DE69622954D1 - Herstellung eines mikromechanischen Teils mit mindestens einer Diamantspitze. - Google Patents

Herstellung eines mikromechanischen Teils mit mindestens einer Diamantspitze.

Info

Publication number
DE69622954D1
DE69622954D1 DE69622954T DE69622954T DE69622954D1 DE 69622954 D1 DE69622954 D1 DE 69622954D1 DE 69622954 T DE69622954 T DE 69622954T DE 69622954 T DE69622954 T DE 69622954T DE 69622954 D1 DE69622954 D1 DE 69622954D1
Authority
DE
Germany
Prior art keywords
production
diamond tip
micromechanical part
micromechanical
diamond
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69622954T
Other languages
English (en)
Inventor
Philipp Niedermann
Rainer F Christoph
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre Suisse dElectronique et Microtechnique SA CSEM
Original Assignee
Centre Suisse dElectronique et Microtechnique SA CSEM
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre Suisse dElectronique et Microtechnique SA CSEM filed Critical Centre Suisse dElectronique et Microtechnique SA CSEM
Application granted granted Critical
Publication of DE69622954D1 publication Critical patent/DE69622954D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/16—Probe manufacture
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/08—Probe characteristics
    • G01Q70/14—Particular materials
DE69622954T 1995-09-29 1996-09-27 Herstellung eines mikromechanischen Teils mit mindestens einer Diamantspitze. Expired - Lifetime DE69622954D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9511490A FR2739494B1 (fr) 1995-09-29 1995-09-29 Procede de fabrication de pieces de micromecanique ayant une partie en diamant constituee au moins d'une pointe, et pieces de micromecanique comportant au moins une pointe en diamant

Publications (1)

Publication Number Publication Date
DE69622954D1 true DE69622954D1 (de) 2002-09-19

Family

ID=9483082

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69622954T Expired - Lifetime DE69622954D1 (de) 1995-09-29 1996-09-27 Herstellung eines mikromechanischen Teils mit mindestens einer Diamantspitze.

Country Status (4)

Country Link
US (1) US5994160A (de)
EP (1) EP0766060B1 (de)
DE (1) DE69622954D1 (de)
FR (1) FR2739494B1 (de)

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DE19718618C2 (de) * 1997-05-02 1999-12-02 Daimler Chrysler Ag Komposit-Struktur mit einem mehrere mikroelektronische Bauteile und eine Diamantschicht aufweisenden Wachstums-Substrat sowie Verfahren zur Herstellung der Komposit-Struktur
FR2764441B1 (fr) * 1997-06-05 2001-05-18 Suisse Electronique Microtech Procede de fabrication d'un organe palpeur pour capteur micromecanique, notamment pour microscope a force atomique
TW374197B (en) * 1997-12-11 1999-11-11 Ind Tech Res Inst Manufacturing process of integrated micro-flow control module
US6583063B1 (en) 1998-12-03 2003-06-24 Applied Materials, Inc. Plasma etching of silicon using fluorinated gas mixtures
US6312616B1 (en) 1998-12-03 2001-11-06 Applied Materials, Inc. Plasma etching of polysilicon using fluorinated gas mixtures
US6235214B1 (en) * 1998-12-03 2001-05-22 Applied Materials, Inc. Plasma etching of silicon using fluorinated gas mixtures
US6400166B2 (en) * 1999-04-15 2002-06-04 International Business Machines Corporation Micro probe and method of fabricating same
EP1111331A1 (de) * 1999-12-23 2001-06-27 C.S.E.M. Centre Suisse D'electronique Et De Microtechnique Sa Taststift für die Nanotechnologie sowie Verfahren zu seiner Herstellung
DE10003836C2 (de) * 2000-01-28 2002-04-25 Fraunhofer Ges Forschung Indentor und Verwendung desselben
US6583412B2 (en) * 2000-03-17 2003-06-24 University Of Utah Research Foundation Scanning tunneling charge transfer microscope
US6422077B1 (en) * 2000-04-06 2002-07-23 The University Of Chicago Ultrananocrystalline diamond cantilever wide dynamic range acceleration/vibration/pressure sensor
US6592519B1 (en) * 2000-04-28 2003-07-15 Medtronic, Inc. Smart microfluidic device with universal coating
US7115523B2 (en) * 2000-05-22 2006-10-03 Applied Materials, Inc. Method and apparatus for etching photomasks
US6391790B1 (en) 2000-05-22 2002-05-21 Applied Materials, Inc. Method and apparatus for etching photomasks
US6827866B1 (en) * 2000-05-24 2004-12-07 Active Optical Networks, Inc. Deep-well lithography process for forming micro-electro-mechanical structures
US6905614B1 (en) 2000-05-24 2005-06-14 Active Optical Networks, Inc. Pattern-transfer process for forming micro-electro-mechanical structures
JP4610811B2 (ja) * 2000-09-15 2011-01-12 アイメック プローブの製造方法及びその装置
DE60042067D1 (de) * 2000-09-15 2009-06-04 Imec Inter Uni Micro Electr Verfahren zur Herstellung montierter AFM-Sonden durch Löten
US6642067B2 (en) * 2000-10-03 2003-11-04 Honeywell International, Inc. Method of trimming micro-machined electromechanical sensors (MEMS) devices
TW480621B (en) 2001-03-02 2002-03-21 Acer Comm & Multimedia Inc Method for producing high density chip
US7183201B2 (en) * 2001-07-23 2007-02-27 Applied Materials, Inc. Selective etching of organosilicate films over silicon oxide stop etch layers
EP1466333B1 (de) * 2002-01-15 2011-06-22 International Business Machines Corporation Mikrostrukturen
KR20040012451A (ko) * 2002-05-14 2004-02-11 어플라이드 머티어리얼스, 인코포레이티드 포토리소그래픽 레티클을 에칭하는 방법
SG101537A1 (en) * 2002-06-03 2004-01-30 Sensfab Pte Ltd Method of forming atomic force microscope tips
EP1543386B1 (de) * 2002-09-25 2008-10-22 Fore Eagle Co Ltd Mechanische teile
US7541219B2 (en) * 2004-07-02 2009-06-02 Seagate Technology Llc Integrated metallic contact probe storage device
US8293430B2 (en) 2005-01-27 2012-10-23 Applied Materials, Inc. Method for etching a molybdenum layer suitable for photomask fabrication
US8048789B2 (en) * 2005-04-26 2011-11-01 Northwestern University Mesoscale pyramids, arrays and methods of preparation
WO2007070745A2 (en) * 2005-12-01 2007-06-21 Mynosys Cellular Devices, Inc. Micro surgical cutting instruments
WO2007092852A2 (en) 2006-02-06 2007-08-16 Mynosys Cellular Devices, Inc. Microsurgical cutting instruments
JP2008191537A (ja) * 2007-02-07 2008-08-21 Canon Inc 振動素子、及び振動素子を備える光偏向器
US8197701B2 (en) * 2007-07-13 2012-06-12 Advanced Diamond Technologies, Inc. Diamond film deposition and probes
US8740209B2 (en) * 2012-02-22 2014-06-03 Expresslo Llc Method and apparatus for ex-situ lift-out specimen preparation
US9038269B2 (en) * 2013-04-02 2015-05-26 Xerox Corporation Printhead with nanotips for nanoscale printing and manufacturing

