|Publication number||US7405398 B2|
|Application number||US 11/406,462|
|Publication date||29 Jul 2008|
|Filing date||18 Apr 2006|
|Priority date||9 Jun 2003|
|Also published as||CA2470452A1, US7091477, US8546750, US8946622, US20050035287, US20060186334, US20080258052, US20140087478, US20150214021|
|Publication number||11406462, 406462, US 7405398 B2, US 7405398B2, US-B2-7405398, US7405398 B2, US7405398B2|
|Inventors||Charles Jolliffe, Gholamreza Javahery, Lisa Cousins|
|Original Assignee||Ionics Mass Spectrometry Group, Inc.|
|Export Citation||BiBTeX, EndNote, RefMan|
|Patent Citations (30), Non-Patent Citations (3), Referenced by (19), Classifications (17), Legal Events (2)|
|External Links: USPTO, USPTO Assignment, Espacenet|
This application is a continuation of U.S. application Ser. No. 10/864,106, entitled “MASS SPECTROMETER INTERFACE,” filed Jun. 9, 2004 now U.S. Pat. No. 7,091,477 which is hereby incorporated by reference in its entirety and which claims the benefit of U.S. Provisional Patent Application No. 60/476,631 filed on Jun. 9, 2003, which is hereby incorporated by reference in its entirety.
The present invention relates generally to mass spectrometry and more particularly to an interface for providing particles to a mass spectrometer, and to a mass spectrometry apparatus including the interface, and related methods.
Mass spectrometry (MS) is a well-known technique of obtaining a molecular weight and structural information about chemical compounds. Using mass spectrometry techniques, molecules may be weighed by ionizing the molecules and measuring the response of their trajectories in a vacuum to electric and magnetic fields. Ions are weighed according to their mass-to-charge (m/z) values.
Atmospheric pressure ion sources (API) have become increasingly important as a means for generating ions used in mass spectrometers. Some common atmospheric pressure ion sources include Electrospray or nebulization assisted Electrospray (ES), Atmospheric Pressure Chemical Ionization (APCI), Atmospheric Photo Ionization (APPI), and Matrix Assisted Laser Desorption Ionization (MALDI). These ion sources produce charged particles, such as protonated molecular ions or adduct, from analyte species in solution or solid form, in a region which is approximately at atmospheric pressure.
API sources are advantageous because they provide a gentle means for charging molecules without inducing fragmentation. They also provide ease of use because samples can be introduced at atmosphere.
Mass spectrometers, however, generally operate in a vacuum maintained between 10−4 to 10−10 Torr depending on the mass analyzer type. Thus once created, the charged particles must be transported into vacuum for mass analysis. Typically, a portion of the ions created in the API sources are entrained in a bath gas API source chamber and swept into vacuum along with a carrier gas through an orifice into vacuum. Doing this efficiently presents numerous challenges.
Disadvantageously, API sources produce high chemical background and relatively low sensitivity. This results in a poor signal-to-noise ratio. This is believed to be caused by sampling of impurites attached to analyte ions (for example, cluster molecules, atoms or ions, or other undesired adducts), caused by incomplete desolvation during the API process. Many solvated droplets enter into the mass spectrometer and consequently produce a large level of chemical noise across the entire mass range. Additionally incompletely vaporized droplets linger near the sampling orifice.
These problems can be most severe for high flow rates. Efficient Electrospray Ionization (ESI) at high liquid flow rates requires sufficient energy transfer for desolvation and a method to deter large clusters from entering the vacuum chamber while enhancing the ion capture. High flow rate analyses are important to industries that have large throughput requirements (such as drug development today, and in the future, protein analysis). For most modern applications of ESI and APCI, liquid samples are passed through the source at high flow rates.
Another problem with electrospray concerns the condensation of the expanding jet and clustering of the ions. Various instrument manufactures use a conventional molecular beam interface to couple an ion source to the low pressure vacuum region. Conventionally, a molecular free jet is formed as gas expands from atmosphere into an evacuated region. The ion flux is proportional to the neutral density in a free jet, which depends on the shape and size of the orifice through which the gas expands, as well as the pressure of the evacuated region. In conventional ion sources, a skimmer samples the free jet, and the ions are detected downstream. This approach has several negative side effects, including: a) restricting the time for ion desolvation, b) enhancing ion salvation, c) restricting the gas flow through the orifice due to pumping requirements and the spatial requirements of sampling a free jet expansion.
