US20010023660A1 - Method for fabricating a semiconductor structure having a crystalline alkaline earth metal oxide interface with silicon - Google Patents
Method for fabricating a semiconductor structure having a crystalline alkaline earth metal oxide interface with silicon Download PDFInfo
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- US20010023660A1 US20010023660A1 US09/871,958 US87195801A US2001023660A1 US 20010023660 A1 US20010023660 A1 US 20010023660A1 US 87195801 A US87195801 A US 87195801A US 2001023660 A1 US2001023660 A1 US 2001023660A1
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B23/00—Single-crystal growth by condensing evaporated or sublimed materials
- C30B23/02—Epitaxial-layer growth
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/16—Oxides
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/16—Oxides
- C30B29/22—Complex oxides
- C30B29/30—Niobates; Vanadates; Tantalates
Definitions
- the present invention relates in general to a method for fabricating a semiconductor structure including a crystalline alkaline earth metal oxide interface between a silicon substrate and other oxides, and more particularly to a method for fabricating an interface including an atomic layer of an alkaline earth metal, silicon, and oxygen.
- Si silicon
- SrTiO 3 has been grown on silicon using thick metal oxide buffer layers (60-120 ⁇ ) of Sr or Ti.
- thick metal oxide buffer layers 60-120 ⁇
- These thick buffer layers would limit the application for transistors.
- FIGS. 1 - 2 illustrate a cross-sectional view of a clean semiconductor substrate having an interface formed thereon in accordance with the present invention
- FIGS. 3 - 6 illustrate a cross-sectional view of a semiconductor substrate having an interface formed from a silicon dioxide layer in accordance with the present invention.
- FIGS. 7 - 8 illustrate a cross-sectional view of an alkaline-earth-metal oxide layer formed on the structures illustrated in FIGS. 1 - 6 in accordance with the present invention.
- FIGS. 9 - 12 illustrate a cross-sectional view of a perovskite formed on the structures of FIGS. 1 - 8 in accordance with the present invention.
- FIG. 13 illustrates a side view of the atomic structure of one embodiment of the layers of FIG. 12 in accordance with the present invention.
- FIG. 14 illustrates a top view along view line AA of FIG. 13 of the interface.
- FIG. 15 illustrates a top view along view line AA of FIG. 13 including the interface and the adjacent atomic layer of the substrate.
- Si substrate having a clean surface
- Si substrate having silicon dioxide (SiO 2 ) on the surface.
- SiO 2 is amorphous rather than single crystalline and it is desirable for purposes of growing additional single crystal material on the substrate that a single crystal oxide be provided as the interface.
- FIGS. 1 and 2 illustrate a semiconductor structure including a Si substrate 10 having a clean surface 12 .
- a clean (2 ⁇ 1) surface 12 may be obtained with any conventional cleaning procedure, for example, with thermal desorption of SiO 2 at a temperature greater than or equal to 850° C., or by removal of the hydrogen from a hydrogen terminated Si(1 ⁇ 1) surface at a temperature greater than or equal to 300° C. in an ultra high vacuum.
- Hydrogen termination is a well known process in which hydrogen is loosely bonded to dangling bonds of the silicon atoms at surface 12 to complete the crystalline structure.
- the interface 14 of a crystaline material may be formed by supplying (as shown by the arrows in FIG.
- the metal applied to the surface 12 to form the interface 14 may be any metal, but in the preferred embodiment comprises an alkaline-earth-metal, such as barium (Ba) or strontium (Sr).
- the growth is monitored using Reflection High Energy Electron Diffraction (RHEED) techniques which are well documented in the art and which can be used in situ, i.e., while performing the exposing step within the growth chamber.
- RHEED Reflection High Energy Electron Diffraction
- the RHEED techniques are used to detect or sense surface crystalline structures and in the present process change rapidly to strong and sharp streaks by the forming of an atomic layer of the BaSiO 2 . It will of course be understood that once a specific manufacturing process is provided and followed, it may not be necessary to perform the RHEED techniques on every substrate.
- another approach comprises forming a Si substrate 10 having a surface 12 , and a layer 16 of SiO 2 thereupon.
- the layer 16 of SiO 2 naturally exists (native oxide) once the Si substrate 10 is exposed to air (oxygen) or it may be formed purposely in a controlled fashion well known in the art, e.g., thermally by applying (arrows) oxygen onto the surface 12 .
- the novel interface 14 may be formed at least in one of the two suggested embodiments as follows: By applying an alkaline-earth-metal to the surface 18 of SiO 2 layer 16 at 700-900° C., under an ultra high vacuum.
