USRE43853E1 - Method for concealing dark defect in image sensor - Google Patents
Method for concealing dark defect in image sensor Download PDFInfo
- Publication number
- USRE43853E1 USRE43853E1 US12/713,040 US71304010A USRE43853E US RE43853 E1 USRE43853 E1 US RE43853E1 US 71304010 A US71304010 A US 71304010A US RE43853 E USRE43853 E US RE43853E
- Authority
- US
- United States
- Prior art keywords
- pixel
- value
- threshold
- dark defect
- pixels
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active, expires
Links
Images
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N9/00—Details of colour television systems
- H04N9/64—Circuits for processing colour signals
- H04N9/646—Circuits for processing colour signals for image enhancement, e.g. vertical detail restoration, cross-colour elimination, contour correction, chrominance trapping filters
-
- E—FIXED CONSTRUCTIONS
- E04—BUILDING
- E04G—SCAFFOLDING; FORMS; SHUTTERING; BUILDING IMPLEMENTS OR AIDS, OR THEIR USE; HANDLING BUILDING MATERIALS ON THE SITE; REPAIRING, BREAKING-UP OR OTHER WORK ON EXISTING BUILDINGS
- E04G25/00—Shores or struts; Chocks
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/68—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N9/00—Details of colour television systems
- H04N9/03—Circuitry for demodulating colour component signals modulated spatially by colour striped filters by frequency separation
-
- E—FIXED CONSTRUCTIONS
- E04—BUILDING
- E04G—SCAFFOLDING; FORMS; SHUTTERING; BUILDING IMPLEMENTS OR AIDS, OR THEIR USE; HANDLING BUILDING MATERIALS ON THE SITE; REPAIRING, BREAKING-UP OR OTHER WORK ON EXISTING BUILDINGS
- E04G25/00—Shores or struts; Chocks
- E04G2025/003—Supports therefor, e.g. tripods
Definitions
- the present invention relates to a method for concealing a dark defect in an image sensor; and more particularly, to a method for concealing a dark defect capable of being actively applied according to a pixel data.
- An image sensor is a device printing images by using a characteristic a semiconductor reacts to a light. That is, the image sensor is a device that a pixel detects a brightness and a wavelength of each different light coming from each different subject and reads the light in an electrical value. The image sensor plays a role in making this electrical value to a level capable of performing a signal processing.
- CMOS complementary metal oxide semiconductor
- CCD charge coupled device
- a poor characteristic of the image sensor is a light signal reproduction in a low illuminated environment. It is because of an influence by a noise signal caused by a unique characteristic of the semiconductor device. This noise component degrades a ratio of a signal to a noise (SNR), thereby deteriorating an image quality.
- SNR signal to a noise
- an internal area should be increased, thereby increasing a signal composition entering.
- the noise composition is also increased with the same ratio and thus, a noise defect such as a spot is generated. Accordingly, it is called a dark defect.
- an object of the present invention to provide a method for concealing a dark defect generating a noise defect such as a spot prominently appeared in a low illuminated environment.
- a method for concealing a dark defect in an image sensor including the steps of: setting a window including five sequential pixels, e.g., a first pixel P 1 , a second pixel P 2 , a third pixel P 3 , a fourth P 4 and a fifth pixel P 5 , from a plurality of pixel data sequentially outputted, the third pixel and the fifth pixels P 3 and P 5 being identical in Bayer color with each other and the second and the fourth pixels P 2 and P 4 being identical in Bayer color with each other; calculating an average value ‘ ⁇ ’ of the first and the fifth pixels P 1 and P 5 and a plurality of ‘ ⁇ /n’ obtained by dividing the average value ‘ ⁇ ’ by ‘n’, ‘n’ being a multiple of 2; selecting one of the plurality of ‘ ⁇ /n’; comparing a threshold value ‘ ⁇ + ⁇ /n’ calculated by adding the average value ‘ ⁇ ’ to the selected ‘ ⁇ /n’ with a value of the third
- a method for concealing a dark defect in an image sensor including the steps of: extracting a window including five sequential pixels, e.g., a first pixel P 1 , a second pixel P 2 , a third pixel P 3 , a fourth P 4 and a fifth pixel P 5 , from a plurality of pixel data sequentially outputted, the third and the fifth pixels P 3 and P 5 being identical in Bayer color with each other and the second and the fourth pixels P 2 and P 4 being identical Bayer color with each other; calculating an average value ‘ ⁇ ’ of the first and the fifth pixels P 1 and P 5 and a plurality of ‘ ⁇ /n’ obtained by dividing the average value ‘ ⁇ ’ by ‘n’, ‘n’ being a multiple of 2; selecting one of the plurality of ‘ ⁇ /n’; comparing a threshold value ‘ ⁇ + ⁇ /n’ calculated by adding the average value ‘ ⁇ ’ to the selected ‘ ⁇ /n’ with a value of the third pixel
- FIG. 1 is a flowchart schematizing a method for concealing a dark defect in accordance with the present invention
- FIG. 2 is a diagram for explaining an arrangement of pixels of a mosaic structure and a data format in accordance with the present invention
- FIG. 3 is a diagram illustrating a window installed in the pixel data outputted in a series of sequential orders illustrated in FIG. 2 ;
- FIG. 4 is a graph illustrating a dark defect discriminating region by using an average value ‘ ⁇ ’ and a threshold value ‘ ⁇ + ⁇ /n’ in accordance with the present invention
- FIG. 5 is a diagram illustrating an embodiment of detecting a dark defect within an installed window in accordance with the present invention
- FIG. 6 is a diagram illustrating an embodiment showing an edge existing within an installed window in accordance with the present invention.
- FIG. 7 is a diagram illustrating an edge discriminating zone
- FIGS. 8A and 8B are photographs of transmission electron microscopy (TEM) illustrating an image quality improvement of an image sensor in case of applying a method for concealing a dark defect in accordance with the present invention.
- TEM transmission electron microscopy
- FIG. 1 is a flowchart schematizing a method for concealing a dark defect in accordance with the present invention
- FIG. 2 is a diagram for explaining an arrangement of pixels of a mosaic structure and a data format in accordance with the present invention.
