this convex design of the metal support plate has proven to be advantageous. A known method for convex deformation of the metal support plate is e.g. described in DE 39 40 933 AI
Bei Modulen mit größeren Grundflachen entstehen aber mechanische Spannungen zwischen dem Keramiksubstrat und der Metalltragerplatte bei der Montage auf den ebenen Kühlkörper, die schlimmstenfalls zur Zerstörung der Keramiksubstrate fuhren. Die Ursache dieser negativen mechanischen Spannungen bei der Montage auf den ebenen Kühlkörper liegt an den stark unterschiedlichen Wärmeausdehnungskoeffizienten zwischen den verwendeten Metalltragerplatten und den verwendeten Keramiksubstraten. Insbesondere sind die Wärmeausdehnungskoeffizienten von Metallen und Keramik sehr unterschiedlich, so daß die beim Verlöten der Keramiksubstrate mit den Metalltragerplatten auftretende Warme dazu fuhrt, daß sich die Keramik und die Metalltragerplatte unterschiedlich stark ausdehnen.In the case of modules with a larger base area, however, mechanical stresses arise between the ceramic substrate and the metal support plate during assembly on the flat heat sink, which in the worst case lead to the destruction of the ceramic substrates. The cause of these negative mechanical stresses when mounting on the flat heat sink is due to the greatly different coefficients of thermal expansion between the metal carrier plates used and the ceramic substrates used. In particular, the thermal expansion coefficients of metals and ceramics are very different, so that the heat which occurs when the ceramic substrates are soldered to the metal support plates leads to the ceramic and the metal support plate expanding to different extents.
Die Folge ist, daß nach Abkühlung der Anordnung nicht mehr eine planparallele, sondern eine, auf die Lage der Keramiksubstrate bezogen, konkav gekrümmte Metalltragerplatte vorliegt. Das bedeutet, daß ein guter Kontakt der Metalltrager- platte zum Kühlkörper nur noch an den seitlichen Flachen der Anordnung gewährleistet ist, der Mittelteil jedoch keinen oder nur schlechten Kontakt aufweist, so daß die Wärmeableitung unbefriedigend ist.The result is that after the arrangement has cooled, there is no longer a plane-parallel metal support plate, but a concavely curved one, based on the position of the ceramic substrates. This means that good contact of the metal support plate with the heat sink is only guaranteed on the lateral surfaces of the arrangement, but the middle part has no or only poor contact, so that the heat dissipation is unsatisfactory.
Es hat sich in der Vergangenheit gezeigt, daß sich Metalltragerplatten aus Kupfer mit einer Grundflache von bis zu 60 x 120 mm bei einer Dicke von 3 mm noch formen lassen. In der Metalltragerplatte gewünschte Konturen und Ausnehmungen werden gestanzt. Konvexe Oberflachenproflle werden durch Biege- gesenke hergestellt.It has been shown in the past that metal support plates made of copper with a base area of up to 60 x 120 mm can still be formed with a thickness of 3 mm. Contours and recesses required in the metal carrier plate are punched. Convex surface profiles are produced by bending dies.
Größere Metalltragerplatten müssen bereits spannend bearbeitet werden. Die äußere Kontur wird gefraßt, wahrend die Bohrungen zur Befestigung der Metalltragerplatte mit dem Kuhl- korper gebohrt werden. Konvexe Oberflachenproflle werden in der Regel gedreht .Dieses aufwendige Bearbeitungsverfahren ermöglicht Metalltragerplatten mit typischen Abmaßen von ca. 140 x 190 mm. Die Dicke der Metalltragerplatte betragt dann bereits 5 mm, wodurch die Materialkosten stark ansteigen. Zu- dem werden die mechanischen Spannungen zwischen der Metalltragerplatte und dem Kühlkörper mit zunehmender Große der Metalltragerplatte immer großer. Aufgabe der vorliegenden Erfindung ist es daher, ein Halbleitermodul der eingangs genannten Art so weiterzubilden, daß auch bei Modulen mit großen Grundflachen eine einfache Lot- montage möglich ist, wobei ein einwandfreier thermischer Kontakt zwischen der Metalltragerplatte und dem Kühlkörper gewährleistet bleibt.Larger metal carrier plates have to be machined excitingly. The outer contour is milled, while the holes for attaching the metal support plate are drilled with the heat sink. Convex surface profiles are usually turned. This complex machining process enables metal carrier plates with typical dimensions of approx. 140 x 190 mm. The thickness of the metal support plate is then already 5 mm, which increases the material costs considerably. In addition, the mechanical stresses between the metal support plate and the heat sink increase with the size of the metal support plate. It is therefore an object of the present invention to develop a semiconductor module of the type mentioned at the outset in such a way that simple solder assembly is possible even in the case of modules with large base areas, with perfect thermal contact between the metal support plate and the heat sink being ensured.