- the Si substrate 10 and the amorphous SiO 2 layer 16 are heated to a temperature below the sublimation temperature of the SiO 2 layer 16 (generally below 900° C.). This can be accomplished in a molecular beam epitaxy chamber or Si substrate 10 can be at least partially heated in a preparation chamber after which it can be transferred to the growth chamber and the heating completed.
- a beam of metal preferrably an alkaline-earth-metal, as illustrated in FIG. 5.
- the beam is Ba or Sr which is generated by resistively heating effusion cells or from e-beam evaporation sources.
- Si substrate 10 and SiO 2 layer 16 are exposed to a beam of Ba.
- the Ba joins the SiO 2 and converts the SiO 2 layer 16 into the interface 14 comprising BaSiO 2 in a crystalline form.
- an alkaline-earth-metal may be provided to the surface 18 at lower temperatures, annealing the result at 700-900° C., in an ultra high vacuum.
- one or more layers of a single crystal oxide may be formed on the surface of the interface 14 .
- an optional layer of an alkaline-earth-metal oxide, such as BaO or SrO, may be placed between the interface 14 and the single crystal oxide.
- This alkaline-earth-metal oxide provides a low dielectric constant (advantageous for certain uses such as memory cells) and also prevents oxygen from migrating from the single crystal oxide to the Si substrate 10 .
- alkaline-earth-metal oxide layer 22 may be accomplished by either the simultaneous or alternating supply to the surface 20 of the interface 14 of an alkaline-earth-metal and oxygen at less than or equal to 700° C. and under O 2 partial pressure less than or equal to 1 ⁇ 10 ⁇ 5 mBar.
- This alkaline-earth-metal oxide layer 22 may, for example, comprise a thickness of 50-500 ⁇ .
- a single crystal oxide layer 26 such as an alkaline-earth-metal perovskite, may be formed on either the surface 20 of the interface 14 or the surface 24 of the alkaline-earth-metal oxide layer 22 by either the simultaneous or alternating supply of an alkaline-earth-metal oxide, oxygen, and a transition metal, such as titanium, at less than or equal to 700° C. under an oxygen partial pressure less than or equal to 1 ⁇ 10 ⁇ 5 mBar.
- This single crystal oxide layer 26 may, for example, comprise a thickness of 50-1000 ⁇ and will be substantially lattice matched with the underlying interface 14 or alkaline-earth-metal oxide layer 22 . It should be understood that the single crystal oxide layer 26 may comprises one or more layers in other embodiments.
- FIG. 13 a side view (looking in the ⁇ overscore (l) ⁇ 10> direction) of the atomic configuration of the Si substrate 10 , interface 14 , and alkaline-earth-metal metal oxygen layer 26 is shown.
- the configuration shown comprises, in relative sizes, for illustrative purposes, from larger to smaller, barium atoms 30 , silicon atoms 32 , oxygen atoms 34 , and titanium atoms 36 .
- the Si substrate 10 comprises only silicon atoms 32 .
- the interface 14 comprises metal atoms (which in the preferred embodiment are illustrated as barium atoms 30 ), silicon atoms 32 , and oxygen atoms 34 .
- the alkaline-earth-metal metal oxygen layer 26 comprises barium atoms 30 , oxygen atoms 34 , and titanium atoms 36 .
- FIG. 14 a top view of the interface along view line AA of FIG. 13, shows the arrangement of the barium, silicon, and oxygen atoms 30 , 32 , 34 .
- a top view along line AA of FIG. 13 shows the interface 14 and the top atomic layer 11 of the Si substrate 10 .
- a monolayer equals 6.8 ⁇ 10 14 atoms/cm 2 and an atomic layer is one atom thick. It is seen that the interface 14 shown in the FIGS. comprises a single atomic layer, but could be more than one atomic layer, while the Si substrate 10 and the alkaline-earth-metal metal oxide layer may be many atomic layers. Note that in FIG. 13, only four atomic layers of the Si substrate 10 and only three atomic layers of the alkaline-earth-metal metal oxide layer 26 are shown.
- the interface 14 comprises a half monolayer of the alkaline-earth-metal, a half monolayer of silicon, and a monolayer of oxygen.
- Each barium atom 30 is substantially equally spaced from four of the silicon atoms 32 in the Si substrate 10 .
- the silicon atoms 32 in the interface 14 are substantially on a line and equally spaced between the alkaline-earth-metal atoms in the ⁇ 110> direction.