- G, B and R denote a green color, a blue color and a red color, respectively.
- the arrangement of the pixels uses a mosaic arrangement method illustrated in FIG. 2 and the pixel data are outputted in a series of sequential orders of GRGRGRGR and BGBGBGBGBG at two rows A and B.
- FIG. 3 is a diagram illustrating a window installed in the pixel data outputted in the series of sequential orders illustrated in FIG. 2 .
- a window (W) comprised of five sequential pixels from a plurality of pixel data sequentially outputted, i.e., a plurality of pixel data of a first pixel P 1 indicating B, a second pixel P 2 indicating G, a third pixel P 3 indicating B, a fourth pixel P 4 indicating G and a fifth pixel P 5 indicating B of the B row in FIG. 2 , is set at step S 101 .
- a present pixel subjected to a dark defect discrimination among the first pixel P 1 , the second pixel P 2 , the third pixel P 3 , the fourth pixel P 4 and the fifth pixel P 5 is the third pixel P 3 indicating B.
- the third pixel P 3 is placed in the right center N.
- the first pixel P 1 , the third pixel P 3 and the fifth pixel P 5 have Bayer color of B.
- the second pixel P 2 and the fourth pixel P 4 have Bayer color of G.
- the window (W) can be simply formed by using five shift resistors. Concealment of the dark defect is first performed to the third pixel P 3 and then, the concealment of the dark defect is performed to the fourth pixel P 4 indicating G placed next to the center N+1.
- an average value ‘ ⁇ ’ is calculated by using the first pixel P 1 and the fifth pixel P 5 having the Bayer color of B identical with the Bayer color of the third pixel P 3 and a plurality of ‘ ⁇ /n’ are calculated by the average value ‘ ⁇ ’ divided by ‘n’ that is a multiple of 2 at step S 102 .
- the average value ‘ ⁇ ’ is the average value of the first pixel P 1 and the fifth pixel P 5 so that the average value can be denoted with a condition of (P 1 +P 5 )/2.
- values denoted with the first pixel P 1 and the fifth pixel P 5 are codes, i.e., voltages, corresponding to the values of the first pixel P 1 and the fifth pixel P 5 among values of the code from 1 to 255, for instance, in case of expressing the value of the pixel data in an 8 bit.
- the third pixel P 3 is the dark defect.
- the first pixel P 1 and the fifth pixel P 5 have the values of the codes, 129 and 131, respectively, thereby having the average value ‘ ⁇ ’, 130.
- the value of the code of the third pixel P 3 is 131
- the value of the code of the third pixel P 3 , 131 is greater than the average value ‘ ⁇ ’ of the first pixel P 1 and the fifth pixel P 5 , 130. Accordingly, it is concluded that the third pixel P 3 is the dark defect.
- the dark defect of the third pixel P 3 is discriminated with ‘2 ⁇ ’ that is two times more than the average value ‘ ⁇ ’, the first pixel P 1 and the fifth pixel P 5 have the values of the codes, 59 and 61, respectively. Accordingly, ‘2 ⁇ ’ is 120. At this time, if the value of the code of the third pixel P 3 is 119, the average value ‘ ⁇ ’, 120 is greater than the value of the code of the third pixel P 3 , 119, thereby concluding that the third pixel P 3 is not the dark defect.
- a threshold value (V T ) is used as a discriminating standard of the dark defect.
- the threshold value (V T ) is calculated by adding ‘ ⁇ /n’ obtained by the average value ‘ ⁇ ’ divided by ‘n’ that is the multiple of 2, i.e., ‘ ⁇ /2’ and ‘ ⁇ /4’, to the average value ‘ ⁇ ’.
- n is made to be selectively changed according to a low luminance of an image.
- the threshold value (V T ) decreases.
- V T the threshold value
- FIG. 4 is a graph illustrating a dark defect discriminating region by using an average value ‘ ⁇ ’ and a threshold value ‘ ⁇ + ⁇ /n’ in accordance with the present invention.
- a first threshold value V T1 is calculated by ‘ ⁇ + ⁇ /2’ and a second threshold value V T2 is calculated by ‘ ⁇ + ⁇ /4’.
- V T1 is calculated by ‘ ⁇ + ⁇ /2’
- V T2 is calculated by ‘ ⁇ + ⁇ /4’.
- the third pixel P 3 is the dark defect pixel and this dark defect is concealed.
- a method for replacing the third pixel P 3 with the average value ‘ ⁇ ’ of the P 1 and the P 5 is used.
- a threshold value applied to the present pixel is selected between the two threshold values V T1 and V T2 at step S 103 .
- the size of the value of the code is compared with the size of the threshold value of at step S 104 .
- the corresponding pixel that is the third pixel P 3 is concluded as a pixel generating the dark defect for a moment.
- FIG. 5 is a diagram illustrating an embodiment of detecting a dark defect within an installed window.
- the third pixel P 3 that is the pixel corresponding to detect the dark defect has an identical Bayer color with the first pixel P 1 and the fifth pixel P 5 .
- the second pixel P 2 and the fourth pixel P 4 also have the identical Bayer color with each other.
- ⁇ circle around (1) ⁇ denotes the average value ⁇
- ⁇ circle around (2) ⁇ denotes the threshold value ‘ ⁇ + ⁇ /2’
- ⁇ circle around (3) ⁇ denotes the threshold value ‘ ⁇ + ⁇ /4’.
- the threshold value is 12.5 in case of using the threshold value calculated by ⁇ circle around (3) ⁇ . Accordingly, the value of the code of the third pixel P 3 is 15, thereby being greater than 12.5 that is the threshold value calculated by ⁇ circle around (3) ⁇ . Thus, in this case, it is concluded that the third pixel P 3 is the dark defect for a moment.
- FIG. 6 is a diagram illustrating an embodiment showing an edge existing within an installed window.
- the average value ⁇ becomes 30 due to the condition of (P 1 +P 5 )/2. If the threshold value corresponding to ⁇ circle around (3) ⁇ shown in FIG. 5 is applied, the threshold value is 5 ⁇ /4, thereby becoming 37.5.