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US3888708A (en) * 1972-02-17 1975-06-10 Kensall D Wise Method for forming regions of predetermined thickness in silicon
US5066358A (en) * 1988-10-27 1991-11-19 Board Of Trustees Of The Leland Stanford Juninor University Nitride cantilevers with single crystal silicon tips
US5221415A (en) * 1989-01-17 1993-06-22 Board Of Trustees Of The Leland Stanford Junior University Method of forming microfabricated cantilever stylus with integrated pyramidal tip
US5021286A (en) * 1989-08-10 1991-06-04 Nhk Spring Co., Ltd. Cushion material and method of manufacturing the same
DE68903951T2 (de) * 1989-08-16 1993-07-08 Ibm Verfahren fuer die herstellung mikromechanischer messfuehler fuer afm/stm-profilometrie und mikromechanischer messfuehlerkopf.
DE68902141T2 (de) * 1989-08-16 1993-02-25 Ibm Verfahren fuer die herstellung mikromechanischer messfuehler fuer afm/stm-profilometrie und mikromechanischer messfuehlerkopf.
US5204210A (en) * 1990-12-07 1993-04-20 Xerox Corporation Method for the direct patterning of diamond films
JP3085719B2 (ja) * 1991-02-28 2000-09-11 株式会社東芝 カンチレバ−およびその製法
JPH04321596A (ja) * 1991-04-22 1992-11-11 Toyota Central Res & Dev Lab Inc ダイヤモンド膜の形成方法
JP3255960B2 (ja) * 1991-09-30 2002-02-12 株式会社神戸製鋼所 冷陰極エミッタ素子
JP3079320B2 (ja) * 1992-01-29 2000-08-21 セイコーインスツルメンツ株式会社 原子間力顕微鏡用カンチレバーの製造方法
DE4314301C1 (de) * 1993-04-30 1994-05-05 Imm Inst Mikrotech Abtastvorrichtung zur Untersuchung von Oberflächenstrukturen mit Auflösung im submicron-Bereich und Verfahren zu deren Herstellung
US5619093A (en) * 1995-03-31 1997-04-08 The United States Of America As Represented By The Secretary Of The Navy Electron field emission
JPH08313541A (ja) * 1995-05-16 1996-11-29 Olympus Optical Co Ltd 走査型プローブ顕微鏡用カンチレバー及びその製造方法

Also Published As

Publication number Publication date
US5994160A (en) 1999-11-30
FR2739494B1 (fr) 1997-11-14
EP0766060A1 (de) 1997-04-02
FR2739494A1 (fr) 1997-04-04
EP0766060B1 (de) 2002-08-14

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Legal Events

Date Code Title Description
8332 No legal effect for de