DE602005015422D1 - Integrierter schaltungschip mit kommunikationsmitteln, wodurch eine fernbedienung von testmitteln von ip-kernen der integrierten schaltung möglich wird - Google Patents

Integrierter schaltungschip mit kommunikationsmitteln, wodurch eine fernbedienung von testmitteln von ip-kernen der integrierten schaltung möglich wird

Info

Publication number
DE602005015422D1
DE602005015422D1 DE602005015422T DE602005015422T DE602005015422D1 DE 602005015422 D1 DE602005015422 D1 DE 602005015422D1 DE 602005015422 T DE602005015422 T DE 602005015422T DE 602005015422 T DE602005015422 T DE 602005015422T DE 602005015422 D1 DE602005015422 D1 DE 602005015422D1
Authority
DE
Germany
Prior art keywords
integrated circuit
testants
schip
core
making
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602005015422T
Other languages
English (en)
Inventor
Oussama Laouamri
Chouki Aktouf
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Institut Polytechnique de Grenoble
Original Assignee
Institut Polytechnique de Grenoble
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Institut Polytechnique de Grenoble filed Critical Institut Polytechnique de Grenoble
Publication of DE602005015422D1 publication Critical patent/DE602005015422D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318505—Test of Modular systems, e.g. Wafers, MCM's
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318505—Test of Modular systems, e.g. Wafers, MCM's
    • G01R31/318508—Board Level Test, e.g. P1500 Standard
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318558—Addressing or selecting of subparts of the device under test
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2294—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing by remote test
DE602005015422T 2004-02-17 2005-02-17 Integrierter schaltungschip mit kommunikationsmitteln, wodurch eine fernbedienung von testmitteln von ip-kernen der integrierten schaltung möglich wird Active DE602005015422D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US54431904P 2004-02-17 2004-02-17
PCT/EP2005/001629 WO2005078465A1 (en) 2004-02-17 2005-02-17 Integrated circuit chip with communication means enabling remote control of testing means of ip cores of the integrated circuit

Publications (1)

Publication Number Publication Date
DE602005015422D1 true DE602005015422D1 (de) 2009-08-27

Family

ID=34860501

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602005015422T Active DE602005015422D1 (de) 2004-02-17 2005-02-17 Integrierter schaltungschip mit kommunikationsmitteln, wodurch eine fernbedienung von testmitteln von ip-kernen der integrierten schaltung möglich wird

Country Status (5)

Country Link
US (1) US7725784B2 (de)
EP (1) EP1716424B1 (de)
JP (1) JP2007524947A (de)
DE (1) DE602005015422D1 (de)
WO (1) WO2005078465A1 (de)