- the value of the code of the third pixel P 3 , 50 is greater than the threshold value, 37.5, the third pixel P 3 is concluded to be the dark defect.
- the edge exists in a region denoted with a dotted line so that the first pixel P 1 and the third pixel P 3 have the values of the codes having a big difference between them.
- the concealment of the dark defect is performed after concluding the dark defect, the image quality is deteriorated.
- an edge discriminating zone is set, thereby checking the existence of the edge by using this edge discriminating zone.
- FIG. 7 is a diagram illustrating the edge discriminating zone.
- a horizontal axis denotes the value of the code of the first pixel P 1 and a vertical axis denotes the value of the fifth pixel P 5 as for a method for expressing data in an 8 bit.
- a condition of P 4 ⁇ P 2 >(P 4 +P 2 )/2 is defined in a R 1 ′ region. If this condition is solved, a new condition of P 4 >3P 2 is obtained. Also, a condition of P 2 ⁇ P 4 >(P 2 +P 4 )/2 is defined in a R 1 region. If this condition is solved, a new condition of P 2 >3P 4 is obtained. These two regions can be expressed with another condition of
- one value of the code is three times greater than the other value of the code so that it is realized that the edge exists in this region.
- a condition of P 5 ⁇ P 1 >(P 5 +P 1 )/4 is defined in a R 2 ′ region. If this condition is solved, a new condition of P 5 >5/3P 1 is obtained. Also, a condition of P 1 ⁇ P 5 >(P 1 +P 5 )/4 is defined in a R 2 region. If this condition is solved, a new condition of P 1 >3P 5 is obtained. These two regions can be expressed with another condition of
- one value of the code is five thirds times greater than the other value of the code so that it is realized that the edge exists in this region.
- R 1 , R 1 ′, R 2 and R 2 ′ even though the value of the code of the third pixel P 3 exceeds the threshold value, the concealment of the dark defect is omitted at step S 105 .
- the concealment of the dark defect is decided by a comparison between the value of the code of the third pixel P 3 and the threshold value.
- the third pixel P 3 is decided to be a defect pixel, thereby performing the concealment of the dark defect with respect to the third pixel P 3 .
- a region where the values of the codes of both the first pixel P 1 and the fifth pixel P 5 are less than a predetermined value of the code is defined as a blocking zone, R 4 to prevent a region where the edge does not actually exist from being judged as the edge since the region where the edge does not actually exist satisfies with the condition of
- R 4 ranges from approximately 7 to approximately 32 in case of that the method for expressing the data of the 8 bit is a 255 code.
- FIGS. 8A and 8B are photographs of transmission electron microscopy (TEM) illustrating an image quality improvement in case of applying the concealment of the dark defect in accordance with the present invention.
- TEM transmission electron microscopy
- FIG. 8A illustrates a photograph before the image quality improvement, thereby observing a plurality of defects such as ‘X’ in the image.
- FIG. 8B illustrates a photograph after the image quality improvement, thereby observing that the defects are almost removed.
- the pixel data comprised of the format of a red color, a green color and a blue color are exemplified, a format of complementary colors such as a yellow color, a magenta color and a cyan color can be applied.
- the present invention performed as described above forms a window with a size of 1 ⁇ 5 by using a simple hardware constitution such as a shift resistor for sequentially outputting image pixel data.
- a simple hardware constitution such as a shift resistor for sequentially outputting image pixel data.
- an average value and a threshold value are determined by using pixels having an identical color with a corresponding pixel in each window and then, a dark defect is judged by comparing the average value and the threshold value.
- a concealment of the dark defect is selectively performed, thereby judging an existence of an edge by using values of the adjacent pixels having the identical color and not having the identical color during judging the dark defect.
- a blocking zone is set and thus, it is possible to improve an image quality by increasing precision during judging the dark defect and discriminating the edge.
- the present invention provides an effect of improving an image quality of image data of an image sensor by minimizing a deterioration of the image through a concealment of a dark defect.
Abstract
Disclosed is a method for concealing a dark defect in an image sensor. The method includes the steps of: setting a window including five sequential pixels from pixel data sequentially outputted, the third pixel and the fifth pixels being identical in Bayer color with each other and the second and the fourth pixels being identical in Bayer color with each other; calculating an average value α of the first and the fifth pixels and a plurality of α/n obtained by dividing the average value α by n; selecting one of the plurality of α/n; comparing a threshold value α+α/n calculated by adding the average value α to the selected α/n with a value of the third pixel in size; and omitting a concealment of the dark defect when the threshold value α+α/n is greater than the value of the third pixel.
Description
The present invention relates to a method for concealing a dark defect in an image sensor; and more particularly, to a method for concealing a dark defect capable of being actively applied according to a pixel data.
An image sensor is a device printing images by using a characteristic a semiconductor reacts to a light. That is, the image sensor is a device that a pixel detects a brightness and a wavelength of each different light coming from each different subject and reads the light in an electrical value. The image sensor plays a role in making this electrical value to a level capable of performing a signal processing.
Recently, a complementary metal oxide semiconductor (CMOS) image sensor having an excellent productivity due to a high scale of integration and a low consuming voltage has been more highlighted compared with a conventional solid camera device, i.e., a charge coupled device (CCD).
Meanwhile, a poor characteristic of the image sensor is a light signal reproduction in a low illuminated environment. It is because of an influence by a noise signal caused by a unique characteristic of the semiconductor device. This noise component degrades a ratio of a signal to a noise (SNR), thereby deteriorating an image quality.
Especially, in the low illuminated environment which the light signal is weakly entered to, an internal area should be increased, thereby increasing a signal composition entering. At this time, the noise composition is also increased with the same ratio and thus, a noise defect such as a spot is generated. Accordingly, it is called a dark defect.
It is, therefore, an object of the present invention to provide a method for concealing a dark defect generating a noise defect such as a spot prominently appeared in a low illuminated environment.
