DE69524575D1 - Spektrale differential-fluoreszenz messung einer substratbeschichtung - Google Patents

Spektrale differential-fluoreszenz messung einer substratbeschichtung

Info

Publication number
DE69524575D1
DE69524575D1 DE69524575T DE69524575T DE69524575D1 DE 69524575 D1 DE69524575 D1 DE 69524575D1 DE 69524575 T DE69524575 T DE 69524575T DE 69524575 T DE69524575 T DE 69524575T DE 69524575 D1 DE69524575 D1 DE 69524575D1
Authority
DE
Germany
Prior art keywords
fluorescence measurement
substrate coating
differential fluorescence
spectral differential
spectral
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69524575T
Other languages
English (en)
Other versions
DE69524575T2 (de
Inventor
A Boettcher
L Harklau
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
3M Co
Original Assignee
Minnesota Mining and Manufacturing Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Minnesota Mining and Manufacturing Co filed Critical Minnesota Mining and Manufacturing Co
Publication of DE69524575D1 publication Critical patent/DE69524575D1/de
Application granted granted Critical
Publication of DE69524575T2 publication Critical patent/DE69524575T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N2021/6417—Spectrofluorimetric devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G01N2021/8427—Coatings

Landscapes

  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
DE69524575T 1994-02-08 1995-02-08 Spektrale differential-fluoreszenz messung einer substratbeschichtung Expired - Fee Related DE69524575T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/193,428 US5464986A (en) 1994-02-08 1994-02-08 Fluorescent spectral differential measurement of a substrate coating
PCT/US1995/001777 WO1995022048A1 (en) 1994-02-08 1995-02-08 Fluorescent spectral differential measurement of a substrate coating

Publications (2)

Publication Number Publication Date
DE69524575D1 true DE69524575D1 (de) 2002-01-24
DE69524575T2 DE69524575T2 (de) 2002-08-08

Family

ID=22713595

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69524575T Expired - Fee Related DE69524575T2 (de) 1994-02-08 1995-02-08 Spektrale differential-fluoreszenz messung einer substratbeschichtung

Country Status (11)

Country Link
US (1) US5464986A (de)
EP (1) EP0745218B1 (de)
JP (1) JPH09508701A (de)
KR (1) KR100367240B1 (de)
CN (1) CN1143414A (de)
BR (1) BR9506765A (de)
CA (1) CA2182865A1 (de)
DE (1) DE69524575T2 (de)
MX (1) MX9603271A (de)
TW (1) TW295625B (de)
WO (1) WO1995022048A1 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5717217A (en) * 1994-05-05 1998-02-10 Spectra Group Limited, Inc. Method for determining thickness, degree of cure and other properties of a polymeric coating
WO1997027503A2 (en) * 1996-01-11 1997-07-31 The Trustees Of Princeton University Organic luminescent coating for light detectors
JP3606499B2 (ja) * 1996-11-13 2005-01-05 株式会社堀場製作所 化学発光法分析計のサンプル希釈方法
US6402986B1 (en) 1999-07-16 2002-06-11 The Trustees Of Boston University Compositions and methods for luminescence lifetime comparison
US6836362B2 (en) 2001-05-14 2004-12-28 General Electric Company Method for the rapid determination of the optical quality of combinatorial libraries
KR20040036124A (ko) * 2002-10-23 2004-04-30 현대자동차주식회사 자동차 글라스 프라이머 도포 검사장치 및 방법
US20040241873A1 (en) * 2002-10-24 2004-12-02 Davis Ronald V Characterizing a mass distribution pattern
CN102959744B (zh) * 2011-06-29 2015-08-19 松下电器产业株式会社 发光元件的制造方法及发光元件的制造装置
US8879066B2 (en) * 2012-10-26 2014-11-04 Ppg Industries Ohio, Inc. Texture analysis of a painted surface using specular angle data
JP2014168442A (ja) * 2013-03-05 2014-09-18 Azbil Corp 微生物検出装置及び微生物検出方法
US10082466B2 (en) * 2016-04-26 2018-09-25 Molecular Devices, Llc Methods and systems for optical-based measurement with selectable excitation light paths
CN113720824B (zh) * 2021-11-01 2022-02-11 北京理工大学 一种荧光探测系统及荧光光谱拼接方法

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5127155B1 (de) * 1970-11-24 1976-08-11
US3737234A (en) * 1970-12-17 1973-06-05 Shimadzu Corp Spectrophotometer for measurement of derivative spectra
JPS4982378A (de) * 1972-12-11 1974-08-08
US3832555A (en) * 1973-04-10 1974-08-27 Hitachi Ltd Fluorescence spectrophotometer
JPS5214636B2 (de) * 1973-11-05 1977-04-22
US3956630A (en) * 1975-03-14 1976-05-11 Westvaco Corporation Fluorimetric coat weight measurement
US4153369A (en) * 1977-11-11 1979-05-08 Farrand Optical Co., Inc. Convertible dual beam differential spectrofluorometer and absorption meter
SU819647A1 (ru) * 1978-09-05 1981-04-07 Всесоюзный Научно-Исследовательскийгеологоразведочный Нефтяной Инсти-Тут Способ компенсации фоновой флуо-РЕСцЕНции B МНОгОКОМпОНЕНТНОйСиСТЕМЕ
US4250382A (en) * 1979-08-14 1981-02-10 Scott Paper Company Coat detection method
US4877965A (en) * 1985-07-01 1989-10-31 Diatron Corporation Fluorometer
US4922113A (en) * 1986-07-10 1990-05-01 Minnesota Mining And Manufacturing Company Process for fluorimetric monitoring of functional coatings and compositions and fluorescent agents therefor
US4978731A (en) * 1986-07-10 1990-12-18 Minnesota Mining And Manufacturing Company Process for fluorimetric monitoring of functional coatings and compositions and fluorescent agents therefor
US5087670A (en) * 1986-07-10 1992-02-11 Minnesota Mining And Manufacturing Company Process for fluorimetric monitoring of functional coatings and compositions and fluorescent agents therefor
US4841156A (en) * 1987-05-15 1989-06-20 Electronic Instrumentation And Technology, Inc. Measurement of the thickness of thin films
SU1539608A1 (ru) * 1987-12-02 1990-01-30 Киевский Государственный Университет Им.Т.Г.Шевченко Способ измерени дифференциальных спектров пропускани на двухлучевых спектральных приборах

Also Published As

Publication number Publication date
MX9603271A (es) 1997-03-29
EP0745218B1 (de) 2001-12-12
US5464986A (en) 1995-11-07
CN1143414A (zh) 1997-02-19
WO1995022048A1 (en) 1995-08-17
KR970701343A (ko) 1997-03-17
CA2182865A1 (en) 1995-08-17
BR9506765A (pt) 1997-10-07
DE69524575T2 (de) 2002-08-08
EP0745218A4 (de) 1999-01-27
KR100367240B1 (ko) 2003-05-09
EP0745218A1 (de) 1996-12-04
JPH09508701A (ja) 1997-09-02
TW295625B (de) 1997-01-11

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee