US20010004313A1 - Cooling unit for cooling circuit component generating heat and electronic apparatus comprising the cooling unit - Google Patents
Cooling unit for cooling circuit component generating heat and electronic apparatus comprising the cooling unit Download PDFInfo
- Publication number
- US20010004313A1 US20010004313A1 US09/732,915 US73291500A US2001004313A1 US 20010004313 A1 US20010004313 A1 US 20010004313A1 US 73291500 A US73291500 A US 73291500A US 2001004313 A1 US2001004313 A1 US 2001004313A1
- Authority
- US
- United States
- Prior art keywords
- heat
- heat sink
- chip
- generating unit
- base
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001816 cooling Methods 0.000 title claims abstract description 35
- 239000004065 semiconductor Substances 0.000 claims abstract description 69
- 125000006850 spacer group Chemical group 0.000 claims abstract description 55
- 238000012546 transfer Methods 0.000 claims abstract description 50
- 239000004519 grease Substances 0.000 claims abstract description 33
- 229910000679 solder Inorganic materials 0.000 claims description 20
- 229920003002 synthetic resin Polymers 0.000 claims description 14
- 239000000057 synthetic resin Substances 0.000 claims description 14
- 230000003014 reinforcing effect Effects 0.000 claims description 2
- 230000005855 radiation Effects 0.000 description 9
- 238000005452 bending Methods 0.000 description 8
- 230000002093 peripheral effect Effects 0.000 description 7
- 239000000919 ceramic Substances 0.000 description 6
- 238000005476 soldering Methods 0.000 description 6
- 230000008901 benefit Effects 0.000 description 5
- 230000002787 reinforcement Effects 0.000 description 5
- 239000013013 elastic material Substances 0.000 description 4
- 239000011159 matrix material Substances 0.000 description 4
- 229910000838 Al alloy Inorganic materials 0.000 description 2
- 239000004642 Polyimide Substances 0.000 description 2
- 239000000470 constituent Substances 0.000 description 2
- 239000004973 liquid crystal related substance Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 239000007769 metal material Substances 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 229920001721 polyimide Polymers 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 230000001737 promoting effect Effects 0.000 description 2
- 210000002105 tongue Anatomy 0.000 description 2
- 230000001133 acceleration Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/367—Cooling facilitated by shape of device
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/16—Constructional details or arrangements
- G06F1/20—Cooling means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/367—Cooling facilitated by shape of device
- H01L23/3675—Cooling facilitated by shape of device characterised by the shape of the housing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/40—Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs
- H01L23/4093—Snap-on arrangements, e.g. clips
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/40—Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs
- H01L23/4006—Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs with bolts or screws
- H01L2023/4037—Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs with bolts or screws characterised by thermal path or place of attachment of heatsink
- H01L2023/4043—Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs with bolts or screws characterised by thermal path or place of attachment of heatsink heatsink to have chip
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/40—Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs
- H01L23/4006—Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs with bolts or screws
- H01L2023/4037—Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs with bolts or screws characterised by thermal path or place of attachment of heatsink
- H01L2023/4062—Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs with bolts or screws characterised by thermal path or place of attachment of heatsink heatsink to or through board or cabinet
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32245—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73203—Bump and layer connectors
- H01L2224/73204—Bump and layer connectors the bump connector being embedded into the layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73253—Bump and layer connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15311—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/161—Cap
- H01L2924/162—Disposition
- H01L2924/16251—Connecting to an item not being a semiconductor or solid-state body, e.g. cap-to-substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/191—Disposition
- H01L2924/19101—Disposition of discrete passive components
- H01L2924/19106—Disposition of discrete passive components in a mirrored arrangement on two different side of a common die mounting substrate
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Materials Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Theoretical Computer Science (AREA)
- Human Computer Interaction (AREA)
- General Engineering & Computer Science (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
- Cooling Or The Like Of Electrical Apparatus (AREA)
Abstract
Description
- This application is based upon and claims the benefit of priority from the prior Japanese Patent Application No. 11-353174, filed Dec. 13, 1999, the entire contents of which are incorporated herein by reference.
- The present invention relates to a cooling unit for promoting heat radiation of circuit components that generate heat, such as a semiconductor package, and an electronic apparatus such as a personal computer comprising the cooling unit.
- An electronic apparatus such as a desktop personal computer and a workstation comprises a semiconductor package for multi-purpose multimedia information such as characters, speech and images. In the semiconductor package of this kind, the power consumption is increased in accordance with the acceleration of the processing speed and the versatility, and in proportion to this the amount of heat in the operation is also inclined to rapidly increase.
- For this reason, heat radiation of the semiconductor package needs to be enhanced to maintain the stable operation thereof. Therefore, various heat radiating/cooling means such as a heat sink or a heat pipe are indispensable.
- A conventional heat sink has a heat receiving portion thermally connected to the semiconductor package. If there is a poor contact between the heat receiving portion and the semiconductor package, a gap occurs therebetween and thereby prevents transfer of the heat from the semiconductor package to the heat receiving portion. Thus, in the prior art, heat conductive grease or a rubber heat transfer sheet is provided between the heat receiving portion and the semiconductor package and the heat sink is pressed against the semiconductor package through a spring to enhance the close contact between the heat receiving portion and the semiconductor package.
- Incidentally, if the heat receiving portion of the heat sink is forcibly pressed against the semiconductor package, load is applied to the semiconductor package through the heat receiving portion and may be the stress to the semiconductor package. In this case, there is no problem if the semiconductor package has strength enough to overcome the stress. Recently, however, the semiconductor package has been structurally simplified due to various requests such as reduction of the manufacturing costs, saving of the weight, miniaturization and the like. For this reason, some kinds of the semiconductor packages do not have the structural strength enough to bear the stress.
- Specifically, in the ceramic package, which is a typical airtight sealing package, an IC chip generating heat is covered with a ceramic board or a ceramic lid having high rigidity. The load of the heat sink can be therefore received by the ceramic board or the ceramic lid.
- On the other hand, in the BGA (Ball Grid Array) package and PGA (Pin Grid Array) package in which the IC chip is subjected to flip chip bonding on a synthetic resin circuit board, or the TCP (Tape Carrier Package) in which the IC chip is bonded to polyimide tape, the IC chip is exposed to the outside and the circuit board or tape supporting the IC chip is formed of synthetic resin. For this reason, it cannot be said that the package of this kind has the strength enough to bear the load from the heat sink.
- Therefore, for example, if the heat receiving portion of the heat sink is pressed against the IC chip of the BGA package, the stress concentrates on the IC chip and the IC chip may be broken. In addition, as the IC chip receives the load caused by pressing the IC chip against the circuit board, the load acts as a bending force to the circuit board and the circuit board may be curved or bent backward. As a result, the stress is continuously applied to the connection portions of the IC chip and the circuit board, which may cause the faulty bonding.
- Therefore, the heat sink cannot be pressed against the IC chip with a large force in the semiconductor package such as the BGA, PGA and the like. For this reason, it is difficult to sufficiently maintain the close contact between the heat sink and the semiconductor package, and efficient transfer of heat from the semiconductor package to the heat sink is prevented.
- The object of the present invention is to provide a cooling unit and circuit module capable of efficiently radiating the heat of the circuit component to the heat sink while reducing the stress applied to the circuit components, and also provide an electronic apparatus comprising the cooling unit.
- To achieve the object, there is provided a cooling unit according to the present invention, for cooling a circuit component including a base of synthetic resin having a mounting surface and a heat generating unit mounted on the mounting surface of the base. The cooling unit comprises a heat sink, which is overlapped on the circuit component and which has a heat receiving portion for receiving heat of the heat generating unit, a flexible heat-transfer member provided between the heat generating unit and the heat receiving portion, for thermally connecting the heat generating unit and the heat receiving portion to one another, pushing means for pushing the heat sink toward the heat generating unit to sandwich the heat-transfer member between the heat generating unit and the heat receiving portion, and a spacer provided between the base of the circuit component and the heat sink, for supporting the heat sink, at a position remote from the heat generating unit.
- In addition, to achieve the above-described object, there is also provided an electronic apparatus comprising a housing, a circuit component, which is contained inside the housing, and which comprises a base of synthetic resin having a mounting surface and a heat generating unit mounted on the mounting surface of the base, a heat sink overlapped on the circuit component, the heat sink having a heat receiving portion for receiving heat of the heat generating unit, a flexible heat-transfer member provided between the heat generating unit and the heat receiving portion, for thermally connecting the heat generating unit and the heat receiving portion to one another, pushing means for pushing the heat sink toward the heat generating unit to sandwich the heat-transfer member between the heat generating unit and the heat receiving portion, and a spacer provided between the base of the circuit component and the heat sink, for supporting the heat sink, at a position remote from the heat generating unit.
- In this structure, when the heat sink is thermally connected to the heat generating unit, the heat sink is pushed on the heat generating unit by the pushing means. At this time, as the spacer is provided between the heat sink and the base of the circuit component, most of the load of heat sink applied to the heat generating unit is received by the spacer. Thus, excessive stress is not concentrated on the heat generating unit and thereby bending or warping of the base supporting the heat generating unit can be prevented. For this reason, it is possible to prevent floating of the heat generating unit or damage of the mounting part of the heat generating unit.
- In addition, the close contact between the heat generating unit and the heat receiving portion can be maintained by appropriately pushing down the flexible heat-transfer member between the heat receiving portion and the heat generating unit. Therefore, the thermal connection between the heat generating unit and the heat receiving portion can be stably maintained and the heat of the heat generating unit can be efficiently transferred to the heat sink.
- To achieve the above-described object, there is also provided a cooling unit according to the present invention, for cooling a circuit component including a base of synthetic resin having a mounting surface and a heat generating unit mounted on the mounting surface of the base. The cooling unit comprises a heat sink, which is overlapped on the circuit component and which has a heat receiving portion for receiving heat of the heat generating unit, a spacer, which is provided between the base and the heat sink and which constitutes a grease-filled chamber surrounding the heat generating unit in cooperation with the base and the heat sink, fixing means for fixing the heat sink on the base to allow the spacer to be sandwiched between the heat sink on the base, and heat-transfer grease packed in the grease-filled chamber to thermally connect the heat generating unit and the heat sink to one another.
- In this structure, as the heat generating unit is embedded in the grease, the contact area of the heat generating unit and the grease and the contact area of the heat sink and the grease can be adequately maintained. Therefore, the heat of the heat generating unit can be efficiently transferred to the heat sink through the grease.
- Moreover, if the heat sink is fixed on the base, the spacer is sandwiched between the heat sink and the base. Thus, the heat generating unit is not directly pushed down by the heat sink or no stress is not applied to the heat generating unit. In addition, the load of the heat sink applied to the base when the heat sink is fixed is dispersed in a wide range around the heat generating unit via the spacer, and the excessive stress cannot be concentrated on a specific part of the base. Therefore, it is possible to prevent the bending or warping of the base supporting the heat generating unit, and also possible to prevent the floating of the heat generating unit or damage of the mounting part of the heat generating unit.
- To achieve the above-described object, there is also provided a circuit module according to the present invention, comprising a wiring board, a semiconductor package containing a circuit board of synthetic resin, which has a mounting surface and a plurality of current-carrying terminals on a opposite side to the mounting surface, and an IC chip, which is mounted on the mounting surface of the circuit board and generates heat, the current-carrying terminals being electrically connected to the wiring board, a heat sink, which is overlapped on the semiconductor package and which has a heat receiving portion for receiving heat of the IC chip, a flexible heat-transfer member provided between the IC chip and the heat receiving portion, for thermally connecting the IC chip and the heat receiving portion to one another, pushing means for pushing the heat sink toward the IC chip to sandwich the heat-transfer member between the IC chip and the heat receiving portion, and a spacer provided between the circuit board of the semiconductor package and the heat sink, for supporting the heat sink, at a position remote from the IC chip.
- In this structure, when the heat sink is thermally connected to the IC chip of the semiconductor package, the heat sink is pushed on the IC chip by the pushing means. At this time, as the spacer is provided between the heat sink and the circuit board of the semiconductor package, most of the load of heat sink applied to the IC chip is received by the spacer. Thus, excessive stress is not concentrated on the IC chip and thereby the bending or warping of the circuit board supporting the IC chip can be prevented. For this reason, it is possible to prevent the floating of the IC chip or the damage of the mounting part of the IC chip.
- Further, the load applied to the circuit board through the spacer is transferred to the wiring board via a plurality of current-carrying terminals. Therefore, the load on each of the current-carrying terminals can be reduced, deformation or breakage of the current-carrying terminals can be prevented, and the damage of the connecting part between the current-carrying terminals and the wiring board can also be prevented.
- In addition, the close contact between the IC chip and the heat receiving portion can be maintained by appropriately pushing down the flexible heat-transfer member between the IC chip and the heat receiving portion. Therefore, the thermal connection between the IC chip and the heat receiving portion can be stably maintained and the heat of the IC chip can be efficiently transferred to the heat sink.
- Additional objects and advantages of the invention will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. The objects and advantages of the invention may be realized and obtained by means of the instrumentalities and combinations particularly pointed out hereinafter.
- The accompanying drawings, which are incorporated in and constitute a part of the specification, illustrate presently preferred embodiments of the invention, and together with the general description given above and the detailed description of the preferred embodiments given below, serve to explain the principles of the invention.
- FIG. 1 is a perspective view showing a desktop personal computer according to a first embodiment of the present invention;
- FIG. 2 is a perspective view showing a desktop personal computer according to the first embodiment of the present invention as seen from the back of the main body;
- FIG. 3 is a side view showing a desktop personal computer according to the first embodiment of the present invention, illustrating a partial section of a housing of the main body;
- FIG. 4 is a sectional view showing a state of attaching a heat sink to a PGA semiconductor package mounted on a printed wiring board, in the first embodiment of the present invention;
- FIG. 5 is a sectional view as seen along a line F5-F5 of FIG. 4;
- FIG. 6 is a sectional view showing a state of attaching a heat sink to a PGA semiconductor package mounted on a printed wiring board, in a second embodiment of the present invention;
- FIG. 7 is a sectional view showing a state of attaching a heat sink to a PGA semiconductor package mounted on a printed wiring board, in a third embodiment of the present invention;
- FIG. 8 is a sectional view showing a state of attaching a heat sink to a PGA semiconductor package mounted on a printed wiring board, in a fourth embodiment of the present invention;
- FIG. 9 is a sectional view showing a state of attaching a heat sink to a PGA semiconductor package mounted on a printed wiring board, in a fifth embodiment of the present invention;
- FIG. 10 is a sectional view showing a state of attaching a heat sink to a PGA semiconductor package mounted on a printed wiring board, in a sixth embodiment of the present invention; and
- FIG. 11 is a plan view showing a reinforcement plate for reinforcing the printed wiring board, in the sixth embodiment of the present invention.
- The desktop personal computer according to the first embodiment of the present invention will be explained below with reference to FIGS.1 to 5.