In accordance with one aspect of the present invention, there is provided a method for concealing a dark defect in an image sensor, including the steps of: setting a window including five sequential pixels, e.g., a first pixel P1, a second pixel P2, a third pixel P3, a fourth P4 and a fifth pixel P5, from a plurality of pixel data sequentially outputted, the third pixel and the fifth pixels P3 and P5 being identical in Bayer color with each other and the second and the fourth pixels P2 and P4 being identical in Bayer color with each other; calculating an average value ‘α’ of the first and the fifth pixels P1 and P5 and a plurality of ‘α/n’ obtained by dividing the average value ‘α’ by ‘n’, ‘n’ being a multiple of 2; selecting one of the plurality of ‘α/n’; comparing a threshold value ‘α+α/n’ calculated by adding the average value ‘α’ to the selected ‘α/n’ with a value of the third pixel P3 in size; and omitting a concealment of the dark defect when the threshold value ‘α+α/n’ is greater than the value of the third pixel P3.
In accordance with another aspect of the present invention, there is provided a method for concealing a dark defect in an image sensor, including the steps of: extracting a window including five sequential pixels, e.g., a first pixel P1, a second pixel P2, a third pixel P3, a fourth P4 and a fifth pixel P5, from a plurality of pixel data sequentially outputted, the third and the fifth pixels P3 and P5 being identical in Bayer color with each other and the second and the fourth pixels P2 and P4 being identical Bayer color with each other; calculating an average value ‘α’ of the first and the fifth pixels P1 and P5 and a plurality of ‘α/n’ obtained by dividing the average value ‘α’ by ‘n’, ‘n’ being a multiple of 2; selecting one of the plurality of ‘α/n’; comparing a threshold value ‘α+α/n’ calculated by adding the average value ‘α’ to the selected ‘α/n’ with a value of the third pixel P3 in size; judging an existence of an edge within the window by using the comparison result; and performing the concealment of the dark defect when the comparison result is affirmative.
The above and other objects and features of the present invention will become better understood with respect to the following description of the preferred embodiments given in conjunction with the accompanying drawings, in which:
Hereinafter, detailed descriptions on preferred embodiments of the present invention will be provided with reference to the accompanying drawings.
With references to FIGS. 1 and 2 , a method for concealing a dark defect in accordance with the embodiment of the present invention will be examined. Hereinafter, reference denotations, G, B and R denote a green color, a blue color and a red color, respectively.
The arrangement of the pixels uses a mosaic arrangement method illustrated in FIG. 2 and the pixel data are outputted in a series of sequential orders of GRGRGRGR and BGBGBGBGBG at two rows A and B.
As a first step of the method for concealing the dark defect, a window (W) comprised of five sequential pixels from a plurality of pixel data sequentially outputted, i.e., a plurality of pixel data of a first pixel P1 indicating B, a second pixel P2 indicating G, a third pixel P3 indicating B, a fourth pixel P4 indicating G and a fifth pixel P5 indicating B of the B row in FIG. 2 , is set at step S101. Herein, a present pixel subjected to a dark defect discrimination among the first pixel P1, the second pixel P2, the third pixel P3, the fourth pixel P4 and the fifth pixel P5 is the third pixel P3 indicating B. The third pixel P3 is placed in the right center N.
The first pixel P1, the third pixel P3 and the fifth pixel P5 have Bayer color of B. The second pixel P2 and the fourth pixel P4 have Bayer color of G. Meanwhile, the window (W) can be simply formed by using five shift resistors. Concealment of the dark defect is first performed to the third pixel P3 and then, the concealment of the dark defect is performed to the fourth pixel P4 indicating G placed next to the center N+1.
In the installed window (W), an average value ‘α’ is calculated by using the first pixel P1 and the fifth pixel P5 having the Bayer color of B identical with the Bayer color of the third pixel P3 and a plurality of ‘α/n’ are calculated by the average value ‘α’ divided by ‘n’ that is a multiple of 2 at step S102.
Herein, the average value ‘α’ is the average value of the first pixel P1 and the fifth pixel P5 so that the average value can be denoted with a condition of (P1+P5)/2. At this time, values denoted with the first pixel P1 and the fifth pixel P5 are codes, i.e., voltages, corresponding to the values of the first pixel P1 and the fifth pixel P5 among values of the code from 1 to 255, for instance, in case of expressing the value of the pixel data in an 8 bit.
Meanwhile, if the dark defect of the third pixel P3 is discriminated only with the average value ‘α’, a serious problem is generated. For instance, the first pixel P1 and the fifth pixel P5 have the values of the codes, 129 and 131, respectively, thereby having the average value ‘α’, 130. At this time, if the value of the code of the third pixel P3 is 131, the value of the code of the third pixel P3, 131 is greater than the average value ‘α’ of the first pixel P1 and the fifth pixel P5, 130. Accordingly, it is concluded that the third pixel P3 is the dark defect.
Furthermore, in an extreme way, if the dark defect of the third pixel P3 is discriminated with ‘2α’ that is two times more than the average value ‘α’, the first pixel P1 and the fifth pixel P5 have the values of the codes, 59 and 61, respectively. Accordingly, ‘2α’ is 120. At this time, if the value of the code of the third pixel P3 is 119, the average value ‘α’, 120 is greater than the value of the code of the third pixel P3, 119, thereby concluding that the third pixel P3 is not the dark defect.
However, these two embodiments described above are not enough to discriminate the dark defect.
Accordingly, in accordance with the present invention, to discriminate the dark defect more precisely, a threshold value (VT) is used as a discriminating standard of the dark defect. Herein, the threshold value (VT) is calculated by adding ‘α/n’ obtained by the average value ‘α’ divided by ‘n’ that is the multiple of 2, i.e., ‘α/2’ and ‘α/4’, to the average value ‘α’.
Accordingly, n is made to be selectively changed according to a low luminance of an image.
In case of that a value of ‘n’ is large, the threshold value (VT) decreases. Thus, there is an advantage of more precisely detecting the dark defect. However, in this case, the concealment of the dark defect is more frequently generated, thereby inducing a deterioration of an image quality. Accordingly, it is preferable to decide the value of n selectively according to a luminance of the image.