To reduce the problem of incomplete desolvation, heated gases are commonly employed to vaporize with a flow direction opposite, or counter, to sprayed droplets in order to desolvate ions at atmospheric pressure. Since the heated gases remove some of the solvent vapor from the stream of gas before being drawn into the vacuum chamber, this technique may partially assist to increase the concentration of ions of interest entering the vacuum chamber.
While the counter flow of gas results in some improvement in sensitivity for low liquid flow rates, it is insufficient for high liquid flow rates, for example 10 microliters per minute or more, where substantially more energy transfer is required than the counter flow of gas can provide. Also, even for low liquid flow rates, it substantially increases the complexity of the interface between the electrospray and the mass spectrometer. In order that the solvent vapor from the evaporating droplets be efficiently removed by the counter flowing gas, both the temperature and the flow rate of the gas must be carefully controlled. High gas flow rates may prevent some ions with low mobility from entering the analyzer, while low gas flow rates or reduced gas temperature may not sufficiently desolvate the ions. The counter flowing gas flow rate and temperature are typically optimized for each analyte and solvent. Accordingly, much trial and error time is necessary to determine the optimum gas flow rate and temperature for each particular analyte utilizing a particular electrospray device and a particular mass spectrometer. As a result only a small fraction of the produced ions are focused by the lenses and transmitted to the mass analyzer for detection. Accordingly, this reduced transfer of ions to the mass analyzer produced by electrospray substantially limits the sensitivity and the signal-to-noise ratio of the electrospray/mass spectrometer technique.
Alternatively, an additional heated desolvation chamber located downstream of the first nozzle of a conventional molecular beam interface may be used. The electrosprayed droplets first expand in a supersonic expansion and then are passed into a second heated chamber pumped by a separate pumping system, which is maintained at a pressure preferably less than 1 Torr. This beam is then passed on-axis into a mass spectrometer. This design suffers from incomplete desolvation due to low residence time in the chamber, and compromises sensitivity due to scattering losses. Also the molecular beam is sampled on-axis with respect to the gas in the heated chamber, and therefore still permits incompletely de-solvated ions to enter the mass spectrometer. This design yields increased complexity and cost of an additional pumping stage following the initial expansion.
It is therefore desirable to provide an improved mass spectrometer interface for atmospheric pressure ionization sources.
Accordingly, in an aspect of the present invention, there is provided a method of supplying ionized particles (having characteristic mass to charge (m/z) ratios) of a sample to a mass spectrometer. The method includes providing a tortuous flow of gas having at least one region of disturbance, to transport the ionized particles. A first mixture of the ionized particles and any attached impurities is introduced into the flow to allow the ionized particles to collide in the region of disturbance. Thermal energy is added proximate the region of disturbance to promote liberation of at least some of the ionized particles from the impurities, thereby increasing the concentration of the ionized particles having the characteristic m/z ratios in the flow.
In an embodiment, a channel guides the gas around a barrier positioned in the flow. The barrier deflects at least part of the flow to form the region of disturbance.
In an example embodiment, the channel guides the gas around a bend having an angle of at least 20 degrees.
The method may further include colliding the ionized particles and attached impurities, with a wall of the channel, so as to promote liberation of at least some of the ionized particles from the impurities.
The method may further optionally include introducing a solid sample in the region of disturbance, and forming the ionized particles and any attached impurities from the solid sample using one or more of matrix assisted laser desorption ionization (MALDI), photo-ionization, and corona discharge ionization.
The ionized particles and any attached impurities may alternatively be formed using one or more of electrospray ionization (ESI), matrix-assisted laser desorption ionization (MALDI), atmospheric pressure chemical ionization (APCI), and atmospheric pressure photoionization (APPI).
In another aspect of the present invention, an apparatus for providing ionized particles (having characteristic mass to charge (m/z) ratios) of a target sample to a mass spectrometer includes a channel for guiding a flow of gas along a tortuous path creating at least one region of disturbance in the flow, the region of disturbance for colliding a mixture of ionized particles and any attached impurities to liberate at least some of the ionized particles from the impurities, thereby increasing the concentration of the ionized particles having the characteristic m/z ratios in said flow.