- FIG. 1 shows a desktop personal computer1 as an electronic apparatus. The computer 1 comprises a
main body 2, and a keyboard 3 connected to themain body 2. - The
main body 2 has ahousing 5 formed of synthetic resin. Thehousing 5 is composed of abase portion 6 and a stand portion 7. Thebase portion 6 is shaped in a flat square casing and contains a CD-ROM drive 8 or a floppy disk drive (not shown) so that it can be removed from thebase portion 6. - The stand portion7 extends upwardly from a rear end of the
base portion 6. The stand portion 7 is shaped in a hollow casing having a front wall 9 a, arear wall 9 b, right and leftside walls 9 c and 9 d, and a top wall 9 e. A plurality ofair vents 10 are formed on therear wall 9 b. - A flat liquid-
crystal display unit 12 is supported at a top end of the stand portion 7. Thedisplay unit 12 comprises adisplay housing 13 and a liquid-crystal display panel 14 contained in thedisplay housing 13. Thedisplay housing 13 has a front face on which anopening portion 15 is formed. A display screen 14 a of thedisplay panel 14 is exposed to the outside through the openingportion 15. - A
circuit module 18 is contained in the stand portion 7 as shown in FIG. 3. Thecircuit module 18 comprises a printedwiring board 20 and also aPGA semiconductor package 26, which is a circuit component. The printedwiring board 20 is arranged along the front wall 9 a of the stand portion 7. The printedwiring board 20 has a component-mountedsurface 21. The component-mountedsurface 21 faces therear wall 9 b. ACPU socket 22 is mounted on the component-mountedsurface 21. - The
CPU socket 22 is a square frame having ahollow portion 23 at the center as shown in FIG. 4. TheCPU socket 22 has aCPU support surface 24 on the opposite side to the printedwiring board 20. A plurality of terminal holes (not shown) are arranged in a matrix on theCPU support surface 24. The terminal holes are electrically connected to pads (not shown) on the component-mountedsurface 21. - The
PGA semiconductor package 26 is supported on the printedwiring board 20 via theCPU socket 22. Thesemiconductor package 26 comprises acircuit board 27 of synthetic resin, which serves as a base, and anIC chip 28, which is a heat generating unit. - The
circuit board 27 has a first mounting surface 29 a and a second mountingsurface 29 b. The second mountingsurface 29 b is on the opposite side to the first mounting surface 29 a. The first mounting surface 29 a of thecircuit board 27 includes a pin-arrangedarea 30 a and a component-arrangedarea 30 b. The pin-arrangedarea 30 a corresponds to theCPU support surface 24 of theCPU socket 22 and is positioned on an outer peripheral portion of the first mounting surface 29 a. The component-arrangedarea 30 b corresponds to thehollow portion 23 of theCPU socket 22 and is positioned at the center of the first mounting surface 29 a. For this reason, the component-arrangedarea 30 b is surrounded with the pin-arrangedarea 30 a. - A plurality of pin-like current-carrying
terminals 31 are arranged in the pin-arrangedarea 30 a of thecircuit board 27 as shown in FIG. 4. The current-carryingterminals 31 are arranged in a matrix to correspond to the terminal holes of theCPU socket 22 and are formed to protrude downwardly from the pin-arrangedarea 30 a of thecircuit board 27. A plurality ofother circuit components 32, for example, capacitors are mounted in the component-arrangedarea 30 b of thecircuit board 27. - The
IC chip 28 of thesemiconductor package 26 consumes large power during the operation since it processes the multi-purpose multimedia information such as characters, speech and images at a high speed. In accordance with this, the amount of heat from theIC chip 28 becomes large such that theIC chip 28 needs to be cooled. TheIC chip 28 is subjected to flip-chip bonding on the second mountingsurface 29 b of thecircuit board 27 via a plurality ofsolder balls 34. TheIC chip 28 is arranged at the center of the second mountingsurface 29 b and positioned on the opposite side to the component-arrangedarea 30 b. For this reason, the current-carryingterminals 31 are arranged in an area except the position corresponding to theIC chip 28, on the first mounting surface 29 a. - In the
semiconductor package 26, when a lock lever (not shown) of theCPU socket 22 is operated after inserting the current-carryingterminals 31 into the terminal holes of theCPU socket 22, the current-carryingterminals 31 are locked such that they cannot be detached from theCPU socket 22. Thus, the fitting of the current-carryingterminals 31 to the terminal holes is maintained and thesemiconductor package 26 is electrically connected to the printedwiring board 20. When thesemiconductor package 26 is mounted on theCPU socket 22,heating IC chip 28 is positioned just above thehollow portion 23 of theCPU socket 22 and thecircuit components 32 are contained in thehollow portion 23. - A
heat sink 36 overlaps thesemiconductor package 26 as shown in FIG. 4. Theheat sink 36 is formed of a metal material excellent in heat conductivity, for example, an aluminum alloy. Theheat sink 36 is shaped in a flat plate that is slightly larger than the plane shape of thesemiconductor package 26. - The
heat sink 36 has afirst surface 37 a and asecond surface 37 b positioned on the opposite side to thefirst surface 37 a. Thefirst surface 37 a faces thesemiconductor package 26. Aheat receiving portion 38 for receiving the heat from theIC chip 28 is formed integrally with a central part of thefirst surface 37 a. Theheat receiving portion 38 protrudes from the central part of thefirst surface 37 a. The protruding end of theheat receiving portion 38 is a flatheat receiving surface 39. Theheat receiving surface 39 has substantially the same size as that of the upper surface of theIC chip 28 and faces theIC chip 28. A flexible heat-transfer member 41 is provided between theheat receiving surface 39 and theIC chip 28. The heat-transfer member 41 is formed of heat-transfer grease or a heat-transfer sheet of a rubber-like elastic material. - A plurality of pin-shaped
radiator fins 42 are formed integrally with thesecond surface 37 b of theheat sink 36. Theradiator fins 42 are arranged in a matrix on thesecond surface 37 b. - The
heat sink 36 is fixed on theCPU socket 22 via a fixingspring 44 serving as pressurizing means so as to be detached therefrom. The fixingspring 44 has a strip-shaped pressurizingportion 45 and a pair ofarm portions 46 a and 46 b connected to both ends of the pressurizingportion 45. The pressurizingportion 45 extends across the central part of thesecond surface 37 b of theheat sink 36 and is curved in a shape of an arc so as to warp to thesecond surface 37 b. For this reason, the central part in the longitudinal direction of the pressurizingportion 45 elastically touches thesecond surface 37 b. Thearm portions 46 a and 46 b are formed by turning up both ends of the pressurizingportion 45 at substantially right angles in the same direction. Engagingportions 47 a and 47 b are formed respectively at the top ends of thearm portions 46 a and 46 b. The engagingportions 47 a and 47 b are hooked in the engagement holes 48 a and 48 b of theCPU socket 22 so as to be detached therefrom. - For this reason, when the engaging
portions 47 a and 47 b of the fixingspring 44 are hooked in the engagement holes 48 a and 48 b of theCPU socket 22, the pressurizingportion 45 of the fixingspring 44 elastically abuts on thesecond surface 37 b of theheat sink 36 and thereby theheat sink 36 is pushed toward thesemiconductor package 26. Thus, the heat-transfer member 41 is sandwiched between theIC chip 28 and theheat receiving surface 39 of theheat sink 36, so that theIC chip 28 and theheat receiving surface 39 are thermally connected via the heat-transfer member 41. - A
spacer 50 is provided between thecircuit board 27 of thesemiconductor package 26 and theheat sink 36 as shown in FIGS. 4 and 5. Thespacer 50 formed of a rigid material such as synthetic resin, metal or ceramic. Thespacer 50 is shaped in a square frame to surround theIC chip 28 and theheat receiving portion 38 of theheat sink 36, and a throughhole 51 is formed at the central part of thespacer 50 while avoiding theIC chip 28 and theheat receiving portion 38. - The
spacer 50 has a thickness extremely greater than the height of theIC chip 28. When theheat sink 36 is fixed at theCPU socket 22 by the fixingspring 44, thespacer 50 is sandwiched between the outer peripheral part of thefirst surface 37 a of theheat sink 36 and the second mountingsurface 29 b of thecircuit board 27 and is positioned just above theCPU socket 22 and the current-carryingterminals 31. - Thus, the
spacer 50 supports theheat sink 36 at the position remote from theIC chip 28 and receives most of the load of theheat sink 36 applied to theIC chip 28. Therefore, the heat-transfer member 41 is pushed down between theIC chip 28 and theheat receiving surface 39 to an appropriate degree by appropriately setting the thickness of thespacer 50 in accordance with the height of theIC chip 28, the degree of the protrusion of theheat receiving portion 38 and the like. As a result, the heat-transfer member 41 is packed at high density without gap between theIC chip 28 and theheat receiving surface 39. - In this structure, when the
IC chip 28 of thesemiconductor package 26 generates heat, the heat of theIC chip 28 is transferred to theheat receiving portion 38 of theheat sink 36 through the heat-transfer member 41. Then, the heat of theIC chip 28 is diffused to theheat sink 36 by the transfer of heat from theheat receiving portion 38 to theheat sink 36 and radiated into the stand portion 7 via theradiator fins 42. - The
heat sink 36 is forcibly pushed down on thesemiconductor package 26 via the fixingspring 44, in the state of thermally connecting theheat sink 36 toIC chip 28, as shown in greatest detail in FIG. 4. At this time, as thespacer 50 surrounding theIC chip 28 is provided between thesemiconductor package 26 andheat sink 36 and theheat sink 36 is supported by thespacer 50, most of the load of theheat receiving portion 38 of theheat sink 36 applied to theIC chip 28 is received by thespacer 50. - For this reason, the excessive load of the
heat receiving portion 38 of theheat sink 36 is not concentrated on theIC chip 28 and therefore it is possible to prevent theIC chip 28 from being damaged. In addition, it is possible to prevent the central part of thecircuit board 27 supporting theIC chip 28 from bending or warping, the soldering part between thecircuit board 27 and thesolder balls 34 is not peeled, or no cracks occur at the solder part. Electric connection between thecircuit board 27 and theIC chip 28 can be therefore maintained preferably. - In addition, as the central part of the
circuit board 27 corresponds to the component-arrangedarea 30 b on thecircuit board 27, bending or warping of the component-arrangedarea 30 b can be prevented. For this reason, it is possible to prevent the connected part between the component-arrangedarea 30 b and thecircuit components 32 from being peeled off or damaged, and it is also possible to remarkably maintain the reliability on the electric connection between thecircuit board 27 and thecircuit components 32. - Further, as the
spacer 50 abuts on the second mountingsurface 29 b of thecircuit board 27, at the position corresponding to theCPU socket 22, the load of thespacer 50 applied to thecircuit board 27 can be received by taking advantage of theCPU socket 22. For this reason, thecircuit board 27 is deformed more hardly and, therefore, it is possible to certainly prevent the soldering part between thecircuit board 27 and theIC chip 28 from being peeled off or damaged. - Moreover, the close contact between the
IC chip 28 and theheat receiving portion 38 of theheat sink 36 can be maintained by appropriately pushing down the flexible heat-transfer member 41 and packing it between theIC chip 28 and theheat receiving portion 38 at high density. Therefore, it is possible to increase the reliability on the electric connection between theIC chip 28 and thecircuit board 27 while maintaining the stable heat connection state between theIC chip 28 and theheat sink 36. - The present invention is not limited to the above-described first embodiment. FIG. 6 shows a second embodiment of the present invention.