Referring to FIG. 4 , the average value ‘α’ and two threshold values are exemplified. Herein, a first threshold value VT1 is calculated by ‘α+α/2’ and a second threshold value VT2 is calculated by ‘α+α/4’. In case of that the value of the code of the third pixel P3 is an oblique lined region greater than either the first threshold value VT1 or the second threshold value VT2, it is concluded that the third pixel P3 is the dark defect pixel and this dark defect is concealed. As for the concealment of the dark defect, a method for replacing the third pixel P3 with the average value ‘α’ of the P1 and the P5 is used.
Subsequently, a threshold value applied to the present pixel is selected between the two threshold values VT1 and VT2 at step S103. Afterwards, the size of the value of the code is compared with the size of the threshold value of at step S104.
As a result of the comparison, if the value of the code of the corresponding pixel that is the third pixel P3 is smaller than the threshold value of the third pixel P3, the corresponding pixel that is the third pixel P3 does not generate a dark defect. Accordingly, a dark defect concealment is omitted at step S106.
Meanwhile, if the value of the code of the third pixel P3 is greater than the threshold value of the third pixel P3, the corresponding pixel that is the third pixel P3 is concluded as a pixel generating the dark defect for a moment.
Referring to FIG. 5 , the third pixel P3 that is the pixel corresponding to detect the dark defect has an identical Bayer color with the first pixel P1 and the fifth pixel P5. The second pixel P2 and the fourth pixel P4 also have the identical Bayer color with each other.
Accordingly, {circle around (1)} denotes the average value α, {circle around (2)} denotes the threshold value ‘α+α/2’ and {circle around (3)} denotes the threshold value ‘α+α/4’.
At this time, when both of the first pixel P1 and the fifth pixel P5 have the value of the code, 10, the threshold value is 12.5 in case of using the threshold value calculated by {circle around (3)}. Accordingly, the value of the code of the third pixel P3 is 15, thereby being greater than 12.5 that is the threshold value calculated by {circle around (3)}. Thus, in this case, it is concluded that the third pixel P3 is the dark defect for a moment.
Meanwhile, if an edge exists in an actual image, situations become different.
That is, if the third pixel P3 is concluded to be the dark defect as shown in FIG. 5 , it may be possible that the edge actually exists in this portion, thereby changing the value of the code.
Accordingly, in case of that the value of the code of the corresponding pixel is greater than the threshold value, whether the edge exists or not within the window is judged at step S106.
Referring to FIG. 6 , if the first pixel P1 and the fifth pixel P5 have the values of the codes, 10 and 50, respectively and the third pixel P3 has the value of the code, 50, the average value α becomes 30 due to the condition of (P1+P5)/2. If the threshold value corresponding to {circle around (3)} shown in FIG. 5 is applied, the threshold value is 5α/4, thereby becoming 37.5.
Accordingly, the value of the code of the third pixel P3, 50 is greater than the threshold value, 37.5, the third pixel P3 is concluded to be the dark defect. However, in case of this window, the edge exists in a region denoted with a dotted line so that the first pixel P1 and the third pixel P3 have the values of the codes having a big difference between them. In this case, if the concealment of the dark defect is performed after concluding the dark defect, the image quality is deteriorated. Thus, it is important to understand an existence of the edge with respect to the corresponding window.
For understanding the existence of the edge, an edge discriminating zone is set, thereby checking the existence of the edge by using this edge discriminating zone.
In FIG. 7 , a horizontal axis denotes the value of the code of the first pixel P1 and a vertical axis denotes the value of the fifth pixel P5 as for a method for expressing data in an 8 bit.
Referring to FIG. 7 , a condition of P4−P2>(P4+P2)/2 is defined in a R1′ region. If this condition is solved, a new condition of P4>3P2 is obtained. Also, a condition of P2−P4>(P2+P4)/2 is defined in a R1 region. If this condition is solved, a new condition of P2>3P4 is obtained. These two regions can be expressed with another condition of |P2−P4|>(P4+P2)/2.
That is, in the relationship between the second pixel P2 and the fourth pixel P4 adjacent to the third pixel P3, one value of the code is three times greater than the other value of the code so that it is realized that the edge exists in this region.
Furthermore, a condition of P5−P1>(P5+P1)/4 is defined in a R2′ region. If this condition is solved, a new condition of P5>5/3P1 is obtained. Also, a condition of P1−P5>(P1+P5)/4 is defined in a R2 region. If this condition is solved, a new condition of P1>3P5 is obtained. These two regions can be expressed with another condition of |P5−P1|>(P5+P1)/4.
That is, in the relationship between the first pixel P1 and the fifth pixel P5 having the identical bayer color with the third pixel P3, one value of the code is five thirds times greater than the other value of the code so that it is realized that the edge exists in this region. In case of that value of the code of the third pixel P3 is falling under the four regions, R1, R1′, R2 and R2′, even though the value of the code of the third pixel P3 exceeds the threshold value, the concealment of the dark defect is omitted at step S105.
Meanwhile, in case of a R3 region that is not corresponding to the aforementioned four regions, since the edge does not exist in the corresponding window, the concealment of the dark defect is decided by a comparison between the value of the code of the third pixel P3 and the threshold value.
That is, if the code value of the third pixel P3 is greater than the threshold value and the edge does not exist, the third pixel P3 is decided to be a defect pixel, thereby performing the concealment of the dark defect with respect to the third pixel P3.
Meanwhile, in the image with an extremely low luminance, even though there is a little bit of difference in the values of the codes of the first pixel P1, the second pixel P2, the third pixel P3, the fourth pixel P4 and the fifth pixel P5, it is judged as the edge, thereby not performing the concealment of the dark defect. As described above, a region where the values of the codes of both the first pixel P1 and the fifth pixel P5 are less than a predetermined value of the code is defined as a blocking zone, R4 to prevent a region where the edge does not actually exist from being judged as the edge since the region where the edge does not actually exist satisfies with the condition of |P2−P4|>(P2+P4)/2 or |P1−P5|>(P1+P5)/2.