Advantageously, embodiments of the invention provide a high signal-to-noise ratio, with increased sensitivity and reduced chemical background, particularly using high liquid flow rates, by improving the efficiency of liberating attached impurities such as cluster molecules, atoms, ions or adducts.
An exemplary embodiment of a mass spectrometer interface 10 is illustrated in
Atmospheric pressure ion source 12 is enclosed in a chamber 16 that is maintained at approximately atmospheric pressure. In the exemplary embodiment, ion source 12 is shown as electrospray, but may be an ion spray, a MALDI, a corona discharge device, an atmospheric pressure chemical ionization device, an atmospheric pressure photo ionization device, or any other known ion source.
A trace substance to be analyzed is ionized by electrospray ionization using a needle 18 or other ionizing means, in a conventional manner. Samples injected into ion source 12 elute in a flow of liquid that typically may be in the range of from 0.5 to more than 10000 microliters per minute. Alternatively, nanospray techniques may be used to improve the flow at lower flow rates. The liquid composition may vary from essentially pure water to essentially pure organic solvent, such as methanol, and both solvent components may contain additives such as organic acids or inorganic buffers. Heated nebulizing gas can be applied through tube 20 heated by element 22 to aid in the dispersion and evaporation of the electrospray droplets.
Interface 10 transports ions from source 12 to mass spectrometer 14. Specifically, ions and neutral gas molecules are transported from high-pressure chamber 16 through first sampling orifice 24, into a lower pressure region 26. Exemplary orifice 24 is 350 microns diameter although other diameters are suitable for alternative configurations. Ions and neutral gas expand into a moderate pressure region of channel 32 where, after several orifice diameters, they are believed to experience shock structures followed by rapid pressure gradients within a sampling tube. Eventually the flow becomes generally laminar. Thus the ions and neutral flow are first entrained in a relatively high velocity neutral flow through sampling channel 32. Exemplary interface 10 body is evacuated through evacuation port 28 by a roughing pump 30, pumping 10 l/s holding the average pressure in the range of 2 Torr.
Sampling channel 32 provides a tortuous path for the gas and ions and may be formed of a conductive tube, a semi-conductive or non-conducting capillary, with a straight geometry, smoothly bent geometry or radius R, a tube with one or more smooth bends, or a tube with one or more sharp bends. Channel 32 is typically a 4-10 mm bore diameter. Exemplary channel 32 of
In any event, ions and neutrals undergo gas-surface and gas-gas interactions in region 36 to liberate at least some of the ionized molecules from attached impurities, such as neutral molecules, radicals, adducts, and other ions. This increases the concentration of desired ionized molecules with characteristic m/z ratios in the flow and reduces impurities that generate chemical background. The ion and neutral gas continue a flow through tubes 42 and 44, with a diameter of typically 5-15 and 10-30 mm bore, respectively. Again eventually the flow becomes generally laminar, typically after the flow has traveled twice the diameter of the tube following the region of disturbance. In exemplary interface 10 the pressure in tube 44 from which ions are sampled from the laminar flow is approximately 2 Torr.
The ion and neutral gas flow is sampled perpendicular to the flow through a second sampling orifice 46 of skimmer body 54. Exemplary sampling orifice 46 is 5 mm diameter. Sampled ions and neutrals are then transported from the laminar flow region through lower pressure region 48 into mass spectrometer 14.
Unsampled ions and neutral flow are evacuated through evacuation port 28 advantageously positioned alongside and downstream the second sampling orifice 46. The position of evacuation port 10 provides angular momentum to the flow that is believed to improve perpendicular sampling efficiency through orifice 46.
In the embodiment of
Thus, with progressively larger cross-sections/diameters in the channel sections, 32, 42, 44, the ion and neutral flow velocity is continually decreased along the flow. The reduced flow velocity extends the transit time prior to sampling, enhancing the desolvation efficiency and therefore signal-to-noise ratio. The reduced velocity of the flow appears to substantially enhance the sampling efficiency near second sampling orifice 46.
If an even slower velocity is desired, the flow tubes 42 and 44 may have an even larger diameter of up to 15 mm and 30 mm bore, respectively.