- In the second embodiment, the structure of the
heat sink 36 is different from that in the first embodiment, but the structures of theCPU socket 22 and thesemiconductor package 26 are the same as those in the first embodiment. For this reason, the same constituent elements as those in the first embodiment are denoted by the same reference numerals in the second embodiment, and their explanations will be omitted. - The
heat sink 36 has a protrudingportion 61 formed integrally with theheat sink 36 as shown in FIG. 6. The protrudingportion 61 protrudes from the outer peripheral part of thefirst surface 37 a toward the second mountingsurface 29 b of thecircuit board 27 and is shaped in a frame surrounding theheat receiving surface 39 of theheat sink 36. The height of protrusion of the protrudingportion 61 is set to be larger than the height of theIC chip 28. - The protruding
portion 61 has aflat contact surface 62 at its protruding end. Thecontact surface 62 is in contact with the second mountingsurface 29 b of thecircuit board 27 in the outer periphery of theIC chip 28 when theheat sink 36 is fixed at theCPU socket 22. Thus, the protrudingportion 61 functions as a spacer in the second embodiment. - In this structure, the
heat sink 36 overlaps thesemiconductor package 26 and the protrudingportion 61 of theheat sink 36 contacts the second mountingsurface 29 b of thecircuit board 27. For this reason, when theheat sink 36 is fixed at theCPU socket 22 via the fixingspring 44, most of the load of theheat receiving portion 38 of theheat sink 36 applied to theIC chip 28 can be received by the protrudingportion 61 and, therefore, excessive stress is not concentrated on theIC chip 28. - Further, as the work for providing a spacer between the
heat sink 36 and thecircuit board 27 is unnecessary, the steps of the working process can be reduced and the fixation of theheat sink 36 can be easily executed. In addition, as the protrudingportion 61 of theheat sink 36 also serves as a spacer, the number of components can be decreased and the manufacturing costs can be reduced as compared with a case where the spacer is separated from theheat sink 36. - Moreover, as the protruding
portion 61 is a part of theheat sink 36 in the above structure, the protrudingportion 61 itself has heat conductivity. Thus, the heat radiated from theIC chip 28 to thecircuit board 27 can be transferred to theheat sink 36 through the protrudingportion 61. Therefore, the heat radiation path from theIC chip 28 to theheat sink 36 is constituted by a route passing through theheat receiving portion 38 and a route passing from thecircuit board 27 through the protrudingportion 61, and the heat radiating ability of theIC chip 28 can be enhanced. - FIG. 7 shows a third embodiment of the present invention. In the third embodiment, the structure of the heat radiation path from the
IC chip 28 to theheat sink 36 is different from that in the first embodiment, and other constituent elements are the same as those of the first embodiment. - As shown in FIG. 7, the
spacer 50 sandwiched between theheat sink 36 and the second mountingsurface 29 b of thecircuit board 27 constitutes a grease-filledchamber 71 in cooperation with theheat receiving surface 39 of theheat sink 36 and the second mountingsurface 29 b of thecircuit board 27. TheIC chip 28 of thesemiconductor package 26 is contained in the grease-filledchamber 71.Grease 72 having heat conductivity is packed at high density in the grease-filledchamber 71. Thegrease 72 is in contact with theIC chip 28, theheat receiving surface 39 of theheat sink 36, the inner surface of the throughhole 51 of thespacer 50, and the second mountingsurface 29 b of thecircuit board 27. Therefore, theIC chip 28 is embedded in thegrease 72 so that the contact area of theIC chip 28 and thegrease 72 and the contact area of thegrease 72 and theheat sink 36 are adequately maintained. - In this structure, the heat of the
IC chip 28 can be efficiently transferred to theheat sink 36 through thegrease 72 and heat radiating ability of theIC chip 28 can be enhanced. Moreover, as thegrease 72 is also in contact with the inner surface of the throughhole 51 of thespacer 50, the heat of theIC chip 28 can be transferred to theheat sink 36 through thespacer 50. For this reason, particularly, if thespacer 50 is formed of a material excellent in the heat conductivity, thespacer 50 can be positively employed as a part of the heat radiation path and thereby the heat radiating ability of theIC chip 28 can be enhanced. - FIG. 8 shows a fourth embodiment of the present invention. The fourth embodiment is similar to the second embodiment shown in FIG. 6, but is different therefrom with respect to the structure of the heat transfer path from the
IC chip 28 to theheat sink 36. - As shown in FIG. 8, the height of the protruding
portion 61 of theheat sink 36 is set to be remarkably larger than the height of theIC chip 28. The protrudingportion 61 constitutes a grease-filledchamber 81 in cooperation with theheat receiving surface 39 of theheat sink 36 and the second mountingsurface 29 b of thecircuit board 27. TheIC chip 28 of thesemiconductor package 26 is contained in the grease-filledchamber 81.Grease 82 having heat conductivity is packed at high density in the grease-filledchamber 81. Thegrease 82 is in contact with theIC chip 28, theheat receiving surface 39 of theheat sink 36, the inner surface of the protrudingportion 61, and the second mountingsurface 29 b of thecircuit board 27. Therefore, theIC chip 28 is embedded in thegrease 82 so that the contact area of theIC chip 28 and thegrease 82 and the contact area of thegrease 82 and theheat sink 36 are adequately maintained. - In this structure, the
grease 82 is packed not only between the upper face of theIC chip 28 and theheat receiving surface 39, but also between the side face of theIC chip 28 and the inner surface of the protrudingportion 61. For this reason, the heat of theIC chip 28 can be efficiently transferred to theheat sink 36 through thegrease 82 and heat radiating ability of theIC chip 28 can be enhanced. - FIG. 9 shows a fifth embodiment of the present invention.