Accordingly, if the values of the codes of the first pixel P1 and the fifth pixel P5 are falling under the blocking zone, R4, the concealment of the dark defect with respect to the third pixel P3 is unconditionally performed.
At this time, in case of that a maximum critical value of the blocking zone, R4 ranges from approximately 7 to approximately 32 in case of that the method for expressing the data of the 8 bit is a 255 code.
Meanwhile, in accordance with the embodiment of the present invention, although the pixel data comprised of the format of a red color, a green color and a blue color are exemplified, a format of complementary colors such as a yellow color, a magenta color and a cyan color can be applied.
The present invention performed as described above forms a window with a size of 1×5 by using a simple hardware constitution such as a shift resistor for sequentially outputting image pixel data. At this time, an average value and a threshold value are determined by using pixels having an identical color with a corresponding pixel in each window and then, a dark defect is judged by comparing the average value and the threshold value. Thus, a concealment of the dark defect is selectively performed, thereby judging an existence of an edge by using values of the adjacent pixels having the identical color and not having the identical color during judging the dark defect. In case of that the values of the pixels having the identical color within the window are less than a predetermined value, a blocking zone is set and thus, it is possible to improve an image quality by increasing precision during judging the dark defect and discriminating the edge.
The present invention provides an effect of improving an image quality of image data of an image sensor by minimizing a deterioration of the image through a concealment of a dark defect.
The present application contains subject matter related to the Korean patent application No. KR 2004-0029070, filed in the Korean Patent Office on Apr. 27, 2004, the entire contents of which being incorporated herein by reference.
While the present invention has been described with respect to certain preferred embodiments, it will be apparent to those skilled in the art that various changes and modifications may be made without departing from the spirit and scope of the invention as defined in the following claims.
Claims (19)
1. A method for concealing a dark defect in an image sensor, comprising the steps of:
setting a window including five sequential pixels, a first pixel P1, a second pixel P2, a third pixel P3, a fourth P4 and a fifth pixel P5, from a plurality of pixel data sequentially outputted, the third pixel and the fifth pixels P3 and P5 being identical in Bayer color with each other and the second and the fourth pixels P2 and P4 being identical in Bayer color with each other;
calculating an average value ‘α’ of the first and the fifth pixels P1 and P5 and a plurality of ‘α/n’ obtained by dividing the average value ‘α’ by ‘n’, ‘n’ being a multiple of 2;
selecting one of the plurality of ‘α/n’;
comparing a threshold value ‘α+α/n’ calculated by adding the average value ‘α’ to the selected ‘α/n’ with a value of the third pixel P3 in size; and
omitting a concealment of the dark defect in the image sensor when the threshold value ‘α+α/n’ is greater than the value of the third pixel P3.
2. The method of claim 1 , wherein further including a step of judging whether the edge exists or not within the window by the comparison result.
3. The method of claim 2 , wherein in the step of judging the edge, the concealment of the dark defect is omitted when the comparison result represents the existence of the edge within the window.
4. The method of claim 3 , wherein if one of conditions of |P2−P4|>(P2+P4)/2 and |P1−P5|>(P1+P5)/4 is satisfied, it is judged that the edge exists within the window.
5. The method of claim 4 , wherein even though the edge exists within the window by satisfying one of the conditions of |P2−P4|>(P2+P4)/2 and |P1−P5|>(P1+P5)/4, as the values of the first and the fifth pixels P1 and P5 are falling under a blocking zone having a less value than a predetermined value, the concealment of the dark defect is performed.
6. The method of claim 5 , wherein the predetermined value ranges from approximately 7 to approximately 32 in case of a 255 code of an 8 bit.
7. The method of claim 1 , wherein at the step of selecting one of the plurality of ‘α/n’, a detecting capability of the dark defect increases and an image quality degrades as a value of ‘n’ increases.
8. The method of claim 1 , wherein the pixel data is comprised of a format of a red color (R), a green color (G) and a blue color (B).
9. A method for concealing a dark defect in an image sensor, comprising the steps of:
extracting a window including five sequential pixels, a first pixel P1, a second pixel P2, a third pixel P3, a fourth P4 and a fifth pixel P5, from a plurality of pixel data sequentially outputted, the third and the fifth pixels P3 and P5 being identical in Bayer color with each other and the second and the fourth pixels P2 and P4 being identical Bayer color with each other;
calculating an average value ‘α’ of the first and the fifth pixels P1 and P5 and a plurality of ‘α/n’ obtained by dividing the average value ‘α’ by ‘n’, ‘n’ being a multiple of 2;
selecting one of the plurality of ‘α/n’;
comparing a threshold value ‘α+α/n’ calculated by adding the average value ‘α’ to the selected ‘α/n’ with a value of the third pixel P3 in size;
judging an existence of an edge within the window by using the comparison result; and
performing the concealment of the dark defect in the image sensor when the comparison result is affirmative.
10. The method of claim 9 , wherein in the step of judging the existence of the edge in the window, the concealment of the dark defect with respect to the third pixel P3 is performed as both of the first and the fifth pixels P1 and P5 are falling under a blocking zone having a value less than a predetermined value even though the edge exists in the window by satisfying one of conditions of |P2−P4|>(P2+P4)/2 and |P1−P5|>(P1+P5)/4.
11. The method of claim 10 , wherein the predetermined value ranges from approximately 7 to approximately 32 in case of a 255 code of an 8 bit.
12. The method of claim 9 , wherein at the step of selecting one of the plurality of ‘α/n’, a detecting capability of the dark defect increases and an image quality degrades as a value of n increases.
13. The method of claim 9 , wherein the pixel data is comprised of a format of a red color (R), a green color (G) and a blue color (B).
14. A method for correcting pixel data in an image sensor, the method comprising:
calculating a first threshold and a second threshold;
determining a luminance value of an image from the image sensor, wherein the image comprises a first pixel having a first pixel value, a second pixel having a second pixel value, and a third pixel having a third pixel value;
selecting one of the first threshold and the second threshold to form a selected threshold according to the luminance value; and
concealing a dark defect in the image sensor if the second pixel value is greater than the selected threshold.
