US4894607A - Surface potential detecting apparatus - Google Patents
Surface potential detecting apparatus Download PDFInfo
- Publication number
- US4894607A US4894607A US07/254,457 US25445788A US4894607A US 4894607 A US4894607 A US 4894607A US 25445788 A US25445788 A US 25445788A US 4894607 A US4894607 A US 4894607A
- Authority
- US
- United States
- Prior art keywords
- electric field
- electro
- optical crystal
- crystal element
- detecting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/12—Measuring electrostatic fields or voltage-potential
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/07—Non contact-making probes
- G01R1/071—Non contact-making probes containing electro-optic elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
- G01R15/241—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption
- G01R15/242—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption based on the Pockels effect, i.e. linear electro-optic effect
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/261—Amplifier which being suitable for instrumentation applications
Definitions
- the present invention relates to a surface potential detecting apparatus. More specifically, the present invention relates to a surface potential detecting apparatus suitable for use as a sensor detecting a drum potential of a Plain Paper Copy machine.
- the precision in detection is degraded as the time passes, and they are easily damaged by physical shocks.
- the passive type surface potential detecting apparatuses such as shown in FIGS. 6 and 8
- the surface potential can not be detected quickly in a simple manner, since the detection output depends on the distance to the surface to be detected.
- the passive and electrical type surface potential detecting apparatus such as shown in FIG. 8, the permittivity of the electro-optical crystal itself is high, and therefore, the electic field induced in the crystal is not strong enough. Therefore, although the surface potential detecting apparatus of FIG. 8 is theoretically usable, the practical application of the apparatus is difficult.
- the electro-optical crystal requires a precise electro-optical characteristic, making it difficult to maintain stable detecting operation.
- a surface potential detecting apparatus 21 is arranged adjacent to a surface 20 whose surface potential is to be measured.
Abstract
Description
Claims (13)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62-251852 | 1987-10-06 | ||
JP62251852A JPH0194270A (en) | 1987-10-06 | 1987-10-06 | Surface potential detector |
Publications (1)
Publication Number | Publication Date |
---|---|
US4894607A true US4894607A (en) | 1990-01-16 |
Family
ID=17228880
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US07/254,457 Expired - Lifetime US4894607A (en) | 1987-10-06 | 1988-10-06 | Surface potential detecting apparatus |
Country Status (3)
Country | Link |
---|---|
US (1) | US4894607A (en) |
JP (1) | JPH0194270A (en) |
DE (1) | DE3833930A1 (en) |
Cited By (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5025209A (en) * | 1988-06-30 | 1991-06-18 | Victor Company Of Japan, Ltd. | Apparatus for detecting surface potential distribution |
US5175503A (en) * | 1990-12-28 | 1992-12-29 | Xerox Corporation | Ascertaining imaging cycle life of a photoreceptor |
US5543723A (en) * | 1991-03-18 | 1996-08-06 | Nippon Telegraph And Telephone Corporation | Apparatus for electro-optic sampling measuring of electrical signals in integrated circuits with improved probe positioning accuracy |
US6316942B1 (en) * | 1998-06-15 | 2001-11-13 | Murata Manufacturing Co., Ltd. | Electrical potential sensor |
US6489776B1 (en) * | 1999-11-02 | 2002-12-03 | The Board Of Trustees Of The Leland Stanford Junior University | Non-contact mechanical resonance method for determining the near surface carrier mobility in conductors |
US20060071669A1 (en) * | 2004-09-29 | 2006-04-06 | Hiroki Funato | Method of measuring electric field distribution and electric field distribution measuring instrument |