Families Citing this family (49)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7546631B1 (en) * 2004-04-30 2009-06-09 Sun Microsystems, Inc. Embedded management system for a physical device having virtual elements
KR100727975B1 (ko) * 2005-09-10 2007-06-14 삼성전자주식회사 시스템 온 칩의 고장 진단 장치 및 방법과 고장 진단이가능한 시스템 온 칩
ATE462980T1 (de) * 2005-10-24 2010-04-15 Nxp Bv Ic-testverfahren und vorrichtung
US7941719B2 (en) * 2005-10-24 2011-05-10 Nxp B.V. IC testing methods and apparatus
JP2009512873A (ja) * 2005-10-24 2009-03-26 エヌエックスピー ビー ヴィ Ｉｃのテスト方法及び装置
WO2007069097A1 (en) * 2005-11-02 2007-06-21 Nxp B.V. Ic testing methods and apparatus
EP1802030A1 (de) * 2005-12-23 2007-06-27 Nagracard S.A. Sicheres System-on-Chip
EP1811415A1 (de) * 2005-12-23 2007-07-25 Nagracard S.A. Sicheres System-on-Chip
US8656191B2 (en) 2005-12-23 2014-02-18 Nagravision S.A. Secure system-on-chip
US7827517B1 (en) * 2006-05-19 2010-11-02 Altera Corporation Automated register definition, builder and integration framework
US7519884B2 (en) 2006-06-16 2009-04-14 Texas Instruments Incorporated TAM controller for plural test access mechanisms
US7908531B2 (en) 2006-09-29 2011-03-15 Teradyne, Inc. Networked test system
WO2008132555A1 (en) 2007-04-26 2008-11-06 Freescale Semiconductor, Inc. Diagnosis for mixed signal device for use in a distributed system
PT103744A (pt) * 2007-05-16 2008-11-17 Coreworks S A Arquitectura de acesso ao núcleo de rede.
US7958479B2 (en) * 2007-12-04 2011-06-07 Alcatel-Lucent Usa Inc. Method and apparatus for describing and testing a system-on-chip
US7949915B2 (en) * 2007-12-04 2011-05-24 Alcatel-Lucent Usa Inc. Method and apparatus for describing parallel access to a system-on-chip
US7962885B2 (en) * 2007-12-04 2011-06-14 Alcatel-Lucent Usa Inc. Method and apparatus for describing components adapted for dynamically modifying a scan path for system-on-chip testing
CN101232456B (zh) * 2008-01-25 2010-09-08 浙江大学 一种分布式可测试片上网络路由器
US7954022B2 (en) 2008-01-30 2011-05-31 Alcatel-Lucent Usa Inc. Apparatus and method for controlling dynamic modification of a scan path
US7958417B2 (en) 2008-01-30 2011-06-07 Alcatel-Lucent Usa Inc. Apparatus and method for isolating portions of a scan path of a system-on-chip
CA3052820C (en) * 2009-01-15 2024-03-19 Electronic Warfare Associates, Inc. Systems and methods of implementing remote boundary scan features
US20100235900A1 (en) * 2009-03-13 2010-09-16 Assa Abloy Ab Efficient two-factor authentication
WO2010105259A1 (en) 2009-03-13 2010-09-16 Assa Abloy Ab Secure card access module for integrated circuit card applications
US8474026B2 (en) * 2009-03-13 2013-06-25 Assa Abloy Ab Realization of access control conditions as boolean expressions in credential authentications
US9032058B2 (en) 2009-03-13 2015-05-12 Assa Abloy Ab Use of SNMP for management of small footprint devices
US8332498B2 (en) 2009-03-13 2012-12-11 Assa Abloy Ab Synchronized relay messaging and coordinated network processing using SNMP
EP2406749B1 (de) * 2009-03-13 2018-06-13 Assa Abloy Ab Sendevorrichtung für ein empfindliches material, z.b. einen kryptographischen schlüssel
EP2372379B1 (de) * 2010-03-26 2013-01-23 Imec Testzugriffsarchitektur für TSV-basierte 3D-gestapelte ICS
US8397188B1 (en) * 2010-09-21 2013-03-12 Altera Corporation Systems and methods for testing a component by using encapsulation
US8694276B2 (en) * 2011-01-20 2014-04-08 Texas Instruments Incorporated Built-in self-test methods, circuits and apparatus for concurrent test of RF modules with a dynamically configurable test structure
US9043665B2 (en) 2011-03-09 2015-05-26 Intel Corporation Functional fabric based test wrapper for circuit testing of IP blocks
US8522189B2 (en) 2011-03-09 2013-08-27 Intel Corporation Functional fabric based test access mechanism for SoCs
TWI557746B (zh) * 2011-05-10 2016-11-11 電子戰協會公司 實施微電腦為基的電路之內容驗證的系統及方法
TWI546692B (zh) 2011-10-27 2016-08-21 電子戰協會公司 包括與已知電路板資訊有關之電路測試及驗證等特徵的裝置鑑別之系統及方法
WO2013164663A1 (en) * 2012-05-02 2013-11-07 Freescale Semiconductor, Inc. System-on-chip, method of manufacture thereof and method of communicating diagnostic data
US8694951B1 (en) 2012-10-02 2014-04-08 Lsi Corporation Core wrapping in the presence of an embedded wrapped core
US8643168B1 (en) 2012-10-16 2014-02-04 Lattice Semiconductor Corporation Integrated circuit package with input capacitance compensation
US8732632B1 (en) * 2013-03-15 2014-05-20 Cadence Design Systems, Inc. Method and apparatus for automated extraction of a design for test boundary model from embedded IP cores for hierarchical and three-dimensional interconnect test
US10481203B2 (en) 2015-04-04 2019-11-19 Nvidia Corporation Granular dynamic test systems and methods
US10451676B2 (en) 2015-10-27 2019-10-22 Nvidia Corporation Method and system for dynamic standard test access (DSTA) for a logic block reuse
US9477807B1 (en) 2015-06-11 2016-10-25 International Business Machines Corporation Automating system on a chip customized design integration, specification, and verification through a single, integrated service
US10698805B1 (en) * 2017-01-25 2020-06-30 Cadence Design Systems, Inc. Method and system for profiling performance of a system on chip
US11408934B2 (en) 2017-12-22 2022-08-09 Nvidia Corporation In system test of chips in functional systems
US11366777B2 (en) * 2019-06-11 2022-06-21 Honeywell International, Inc. Process control device having modern architecture and legacy compatibility
US11269999B2 (en) * 2019-07-01 2022-03-08 At&T Intellectual Property I, L.P. Protecting computing devices from malicious tampering
US11250167B2 (en) * 2019-09-26 2022-02-15 Intel Corporation Secure external SoC debugging
CN114443375A (zh) * 2020-11-04 2022-05-06 富泰华工业（深圳）有限公司 测试方法及装置、电子装置及计算机可读存储介质
CN114650246A (zh) * 2020-12-18 2022-06-21 中国移动通信有限公司研究院 Ip核调用的检测方法、装置及设备
CN116298799B (zh) * 2023-03-10 2024-03-19 深圳市晶存科技有限公司 芯片测试多界面联动显示方法及系统