Optionally, a small voltage gradient may be applied across interface 10 and skimmer body 54 aiding in the deflection of ions into mass spectrometer 14.
Mass spectrometer 14 may be a conventional mass spectrometer, including but not limited to quadrupole mass analyzers, magnetic sectors, hybrid and stand-alone time-of-flight devices, 2- and 3-dimensional ion traps, and Fourier transform mass spectrometers.
In the embodiment of
Various alternative configurations of mass spectrometer interface are illustrated in
As illustrated in
Various electrode configurations may be used to aid in the ion transport through the mass spectrometer interface 10 of
Yet another alternative electrode configuration is illustrated in mass spectrometer interface 210G of
It will be apparent to those skilled in the art that a suitable interface could include multiple ion inlets. For example,
Referring back to
Accordingly, a chemical reaction region whereby chemical reagents can be combined to produce alternative ion species, for example to generate one kind of ion, and to discriminate against the rest, may be included along the path of the gas and ions in interface 10 (or 210A-210G). There have been several attempts to discriminate within the ionization process in order to selectively produce certain ions and not others. For example, as disclosed in U.S. Pat. No. 6,124,675 of Bertrand et al., a metastable atom bombardment source is capable of selective ionization. Here, the source consists of metastable rare gas atoms that collide with neutral molecules, and due to an energy transfer mechanism between the excited states of one or both, selective ionization can occur. In many cases there is substantially reduced complexity of a mixture over electron impact sources. The ionization is selective because the neutral molecule must have an ionization potential below that of the rare gas metastable. As another example, there are several cases where charge reduction may be desirable. Peptides and proteins carry many charged sites, and intensity for each m/z value can be very small. It may be desirable to collapse the distribution in some cases to improve the SNR. This can be done through some form of charge stripping (R. G. Kingston, M. Guilhaus, A. G. Brenton, J. H. Beynon, OMS 20 486 (1985)) through anion-ion reactions in a trap (W. J. Herron, D. E. Goerringer, and S. A. McLuckey, RCMS 10 277 (1996)), or through ion-molecule reactions. Alternatively, it may be desirable to squeeze the charge distribution among a number of larger charge states. As yet another example, low energy electron collisions with multiply charge peptides and proteins are now well known to yield useful, alternative fragmentation patterns over conventional fragmentation techniques (Zubarev R. A.; Kelleher, N. L.; McLafferty, F. W J. Am. Chem. Soc. 1998, 120, 3265-3266). It is possible to incorporate similar reactions in the present invention.
In addition to introducing a chemical reagent, or introducing a second mixture of ionized particles as described above, it is also possible to introduce electrons directly into an electron interaction region of the ion source interface 10 to promote interaction between the introduced electrons and the ionized particles. The electron interaction region could be placed at the same locations as the chemical reaction region. A suitable electron source, such as an electron gun or a needle with an applied high voltage, may be used to discharge free electrons and electrons weakly bound to neutral molecules.
It will be apparent to those skilled in the art that multiple ion sources may be applied either simultaneously or in a near-simultaneous but sequential fashion. Multiple ion sources may be applied at atmosphere pressure simultaneous or nearly simultaneous with each other as well as with multiple ion sources positioned in the flow tube. As an example, near simultaneous application of APCI and ESI is often useful, because each technique provides different ionization efficiencies for various classes of compounds that may both be present in a sample. Also, near simultaneous application of MALDI and ESI is sometimes useful, because together they provide more information than either technique alone. This is because MALDI is known to generate primarily singly charged ions while ESI efficiently generates multiply charged ions, for example for peptides and proteins.
It will also be apparent to those skilled in the art that other ion sources may be advantageously positioned in or near the region of disturbance. For example, as shown in
In order to verify that the mass spectrometer interface of the present invention operates to improve signal-to-noise ratio as intended, experiments were conducted.