US20060158196A1 (en) * | 2004-07-12 | 2006-07-20 | Canon Kabushiki Kaisha | Electric potential measuring apparatus, and image forming apparatus |
US20060267593A1 (en) * | 2005-05-16 | 2006-11-30 | Canon Kabushiki Kaisha | Potential measuring device and image forming apparatus using the same |
US20070091438A1 (en) * | 1998-03-31 | 2007-04-26 | Nikon Corporation | Optical filter and optical device provided with this optical filter |
US20100019779A1 (en) * | 2007-01-29 | 2010-01-28 | Canon Kabushiki Kaisha | Potential measurement apparatus and image forming apparatus |
CN106291137A (en) * | 2016-07-25 | 2017-01-04 | 西安冠泰检测技术有限公司 | A kind of floating ring formula liquid electrostatic test system |
US9804199B2 (en) | 2013-11-19 | 2017-10-31 | The United States of America as Represented by NASA | Ephemeral electric potential and electric field sensor |
US10024900B2 (en) | 2016-06-09 | 2018-07-17 | United States Of America As Represented By The Administrator Of Nasa. | Solid state ephemeral electric potential and electric field sensor |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2631138B2 (en) * | 1988-10-05 | 1997-07-16 | 浜松ホトニクス株式会社 | Voltage measuring device |
US5036270A (en) * | 1989-08-15 | 1991-07-30 | Victor Company Of Japan, Ltd. | Apparatus for detecting electrostatic surface potential |
DE3927885A1 (en) * | 1989-08-23 | 1991-02-28 | Victor Company Of Japan | Read=out head for imaging and recording system - has double refractive elements in light path which form set with light inlet and outlet face, and beam divider |
EP0510430A3 (en) * | 1991-04-22 | 1993-02-24 | Siemens Aktiengesellschaft | Method and device for measuring the electrical potential of a sample with a radiation probe |
JPH0727808A (en) * | 1993-07-13 | 1995-01-31 | Stanley Electric Co Ltd | Noncontact type surface potentiometer |
JPH0763803A (en) * | 1993-08-30 | 1995-03-10 | Stanley Electric Co Ltd | Non-contact type surface potentiometer |
CN103792437A (en) * | 2014-02-21 | 2014-05-14 | 中国人民解放军理工大学 | Integrated LEMP three-dimensional electric field measuring instrument |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3639771A (en) * | 1969-10-09 | 1972-02-01 | Nicholas F Borrelli | Bistable optical elements using transparent ferroelectric glass ceramics |
US3700912A (en) * | 1971-05-12 | 1972-10-24 | Bell Telephone Labor Inc | Radiation-resistant linbo{11 and optical devices utilizing same |
US4465969A (en) * | 1980-01-12 | 1984-08-14 | Sumitomo Electric Industries, Ltd. | Voltage and electric field measuring device using light |
US4786858A (en) * | 1986-12-18 | 1988-11-22 | Xerox Corporation | Liquid crystal electrostatic voltmeter |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4266870A (en) * | 1978-03-09 | 1981-05-12 | Ricoh Company, Ltd. | Electrostatographic apparatus comprising developing bias means |
JPS5917170A (en) * | 1982-07-21 | 1984-01-28 | Hitachi Ltd | Optical system electric field intensity measuring instrument |
JPS59147274A (en) * | 1983-02-10 | 1984-08-23 | Hitachi Ltd | Optical electric field measuring apparatus |
-
1987
- 1987-10-06 JP JP62251852A patent/JPH0194270A/en active Granted
-
1988
- 1988-10-05 DE DE3833930A patent/DE3833930A1/en active Granted
- 1988-10-06 US US07/254,457 patent/US4894607A/en not_active Expired - Lifetime
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3639771A (en) * | 1969-10-09 | 1972-02-01 | Nicholas F Borrelli | Bistable optical elements using transparent ferroelectric glass ceramics |
US3700912A (en) * | 1971-05-12 | 1972-10-24 | Bell Telephone Labor Inc | Radiation-resistant linbo{11 and optical devices utilizing same |
US4465969A (en) * | 1980-01-12 | 1984-08-14 | Sumitomo Electric Industries, Ltd. | Voltage and electric field measuring device using light |
US4786858A (en) * | 1986-12-18 | 1988-11-22 | Xerox Corporation | Liquid crystal electrostatic voltmeter |