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6658615B2 (en) * 1998-06-30 2003-12-02 Texas Instruments Incorporated IC with IP core and user-added scan register
US7046657B2 (en) * 2000-12-20 2006-05-16 Wherenet Corp Wireless local area network system with mobile access point station determination
US6877122B2 (en) * 2001-12-21 2005-04-05 Texas Instruments Incorporated Link instruction register providing test control signals to core wrappers
US7058918B2 (en) * 2003-04-28 2006-06-06 Dafca, Inc. Reconfigurable fabric for SoCs using functional I/O leads
US7437635B1 (en) * 2003-12-30 2008-10-14 Altera Corporation Testing hard-wired IP interface signals using a soft scan chain

Also Published As

Publication number Publication date
WO2005078465A1 (en) 2005-08-25
US7725784B2 (en) 2010-05-25
EP1716424B1 (de) 2009-07-15
US20080034334A1 (en) 2008-02-07
EP1716424A1 (de) 2006-11-02
JP2007524947A (ja) 2007-08-30

Similar Documents

Publication Publication Date Title
DE602005015422D1 (de) Integrierter schaltungschip mit kommunikationsmitteln, wodurch eine fernbedienung von testmitteln von ip-kernen der integrierten schaltung möglich wird
DK1656780T3 (da) Opsætning af kommunikationssessioner
NL1026826A1 (nl) Gesubstitueerde pyridinonen.
EP1588268A4 (de) Fernbedienung mit lokalem, bildschirmgeführtem setup
EP1839403A4 (de) Passwort-bereitstellung in einem drahtlosen netzwerk
DK1601680T3 (da) Fremgangsmåder til fremstilling af organiske jern(iii)forbindelser
WO2009064889A3 (en) Configuring a wireless router
EP1844356A4 (de) Verfahren zur strukturierung leitfähiger schichten, verfahren zur herstellung von polarisatoren sowie damit hergestellte polarisatoren
DE502005003505D1 (de) Optoelektronisches bauelement mit einer drahtlosen kontaktierung
DE602005020564D1 (de) Kommunikationssystem mit statistischer Regelung
DE10295444T1 (de) Verkapselter rückprallminimierter Hammer mit verbessertem Skelett
DE602005010768D1 (de) Protokollstapel mit Änderungsmöglichkeit
DE602005014051D1 (de) Funkkommunikationsgerät
DE60333289D1 (de) Chip verbunden mit einer integrierten schaltung
DE602005003909D1 (de) Stentquetschwerkzeug mit geschlitzter Hülle
DE602005002539D1 (de) Integrierte schaltung mit einer sehr kleinen lesediode
WO2006004409A3 (en) Method for preparing a glass substrate with a durable coloured pattern
DE60139155D1 (de) Chronograph mit zwei drehrichtungen
ITRM20030018A0 (it) Interruttore a pulsante.
DE60233709D1 (de) Ausnehmmechanismus einer Hohlglasformmaschine
DE602005015444D1 (de) Verbrückte monoazofarbstoffe
DE60218269D1 (de) Ausnehmmechanismus einer Hohlglasformmaschine
DE602004019273D1 (de) Funkkommunikationsvorrichtung
DE60211874D1 (de) Anordnung von zwei Geräten, verbunden durch einen Kreuzvermittlungsschalter
GB0407145D0 (en) Inter-agent communication

Legal Events

Date Code Title Description
8364 No opposition during term of opposition