- Each silicon atom 32 in the top layer of atoms in the Si substrate 10 is bonded to an oxygen atom 34 in the interface 14 and each silicon atom 32 in the interface 14 is bonded to two oxygen atoms 34 in the interface 14 .
- the interface 14 comprises rows of barium, silicon, and oxygen atoms 30 , 32 , 34 in a 2 ⁇ 1 configuration on a (001) surface of the Si substrate 10 , 1 ⁇ in the ⁇ overscore (l) ⁇ 10> direction and 2 ⁇ in the ⁇ 110> direction.
- the interface 14 has a 2 ⁇ 1 reconstruction.
- the interface 14 may comprise a single atomic layer. Better transistor applications are achieved by the interface 14 being thin, in that the electrical coupling of the overlying oxide layers to the Si substrate 10 is not compromised, and in that the interface 14 is more stable since the atoms will more likely maintain their crystalinity in processing.
Abstract
A method for fabricating a semiconductor structure comprises the steps of providing a silicon substrate (10) having a surface (12); forming on the surface of the silicon substrate an interface (14) comprising a single atomic layer of silicon, oxygen, and a metal; and forming one or more layers of a single crystal oxide (26) on the interface. The interface comprises an atomic layer of silicon, oxygen, and a metal in the form XSiO2, where X is a metal.
Description
- The present invention relates in general to a method for fabricating a semiconductor structure including a crystalline alkaline earth metal oxide interface between a silicon substrate and other oxides, and more particularly to a method for fabricating an interface including an atomic layer of an alkaline earth metal, silicon, and oxygen.
- An ordered and stable silicon (Si) surface is most desirable for subsequent epitaxial growth of single crystal thin films on silicon for numerous device applications, e.g., ferroelectrics or high dielectric constant oxides for non-volatile high density memory and logic devices. It is pivotal to establish an ordered transition layer on the Si surface, especially for subsequent growth of single crystal oxides, e.g., perovskites.
- Some reported growth of these oxides, such as BaO and BaTiO3 on Si(100) was based on a BaSi2 (cubic) template by depositing one fourth monolayer of Ba on Si(100) using reactive epitaxy at temperatures greater than 850° C. See for example: R. McKee et al., Appl. Phys. Lett. 59(7), pp 782-784 (Aug. 12, 1991); R. McKee et al., Appl. Phys. Lett. 63(20), pp. 2818-2820 (Nov. 15, 1993); R. McKee et al., Mat. Res. Soc. Symp. Proc., Vol. 21, pp. 131-135 (1991); U.S. Pat. No. 5,225,031, issued Jul. 6, 1993, entitled “Process for Depositing an Oxide Epitaxially onto a Silicon Substrate and Structures Prepared with the Process”; and U.S. Pat. No. 5,482,003, issued Jan. 9, 1996, entitled “Process for Depositing Epitaxial Alkaline Earth Oxide onto a Substrate and Structures Prepared with the Process”. However, atomic level simulation of this proposed structure indicates that it likely is not stable at elevated temperatures.
- Growth of SrTiO3 on silicon (100) using an SrO buffer layer has been accomplished. T. Tambo et al., Jpn. J. Appl. Phys., Vol. 37 (1998), pp. 4454-4459. However, the SrO buffer layer was thick (100 Å), thereby limiting application for transistor films, and crystallinity was not maintained throughout the growth.
- Furthermore, SrTiO3 has been grown on silicon using thick metal oxide buffer layers (60-120 Å) of Sr or Ti. B. K. Moon et al., Jpn. J. Appl. Phys., Vol. 33 (1994), pp. 1472-1477. These thick buffer layers would limit the application for transistors.
- Therefore, a method for fabricating a thin, stable crystalline interface with silicon is needed.
- FIGS.1-2 illustrate a cross-sectional view of a clean semiconductor substrate having an interface formed thereon in accordance with the present invention;
- FIGS.3-6 illustrate a cross-sectional view of a semiconductor substrate having an interface formed from a silicon dioxide layer in accordance with the present invention; and
- FIGS.7-8 illustrate a cross-sectional view of an alkaline-earth-metal oxide layer formed on the structures illustrated in FIGS. 1-6 in accordance with the present invention.
- FIGS.9-12 illustrate a cross-sectional view of a perovskite formed on the structures of FIGS. 1-8 in accordance with the present invention.
- FIG. 13 illustrates a side view of the atomic structure of one embodiment of the layers of FIG. 12 in accordance with the present invention.
- FIG. 14 illustrates a top view along view line AA of FIG. 13 of the interface.