Cited By (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5025209A (en) * | 1988-06-30 | 1991-06-18 | Victor Company Of Japan, Ltd. | Apparatus for detecting surface potential distribution |
US5175503A (en) * | 1990-12-28 | 1992-12-29 | Xerox Corporation | Ascertaining imaging cycle life of a photoreceptor |
US5543723A (en) * | 1991-03-18 | 1996-08-06 | Nippon Telegraph And Telephone Corporation | Apparatus for electro-optic sampling measuring of electrical signals in integrated circuits with improved probe positioning accuracy |
US20070091438A1 (en) * | 1998-03-31 | 2007-04-26 | Nikon Corporation | Optical filter and optical device provided with this optical filter |
US7961244B2 (en) * | 1998-03-31 | 2011-06-14 | Nikon Corporation | Optical filter and optical device provided with this optical filter |
US6316942B1 (en) * | 1998-06-15 | 2001-11-13 | Murata Manufacturing Co., Ltd. | Electrical potential sensor |
US6489776B1 (en) * | 1999-11-02 | 2002-12-03 | The Board Of Trustees Of The Leland Stanford Junior University | Non-contact mechanical resonance method for determining the near surface carrier mobility in conductors |
US20060158196A1 (en) * | 2004-07-12 | 2006-07-20 | Canon Kabushiki Kaisha | Electric potential measuring apparatus, and image forming apparatus |
US7741850B2 (en) * | 2004-07-12 | 2010-06-22 | Canon Kabushiki Kaisha | Electric potential measuring apparatus, and image forming apparatus |
US7315173B2 (en) * | 2004-09-29 | 2008-01-01 | Hitachi, Ltd. | Method of measuring electric field distribution and electric field distribution measuring instrument |
US20060071669A1 (en) * | 2004-09-29 | 2006-04-06 | Hiroki Funato | Method of measuring electric field distribution and electric field distribution measuring instrument |
US20060267593A1 (en) * | 2005-05-16 | 2006-11-30 | Canon Kabushiki Kaisha | Potential measuring device and image forming apparatus using the same |
US7548066B2 (en) * | 2005-05-16 | 2009-06-16 | Canon Kabushiki Kaisha | Potential measuring device and image forming apparatus using the same |
US20100019779A1 (en) * | 2007-01-29 | 2010-01-28 | Canon Kabushiki Kaisha | Potential measurement apparatus and image forming apparatus |
US7990159B2 (en) * | 2007-01-29 | 2011-08-02 | Canon Kabushiki Kaisha | Potential measurement apparatus and image forming apparatus |
US9804199B2 (en) | 2013-11-19 | 2017-10-31 | The United States of America as Represented by NASA | Ephemeral electric potential and electric field sensor |
US10024900B2 (en) | 2016-06-09 | 2018-07-17 | United States Of America As Represented By The Administrator Of Nasa. | Solid state ephemeral electric potential and electric field sensor |
CN106291137A (en) * | 2016-07-25 | 2017-01-04 | 西安冠泰检测技术有限公司 | A kind of floating ring formula liquid electrostatic test system |
CN106291137B (en) * | 2016-07-25 | 2019-08-02 | 西安冠泰检测技术有限公司 | A kind of floating ring formula liquid electrostatic test macro |
Also Published As
Publication number | Publication date |
---|---|
DE3833930A1 (en) | 1989-04-27 |
DE3833930C2 (en) | 1992-03-19 |
JPH0569469B2 (en) | 1993-10-01 |
JPH0194270A (en) | 1989-04-12 |
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Legal Events
Date | Code | Title | Description |
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AS | Assignment |
Owner name: MURATA MANUFACTURING CO., LTD., 26-10 TENJIN 2-CHO Free format text: ASSIGNMENT OF ASSIGNORS INTEREST.;ASSIGNOR:KUMADA, AKIRA;REEL/FRAME:004955/0936 Effective date: 19880914 Owner name: MURATA MANUFACTURING CO., LTD., 26-10 TENJIN 2-CHO Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:KUMADA, AKIRA;REEL/FRAME:004955/0936 Effective date: 19880914 |
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Free format text: PATENTED CASE |
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Free format text: PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |
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