Erfmdungsgemaß wird diese Aufgabe durch ein Halbleitermodul der eingangs genannten Art gelost, welches dadurch gekennzeichnet ist, daß m die Metalltragerplatte eine oder mehrere Ausnehmungen eingebracht sind.According to the invention, this object is achieved by a semiconductor module of the type mentioned at the outset, which is characterized in that one or more recesses are made in the metal carrier plate.
Durch die Einfuhrung von solchen Ausnehmungen, d.h. von defi- nierten elastischen Stellen, m die Metalltragerplatte werden die mechanischen Spannungen zwischen dem Keramiksubstrat und der Metalltragerplatte bei der Montage auf den Kühlkörper drastisch verringert. Insbesondere können die durch die Ausnehmungen gebildeten Segmente einzeln konvex verformt werden, so daß keine Gefahr besteht, daß die in den Modulen befindlichen Keramiksubstrate durch unterschiedliche Wärmeausdehnungskoeffizienten zerstört werden. Dadurch ist die Fertigung von Halbleitermodulen möglich, die einen sehr gunstigen Über- gangswar ewiderstandes aufweisen. Zudem kann durch eine ent- sprechende Anzahl an Ausnehmungen die Große der Segmente bestimmt werden, so daß die Große der Metalltragerplatte prinzipiell beliebig groß gestaltet werden kann. Ein weiterer Vorteil der Erfindung besteht in kostengünstigen Fertigungs- prozessen und Materialien.By introducing such exceptions, i.e. From defined elastic points, the mechanical stresses between the ceramic substrate and the metal support plate are drastically reduced when mounted on the heat sink. In particular, the segments formed by the recesses can be individually convexly deformed, so that there is no danger that the ceramic substrates located in the modules will be destroyed by different coefficients of thermal expansion. This makes it possible to manufacture semiconductor modules that have a very inexpensive transition resistance. In addition, the size of the segments can be determined by a corresponding number of recesses, so that the size of the metal support plate can, in principle, be of any size. Another advantage of the invention consists in cost-effective manufacturing processes and materials.
In einer Ausführungsform der vorliegenden Erfindung sind mehrere Substrate, die vorzugsweise beidseitig metallisiert sind, um einerseits die Montage auf die Metalltragerplatte zu erleichtern und andererseits die Halbleiterbauelemente struk- turiert aufbringen zu können, auf die obere Oberflache der Metalltragerplatte befestigt. Die Befestigung erfolgt dabei vorzugsweise über eine Weichlotschicht . Wegen der Beziehung ΔX = Δα x ΔT x 1, bei der ΔX die Differenz der linearen Ausdehnung und Δα die Differenz der linearen Ausdehnungskoeffizienten von Keramiksub- strat und Metalltragerplatte bezeichnet, sowie ΔT die Temperaturdifferenz der Anordnung zwischen Schmelztemperatur des Lots und der Raumtemperatur und 1 die Lange des aufzubringenden Keramiksubstrats, folgt, daß ein g nstiges Verfahren zur Vermeidung von unerwünschten Tragerplattenverformungen darin besteht, ΔX und damit also die Parameter Δα, ΔT und 1 möglichst zu verkleinern. Δα ist alle.n materialabhangig und somit nicht variabel, wenn Metalltragerplatten und Keramiksubstrate verwendet werden. Um die Differenz der Temperaturen wahrend des Lotvorgangs und nach Abkühlung der Anord- nung möglichst klein zu halten, muß ein Lot verwendet werden, das e ne niedrige Schmelztemperatur besitzt, andererseits jedoch nicht derart niedrig, daß die spater bei Betrieb des Halbleitermoduls auftretende Verlustwarme das Lot zum Schmelzen bringt. Es sind Schmelztemperaturen von ca. 180°C üblich. Diese Maßnahme reicht jedoch nicht mehr aus, wenn größere Keramiksubstrate verwendet werden sollen, da die Keramiksub- stratlangen 1 ebenfalls proportional in die Beziehung für die Differenz der linearen Ausdehnung zweier unterschiedlicher Werkstoffe eingeht. Daher ist es sehr gunstig, statt eines einzelnen großen Keramiksubstrats mehrere kleinere Keramiksubstrate zu verwenden, um so die Lange 1 wunschgemäß zu dimensionieren. Die Große der Keramiksubstrate ist vorteil- hafterweise an die Große bzw. Form der durch die Ausnehmung gebildeten Segmente angepaßt.In one embodiment of the present invention, a