- FIG. 15 illustrates a top view along view line AA of FIG. 13 including the interface and the adjacent atomic layer of the substrate.
- To form the novel interface between a silicon (Si) substrate and one or more layers of a single crystal oxide, various approaches may be used. Several examples will be provided for both starting with a Si substrate having a clean surface, and a Si substrate having silicon dioxide (SiO2) on the surface. SiO2 is amorphous rather than single crystalline and it is desirable for purposes of growing additional single crystal material on the substrate that a single crystal oxide be provided as the interface.
- Turning now to the drawings in which like elements are designated with like numbers throughout, FIGS. 1 and 2 illustrate a semiconductor structure including a
Si substrate 10 having aclean surface 12. A clean (2×1)surface 12 may be obtained with any conventional cleaning procedure, for example, with thermal desorption of SiO2 at a temperature greater than or equal to 850° C., or by removal of the hydrogen from a hydrogen terminated Si(1×1) surface at a temperature greater than or equal to 300° C. in an ultra high vacuum. Hydrogen termination is a well known process in which hydrogen is loosely bonded to dangling bonds of the silicon atoms atsurface 12 to complete the crystalline structure. Theinterface 14 of a crystaline material may be formed by supplying (as shown by the arrows in FIG. 1) controlled amounts of a metal, Si, and O2, either simultaneously or sequentially to thesurface 12 at a temperature less than or equal to 900° C. in a growth chamber with O2 partial pressure less than or equal to 1×10−9 mBar. The metal applied to thesurface 12 to form theinterface 14 may be any metal, but in the preferred embodiment comprises an alkaline-earth-metal, such as barium (Ba) or strontium (Sr). - As the application of the Ba, Si, and O2 form BaSiO2 as the
interface 14, the growth is monitored using Reflection High Energy Electron Diffraction (RHEED) techniques which are well documented in the art and which can be used in situ, i.e., while performing the exposing step within the growth chamber. The RHEED techniques are used to detect or sense surface crystalline structures and in the present process change rapidly to strong and sharp streaks by the forming of an atomic layer of the BaSiO2. It will of course be understood that once a specific manufacturing process is provided and followed, it may not be necessary to perform the RHEED techniques on every substrate. - The novel atomic structure of the
interface 14 will be described in subsequent paragraphs. - It should be understood by those skilled in the art that the temperatures and pressures given for these processes are recommended for the particular embodiment described, but the invention is not limited to a particular temperature or pressure range.
- Referring to FIGS.3-6, another approach comprises forming a
Si substrate 10 having asurface 12, and alayer 16 of SiO2 thereupon. Thelayer 16 of SiO2 naturally exists (native oxide) once theSi substrate 10 is exposed to air (oxygen) or it may be formed purposely in a controlled fashion well known in the art, e.g., thermally by applying (arrows) oxygen onto thesurface 12. Thenovel interface 14 may be formed at least in one of the two suggested embodiments as follows: By applying an alkaline-earth-metal to thesurface 18 of SiO2 layer 16 at 700-900° C., under an ultra high vacuum. More specifically, theSi substrate 10 and the amorphous SiO2 layer 16 are heated to a temperature below the sublimation temperature of the SiO2 layer 16 (generally below 900° C.). This can be accomplished in a molecular beam epitaxy chamber orSi substrate 10 can be at least partially heated in a preparation chamber after which it can be transferred to the growth chamber and the heating completed. Once theSi substrate 10 is properly heated and the pressure in the growth chamber has been reduced appropriately, thesurface 12 of theSi substrate 10 having SiO2 layer 16 thereon is exposed to a beam of metal, preferrably an alkaline-earth-metal, as illustrated in FIG. 5. In a preferred embodiment, the beam is Ba or Sr which is generated by resistively heating effusion cells or from e-beam evaporation sources. In a specific example,Si substrate 10 and SiO2 layer 16 are exposed to a beam of Ba. The Ba joins the SiO2 and converts the SiO2 layer 16 into theinterface 14 comprising BaSiO2in a crystalline form. Alternatively, an alkaline-earth-metal may be provided to thesurface 18 at lower temperatures, annealing the result at 700-900° C., in an ultra high vacuum. - Once the