In one experiment, data were acquired using a design based on the mass spectrometer interface of
Of course, the above described embodiments are intended to be illustrative only and in no way limiting. The described embodiments of carrying out the invention are susceptible to many modifications of form, arrangement of parts, details and order of operation. The invention, rather, is intended to encompass all such modification within its scope, as defined by the claims.
|Cited Patent||Filing date||Publication date||Applicant||Title|
|US4023398||3 Mar 1975||17 May 1977||John Barry French||Apparatus for analyzing trace components|
|US4531056||20 Apr 1983||23 Jul 1985||Yale University||Method and apparatus for the mass spectrometric analysis of solutions|
|US4842701||6 Apr 1987||27 Jun 1989||Battelle Memorial Institute||Combined electrophoretic-separation and electrospray method and system|
|US4861988||30 Sep 1987||29 Aug 1989||Cornell Research Foundation, Inc.||Ion spray apparatus and method|
|US4885076||5 Apr 1988||5 Dec 1989||Battelle Memorial Institute||Combined electrophoresis-electrospray interface and method|
|US4948962 *||6 Jun 1989||14 Aug 1990||Hitachi, Ltd.||Plasma ion source mass spectrometer|
|US4977320||22 Jan 1990||11 Dec 1990||The Rockefeller University||Electrospray ionization mass spectrometer with new features|
|US4990740 *||6 Mar 1989||5 Feb 1991||The Dow Chemical Company||Intra-microspray ICP torch|
|US5015845||1 Jun 1990||14 May 1991||Vestec Corporation||Electrospray method for mass spectrometry|
|US5070240 *||29 Aug 1990||3 Dec 1991||Brigham Young University||Apparatus and methods for trace component analysis|
|US5103093||26 Apr 1989||7 Apr 1992||Hitachi, Ltd.||Mass spectrometer|
|US5171990||17 May 1991||15 Dec 1992||Finnigan Corporation||Electrospray ion source with reduced neutral noise and method|
|US5229605 *||2 Jan 1992||20 Jul 1993||L'air Liquide, Societe Anonyme Pour L'etude Et L'exploitation Des Procedes Georges Claude||Process for the elementary analysis of a specimen by high frequency inductively coupled plasma mass spectrometry and apparatus for carrying out this process|
|US5313061||6 Dec 1991||17 May 1994||Viking Instrument||Miniaturized mass spectrometer system|
|US5352892||26 Jan 1993||4 Oct 1994||Cornell Research Foundation, Inc.||Atmospheric pressure ion interface for a mass analyzer|
|US5412208 *||13 Jan 1994||2 May 1995||Mds Health Group Limited||Ion spray with intersecting flow|
|US5454274 *||23 May 1994||3 Oct 1995||Cetac Technologies Inc.||Sequential combination low temperature condenser and enclosed filter solvent removal system, and method of use|
|US5756994||13 Dec 1996||26 May 1998||Micromass Limited||Electrospray and atmospheric pressure chemical ionization mass spectrometer and ion source|
|US6124675||1 Jun 1998||26 Sep 2000||University Of Montreal||Metastable atom bombardment source|
|US6252225 *||27 Jan 2000||26 Jun 2001||Hitachi, Ltd.||Mass spectrometry of solution and apparatus therefor|
|US6265717 *||8 Dec 1998||24 Jul 2001||Agilent Technologies||Inductively coupled plasma mass spectrometer and method|
|US6462336||28 Apr 1998||8 Oct 2002||Masslab Limited||Ion source for a mass analyzer and method of providing a source of ions for analysis|
|US6700119||2 Feb 2000||2 Mar 2004||Thermo Finnigan Llc||Ion source for mass analyzer|
|US6781117 *||29 May 2003||24 Aug 2004||Ross C Willoughby||Efficient direct current collision and reaction cell|
|US7098452 *||13 Feb 2004||29 Aug 2006||Mds Sciex||Atmospheric pressure charged particle discriminator for mass spectrometry|
|US20020003210 *||21 Aug 2001||10 Jan 2002||Marcus R. Kenneth||Sampling and analysis of airborne particulate matter by glow discharge atomic emission and mass spectrometries|