plurality of substrates, which are preferably metallized on both sides, on the one hand to facilitate assembly on the metal support plate and on the other hand to be able to apply the semiconductor components in a structured manner, are fastened to the upper surface of the metal support plate. The attachment is preferably carried out via a soft solder layer. Because of the relationship ΔX = Δα x ΔT x 1, where ΔX denotes the difference of the linear expansion and Δα the difference of the linear expansion coefficients of the ceramic substrate and the metal support plate, and ΔT the temperature difference of the arrangement between the melting temperature of the solder and the room temperature and 1 die Long of the ceramic substrate to be applied, it follows that an inexpensive method for avoiding undesired carrier plate deformations is to reduce ΔX and thus the parameters Δα, ΔT and 1 as much as possible. Δα depends on the material and is therefore not variable if metal carrier plates and ceramic substrates are used. In order to keep the difference in temperature as low as possible during the soldering process and after the arrangement has cooled, a solder must be used which has a low melting temperature, but on the other hand is not so low that the heat of loss which occurs later when the semiconductor module is in operation dissolves the solder melts. Melting temperatures of approx. 180 ° C are common. However, this measure is no longer sufficient if larger ceramic substrates are to be used, since the ceramic substrate lengths 1 likewise enter into the relationship for the difference in the linear expansion of two different materials. It is therefore very convenient to use several smaller ceramic substrates instead of a single large ceramic substrate in order to dimension the length 1 as desired. The size of the ceramic substrates is advantageously adapted to the size or shape of the segments formed by the recess.
Typischerweise sind dann zwischen den einzelnen Keramiksubstraten Lucken vorgesehen. Es ist jedoch auch denkbar, daß die einzelnen Keramiksubstrate Stoß an Stoß auf die Metalltragerplatte aufgelotet werden.Gaps are then typically provided between the individual ceramic substrates. However, it is also conceivable for the individual ceramic substrates to be soldered onto the metal carrier plate in abutting fashion.
Wie eingangs erwähnt, hat es sich als besonders gunstig erwiesen, die untere Oberflache, d.h. die durch die Ausneh un- ) CO ) 1 As mentioned at the beginning, it has proven to be particularly advantageous to use the lower surface, ie the surface ) CO) 1
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Der Ausgestaltung der Segmente angepaßt sind die Anordnungen der Bohrungen in der Metalltragerplatte zur Befestigung auf dem Kühlkörper. Vorte lhafterweise ist jeweils eine Schraube benachbart zu gegenüberliegenden Randern der Metalltrager- platte zwischen zwei Ausnehmungen und/oder zwischen einer Ausnehmung und dem benachbarten, parallel verlaufenden Rand vorgesehen.The configurations of the segments are adapted to the arrangement of the holes in the metal support plate for attachment to the heat sink. Advantageously, a screw is provided adjacent to opposite edges of the metal carrier plate between two recesses and / or between a recess and the adjacent, parallel edge.
Die Erfindung ist in der Zeichnung beispielsweise veranschau- licht und im nachstehenden im einzelnen anhand der Zeichnung beschrieben. Es zeigen:The invention is illustrated in the drawing, for example, and described in detail below with reference to the drawing. Show it:
Figur 1 in schematischer Darstellung einen Schnitt durch ein Halbleitermodul gemäß der vorliegenden Erfindung,1 shows a schematic illustration of a section through a semiconductor module according to the present invention,
Figur 2 eine Draufsicht auf das Halbleitermodul gemäß Figur 1,FIG. 2 shows a plan view of the semiconductor module according to FIG. 1,
Figur 3 eine Draufsicht auf ein alternatives Halbleitermodul undFigure 3 is a plan view of an alternative semiconductor module and
Figur 4 eine Draufsicht auf ein weiteres Halbleitermodul.Figure 4 is a plan view of a further semiconductor module.