interface 14 is formed, one or more layers of a single crystal oxide may be formed on the surface of theinterface 14. However, an optional layer of an alkaline-earth-metal oxide, such as BaO or SrO, may be placed between theinterface 14 and the single crystal oxide. This alkaline-earth-metal oxide provides a low dielectric constant (advantageous for certain uses such as memory cells) and also prevents oxygen from migrating from the single crystal oxide to theSi substrate 10. - Referring to FIGS. 7 and 8, the formation of alkaline-earth-
metal oxide layer 22 may be accomplished by either the simultaneous or alternating supply to the surface 20 of theinterface 14 of an alkaline-earth-metal and oxygen at less than or equal to 700° C. and under O2 partial pressure less than or equal to 1×10−5 mBar. This alkaline-earth-metal oxide layer 22 may, for example, comprise a thickness of 50-500 Å. - Referring to FIGS.9-12, a single
crystal oxide layer 26, such as an alkaline-earth-metal perovskite, may be formed on either the surface 20 of theinterface 14 or the surface 24 of the alkaline-earth-metal oxide layer 22 by either the simultaneous or alternating supply of an alkaline-earth-metal oxide, oxygen, and a transition metal, such as titanium, at less than or equal to 700° C. under an oxygen partial pressure less than or equal to 1×10−5 mBar. This singlecrystal oxide layer 26 may, for example, comprise a thickness of 50-1000 Å and will be substantially lattice matched with the underlyinginterface 14 or alkaline-earth-metal oxide layer 22. It should be understood that the singlecrystal oxide layer 26 may comprises one or more layers in other embodiments. - Referring to FIG. 13, a side view (looking in the <{overscore (l)}10> direction) of the atomic configuration of the
Si substrate 10,interface 14, and alkaline-earth-metalmetal oxygen layer 26 is shown. The configuration shown comprises, in relative sizes, for illustrative purposes, from larger to smaller,barium atoms 30,silicon atoms 32,oxygen atoms 34, andtitanium atoms 36. TheSi substrate 10 comprises onlysilicon atoms 32. Theinterface 14 comprises metal atoms (which in the preferred embodiment are illustrated as barium atoms 30),silicon atoms 32, andoxygen atoms 34. The alkaline-earth-metalmetal oxygen layer 26 comprisesbarium atoms 30,oxygen atoms 34, andtitanium atoms 36. - Referring to FIG. 14, a top view of the interface along view line AA of FIG. 13, shows the arrangement of the barium, silicon, and
oxygen atoms - Referring to FIG. 15, a top view along line AA of FIG. 13, shows the
interface 14 and the topatomic layer 11 of theSi substrate 10. - For this discussion, a monolayer equals 6.8×1014 atoms/cm2 and an atomic layer is one atom thick. It is seen that the
interface 14 shown in the FIGS. comprises a single atomic layer, but could be more than one atomic layer, while theSi substrate 10 and the alkaline-earth-metal metal oxide layer may be many atomic layers. Note that in FIG. 13, only four atomic layers of theSi substrate 10 and only three atomic layers of the alkaline-earth-metalmetal oxide layer 26 are shown. Theinterface 14 comprises a half monolayer of the alkaline-earth-metal, a half monolayer of silicon, and a monolayer of oxygen. Eachbarium atom 30 is substantially equally spaced from four of thesilicon atoms 32 in theSi substrate 10. Thesilicon atoms 32 in theinterface 14 are substantially on a line and equally spaced between the alkaline-earth-metal atoms in the <110> direction. Eachsilicon atom 32 in the top layer of atoms in theSi substrate 10 is bonded to anoxygen atom 34 in theinterface 14 and eachsilicon atom 32 in theinterface 14 is bonded to twooxygen atoms 34 in theinterface 14. Theinterface 14 comprises rows of barium, silicon, andoxygen atoms Si substrate interface 14 has a 2×1 reconstruction. - A method for fabricating a thin,
crystalline interface 14 withsilicon 10 has been described herein. Theinterface 14 may comprise a single atomic layer. Better transistor applications are achieved by theinterface 14 being thin, in that the electrical coupling of the overlying oxide layers to theSi substrate 10 is not compromised, and in that theinterface 14 is more stable since the atoms will more likely maintain their crystalinity in processing.
Claims (24)
1. A method of fabricating a semiconductor structure comprising the steps of:
providing a silicon substrate having a surface;
forming on the surface of the silicon substrate an interface comprising a single atomic layer of silicon, oxygen, and a metal; and
forming one or more layers of a single crystal oxide on the interface.
