DE69428623T2 - Zeitbereichsreflektometer mit doppelter Zeitbasis und ohne toten Bereich - Google Patents

Zeitbereichsreflektometer mit doppelter Zeitbasis und ohne toten Bereich

Info

Publication number
DE69428623T2
DE69428623T2 DE69428623T DE69428623T DE69428623T2 DE 69428623 T2 DE69428623 T2 DE 69428623T2 DE 69428623 T DE69428623 T DE 69428623T DE 69428623 T DE69428623 T DE 69428623T DE 69428623 T2 DE69428623 T2 DE 69428623T2
Authority
DE
Germany
Prior art keywords
domain reflectometer
dead area
double
time domain
time
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69428623T
Other languages
English (en)
Other versions
DE69428623D1 (de
Inventor
Joseph F Walsh
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fluke Corp
Original Assignee
Fluke Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fluke Corp filed Critical Fluke Corp
Publication of DE69428623D1 publication Critical patent/DE69428623D1/de
Application granted granted Critical
Publication of DE69428623T2 publication Critical patent/DE69428623T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/04—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • G01R27/06—Measuring reflection coefficients; Measuring standing-wave ratio

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Unknown Time Intervals (AREA)
DE69428623T 1993-04-06 1994-02-25 Zeitbereichsreflektometer mit doppelter Zeitbasis und ohne toten Bereich Expired - Lifetime DE69428623T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/043,512 US5382910A (en) 1993-04-06 1993-04-06 Dual time base zero dead zone time domain reflectometer

Publications (2)

Publication Number Publication Date
DE69428623D1 DE69428623D1 (de) 2001-11-22
DE69428623T2 true DE69428623T2 (de) 2003-02-20

Family

ID=21927538

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69428623T Expired - Lifetime DE69428623T2 (de) 1993-04-06 1994-02-25 Zeitbereichsreflektometer mit doppelter Zeitbasis und ohne toten Bereich

Country Status (3)