Der m Figur 1 dargestellte prinzipielle Aufbau eines Halb- leitermoduls 1 besteht aus einer Metalltragerplatte 2 ausThe basic structure of a semiconductor module 1 shown in FIG. 1 consists of a metal carrier plate 2
Kupfer, dreier mittels Weichlotschicht aufgebrachten Substraten 4 aus Al203-Keramιk, auf denen, mittels einer weiteren Lotschicht 5, die eigentlichen Halbleiterbauelemente 6 befestigt sind. Die Metalltragerplatte 2 ist mittels zweier (strichliert dargestellter) Ausnehmungen 12 in drei Segmente I, II, III unterteilt. Jedes Segment I, II, III tragt im vorliegenden Beispiel ein Substrat 4.Copper, three substrates 4 made of Al 2 O 3 ceramic applied by means of a soft solder layer, on which the actual semiconductor components 6 are attached by means of a further solder layer 5. The metal carrier plate 2 is divided into three segments I, II, III by means of two recesses 12 (shown in broken lines). In the present example, each segment I, II, III carries a substrate 4.
Die Metalltragerplatte 2 weist eine obere Oberflache 11 und eine untere Oberflache 10 auf. Die Metalltragerplatte 2 liegt mit ihrer unteren Oberflache 10 auf einem Kühlkörper 8 auf und wird über Schrauben (nicht dargestellt) auf dem Kuhlkor- per 8 aufgeschraubt. Jedes Segment I, II, III der Metalltragerplatte 2 hat eine bezüglich des Kühlkörpers 8 konvex ausgebildete untere Oberflache 10. Auf der oberen Oberflache 11 befinden sich die drei thermisch gut leitende, elektrisch isolierende Substrate 4, zwischen denen Lucken 13 s nd. Die Substrate 4 werden mit der oberen Oberflache 11 der Metalltragerplatte 2 durch eine Weichlotschicht 3 verbunden. Auf der Oberseite des Substrats 6 sind wiederum über Weichlot- schichten 5 Halbleiterbauelemente 6 befestigt. Diese können mit Gehauseanschlussen (nicht gezeigt) verbunden werden. Die Oberseiten der Halbleiterbauelemente 6 sind typischerweise über Bondverbindungen miteinander verbunden (nicht gezeigt) .The metal carrier plate 2 has an upper surface 11 and a lower surface 10. The metal support plate 2 rests with its lower surface 10 on a heat sink 8 and is screwed (not shown) onto the cooling element. screwed on by 8. Each segment I, II, III of the metal support plate 2 has a lower surface 10 which is convex with respect to the heat sink 8. On the upper surface 11 there are the three thermally highly conductive, electrically insulating substrates 4, between which there are gaps 13 s. The substrates 4 are connected to the upper surface 11 of the metal support plate 2 by a soft solder layer 3. Semiconductor components 6 are in turn fastened on the upper side of the substrate 6 via soft solder layers 5. These can be connected to housing connections (not shown). The top sides of the semiconductor components 6 are typically connected to one another via bond connections (not shown).
Diese Ausnehmungen verlaufen quer zur Längsrichtung der Me- talltragerplatte 2 in den den Lucken 13 entsprechenden Bereichen 14 der unteren Oberflache 11 des Substrats 4, was aus der Figur 2 zu ersehen ist. Es ist jedoch auch denkbar, eine oder mehrere Ausnehmungen m Längsrichtung der Metalltragerplatte 2 anzuordnen (Figur 3) .These recesses run transversely to the longitudinal direction of the metal carrier plate 2 in the regions 14 of the lower surface 11 of the substrate 4 corresponding to the gaps 13, which can be seen from FIG. 2. However, it is also conceivable to arrange one or more recesses in the longitudinal direction of the metal support plate 2 (FIG. 3).