2. The method of fabricating a semiconductor structure of wherein the forming the interface step includes forming a 2×1 reconstruction.
claim 1
3. The method of fabricating a semiconductor structure of wherein the forming an interface step includes forming the interface in an ultra-high-vacuum system.
claim 1
4. The method of fabricating a semiconductor structure of wherein the forming an interface step includes forming the interface in a chemical vapor deposition system.
claim 1
5. The method of fabricating a semiconductor structure of wherein the forming an interface step includes forming the interface in a physical vapor deposition system.
claim 1
6. The method of fabricating a semiconductor structure of wherein the forming an interface step comprises forming a single atomic layer of silicon, oxygen, and an alkaline-earth-metal.
claim 1
7. The method of fabricating a semiconductor structure of wherein the alkaline-earth-metal is selected from the group of barium and strontium.
claim 6
8. The method of fabricating a semiconductor structure of wherein forming an interface step comprises the steps of:
claim 1
forming a half of a monolayer of an alkaline-earth-metal;
forming a half of a monolayer of silicon; and
forming a monolayer of oxygen.
9. A method of fabricating a semiconductor structure comprising the steps of:
providing a silicon substrate having a surface;
forming amorphous silicon dioxide on the surface of the silicon substrate;
providing an alkaline-earth-metal on the amorphous silicon dioxide; and
heating the semiconductor structure to form an interface comprising a single atomic layer adjacent the surface of the silicon substrate.
10. The method of fabricating a semiconductor structure of wherein the heating step includes forming the interface with a 2×1 reconstruction.
claim 9
11. The method of fabricating a semiconductor structure of wherein the steps of providing an alkaline-earth-metal and heating the semiconductor structure are accomplished in an ultra-high-vacuum system.
claim 9
12. The method of fabricating a semiconductor structure of wherein the steps of providing an alkaline-earth-metal and heating the semiconductor structure are accomplished in a chemical vapor deposition system.
claim 9
13. The method of fabricating a semiconductor structure of wherein the steps of providing an alkaline-earth-metal and heating the semiconductor structure are accomplished in a physical vapor deposition system.
claim 9
14. The method of fabricating a semiconductor structure of wherein the heating step includes forming an interface having a single atomic layer of silicon, oxygen, and an alkaline-earth-metal.
claim 9
15. The method of fabricating a semiconductor structure of wherein the alkaline-earth-metal is selected from the group of barium and strontium.
claim 14
16. The method of fabricating a semiconductor structure of wherein heating step includes forming an interface step comprises the steps of:
claim 9
forming a half of a monolayer of an alkaline-earth-metal;
forming a half of a monolayer of silicon; and
forming a monolayer of oxygen.
17. A method of fabricating a semiconductor structure comprising the steps of:
providing a silicon substrate having a surface;
providing an alkaline-earth-metal on the surface of the silicon substrate; and
providing silicon and oxygen to form an interface comprising a single atomic interface with the surface of the silicon substrate.
18. The method of fabricating a semiconductor structure of wherein the providing silicon and oxygen step comprises forming an interface having a 2×1 reconstruction.
claim 17
19. The method of fabricating a semiconductor structure of wherein the steps of providing an alkaline-earth-metal and providing silicon and oxygen are accomplished in an ultra-high-vacuum system.
claim 17
20. The method of fabricating a semiconductor structure of wherein the steps of providing an alkaline-earth-metal and providing silicon and oxygen are accomplished in a chemical vapor deposition system.
claim 17
21. The method of fabricating a semiconductor structure of wherein the steps of providing an alkaline-earth-metal and providing silicon and oxygen are accomplished in a physical vapor deposition system.
claim 17
22. The method of fabricating a semiconductor structure of wherein the providing silicon and oxygen step comprises forming a single atomic layer of silicon, oxygen, and an alkaline-earth-metal.
claim 17
23. The method of fabricating a semiconductor structure of wherein the alkaline-earth-metal is selected from the group of barium and strontium.
claim 22
24. The method of fabricating a semiconductor structure of wherein the providing silicon and oxygen step comprises the steps of:
claim 17
forming a half of a monolayer of an alkaline-earth-metal;
forming a half of a monolayer of silicon; and
forming a monolayer of oxygen.
