DE69522586D1 - Manipulator für einen testkopf einer automatischen testanlage - Google Patents

Manipulator für einen testkopf einer automatischen testanlage

Info

Publication number
DE69522586D1
DE69522586D1 DE69522586T DE69522586T DE69522586D1 DE 69522586 D1 DE69522586 D1 DE 69522586D1 DE 69522586 T DE69522586 T DE 69522586T DE 69522586 T DE69522586 T DE 69522586T DE 69522586 D1 DE69522586 D1 DE 69522586D1
Authority
DE
Germany
Prior art keywords
test head
manipulator
cable
test
vertical member
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69522586T
Other languages
English (en)
Other versions
DE69522586T2 (de
Inventor
H Slocum
A Hochmuth
H Levy
Sepehr Kiani
Ryan Vallance
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
AESOP Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by AESOP Inc filed Critical AESOP Inc
Application granted granted Critical
Publication of DE69522586D1 publication Critical patent/DE69522586D1/de
Publication of DE69522586T2 publication Critical patent/DE69522586T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T74/00—Machine element or mechanism
    • Y10T74/20—Control lever and linkage systems
    • Y10T74/20207—Multiple controlling elements for single controlled element
    • Y10T74/20305—Robotic arm
    • Y10T74/20311—Robotic arm including power cable or connector
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T74/00—Machine element or mechanism
    • Y10T74/20—Control lever and linkage systems
    • Y10T74/20207—Multiple controlling elements for single controlled element
    • Y10T74/20341—Power elements as controlling elements
DE69522586T 1995-02-23 1995-10-11 Manipulator für einen testkopf einer automatischen testanlage Expired - Lifetime DE69522586T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US39264795A 1995-02-23 1995-02-23
PCT/US1995/013438 WO1996026446A1 (en) 1995-02-23 1995-10-11 Manipulator for automatic test equipment test head

Publications (2)

Publication Number Publication Date
DE69522586D1 true DE69522586D1 (de) 2001-10-11
DE69522586T2 DE69522586T2 (de) 2002-07-11

Family

ID=23551455

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69522586T Expired - Lifetime DE69522586T2 (de) 1995-02-23 1995-10-11 Manipulator für einen testkopf einer automatischen testanlage

Country Status (6)

Country Link
US (1) US5931048A (de)
EP (1) EP0811167B1 (de)
JP (2) JP3869465B2 (de)
AT (1) ATE205303T1 (de)
DE (1) DE69522586T2 (de)
WO (1) WO1996026446A1 (de)

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US6788078B2 (en) 2001-11-16 2004-09-07 Delaware Capital Formation, Inc. Apparatus for scan testing printed circuit boards
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US7235964B2 (en) * 2003-03-31 2007-06-26 Intest Corporation Test head positioning system and method
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US8350584B2 (en) * 2006-12-29 2013-01-08 Intest Corporation Test head positioning system and method
TWI439709B (zh) * 2006-12-29 2014-06-01 Intest Corp 用於使負載沿平移軸線平移之操縱器與負載定位系統
CN103913697B (zh) * 2007-02-23 2017-04-12 英泰斯特股份有限公司 测试头操作系统
DE102007011700B4 (de) * 2007-03-09 2009-03-26 Hubertus Heigl Handhabungsvorrichtung zum Positionieren eines Testkopfs, insbesondere an einer Prüfeinrichtung
CN101680911B (zh) * 2007-05-07 2014-06-18 英泰斯特股份有限公司 测试头操作器的支架与缆线保持器
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JP4514236B2 (ja) * 2008-02-25 2010-07-28 株式会社協同 プローブカード移載装置
WO2011027392A1 (ja) * 2009-09-02 2011-03-10 株式会社アドバンテスト 試験装置、試験方法およびプログラム
US8981807B2 (en) * 2010-07-27 2015-03-17 Intest Corporation Positioner system and method of positioning
US20140317453A1 (en) 2011-07-12 2014-10-23 Intest Corporation Method and apparatus for docking a test head with a peripheral
CN103558421B (zh) * 2013-11-02 2015-12-02 国家电网公司 用于断路器电气试验的接线杆
WO2015078887A1 (en) * 2013-11-26 2015-06-04 Tyco Electronics Uk Ltd. Balunless test fixture
US10094854B2 (en) * 2015-10-23 2018-10-09 Teradyne, Inc. Manipulator in automatic test equipment
KR102653657B1 (ko) * 2016-02-12 2024-04-03 (주)테크윙 반도체소자 테스트용 핸들러
KR101640749B1 (ko) * 2016-03-04 2016-07-19 (주)에스엠디에스피 모바일 모듈 및 이를 구비한 컨택 장치
US10634718B2 (en) 2016-10-10 2020-04-28 Reid-Ashman Manufacturing, Inc. Manipulator for moving a test head
US20180364131A1 (en) * 2017-06-14 2018-12-20 Optofidelity Oy Testing apparatus
US11498207B2 (en) 2021-01-08 2022-11-15 Teradyne, Inc. Test head manipulator configured to address uncontrolled test head rotation

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Also Published As

Publication number Publication date
EP0811167A1 (de) 1997-12-10
DE69522586T2 (de) 2002-07-11
JPH11501722A (ja) 1999-02-09
JP4589271B2 (ja) 2010-12-01
US5931048A (en) 1999-08-03
EP0811167B1 (de) 2001-09-05
WO1996026446A1 (en) 1996-08-29
JP3869465B2 (ja) 2007-01-17
JP2006322944A (ja) 2006-11-30
ATE205303T1 (de) 2001-09-15

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Legal Events

Date Code Title Description
8327 Change in the person/name/address of the patent owner

Owner name: TERADYNE INC., BOSTON, MASS., US

8364 No opposition during term of opposition