15. The method of claim 14, further comprising:
judging an existence of an edge in the window; and
omitting the step of concealing a dark defect if the edge exists.
16. The method of claim 14, wherein each of the first threshold and the second threshold are proportional to an average value of the first pixel value and the third pixel value.
17. The method of claim 14, wherein the first pixel and the second pixel are separated by a pixel having a different color; and
wherein the second pixel and the third pixel are separated by another pixel having a different color.
18. A method for correcting pixel data in an image sensor, the method comprising:
calculating a first threshold and a second threshold;
wherein the first threshold and the second threshold are each proportional to an average value of a first pixel value and a third pixel value;
selecting one of the first threshold and the second threshold to form a selected threshold; and
concealing a dark defect in the image sensor if a second pixel value is greater than the selected threshold;
wherein each of the first pixel value, the second pixel value, and the third pixel value are representative of a first color.
19. The method of claim 18, further comprising:
determining a luminance of an image comprising the first pixel value, the second pixel value, and the third pixel value; and
wherein the step of selecting one of the first threshold and the second threshold is performed according to the luminance.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12/713,040 USRE43853E1 (en) | 2004-04-27 | 2010-02-25 | Method for concealing dark defect in image sensor |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2004-0029070 | 2004-04-27 | ||
KR1020040029070A KR100573487B1 (en) | 2004-04-27 | 2004-04-27 | Image sensor |
US11/097,852 US7336850B2 (en) | 2004-04-27 | 2005-03-30 | Method for concealing dark defect in image sensor |
US12/713,040 USRE43853E1 (en) | 2004-04-27 | 2010-02-25 | Method for concealing dark defect in image sensor |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US11/097,852 Reissue US7336850B2 (en) | 2004-04-27 | 2005-03-30 | Method for concealing dark defect in image sensor |
Publications (1)
Publication Number | Publication Date |
---|---|
USRE43853E1 true USRE43853E1 (en) | 2012-12-11 |
Family
ID=35136485
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US11/097,852 Ceased US7336850B2 (en) | 2004-04-27 | 2005-03-30 | Method for concealing dark defect in image sensor |
US12/713,040 Active 2026-04-04 USRE43853E1 (en) | 2004-04-27 | 2010-02-25 | Method for concealing dark defect in image sensor |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US11/097,852 Ceased US7336850B2 (en) | 2004-04-27 | 2005-03-30 | Method for concealing dark defect in image sensor |
Country Status (3)
Country | Link |
---|---|
US (2) | US7336850B2 (en) |
JP (1) | JP4721744B2 (en) |
KR (1) | KR100573487B1 (en) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100607805B1 (en) * | 2004-05-06 | 2006-08-02 | 매그나칩 반도체 유한회사 | Method for distinction of dark condition and color interpolation in image sensor |
US7929798B2 (en) * | 2005-12-07 | 2011-04-19 | Micron Technology, Inc. | Method and apparatus providing noise reduction while preserving edges for imagers |
JP4745816B2 (en) * | 2005-12-20 | 2011-08-10 | 富士通セミコンダクター株式会社 | Image processing circuit and image processing method |
KR100819288B1 (en) | 2006-10-20 | 2008-04-02 | 삼성전자주식회사 | Method of eliminating low-luminance noise and image compression apparatus |
CN100573315C (en) * | 2007-04-04 | 2009-12-23 | 鸿富锦精密工业(深圳)有限公司 | Camera module stain test macro and method |
JP2009105872A (en) * | 2007-10-01 | 2009-05-14 | Sony Corp | Defective pixel correction circuit and solid-state imaging device |
KR101442242B1 (en) * | 2007-12-12 | 2014-09-29 | 삼성전자주식회사 | Defect and noise removal method |
US8237825B2 (en) * | 2008-12-11 | 2012-08-07 | Exelis, Inc. | Pixel replacement using five nearest neighbors |
KR101653622B1 (en) * | 2015-05-07 | 2016-09-05 | 고려대학교 산학협력단 | Image sensor for extracting edge information |
CN110650334B (en) * | 2019-10-29 | 2021-01-22 | 锐芯微电子股份有限公司 | Dead pixel detection and correction method and device, storage medium and terminal |
CN113949756B (en) * | 2020-07-17 | 2022-11-15 | Oppo广东移动通信有限公司 | Sensor hiding method, device, terminal and storage medium |
US11742175B2 (en) * | 2021-06-30 | 2023-08-29 | Fei Company | Defective pixel management in charged particle microscopy |
Citations (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4579455A (en) * | 1983-05-09 | 1986-04-01 | Kla Instruments Corporation | Photomask inspection apparatus and method with improved defect detection |
JPH04345383A (en) | 1991-05-23 | 1992-12-01 | Hitachi Ltd | Picture defect correcting circuit |
JPH11239298A (en) | 1998-02-19 | 1999-08-31 | Konica Corp | Electronic camera, pixel signal correction method and recording medium |
JP2001028711A (en) | 1999-07-14 | 2001-01-30 | Fuji Photo Film Co Ltd | Correction device for defect pixel data for solid-state image pickup element |
US20010033683A1 (en) * | 2000-04-25 | 2001-10-25 | Maki Tanaka | Method of inspecting a pattern and an apparatus thereof and a method of processing a specimen |
US20020126299A1 (en) * | 2001-01-22 | 2002-09-12 | Xerox Corporation | Document scanner having replaceable backing and automatic selection of registration parameters |
JP2002354340A (en) | 2001-05-24 | 2002-12-06 | Olympus Optical Co Ltd | Imaging device |
US20030012452A1 (en) * | 2001-07-06 | 2003-01-16 | Jasc Software, Inc. | Assisted scratch removal |
US20030228045A1 (en) * | 2002-06-10 | 2003-12-11 | Dainippon Screen Mfg. Co., Ltd. | Apparatus and method for inspecting pattern |