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SG101424A1 (en) * | 1999-03-22 | 2004-01-30 | Motorola Inc | Semiconductors structure having a crystalline alkaline earth metal oxide interface with silicon |
SG101423A1 (en) * | 1999-03-22 | 2004-01-30 | Motorola Inc | Method for fabricating a semiconductor structure having a crystalline alkaline earth metal oxide interface with silicon |
US6652989B2 (en) * | 1999-04-06 | 2003-11-25 | Ut-Battelle, Llc | Structure and method for controlling band offset and alignment at a crystalline oxide-on-semiconductor interface |
TW468212B (en) * | 1999-10-25 | 2001-12-11 | Motorola Inc | Method for fabricating a semiconductor structure including a metal oxide interface with silicon |
US6479173B1 (en) * | 1999-12-17 | 2002-11-12 | Motorola, Inc. | Semiconductor structure having a crystalline alkaline earth metal silicon nitride/oxide interface with silicon |
US6693033B2 (en) | 2000-02-10 | 2004-02-17 | Motorola, Inc. | Method of removing an amorphous oxide from a monocrystalline surface |
US6501973B1 (en) | 2000-06-30 | 2002-12-31 | Motorola, Inc. | Apparatus and method for measuring selected physical condition of an animate subject |
WO2002003437A1 (en) * | 2000-06-30 | 2002-01-10 | Motorola, Inc., A Corporation Of The State Of Delaware | Hybrid semiconductor structure and device |
SG165139A1 (en) * | 2000-07-17 | 2010-10-28 | Freescale Semiconductor Inc | Method of preparing crystalline alkaline earth metal oxides on a si substrate |
US6555946B1 (en) | 2000-07-24 | 2003-04-29 | Motorola, Inc. | Acoustic wave device and process for forming the same |
US6590236B1 (en) | 2000-07-24 | 2003-07-08 | Motorola, Inc. | Semiconductor structure for use with high-frequency signals |
EP1176230A1 (en) * | 2000-07-26 | 2002-01-30 | Motorola, Inc. | Method of preparing crystalline alkaline earth metal oxides on an Si substrate |
US6493497B1 (en) | 2000-09-26 | 2002-12-10 | Motorola, Inc. | Electro-optic structure and process for fabricating same |
US6638838B1 (en) | 2000-10-02 | 2003-10-28 | Motorola, Inc. | Semiconductor structure including a partially annealed layer and method of forming the same |
KR100693781B1 (en) * | 2000-10-25 | 2007-03-12 | 주식회사 하이닉스반도체 | Method for forming silicate by using atomic layer deposition |
AU2002213173A1 (en) * | 2000-11-14 | 2002-05-27 | Motorola, Inc. | Semiconductor structure having high dielectric constant material |
US6501121B1 (en) * | 2000-11-15 | 2002-12-31 | Motorola, Inc. | Semiconductor structure |
US6559471B2 (en) | 2000-12-08 | 2003-05-06 | Motorola, Inc. | Quantum well infrared photodetector and method for fabricating same |
US6673646B2 (en) | 2001-02-28 | 2004-01-06 | Motorola, Inc. | Growth of compound semiconductor structures on patterned oxide films and process for fabricating same |
US20020140012A1 (en) * | 2001-03-30 | 2002-10-03 | Motorola, Inc. | Semiconductor structures and devices for detecting far-infrared light and methods for fabricating same |
US6908639B2 (en) | 2001-04-02 | 2005-06-21 | Micron Technology, Inc. | Mixed composition interface layer and method of forming |
US20020175334A1 (en) * | 2001-05-22 | 2002-11-28 | Motorola, Inc. | Optical data converter |
US6709989B2 (en) | 2001-06-21 | 2004-03-23 | Motorola, Inc. | Method for fabricating a semiconductor structure including a metal oxide interface with silicon |
US6531740B2 (en) | 2001-07-17 | 2003-03-11 | Motorola, Inc. | Integrated impedance matching and stability network |
US6646293B2 (en) | 2001-07-18 | 2003-11-11 | Motorola, Inc. | Structure for fabricating high electron mobility transistors utilizing the formation of complaint substrates |
US6693298B2 (en) | 2001-07-20 | 2004-02-17 | Motorola, Inc. | Structure and method for fabricating epitaxial semiconductor on insulator (SOI) structures and devices utilizing the formation of a compliant substrate for materials used to form same |
US6498358B1 (en) | 2001-07-20 | 2002-12-24 | Motorola, Inc. | Structure and method for fabricating an electro-optic system having an electrochromic diffraction grating |
US6594414B2 (en) | 2001-07-25 | 2003-07-15 | Motorola, Inc. | Structure and method of fabrication for an optical switch |
US6667196B2 (en) | 2001-07-25 | 2003-12-23 | Motorola, Inc. | Method for real-time monitoring and controlling perovskite oxide film growth and semiconductor structure formed using the method |