Durch Einfuhrung der Ausnehmungen 12 in der Metalltragerplatte 2 werden die mechanischen Spannungen zwischen den Keramiksubstraten 4 und der Metalltragerplatte 2 bei den Montage auf den Kühlkörper 8 wesentlich verringert. Gleichzeitig sind gute thermische Eigenschaften gewahrleistet. Insbesondere ist hervorzuheben, daß die Ausnehmungen überschüssige Warmeleitpaste aufnehmen können, so daß eine weitere Verbesserung des Ubergangswar ewiderstandes erreicht werden kann. Als weiterer wesentlicher Vorteil kann durch eine entspre- chende Anzahl und Große an Ausnehmungen die Metalltragerplatte prinzipiell beliebig groß gestaltet werden, ohne daß mechanische Spannungen auftreten können. Weiterhin kann die Dicke - unabhängig von der Große - der Metalltragerplatte gering (z.B. 3 mm) gewählt werden, da auf eine spannende Bear- beitung zur Herstellung der konvexen Oberflache verzichtet werden kann. Es ist somit gegenüber dem Stand der Technik bei einer großen Metalltragerplatte eine erhebliche Material- und Kosteneinsparung möglich, da sich die Metalltragerplatte mit gangigen Fertigungsverfahren für Großserien, z. B. durch Stanzen und Verformen herstellen laßt.By introducing the recesses 12 in the metal support plate 2, the mechanical stresses between the ceramic substrates 4 and the metal support plate 2 are significantly reduced during assembly on the heat sink 8. At the same time, good thermal properties are guaranteed. In particular, it should be emphasized that the recesses can accommodate excess thermal paste, so that a further improvement in the transition resistance can be achieved. As a further essential advantage, the corresponding number and size of recesses can in principle be used to make the metal support plate any size without mechanical stresses occurring. Furthermore, the thickness of the metal support plate can be chosen to be small (eg 3 mm), regardless of the size, since there is no need for exciting machining to produce the convex surface. It is therefore a considerable material and compared to the prior art for a large metal support plate Cost savings possible because the metal carrier plate with common manufacturing processes for large series, z. B. can be produced by stamping and shaping.
Weist ein Segment der Metalltragerplatte 2 eine wesentlich größere Lange als Breite auf, so genügt unter Umstanden eine konvexe Verformung in der Längsrichtung nicht. Bei Segmenten, deren Querabmessungen recht groß sind und z.B. in der Große der Querabmessungen liegen, ist eine konvexe Verformung so- wohl in Längs- als auch in Querrichtung sehr vorteilhaft. Ein Segment weist in diesem Fall typischerweise die Form einer Kugelkalotte auf.If a segment of the metal support plate 2 has a much greater length than its width, a convex deformation in the longitudinal direction may not suffice. For segments whose transverse dimensions are quite large and e.g. in the size of the transverse dimensions, a convex deformation in both the longitudinal and transverse directions is very advantageous. In this case, a segment typically has the shape of a spherical cap.
Figur 2 zeigt eine Draufsicht auf das erfmdungsgemaße Halb- leitermodul gemäß Figur 1. Insbesondere ist die Anordnung der Substrate 4, der Ausnehmungen 12 sowie der Bohrungen 7 in einer vorteilhaften Form dargestellt. Die Ausnehmungen 12 unterteilen die Flache der Metalltragerplatte 2 in drei in etwa gleich große Segmente I, II, III. Jedes Segment weist zwei benachbart den Randern 13b, 13d liegende Bohrungen 7 auf. Die Bohrungen 7 sind vorteilhafterweise mittig im jeweiligen Segment bezüglich des Segmentrandes angeordnet. In der vorliegenden Draufsicht beinhaltet jedes Segment nur ein Substrat 4. Es ist jedoch auch denkbar, daß ein Segment mehrere Sub- strate aufnimmt.FIG. 2 shows a plan view of the semiconductor module according to the invention according to FIG. 1. In particular, the arrangement of the substrates 4, the recesses 12 and the bores 7 is shown in an advantageous form. The recesses 12 divide the area of the metal support plate 2 into three segments I, II, III of approximately the same size. Each segment has two bores 7 lying adjacent to the edges 13b, 13d. The bores 7 are advantageously arranged centrally in the respective segment with respect to the segment edge. In the present plan view, each segment contains only one substrate 4. However, it is also conceivable that one segment accommodates several substrates.
Figur 3 zeigt ein weiteres Ausfuhrungsbeispiel einer Draufsicht auf das erfmdungsgemaße Halbleitermodul. In der vorliegenden Figur sind 7 Ausnehmungen 12 vorgesehen, die die Flache der Metalltragerplatte 2 in sechs etwa gleich große Segmente I ... VI unterteilen. Die Ausnehmungen 12 sind als längliche Schlitze ausgeführt, die in Längs- und Querrichtung, d. h. in etwa parallel zu den Randern der Metalltragerplatte eingebracht sind. Die Ausnehmungen enden benachbart den Randern 13a ... 13d. Somit entstehen entlang den Randern definierte elastische Stellen A. Derartige elastische Stellen B sind ebenfalls im Inneren der Metalltragerplatte 2 durch den Schnittpunkt der gedachten Verlangerungen der Ausnehmungen 12 gebildet. Die Anordnung der Bohrungen 7 ist entsprechend Figur 2 gewählt.FIG. 3 shows a further exemplary embodiment of a top view of the semiconductor module according to the invention. In the present figure, 7 recesses 12 are provided which divide the surface of the metal support plate 2 into six segments I ... VI of approximately the same size. The recesses 12 are designed as elongated slots which are introduced in the longitudinal and transverse directions, ie approximately parallel to the edges of the metal carrier plate. The recesses end adjacent to the edges 13a ... 13d. Defined elastic points A are thus created along the edges. Such elastic points B are likewise in the interior of the metal carrier plate 2 formed the intersection of the imaginary extensions of the recesses 12. The arrangement of the bores 7 is chosen in accordance with FIG. 2.