JP2004023683A (en) | 2002-06-20 | 2004-01-22 | Fuji Photo Film Co Ltd | Defect correction apparatus and method for solid-state imaging device |
US6829381B2 (en) * | 2001-11-28 | 2004-12-07 | Applied Materials, Inc. | Method for detecting defects |
US20050249417A1 (en) * | 2004-05-06 | 2005-11-10 | Dong-Seob Song | Edge detecting method |
US20080055434A1 (en) * | 2006-08-31 | 2008-03-06 | Micron Technology, Inc. | Image sensor defect identification using blurring techniques |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3847595B2 (en) * | 2001-10-04 | 2006-11-22 | オリンパス株式会社 | Electronic camera and electronic camera system |
JP3884952B2 (en) * | 2001-12-21 | 2007-02-21 | 株式会社日立製作所 | Imaging device |
-
2004
- 2004-04-27 KR KR1020040029070A patent/KR100573487B1/en not_active IP Right Cessation
-
2005
- 2005-03-30 JP JP2005096952A patent/JP4721744B2/en active Active
- 2005-03-30 US US11/097,852 patent/US7336850B2/en not_active Ceased
-
2010
- 2010-02-25 US US12/713,040 patent/USRE43853E1/en active Active
Patent Citations (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4579455A (en) * | 1983-05-09 | 1986-04-01 | Kla Instruments Corporation | Photomask inspection apparatus and method with improved defect detection |
JPH04345383A (en) | 1991-05-23 | 1992-12-01 | Hitachi Ltd | Picture defect correcting circuit |
JPH11239298A (en) | 1998-02-19 | 1999-08-31 | Konica Corp | Electronic camera, pixel signal correction method and recording medium |
JP2001028711A (en) | 1999-07-14 | 2001-01-30 | Fuji Photo Film Co Ltd | Correction device for defect pixel data for solid-state image pickup element |
US20010033683A1 (en) * | 2000-04-25 | 2001-10-25 | Maki Tanaka | Method of inspecting a pattern and an apparatus thereof and a method of processing a specimen |
US20020126299A1 (en) * | 2001-01-22 | 2002-09-12 | Xerox Corporation | Document scanner having replaceable backing and automatic selection of registration parameters |
JP2002354340A (en) | 2001-05-24 | 2002-12-06 | Olympus Optical Co Ltd | Imaging device |
US20030012452A1 (en) * | 2001-07-06 | 2003-01-16 | Jasc Software, Inc. | Assisted scratch removal |
US6829381B2 (en) * | 2001-11-28 | 2004-12-07 | Applied Materials, Inc. | Method for detecting defects |
US20030228045A1 (en) * | 2002-06-10 | 2003-12-11 | Dainippon Screen Mfg. Co., Ltd. | Apparatus and method for inspecting pattern |
JP2004023683A (en) | 2002-06-20 | 2004-01-22 | Fuji Photo Film Co Ltd | Defect correction apparatus and method for solid-state imaging device |
US20050249417A1 (en) * | 2004-05-06 | 2005-11-10 | Dong-Seob Song | Edge detecting method |
US20080055434A1 (en) * | 2006-08-31 | 2008-03-06 | Micron Technology, Inc. | Image sensor defect identification using blurring techniques |
Non-Patent Citations (1)
Title |
---|
Uncertified translation of Japanese Office Action dated Sep. 6, 2010. |
Also Published As
Publication number | Publication date |
---|---|
KR100573487B1 (en) | 2006-04-24 |
US20050238250A1 (en) | 2005-10-27 |
US7336850B2 (en) | 2008-02-26 |
JP2005318565A (en) | 2005-11-10 |
KR20050103773A (en) | 2005-11-01 |
JP4721744B2 (en) | 2011-07-13 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
USRE43853E1 (en) | Method for concealing dark defect in image sensor | |
KR101001431B1 (en) | Pixel defect detecting/correcting device and pixel defect detecting/correcting method | |
US7636472B2 (en) | Image quality correction apparatus and image quality correction method | |
EP1389771B1 (en) | Digital image system and method for combining demosaicing and bad pixel correction | |
EP2026563A1 (en) | System and method for detecting defective pixels | |
US8964069B2 (en) | Image processing device and solid-state imaging device including a defect correcting function | |
US8837852B2 (en) | Apparatus and method for removing defective pixels | |
US6473202B1 (en) | Image processing apparatus | |
JP2008306379A (en) | Solid-state imaging element | |
JP2003078821A (en) | Imaging apparatus | |
US20080112639A1 (en) | Method and apparatus for removing noise in dark area of image | |
US20110234858A1 (en) | Image processing apparatus and method, and image processing program | |
JP2000059799A (en) | Pixel defect correcting device and pixel defect correcting method | |
JP3696069B2 (en) | Method and apparatus for detecting defective pixels of solid-state image sensor | |
US7199822B2 (en) | Dynamic white balance control circuit and multi-screen display device | |
JPH077675A (en) | Picture element defect correction device | |
JP2005184307A (en) | Circuit and method for correcting flawed pixel | |
JP2000101924A (en) | Defect detection correction device in image input device | |
JP3379462B2 (en) | Image processing device | |
WO2020195515A1 (en) | Imaging device and image processing method | |
JP4287356B2 (en) | Image processing method and apparatus | |
JPH06245148A (en) | Picture element defect correction device | |
JP2005318642A (en) | Method and apparatus for detecting defective pixel of solid-state imaging device | |
JP2005168057A (en) | Pixel defective correction method and apparatus of solid imaging device | |
KR100653677B1 (en) | Method and Apparatus for concealing dead defeat pixel |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AS | Assignment |
Owner name: INTELLECTUAL VENTURES II LLC, DELAWARE Free format text: MERGER;ASSIGNOR:CROSSTEK CAPITAL, LLC;REEL/FRAME:026637/0632 Effective date: 20110718 |
|
CC | Certificate of correction | ||
FPAY | Fee payment |
Year of fee payment: 8 |
|
MAFP | Maintenance fee payment |
Free format text: PAYMENT OF MAINTENANCE FEE, 12TH YEAR, LARGE ENTITY (ORIGINAL EVENT CODE: M1553); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY Year of fee payment: 12 |