US6585424B2 (en) | 2001-07-25 | 2003-07-01 | Motorola, Inc. | Structure and method for fabricating an electro-rheological lens |
US6639249B2 (en) | 2001-08-06 | 2003-10-28 | Motorola, Inc. | Structure and method for fabrication for a solid-state lighting device |
US6589856B2 (en) | 2001-08-06 | 2003-07-08 | Motorola, Inc. | Method and apparatus for controlling anti-phase domains in semiconductor structures and devices |
US6673667B2 (en) | 2001-08-15 | 2004-01-06 | Motorola, Inc. | Method for manufacturing a substantially integral monolithic apparatus including a plurality of semiconductor materials |
US6806202B2 (en) * | 2002-12-03 | 2004-10-19 | Motorola, Inc. | Method of removing silicon oxide from a surface of a substrate |
DE10303875B4 (en) * | 2003-01-31 | 2006-03-16 | Technische Universität Clausthal | Structure, in particular semiconductor structure, and method for producing a structure |
DE10340202A1 (en) * | 2003-08-28 | 2005-04-14 | IHP GmbH - Innovations for High Performance Microelectronics/Institut für innovative Mikroelektronik | Manufacturing Method for Semiconductor Device with Praseodymium Oxide Dielectric |
JP4826971B2 (en) * | 2009-04-15 | 2011-11-30 | 日本電気株式会社 | Manufacturing method of semiconductor device using high dielectric constant thin film |
US9396946B2 (en) * | 2011-06-27 | 2016-07-19 | Cree, Inc. | Wet chemistry processes for fabricating a semiconductor device with increased channel mobility |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5482003A (en) | 1991-04-10 | 1996-01-09 | Martin Marietta Energy Systems, Inc. | Process for depositing epitaxial alkaline earth oxide onto a substrate and structures prepared with the process |
US5225031A (en) | 1991-04-10 | 1993-07-06 | Martin Marietta Energy Systems, Inc. | Process for depositing an oxide epitaxially onto a silicon substrate and structures prepared with the process |
DE4120258A1 (en) | 1991-06-19 | 1992-12-24 | Siemens Ag | Epitaxial prodn. of high temp. superconducting layer on substrate - by sputtering intermediate metal oxide layer on substrate, and then depositing superconducting layer |
DE69325614T2 (en) | 1992-05-01 | 2000-01-13 | Texas Instruments Inc | Oxides of high dielectric constant containing Pb / Bi using perovskites as a buffer layer which do not contain Pb / Bi |
US5514484A (en) | 1992-11-05 | 1996-05-07 | Fuji Xerox Co., Ltd. | Oriented ferroelectric thin film |
US5450812A (en) | 1993-07-30 | 1995-09-19 | Martin Marietta Energy Systems, Inc. | Process for growing a film epitaxially upon an oxide surface and structures formed with the process |
JP3095944B2 (en) * | 1994-06-21 | 2000-10-10 | シャープ株式会社 | Method for producing oxide crystal thin film and thin film element |
TW410272B (en) * | 1996-05-07 | 2000-11-01 | Thermoscan Lnc | Enhanced protective lens cover |
JPH09315897A (en) | 1996-05-31 | 1997-12-09 | Sumitomo Electric Ind Ltd | Single crystal oxide thin film having rock crystal type crystal structure and its production |
US5830270A (en) | 1996-08-05 | 1998-11-03 | Lockheed Martin Energy Systems, Inc. | CaTiO3 Interfacial template structure on semiconductor-based material and the growth of electroceramic thin-films in the perovskite class |
US6023082A (en) * | 1996-08-05 | 2000-02-08 | Lockheed Martin Energy Research Corporation | Strain-based control of crystal anisotropy for perovskite oxides on semiconductor-based material |
US5767543A (en) | 1996-09-16 | 1998-06-16 | Motorola, Inc. | Ferroelectric semiconductor device having a layered ferroelectric structure |
-
1999
- 1999-03-22 US US09/273,929 patent/US6241821B1/en not_active Expired - Lifetime
-
2000
- 2000-03-10 JP JP2000066646A patent/JP2000294554A/en active Pending
- 2000-03-14 KR KR1020000012773A patent/KR20000076851A/en not_active Application Discontinuation
- 2000-03-21 EP EP00106104A patent/EP1043426A1/en not_active Withdrawn
- 2000-03-28 TW TW089105137A patent/TW454246B/en not_active IP Right Cessation
-
2001
- 2001-06-04 US US09/871,958 patent/US20010023660A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
KR20000076851A (en) | 2000-12-26 |
US6241821B1 (en) | 2001-06-05 |
JP2000294554A (en) | 2000-10-20 |
TW454246B (en) | 2001-09-11 |
EP1043426A1 (en) | 2000-10-11 |
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