Figur 4 zeigt ein weiteres Ausfuhrungsbeispiel, in dem die Bohrungen 7 benachbart den Eckpunkten der Keramik plaziert sind. Somit können in den jeweiligen Segmenten gegenüber Figur 3 größere Substrate verwendet werden, ohne die äußeren Abmaße der Metalltragerplatte zu verandern. In der vorliegen- den Figur sind acht Bohrungen vorgesehen, wobei m jdem Segment drei Substrate aufgebracht sind.FIG. 4 shows a further exemplary embodiment in which the bores 7 are placed adjacent to the corner points of the ceramic. Thus, larger substrates can be used in the respective segments compared to FIG. 3 without changing the external dimensions of the metal carrier plate. In the present figure, eight holes are provided, three substrates being applied in each segment.
In einem praktischen Ausfuhrungsbeispiel hat die Metalltragerplatte 2 eine Lange von 162 mm und eine Breite von 122 mm. Ihre Dicke betragt 3 mm. Typischerweise verlaufen dann zwei Ausnehmungen in einem Abstand von 54 mm zueinander symmetrisch auf der unteren Oberflache der Metalltragerplatte in Querrichtung. Die Ausnehmungen enden wenige Millimeter vor den jeweiligen Randern der Metalltragerplatte.In a practical exemplary embodiment, the metal carrier plate 2 has a length of 162 mm and a width of 122 mm. Its thickness is 3 mm. Typically, two recesses at a distance of 54 mm from one another then run symmetrically on the lower surface of the metal carrier plate in the transverse direction. The recesses end a few millimeters in front of the respective edges of the metal carrier plate.
Eine solche Metalltragerplatte wird dann beispielsweise durch sechs Schrauben auf dem Kühlkörper befestigt.Such a metal support plate is then attached to the heat sink, for example by six screws.
Die m den Figuren gezeigten Ausfuhrungsbeispiele werden ub- licherweise in einem Kunststoffgehause verwendet. Dieses wird mit einer Vergußmasse gefüllt, um eine mechanische Stabilität von Bondverbindungen der Halbleiterbauelemente zu gewährleisten und die Isolationsfahigkeit zu erhohen. Um ein Auslaufen der Vergußmasse über die Ausnehmungen zu verhindern, ist der Kunststoffrahmen vorteilhafterweise so ausgeführt, daß Verstrebungen (am Kunststoffrahmen) die Ausnehmungen bedecken. The exemplary embodiments shown in the figures are usually used in a plastic housing. This is filled with a casting compound in order to ensure mechanical stability of bond connections of the semiconductor components and to increase the insulation capability. In order to prevent the casting compound from leaking out over the recesses, the plastic frame is advantageously designed such that struts (on the plastic frame) cover the recesses.

Claims

Patentansprüche claims
1. Halbleitermodul (1) bestehend aus einer Metalltragerplatte (2) mit einer oberen Oberflache (11) und einer unteren Ober- flache (10), einem Kühlkörper (8) auf dem die Metalltragerplatte (2) über ihre untere Oberflache (10) befestigt ist, zumindest einem wärmeleitenden und elektrisch isolierenden Substrat (4), das auf die obere Oberflache (11) der Metalltragerplatte (2) befestigt ist, sowie mehreren Halbleiterbau- elementen (6), die auf das Substrat (4) aufgebracht sind, d a d u r c h g e k e n n z e i c h n e t , daß in die Metalltragerplatte (2) eine ödere mehrere Ausnehmungen (12) eingebracht sind.1. Semiconductor module (1) consisting of a metal support plate (2) with an upper surface (11) and a lower surface (10), a heat sink (8) on which the metal support plate (2) is fastened via its lower surface (10) is characterized, at least one heat-conducting and electrically insulating substrate (4), which is attached to the upper surface (11) of the metal carrier plate (2), and several semiconductor components (6), which are applied to the substrate (4), that one or more recesses (12) are made in the metal support plate (2).