- The fifth embodiment is different from the first embodiment with respect to the structure of the heat radiation path to transfer the heat of the
IC chip 28 to theheat sink 36. - As shown in FIG. 9, a first heat-
transfer sheet 91 serving as a heat-transfer member is provided between theheat receiving surface 39 of theheat sink 36 and the upper face of theIC chip 28. The first heat-transfer sheet 91 is formed of a rubber-like elastic material having the heat conductivity. - The
heat sink 36 has a protruding portion 92 formed integrally with theheat sink 36. The protruding portion 92 protrudes from the outer peripheral part of thefirst surface 37 a toward the second mountingsurface 29 b of thecircuit board 27 and is shaped in a frame surrounding theheat receiving surface 39. The protruding portion 92 has aflat contact surface 93 on its protruding end. When theheat sink 36 is fixed at theCPU socket 22, thecontact surface 93 faces the second mountingsurface 29 b of thecircuit board 27 in the outer periphery of theIC chip 28. - A second heat-
transfer sheet 94 is provided between thecontact surface 93 of the protruding portion 92 and the second mountingsurface 29 b of thecircuit board 27. The second heat-transfer sheet 94 is formed of a rubber-like elastic material having the heat conductivity. The second heat-transfer sheet 94 has a throughhole 95 that avoids theIC chip 28 at its central part. When theheat sink 36 is fixed at theCPU socket 22, the second heat-transfer sheet 94 is sandwiched between thecontact surface 93 of the protruding portion 92 and the second mountingsurface 29 b of thecircuit board 27. - Thus, the protruding portion92 and the second heat-
transfer sheet 94 function as aspacer 96 for supporting theheat sink 36 in this embodiment. The load of theheat sink 36 applied to theIC chip 28 is received by thespacer 96. - In this structure, as the
spacer 96 supporting theheat sink 36 has the heat conductivity, the heat radiated from theIC chip 28 to thecircuit board 27 can be transferred to theheat sink 36 through thespacer 96. Thus, the heat radiation path of theIC chip 28 is constituted by a route passing from the first heat-transfer sheet 91 through theheat receiving portion 38 and a route passing from thecircuit board 27 through thespacer 96. Therefore, the routes for heat radiation from theIC chip 28 to theheat sink 36 can be increased and the heat radiating ability of theIC chip 28 can be enhanced. - FIGS. 10 and 11 show a sixth embodiment of the present invention.
- A
BGA semiconductor package 100 is employed as a circuit component in the sixth embodiment. - As shown in FIG. 10, the
semiconductor package 100 comprises acircuit board 101 of synthetic resin, which serves as a base, and theIC chip 28, which radiates heat. Thecircuit board 101 has a first mounting surface 102 a and a second mounting surface 102 b positioned on the opposite side to the first mounting surface 102 a. TheIC chip 28 is subjected to the flip-flop bonding at the central part of the first mounting surface 102 a of thecircuit board 101 via a plurality ofsolder balls 34. The second mounting surface 102 b of thecircuit board 101 has aball arrangement region 103. Theball arrangement region 103 is positioned at the outer peripheral part of the second mounting surface 102 b remote from the central part thereof. A plurality ofsolder balls 104, which serve as current-carrying terminals, are arranged in a matrix and soldered in theball arrangement region 103. Thus, thesolder balls 104 are arranged in an area except that just below theIC chip 28. - The
semiconductor package 100 is mounted on the printedwiring board 20 by soldering thesolder balls 104 on pads (not shown) on the component-mountedsurface 21 of the printedwiring board 20. - A
heat sink 106 for promoting the heat radiation of thesemiconductor package 100 is provided on the component-mountedsurface 21 of the printedwiring board 20. Theheat sink 106 is formed of, for example, a metal material such as an aluminum alloy having excellent heat conductivity. Theheat sink 106 is shaped in a flat plate slightly larger than the plane of thesemiconductor package 100. - The
heat sink 106 has a first surface 107 a and asecond surface 107 b positioned on the opposite side to the first surface 107 a. The first surface 107 a faces thesemiconductor package 100. The central part of the first surface 107 a functions as aheat receiving portion 108 for receiving the heat of theIC chip 28. Theheat receiving portion 108 has aheat receiving surface 109 positioned in the same plane as the first surface 107 a. A heat-transfer sheet 110 serving as a heat-transfer member is provided between theheat receiving surface 109 and the upper face of theIC chip 28. The heat-transfer sheet 110 is formed of a rubber-like elastic material having the heat conductivity. - The
heat sink 106 integrally has a protrudingportion 112. The protrudingportion 112 protrudes from the outer peripheral part of the first surface 107 a except theheat receiving surface 109 toward the second mounting surface 102 b of thecircuit board 101 and is shaped in a frame surrounding theheat receiving surface 109. The height of protrusion of the protrudingportion 112 is set to be greater than the height of theIC chip 28. - The protruding
portion 112 has aflat contact surface 113 at its protruding end. Thecontact surface 113 is in contact with the first mounting surface 102 a of thecircuit board 101 in the outer periphery of theIC chip 28. The contact part between thecontact surface 113 and the first mounting surface 102 a is positioned just above thesolder balls 104. Thus, the protrudingportion 112 functions as a spacer in the sixth embodiment. - A plurality of
radiator fins 114 are integrally formed onsecond surface 107 b of theheat sink 106. - The
heat sink 106 has a plurality ofsupport legs 115. Thesupport legs 115 are positioned at corner parts of theheat sink 106 so as to protrude from the corner parts toward the printedwiring board 20. Distal ends of thesupport legs 115 are fixed on the component-mountedsurface 21 of the printedwiring board 20 byscrews 116. - For this reason, if the
support legs 115 are fixed on the printedwiring board 20, theheat sink 106 is pushed toward thesemiconductor package 100. Thus, the heat-transfer sheet 110 is sandwiched between theheat receiving surface 109 of theheat sink 106 and the upper face of theIC chip 28, so that theheat receiving surface 109 and theIC chip 28 are thermally connected through the heat-transfer sheet 110. At the same time, thecontact surface 113 at the protruding end of the protrudingportion 112 abuts on the first mounting surface 102 a of thecircuit board 101, so that the protrudingportion 112 receives most of the load of theheat sink 106 applied to theIC chip 28. - Therefore, the
screws 116 function as pressurizing means for pushing down theheat sink 106 on thesemiconductor package 100, in the present embodiment. - A
metal reinforcement plate 121 as shown in FIG. 11 is attached to aback surface 120 on the opposite side to the component-mountedsurface 21 of the printedwiring board 20. Thereinforcement plate 121 is shaped in a square frame extending along the outer peripheral part of theheat sink 106.Tongues 122 are integrally formed at four corners of thereinforcement plate 121, respectively. Thetongues 122 are fixed on the printedwiring board 20 via thescrews 116. - For this reason, the
reinforcement plate 121 is positioned opposite to thesemiconductor package 100 and theheat sink 106 about the printedwiring board 20, so as to prevent the bending or warping of the printedwiring board 20 caused by pushing down theheat sink 106 toward thesemiconductor package 100. - In this structure, the
heat sink 106 receives the load of being pushed down on thesemiconductor package 100 in accordance with the fastening of thescrews 116, in the state that theheat sink 106 is thermally connected to theIC chip 28 of thesemiconductor package 100. At this time, theheat sink 106 has the protrudingportion 112 that functions as a spacer and thecontact surface 113 at the protruding end of the protrudingportion 112 is in contact with the first mounting surface 102 a of thecircuit board 101. Therefore, theheat sink 106 can be supported by the protrudingportion 112 and most of the load of theheat sink 106 applied to theIC chip 28 can be received by the protrudingportion 112. - As a result, excessive stress is not concentrated on the
IC chip 28, and it is possible to prevent the bending or warping of the central part of thecircuit board 101. Thus, the soldering part between thecircuit board 101 and thesolder balls 34 is not peeled off, crack does not occur at the soldering part, or the electric connection between theIC chip 28 and thecircuit board 101 can be preferably maintained. - As the protruding
portion 112 is in contact with the first mounting surface 102 a of thecircuit board 101, at the position corresponding to thesolder balls 104, the load of the protrudingportion 112 applied to thecircuit board 101 can be received by a plurality ofsolder balls 104. Thus, thecircuit board 101 is hardly deformed and, of course, the load on each of thesolder balls 104 can be reduced. Therefore, it is possible to prevent thesolder balls 104 from being deformed or damaged, and also possible to the soldering part between thesolder balls 104 and the printedwiring board 20 from being peeled off or damaged. - Moreover, in the above-described structure, the close contact between the
IC chip 28 and theheat receiving portion 108 of theheat sink 106 can be maintained as the elastic heat-transfer sheet 110 is pushed down to some extent and is packed between theIC chip 28 and theheat receiving portion 108 at high density. It is therefore possible to increase the reliability on the electric connection between theIC chip 28 and thecircuit board 101 and between thesemiconductor package 100 and the printedwiring board 20, while maintaining the stable heat connection state betweenIC chip 28 and theheat sink 106. - In the sixth embodiment, the solder balls are arranged in the area avoiding the IC chip. However, the solder balls may be arranged over the entire first mounting surface of the circuit board and may also be provided just beyond the IC chip.