|US20030062474 *||3 Oct 2001||3 Apr 2003||Baranov Vladimir I.||Electrospray ion source for mass spectrometry with atmospheric pressure desolvating capabilities|
|US20040262512 *||7 Nov 2001||30 Dec 2004||Tomoyuki Tobita||Mass spectrometer|
|US20060118715 *||12 Jan 2006||8 Jun 2006||Mds Sciex||Atmospheric pressure charged particle discriminator for mass spectrometry|
|GB2324906A||Title not available|
|1||Edgar D. Lee, et al., "Thermally Assisted Electrospray Interface for Liquid Chromatograph/ Mass Spectrometry", Rapid Communication in Mass Spectrometry, vol. 6, 727-733 (1992).|
|2||R.A. Zubarev, et al., "Electron Capture Disassociation of Multiply Charged Protein Cations. A Nonergodic Process", J. Am. Chem. Soc., 120, 3265-3266 (1998).|
|3||William J. Herron et al., "Reactions of Polyatomic Dianions with Cations in the Paul Trap", Chemical and Analysis Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, 5 pgs. (1995).|
|Citing Patent||Filing date||Publication date||Applicant||Title|
|US8044348 *||18 Dec 2009||25 Oct 2011||Ionics Mass Spectrometry Group Inc.||Ion source vessel and methods|
|US8373118||18 Aug 2011||12 Feb 2013||Advion, Inc.||Atmospheric pressure ionization inlet for mass spectrometers|
|US8410431 *||5 Oct 2009||2 Apr 2013||Purdue Research Foundation||Systems and methods for transfer of ions for analysis|
|US8487247||1 Aug 2012||16 Jul 2013||Advion Inc.||Atmospheric pressure ionization inlet for mass spectrometers|
|US8546750 *||27 Jun 2008||1 Oct 2013||Ionics Mass Spectrometry Group, Inc.||Mass spectrometer interface|
|US8592756 *||27 Dec 2012||26 Nov 2013||Purdue Research Foundation||Systems and methods for transfer of ions for analysis|
|US8686351 *||9 Jul 2013||1 Apr 2014||Purdue Research Foundation||Systems and methods for transfer of ions for analysis|
|US8803085 *||14 Feb 2014||12 Aug 2014||Purdue Research Foundation||Systems and methods for transfer of ions for analysis|
|US8946622 *||29 Aug 2013||3 Feb 2015||Ionics Mass Spectrometry Group, Inc.||Mass spectrometer interface|
|US8963079 *||8 Aug 2014||24 Feb 2015||Purdue Research Foundation||Systems and methods for transfer of ions for analysis|
|US9159540||12 Jan 2015||13 Oct 2015||Purdue Research Foundation||Systems and methods for transfer of ions for analysis|
|US20080258052 *||27 Jun 2008||23 Oct 2008||Ionics Mass Spectrometry Group, Inc.||Mass spectrometer interface|
|US20090283674 *||2 Aug 2007||19 Nov 2009||Reinhold Pesch||Efficient Atmospheric Pressure Interface for Mass Spectrometers and Method|
|US20100078553 *||1 Apr 2010||Advion Biosciences, Inc.||Atmospheric pressure ionization (api) interface structures for a mass spectrometer|
|US20100171033 *||8 Jul 2010||Ionics Mass Spectrometry Group Inc.||Ion source vessel and methods|
|US20110240844 *||5 Oct 2009||6 Oct 2011||Purdue Research Foundation||Systems and methods for transfer of ions for analysis|
|US20140158882 *||14 Feb 2014||12 Jun 2014||Purdue Research Foundation||Systems and methods for transfer of ions for analysis|
|US20150014525 *||8 Aug 2014||15 Jan 2015||Purdue Research Foundation||Systems and methods for transfer of ions for analysis|
|US20150214021 *||17 Dec 2014||30 Jul 2015||Ionics Mass Spectrometry Group Inc.||Mass Spectrometer Interface|
|U.S. Classification||250/288, 250/286, 250/284, 250/281, 250/287|
|International Classification||H01J49/26, H01J49/42, H01J49/04, H01J49/00|
|Cooperative Classification||H01J49/26, H01J49/04, H01J49/0422, H01J49/0468, H01J49/06, Y10T436/24|
|European Classification||H01J49/04T, H01J49/06|
|23 Jan 2012||FPAY||Fee payment|
Year of fee payment: 4
|21 Nov 2014||AS||Assignment|
Owner name: IONICS MASS SPECTROMETRY GROUP, INC., ONTARIO
Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:JOLLIFFE, CHARLES;JAVAHERY, GHOLAMREZA;COUSINS, LISA;REEL/FRAME:034230/0769
Effective date: 20040609