2. Halbleitermodul nach Anspruch 1, d a d u r c h g e k e n n z e i c h n e t , daß mehrere Substrate (4) auf die obere Oberflache (11) der Metalltragerplatte (2) befestigt sind.2. Semiconductor module according to claim 1, that a plurality of substrates (4) are attached to the upper surface (11) of the metal carrier plate (2).
3. Halbleitermodul nach Anspruch 2, d a d u r c h g e k e n n z e i c h n e t , daß zwischen den Substraten (4) Lucken (13) vorgesehen sind.3. Semiconductor module according to claim 2, d a d u r c h g e k e n e z e i c h n e t that gaps (13) are provided between the substrates (4).
4. Halbleitermodul nach einem der Ansprüche 1 bis 3, d a d u r c h g e k e n n z e i c h n e t , daß die untere Oberflache (10) der Metalltragerplatte (2) jeweils an den Stellen der zu befestigenden Substrate (4) konvex ausgebildet ist.4. Semiconductor module according to one of claims 1 to 3, d a d u r c h g e k e n n z e i c h n e t that the lower surface (10) of the metal support plate (2) is convex at the locations of the substrates to be fastened (4).
5. Halbleitermodul nach Anspruch 4, d a d u r c h g e k e n n z e i c h n e t , daß die Konvexität in Längs- und Querrichtung derart ausgebildet ist, daß sie einer Kugeloberflache entspricht.5. Semiconductor module according to claim 4, d a d u r c h g e k e n n z e i c h n e t that the convexity in the longitudinal and transverse directions is designed such that it corresponds to a spherical surface.
6. Halbleitermodul nach Anspruch 5, d a d u r c h g e k e n n z e i c h n e t , daß die Ausnehmungen (12) in den den Lucken (13) entsprechenden Bereichen (14) der unteren Oberflache (10) eingebracht sind.6. The semiconductor module according to claim 5, characterized in that the recesses (12) are made in the regions (14) of the lower surface (10) corresponding to the gaps (13).
7. Halbleitermodul nach Anspruch 5, d a d u r c h g e k e n n z e i c h n e t , daß die Ausnehmungen (12) in den in etwa unter den Randern (16) der Substrate (4) liegenden Bereichen der unteren Oberflache (10) eingebracht sind.7. The semiconductor module as claimed in claim 5, so that the recesses (12) are made in the regions of the lower surface (10) which are approximately below the edges (16) of the substrates (4).
8. Halbleitermodul nach einem der Ansprüche 1 bis 7, d a d u r c h g e k e n n z e i c h n e t , daß wenigstens einige der Ausnehmungen (12) benachbart den Randern der Metalltragerplatte (2) enden.8. Semiconductor module according to one of claims 1 to 7, d a d u r c h g e k e n n z e i c h n e t that at least some of the recesses (12) end adjacent to the edges of the metal support plate (2).
9. Halbleitermodul nach einem der Anspr che 1 bis 8, d a d u r c h g e k e n n z e i c h n e t , daß die Substrate (4) auf die Metalltragerplatte (2) über eine Weichlotschicht (3) befestigt sind.9. Semiconductor module according to one of claims 1 to 8, so that the substrates (4) are attached to the metal carrier plate (2) via a soft solder layer (3).
10. Halbleitermodul nach einem der Ansprüche 1 bis 9, d a d u r c h g e k e n n z e i c h n e t , daß die Halbleiterbauelemente (6) über eine weitere Lotschicht (5) auf die Substrate (4) befestigt sind.10. The semiconductor module according to one of claims 1 to 9, that the semiconductor components (6) are attached to the substrates (4) via a further solder layer (5).
11. Halbleitermodul nach einem der Ansprüche 1 bis 10, d a d u r c h g e k e n n z e i c h n e t , daß die Metalltragerplatte (2) auf den Kühlkörper (8) mit Schrauben (9) befestigt sind.11. Semiconductor module according to one of claims 1 to 10, d a d u r c h g e k e n n z e i c h n e t that the metal support plate (2) on the heat sink (8) with screws (9) are attached.