Country Link
US (2) US5382910A (de)
EP (1) EP0623827B1 (de)
DE (1) DE69428623T2 (de)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5521512A (en) * 1993-08-16 1996-05-28 The Penn State Research Foundation Time domain reflectometer using successively delayed test pulses and an interleaved sampling procedure
JPH0755856A (ja) * 1993-08-23 1995-03-03 Mitsubishi Electric Corp 周期測定装置
GB9322920D0 (en) * 1993-11-06 1993-12-22 Bicc Plc Device for testing an electrical line
US5570029A (en) * 1994-03-30 1996-10-29 Fluke Corporation Cable crosstalk measurement system
US5471145A (en) * 1994-04-07 1995-11-28 Texas Instruments Incorporated Calibrating transition dependent timing errors in automatic test equipment using a precise pulse width generator
JP3509943B2 (ja) * 1994-07-20 2004-03-22 株式会社アドバンテスト 伝送経路の伝播遅延時間測定回路
US5661385A (en) * 1994-12-19 1997-08-26 The Regents Of The University Of California Window-closing safety system
EP0878078A2 (de) * 1996-01-29 1998-11-18 Lecroy Corporation Paketnetz-überwachungsvorrichting
US6104197A (en) * 1997-06-02 2000-08-15 Tektronix, Inc. Apparatus for acquiring waveform data from a metallic transmission cable
US6195614B1 (en) 1997-06-02 2001-02-27 Tektronix, Inc. Method of characterizing events in acquired waveform data from a metallic transmission cable
US6285195B1 (en) 1998-03-16 2001-09-04 David Needle Time domain reflectometry apparatus and method
US6891803B1 (en) 1998-12-18 2005-05-10 Sunrise Telecom, Inc. Telecommunications transmission test set
US6531879B1 (en) 1999-10-28 2003-03-11 Tollgrade Communications, Inc. Method and apparatus for delay-line time-domain reflectometry
US6434221B1 (en) 2000-05-17 2002-08-13 Sunrise Telecom, Inc. Digital subscriber line access and network testing multiplexer
US6574311B1 (en) * 2001-02-23 2003-06-03 Tollgrade Communications, Inc. Apparatus and method for detecting a bridged tap and/or an end-of-line of a conventional telephone line using delay-line time-domain reflectometry
US6621562B2 (en) * 2001-09-26 2003-09-16 Tempo Research Corporation Time domain reflectometer with wideband dual balanced duplexer line coupling circuit
US6859041B2 (en) 2002-11-26 2005-02-22 Honeywell International, Inc. Methods for locating faults in aircraft branch conductors and determining the distance to the faults
US6822457B2 (en) * 2003-03-27 2004-11-23 Marshall B. Borchert Method of precisely determining the location of a fault on an electrical transmission system
US7135873B2 (en) * 2003-09-05 2006-11-14 Psibor Date Systems, Inc. Digital time domain reflectometer system
US7075310B2 (en) * 2004-06-09 2006-07-11 General Electric Company Device and method for testing for a wiring fault condition
US7315489B2 (en) * 2004-06-14 2008-01-01 Powerprecise Solutions, Inc. Method and apparatus for time measurement
KR100641414B1 (ko) * 2004-11-01 2006-11-02 한국전자통신연구원 루프백 형 파장분할다중방식의 수동형 광 네트워크의 장애관리 장치 및 방법
US7385403B2 (en) * 2005-01-25 2008-06-10 Belkin International, Inc. KVM switch configured to estimate a length of a conductor
US7679371B1 (en) * 2005-05-27 2010-03-16 Marvell International Ltd. Advanced time domain reflection cable testing
US7330803B2 (en) * 2005-06-22 2008-02-12 Ametek, Inc. High resolution time interval measurement apparatus and method
US7257280B1 (en) 2006-08-16 2007-08-14 General Instrument Corporation Method and apparatus for monitoring the security of an optical cablelink during installation
JP4757166B2 (ja) * 2006-10-06 2011-08-24 日置電機株式会社 多芯ケーブル長測定装置
US20080133308A1 (en) * 2006-11-27 2008-06-05 Harris James E Leakage location methods
FR2926141B1 (fr) * 2008-01-03 2010-03-19 Commissariat Energie Atomique Procede pour l'amelioration de la precision de detection et de localisation de defauts par reflectometrie dans un reseau electrique cable
US20090300534A1 (en) * 2008-05-30 2009-12-03 Trilithic, Inc. Apparatus and method for displaying network status
US20100064078A1 (en) * 2008-08-15 2010-03-11 Powell Thomas J Wireless communication between testing instrument and network
US9429613B1 (en) 2012-07-02 2016-08-30 Marshall B. Borchert Time domain reflectometer
FR3034203B1 (fr) 2015-03-27 2018-07-13 Commissariat A L'energie Atomique Et Aux Energies Alternatives Procede de caracterisation d'un troncon d'une ligne de transmission, en particulier troncon correspondant a un connecteur ou une serie de connecteurs reliant un equipement de mesure a un cable
FR3081561B1 (fr) 2018-05-23 2020-06-12 Commissariat A L'energie Atomique Et Aux Energies Alternatives Systeme de reflectometrie binaire pour l'analyse de defauts dans une ligne de transmission
WO2019224137A1 (fr) * 2018-05-23 2019-11-28 Commissariat A L'energie Atomique Et Aux Energies Alternatives Systeme de reflectometrie binaire pour l'analyse de defauts dans une ligne de transmission
US11624681B2 (en) 2020-01-16 2023-04-11 Saudi Arabian Oil Company Overcoming OTDR dead zones using a few-mode fiber
CN112486009B (zh) * 2020-11-20 2022-07-19 山东山大电力技术股份有限公司 一种授时信号异常波形记录分析仪及方法

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1558042A (en) 1977-01-18 1979-12-19 Cossor Ltd A C Measurement of pulse duration
US4164648A (en) * 1978-06-23 1979-08-14 Hewlett-Packard Company Double vernier time interval measurement using triggered phase-locked oscillators
US4479228A (en) * 1981-03-11 1984-10-23 3Com Corporation Local computer network transceiver
JPS6278886A (ja) * 1985-10-01 1987-04-11 Iwatsu Electric Co Ltd アバランシエ・ホトダイオ−ドのバイアス回路
US4853950A (en) * 1987-10-29 1989-08-01 3Com Corporation Impedance measuring apparatus for R.F. baseband signals over two wire telephone lines
US4970466A (en) * 1989-03-22 1990-11-13 Microtest, Inc. TDR cable testing apparatus with pulse timing manipulation to automatically compensate for diverse cable characteristics
US4960989A (en) * 1989-03-28 1990-10-02 Photon Kinetics Inc. Optical time domain reflectometer having a receiver with selectively controlled gain
US5023445A (en) * 1990-04-27 1991-06-11 Tektronix, Inc. Signal acquisition method and automatic masking system for an OTDR
EP0471119A1 (de) * 1990-08-14 1992-02-19 Hewlett-Packard Limited Wellenformmessung
DE69225262T2 (de) * 1991-02-26 1998-09-03 Nippon Telegraph & Telephone Verfahren zur Messung der Länge einer Übertragungsleitung

Also Published As

Publication number Publication date
DE69428623D1 (de) 2001-11-22
EP0623827A3 (de) 1995-08-02
EP0623827B1 (de) 2001-10-17
US5440528A (en) 1995-08-08
EP0623827A2 (de) 1994-11-09
US5382910A (en) 1995-01-17

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Legal Events

Date Code Title Description
8332 No legal effect for de
8370 Indication of lapse of patent is to be deleted