- In this structure, as the central part of the circuit board is supported by the solder balls, deformation at the central part of the circuit board can be certainly prevented. In addition, the load on each of the solder balls can be reduced to be smaller and thereby the reliability on the electric connection between the solder balls and the circuit board or the printed wiring board can be more increased.
- Moreover, the present invention is not limited to the cooling of the PGA or BGA semiconductor package, but can be applied to a TCP (Tape Carrier Package) type semiconductor package obtained by bonding the IC chip on, for example, a polyimide tape used as a base.
- Further, the electronic apparatus according to the present invention is not limited to a desktop personal computer, but can also be applied to a notebook-size portable computer.
- Additional advantages and modifications will readily occur to those skilled in the art. Therefore, the invention in its broader aspects is not limited to the specific details and representative embodiments shown and described herein. Accordingly, various modifications may be made without departing from the spirit or scope of the general inventive concept as defined by the appended claims and their equivalents.
Claims (20)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP35317499A JP3881488B2 (en) | 1999-12-13 | 1999-12-13 | Circuit module cooling device and electronic apparatus having the cooling device |
JP11-353174 | 1999-12-13 |
Publications (2)
Publication Number | Publication Date |
---|---|
US20010004313A1 true US20010004313A1 (en) | 2001-06-21 |
US6442026B2 US6442026B2 (en) | 2002-08-27 |
Family
ID=18429066
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US09/732,915 Expired - Lifetime US6442026B2 (en) | 1999-12-13 | 2000-12-11 | Apparatus for cooling a circuit component |
Country Status (4)
Country | Link |
---|---|
US (1) | US6442026B2 (en) |
JP (1) | JP3881488B2 (en) |
CN (1) | CN1175335C (en) |
TW (1) | TW510986B (en) |
Cited By (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20040188065A1 (en) * | 2003-01-31 | 2004-09-30 | Cooligy, Inc. | Decoupled spring-loaded mounting apparatus and method of manufacturing thereof |
EP1282169A3 (en) * | 2001-07-30 | 2005-10-05 | Fujitsu Hitachi Plasma Display Limited | IC chip mounting structure and display device |
US20060169488A1 (en) * | 2005-01-31 | 2006-08-03 | Kabushiki Kaisha Toshiba | Circuit board mounted with surface mount type circuit component and method for producing the same |
US20070035931A1 (en) * | 2005-08-15 | 2007-02-15 | Via Technologies, Inc. | Electronic system |
US20070201181A1 (en) * | 2006-02-24 | 2007-08-30 | Cisco Technology, Inc. | Method and apparatus for ventilating a computerized device |
US20090039504A1 (en) * | 2007-08-08 | 2009-02-12 | Mitsubishi Electric Corporation | Semiconductor device |
US20100061065A1 (en) * | 2008-09-10 | 2010-03-11 | Kabushiki Kaisha Toshiba | Electronic device |
US20110164382A1 (en) * | 2010-01-06 | 2011-07-07 | Methode Electronics Inc. | Thermal management for electronic device housing |
US20110303441A1 (en) * | 2010-06-10 | 2011-12-15 | Fujitsu Limited | Board reinforcing structure, board assembly, and electronic device |
US8169789B1 (en) * | 2007-04-10 | 2012-05-01 | Nvidia Corporation | Graphics processing unit stiffening frame |
US20120120610A1 (en) * | 2004-04-14 | 2012-05-17 | Denso Corporation | Semiconductor device |
US20140328018A1 (en) * | 2013-05-03 | 2014-11-06 | Nvidia Corporation | Fanless notebook computer structure providing enhanced graphics performance and form factor |
US9065317B2 (en) | 2011-01-06 | 2015-06-23 | Kabushiki Kaisha Toyota Jidoshokki | Fixing structure for electrical component |
US9907208B2 (en) | 2011-11-21 | 2018-02-27 | Thomson Licensing | Hold down for retaining a heat sink |
EP3525235A1 (en) * | 2018-02-12 | 2019-08-14 | Samsung Electro-Mechanics Co., Ltd. | Communication module and mounting structure thereof |
US20200286839A1 (en) * | 2019-03-06 | 2020-09-10 | Samsung Electro-Mechanics Co., Ltd. | Electronic device module and method of manufacturing the same |
US11350517B2 (en) | 2018-01-25 | 2022-05-31 | Mitsubishi Electric Corporation | Circuit device and power conversion device |
TWI768118B (en) * | 2017-11-16 | 2022-06-21 | 韓商愛思開海力士有限公司 | Semiconductor packages relating to thermal transfer plate and methods of manufacturing the same |
EP4086951A4 (en) * | 2020-02-10 | 2023-07-12 | Huawei Technologies Co., Ltd. | Heat sink, single board, electronic device, and manufacturing method |
Families Citing this family (64)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100609872B1 (en) * | 2000-11-17 | 2006-08-09 | 삼성전자주식회사 | Computer |
US6500024B2 (en) * | 2000-12-06 | 2002-12-31 | Asustek Computer Inc. | Circuit protection mechanism for CPU socket |
US6547580B1 (en) * | 2001-09-24 | 2003-04-15 | Texas Instruments Incorporated | Socket apparatus particularly adapted for land grid array type semiconductor devices |
JP3713706B2 (en) * | 2001-09-28 | 2005-11-09 | 日本電気株式会社 | Heat dissipation structure, package assembly, and heat dissipation sheet |
KR20030046807A (en) * | 2001-12-06 | 2003-06-18 | 엘지전선 주식회사 | Device holding a heat sink for electronic components |
US20030106708A1 (en) * | 2001-12-12 | 2003-06-12 | Hao-Yun Ma | Heat sink securing means with back plate |
US6545879B1 (en) * | 2002-01-10 | 2003-04-08 | Tyco Electronics Corporation | Method and apparatus for mounting a lidless semiconductor device |
JP4045241B2 (en) | 2002-01-16 | 2008-02-13 | 富士通株式会社 | Heat sink with improved cooling capacity and semiconductor device including the heat sink |
EP1331665B1 (en) * | 2002-01-26 | 2009-10-14 | Danfoss Silicon Power GmbH | Cooling apparatus |
US6836408B2 (en) * | 2002-09-19 | 2004-12-28 | Sun Microsystems, Inc. | Method and apparatus for force transfer via bare die package |
US6786739B2 (en) | 2002-09-30 | 2004-09-07 | Intel Corporation | Bridge clip with reinforced stiffener |
TWI277992B (en) * | 2002-10-30 | 2007-04-01 | Matsushita Electric Ind Co Ltd | Sheet capacitor, IC socket using the same, and manufacturing method of sheet capacitor |
TWI286832B (en) * | 2002-11-05 | 2007-09-11 | Advanced Semiconductor Eng | Thermal enhance semiconductor package |
TWI221664B (en) * | 2002-11-07 | 2004-10-01 | Via Tech Inc | Structure of chip package and process thereof |
US7231734B2 (en) * | 2003-02-03 | 2007-06-19 | Luminator Holding, L.P. | Display device with rail support |
JP3891123B2 (en) * | 2003-02-06 | 2007-03-14 | セイコーエプソン株式会社 | SEMICONDUCTOR DEVICE, ELECTRONIC DEVICE, ELECTRONIC DEVICE, AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD |
JP4110992B2 (en) * | 2003-02-07 | 2008-07-02 | セイコーエプソン株式会社 | Semiconductor device, electronic device, electronic apparatus, semiconductor device manufacturing method, and electronic device manufacturing method |
JP4069771B2 (en) * | 2003-03-17 | 2008-04-02 | セイコーエプソン株式会社 | SEMICONDUCTOR DEVICE, ELECTRONIC DEVICE, AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD |
JP2004281818A (en) * | 2003-03-17 | 2004-10-07 | Seiko Epson Corp | Semiconductor device, electronic device, electronic apparatus, method for manufacturing carrier substrate, method for manufacturing semiconductor device, and method for manufacturing electronic device |
JP2004281920A (en) * | 2003-03-18 | 2004-10-07 | Seiko Epson Corp | Semiconductor device, electronic device, electronic apparatus, process for producing semiconductor device, and process for producing electronic device |
JP2004281919A (en) * | 2003-03-18 | 2004-10-07 | Seiko Epson Corp | Semiconductor device, electronic device, electronic apparatus, process for producing semiconductor device, and process for producing electronic device |
JP4096774B2 (en) * | 2003-03-24 | 2008-06-04 | セイコーエプソン株式会社 | SEMICONDUCTOR DEVICE, ELECTRONIC DEVICE, ELECTRONIC DEVICE, SEMICONDUCTOR DEVICE MANUFACTURING METHOD, AND ELECTRONIC DEVICE MANUFACTURING METHOD |
JP2004349495A (en) * | 2003-03-25 | 2004-12-09 | Seiko Epson Corp | Semiconductor device and its manufacturing method, and electronic device and electronic equipment |
US6894908B1 (en) | 2003-03-28 | 2005-05-17 | Intel Corporation | Bridge clip with bimetallic leaf and method |
WO2004093187A1 (en) * | 2003-04-16 | 2004-10-28 | Fujitsu Limited | Electronic component package, electronic component package assembly and printed board unit |
KR100549666B1 (en) * | 2003-05-23 | 2006-02-08 | 엘지전자 주식회사 | Apparatus of driving plasma display panel |
JP2004356492A (en) | 2003-05-30 | 2004-12-16 | Toshiba Corp | Electronic apparatus |
US20050174738A1 (en) * | 2004-02-06 | 2005-08-11 | International Business Machines Corporation | Method and structure for heat sink attachment in semiconductor device packaging |
JP4234635B2 (en) * | 2004-04-28 | 2009-03-04 | 株式会社東芝 | Electronics |
US7296420B2 (en) * | 2004-12-02 | 2007-11-20 | Hitachi Global Storage Technologies Amsterdam, B.V. | Direct cooling pallet tray for temperature stability for deep ion mill etch process |
US7481312B2 (en) * | 2004-12-02 | 2009-01-27 | Hitachi Global Storage Technologies Netherlands B.V. | Direct cooling pallet assembly for temperature stability for deep ion mill etch process |
WO2006087770A1 (en) | 2005-02-15 | 2006-08-24 | Fujitsu Limited | Package unit |
TWI253154B (en) * | 2005-05-06 | 2006-04-11 | Neobulb Technologies Inc | Integrated circuit packaging and method of making the same |
US7486516B2 (en) * | 2005-08-11 | 2009-02-03 | International Business Machines Corporation | Mounting a heat sink in thermal contact with an electronic component |
US7714423B2 (en) * | 2005-09-30 | 2010-05-11 | Apple Inc. | Mid-plane arrangement for components in a computer system |
JP4811933B2 (en) * | 2006-06-08 | 2011-11-09 | 株式会社山武 | Heat dissipation structure in electronic equipment |
US7777329B2 (en) * | 2006-07-27 | 2010-08-17 | International Business Machines Corporation | Heatsink apparatus for applying a specified compressive force to an integrated circuit device |
US7751918B2 (en) * | 2007-01-05 | 2010-07-06 | International Business Machines Corporation | Methods for configuring tubing for interconnecting in-series multiple liquid-cooled cold plates |
WO2008139563A1 (en) * | 2007-05-07 | 2008-11-20 | Fujitsu Limited | Electronic device and its manufacturing method, and electronic equipment equipped with the electronic device |
US20080296756A1 (en) * | 2007-05-30 | 2008-12-04 | Koch James L | Heat spreader compositions and materials, integrated circuitry, methods of production and uses thereof |
US7422471B1 (en) * | 2007-08-14 | 2008-09-09 | Hon Hai Precision Ind. Co., Ltd. | Electrical connector with heat sink function |
US20090091021A1 (en) * | 2007-10-03 | 2009-04-09 | Matsushita Electric Industrial Co., Ltd. | Semiconductor device and method of manufacturing the same |
US7863732B2 (en) * | 2008-03-18 | 2011-01-04 | Stats Chippac Ltd. | Ball grid array package system |
US7781883B2 (en) * | 2008-08-19 | 2010-08-24 | International Business Machines Corporation | Electronic package with a thermal interposer and method of manufacturing the same |
US7871862B2 (en) * | 2008-09-08 | 2011-01-18 | Stats Chippac Ltd. | Ball grid array package stacking system |
JP5185048B2 (en) * | 2008-09-29 | 2013-04-17 | 株式会社東芝 | Electronic devices and semiconductor packages |
US20110164381A1 (en) * | 2008-10-31 | 2011-07-07 | Jeffrey A Lev | Assembly-supporting Spring Between Rigid Connectors |
JP2011049311A (en) * | 2009-08-26 | 2011-03-10 | Shinko Electric Ind Co Ltd | Semiconductor package and manufacturing method |
US8305761B2 (en) * | 2009-11-17 | 2012-11-06 | Apple Inc. | Heat removal in compact computing systems |
JP2011128708A (en) * | 2009-12-15 | 2011-06-30 | Toshiba Corp | Electronic apparatus |
JP4818429B2 (en) * | 2009-12-28 | 2011-11-16 | 株式会社東芝 | Electronics |
US8064202B2 (en) * | 2010-02-24 | 2011-11-22 | Monolithic Power Systems, Inc. | Sandwich structure with double-sided cooling and EMI shielding |
JP2013098388A (en) * | 2011-11-01 | 2013-05-20 | Keihin Corp | Packaging structure of electronic component |
US8913391B2 (en) * | 2012-01-30 | 2014-12-16 | Alcatel Lucent | Board-level heat transfer apparatus for communication platforms |
WO2013172004A1 (en) * | 2012-05-16 | 2013-11-21 | 日本電気株式会社 | Structure for connecting cooling apparatus, cooling apparatus, and method for connecting cooling apparatus |
KR200471366Y1 (en) * | 2012-06-20 | 2014-02-25 | 주식회사 에이치앤에스 | Heat sink |
US9049811B2 (en) * | 2012-11-29 | 2015-06-02 | Bose Corporation | Circuit cooling |
US9379037B2 (en) | 2014-03-14 | 2016-06-28 | Apple Inc. | Thermal module accounting for increased board/die size in a portable computer |
US10356948B2 (en) * | 2015-12-31 | 2019-07-16 | DISH Technologies L.L.C. | Self-adjustable heat spreader system for set-top box assemblies |
JP2018064120A (en) * | 2017-12-25 | 2018-04-19 | 日立オートモティブシステムズ株式会社 | Electronic control device |
JP6958438B2 (en) * | 2018-03-08 | 2021-11-02 | 株式会社デンソー | Heat dissipation device for electronic components |
US10651598B2 (en) * | 2018-03-22 | 2020-05-12 | Quanta Computer Inc. | Transceiver hot swap contact structure |
CN111987523A (en) * | 2019-05-24 | 2020-11-24 | 泰科电子(上海)有限公司 | Connector and radiator |
CN115249666A (en) * | 2021-04-25 | 2022-10-28 | 华为技术有限公司 | Chip packaging structure and electronic equipment |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5784256A (en) * | 1994-09-14 | 1998-07-21 | Kabushiki Kaisha Toshiba | Portable computer having a circuit board including a heat-generating IC chip and a metal frame supporting the circuit board |
US5926371A (en) * | 1997-04-25 | 1999-07-20 | Advanced Micro Devices, Inc. | Heat transfer apparatus which accommodates elevational disparity across an upper surface of a surface-mounted semiconductor device |
JPH1168360A (en) | 1997-08-08 | 1999-03-09 | Nec Corp | Cooling structure for semiconductor element |
-
1999
- 1999-12-13 JP JP35317499A patent/JP3881488B2/en not_active Expired - Lifetime
-
2000
- 2000-12-05 TW TW089125911A patent/TW510986B/en not_active IP Right Cessation
- 2000-12-11 US US09/732,915 patent/US6442026B2/en not_active Expired - Lifetime
- 2000-12-13 CN CNB001355678A patent/CN1175335C/en not_active Expired - Lifetime
Cited By (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1282169A3 (en) * | 2001-07-30 | 2005-10-05 | Fujitsu Hitachi Plasma Display Limited | IC chip mounting structure and display device |
US7044196B2 (en) * | 2003-01-31 | 2006-05-16 | Cooligy,Inc | Decoupled spring-loaded mounting apparatus and method of manufacturing thereof |
US20040188065A1 (en) * | 2003-01-31 | 2004-09-30 | Cooligy, Inc. | Decoupled spring-loaded mounting apparatus and method of manufacturing thereof |
US20120120610A1 (en) * | 2004-04-14 | 2012-05-17 | Denso Corporation | Semiconductor device |
US20060169488A1 (en) * | 2005-01-31 | 2006-08-03 | Kabushiki Kaisha Toshiba | Circuit board mounted with surface mount type circuit component and method for producing the same |
US20070035931A1 (en) * | 2005-08-15 | 2007-02-15 | Via Technologies, Inc. | Electronic system |
US7443686B2 (en) * | 2005-08-15 | 2008-10-28 | Via Technologies, Inc. | Electronic system |
US20070201181A1 (en) * | 2006-02-24 | 2007-08-30 | Cisco Technology, Inc. | Method and apparatus for ventilating a computerized device |
US7529087B2 (en) * | 2006-02-24 | 2009-05-05 | Cisco Technology, Inc. | Method and apparatus for ventilating a computerized device |
US8169789B1 (en) * | 2007-04-10 | 2012-05-01 | Nvidia Corporation | Graphics processing unit stiffening frame |
US20090039504A1 (en) * | 2007-08-08 | 2009-02-12 | Mitsubishi Electric Corporation | Semiconductor device |
US7880299B2 (en) * | 2007-08-08 | 2011-02-01 | Mitsubishi Electric Corporation | Semiconductor device |
US20100061065A1 (en) * | 2008-09-10 | 2010-03-11 | Kabushiki Kaisha Toshiba | Electronic device |
US8339784B2 (en) * | 2010-01-06 | 2012-12-25 | Methode Electronics, Inc. | Thermal management for electronic device housing |
US20110164382A1 (en) * | 2010-01-06 | 2011-07-07 | Methode Electronics Inc. | Thermal management for electronic device housing |
US20110303441A1 (en) * | 2010-06-10 | 2011-12-15 | Fujitsu Limited | Board reinforcing structure, board assembly, and electronic device |
US8604347B2 (en) * | 2010-06-10 | 2013-12-10 | Fujitsu Limited | Board reinforcing structure, board assembly, and electronic device |
US9065317B2 (en) | 2011-01-06 | 2015-06-23 | Kabushiki Kaisha Toyota Jidoshokki | Fixing structure for electrical component |
US9907208B2 (en) | 2011-11-21 | 2018-02-27 | Thomson Licensing | Hold down for retaining a heat sink |
US20140328018A1 (en) * | 2013-05-03 | 2014-11-06 | Nvidia Corporation | Fanless notebook computer structure providing enhanced graphics performance and form factor |
TWI768118B (en) * | 2017-11-16 | 2022-06-21 | 韓商愛思開海力士有限公司 | Semiconductor packages relating to thermal transfer plate and methods of manufacturing the same |
US11350517B2 (en) | 2018-01-25 | 2022-05-31 | Mitsubishi Electric Corporation | Circuit device and power conversion device |
EP3525235A1 (en) * | 2018-02-12 | 2019-08-14 | Samsung Electro-Mechanics Co., Ltd. | Communication module and mounting structure thereof |
CN110167316A (en) * | 2018-02-12 | 2019-08-23 | 三星电机株式会社 | The mounting structure of communication module and the communication module |
US10999957B2 (en) | 2018-02-12 | 2021-05-04 | Samsung Electro-Mechanics Co., Ltd. | Communication module and mounting structure thereof |
US20200286839A1 (en) * | 2019-03-06 | 2020-09-10 | Samsung Electro-Mechanics Co., Ltd. | Electronic device module and method of manufacturing the same |
US11195800B2 (en) * | 2019-03-06 | 2021-12-07 | Samsung Electro-Mechanics Co., Ltd. | Electronic device module and method of manufacturing the same |
EP4086951A4 (en) * | 2020-02-10 | 2023-07-12 | Huawei Technologies Co., Ltd. | Heat sink, single board, electronic device, and manufacturing method |
Also Published As
Publication number | Publication date |
---|---|
CN1175335C (en) | 2004-11-10 |
TW510986B (en) | 2002-11-21 |
US6442026B2 (en) | 2002-08-27 |
CN1299993A (en) | 2001-06-20 |
JP3881488B2 (en) | 2007-02-14 |
JP2001168562A (en) | 2001-06-22 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US6442026B2 (en) | Apparatus for cooling a circuit component | |
TW486796B (en) | Circuit module and electronic machine installed with the circuit module | |
US6223815B1 (en) | Cooling unit for cooling a heat-generating component and electronic apparatus having the cooling unit | |
US5557500A (en) | Heat dissipating arrangement in a portable computer | |
US5513070A (en) | Dissipation of heat through keyboard using a heat pipe | |
JP3281220B2 (en) | Circuit module cooling system | |
US6545871B1 (en) | Apparatus for providing heat dissipation for a circuit element | |
US5761044A (en) | Semiconductor module for microprocessor | |
JP2004165586A (en) | Package structure, printed board mounted with the same package structure and electronic equipment having the same printed board | |
US7221571B2 (en) | Package unit, printed board having the same, and electronic apparatus having the printed board | |
US8254129B2 (en) | Electronic apparatus | |
US6392887B1 (en) | PLGA-BGA socket using elastomer connectors | |
US20080285239A1 (en) | Ic Holder | |
US6205027B1 (en) | Structure and method for mounting a circuit module | |
JPH10321775A (en) | Mounting structure of multi-chip module | |
US6791835B2 (en) | Electronic device | |
CN113573541A (en) | Heat transport device and electronic apparatus | |
JP3378174B2 (en) | Heat dissipation structure of high heating element | |
JPH11163232A (en) | Heat radiating device of electric component | |
JPH1098287A (en) | Cooler for circuit board module and portable electronic equipment having the cooler | |
US7690938B2 (en) | Electrical connector assembly | |
JPH0888299A (en) | Semiconductor device | |
JP3631193B2 (en) | Heat dissipation device | |
JP3318511B2 (en) | Mounting structure of card type semiconductor device | |
JPH09226280A (en) | Card module |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AS | Assignment |
Owner name: KABUSHIKI KAISHA TOSHIBA, JAPAN Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:YAMAOKA, YOJI;REEL/FRAME:011382/0535 Effective date: 20001204 |
|
STCF | Information on status: patent grant |
Free format text: PATENTED CASE |
|
FPAY | Fee payment |
Year of fee payment: 4 |
|
FEPP | Fee payment procedure |
Free format text: PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY Free format text: PAYER NUMBER DE-ASSIGNED (ORIGINAL EVENT CODE: RMPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |
|
FPAY | Fee payment |
Year of fee payment: 8 |
|
FPAY | Fee payment |
Year of fee payment: 12 |
|
AS | Assignment |
Owner name: TOSHIBA CLIENT SOLUTIONS CO., LTD., JAPAN Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:KABUSHIKI KAISHA TOSHIBA;REEL/FRAME:048991/0183 Effective date: 20181126 |