12. Halbleitermodul nach einem der Ansprüche 1 bis 11, d a d u r c h g e k e n n z e i c h n e t , daß jeweils eine Schraube (9) benachbart zu gegenüberliegenden Randern (13a, 13c; 13b, 13d) der Metalltragerplatte (2) zwischen zwei Ausnehmungen (12) und/oder zwischen einer Ausnehmung und dem benachbarten, in etwa parallel verlaufenden Rand vorgesehen 12. Semiconductor module according to one of claims 1 to 11, characterized in that in each case a screw (9) adjacent to opposite edges (13a, 13c; 13b, 13d) of the metal support plate (2) between two recesses (12) and / or between a recess and the adjacent, approximately parallel edge is provided
13. Halbleitermodul nach einem der Ansprüche 1 bis 12, d a d u r c h g e k e n n z e i c h n e t , daß als Substrate (4) Keramiksubstrate vorgesehen sind, insbesondere A1203- oder AIN-Substrate .13. Semiconductor module according to one of claims 1 to 12, characterized in that ceramic substrates are provided as substrates (4), in particular A1 2 0 3 - or AIN substrates.
14. Halbleitermodul nach einem der Ansprüche 1 bis 13, d a d u r c h g e k e n n z e i c h n e t , daß als Me- tallträgerplatte eine Kupferplatte vorgesehen ist. 14. Semiconductor module according to one of claims 1 to 13, d a d u r c h g e k e n n z e i c h n e t that a copper plate is provided as the metal carrier plate.
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US8227913B2 (en) 2001-09-01 2012-07-24 Infineon Technologies Ag Power semiconductor module comprising elastic housing for accommodating movement of individual substrate regions on a heat sink
WO2003021680A3 (en) * 2001-09-01 2008-02-07 Eupec Gmbh Power semiconductor module
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EP1501127A2 (en) * 2003-07-23 2005-01-26 Semikron Elektronik GmbH Patentabteilung Power semiconductor module with base plate having high bending stiffness
EP1501127A3 (en) * 2003-07-23 2007-10-24 SEMIKRON Elektronik GmbH &amp; Co. KG Power semiconductor module with base plate having high bending stiffness
DE102006011995B3 (en) * 2006-03-16 2007-11-08 Semikron Elektronik Gmbh & Co. Kg Power semiconductor module, has base plate connected with substrate in material-coherent manner, and contact layer of substrate divided into segments for providing material-coherent connection with base plate
DE102006045939A1 (en) * 2006-09-28 2008-04-10 Infineon Technologies Ag Power semiconductor module with improved thermal shock resistance
US7910952B2 (en) 2006-09-28 2011-03-22 Infineon Technologies Ag Power semiconductor arrangement
DE102006045939B4 (en) * 2006-09-28 2021-06-02 Infineon Technologies Ag Power semiconductor module with improved stability against temperature changes
US8237260B2 (en) 2008-11-26 2012-08-07 Infineon Technologies Ag Power semiconductor module with segmented base plate
DE102010063455B4 (en) * 2009-12-18 2020-10-08 Cree, Inc. Semiconductor package, method for producing a semiconductor package and method for producing a substrate arrangement
CN102456640B (en) * 2010-11-02 2016-06-01 Abb技术有限公司 substrate
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US8897015B2 (en) 2010-11-02 2014-11-25 Abb Technology Ag Base plate
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US9488344B2 (en) 2011-06-16 2016-11-08 Osram Gmbh Method for producing a lighting device and lighting device
CN103608941A (en) * 2011-06-16 2014-02-26 欧司朗有限公司 Method for producing a lighting device and lighting device
WO2013004455A1 (en) * 2011-06-16 2013-01-10 Osram Ag Method for producing a lighting device and lighting device
US9129932B2 (en) 2011-06-27 2015-09-08 Rohm Co., Ltd. Semiconductor module
EP2725609A4 (en) * 2011-06-27 2015-06-17 Rohm Co Ltd Semiconductor module
AT14114U1 (en) * 2013-09-20 2015-04-15 Mikroelektronik Ges Mit Beschränkter Haftung Ab Support plate for a power electronics module
WO2015091117A1 (en) * 2013-12-20 2015-06-25 Koninklijke Philips N.V. Laser module with simplified alignment
US9882346B2 (en) 2013-12-20 2018-01-30 Koninklijke Philips N.V. Laser module with simplified alignment
US9519159B1 (en) 2015-11-12 2016-12-13 Joseph Scott King Hunting visored eye shield
US9929066B1 (en) 2016-12-13 2018-03-27 Ixys Corporation Power semiconductor device module baseplate having peripheral heels

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