DE602004014904D1 - Komprimieren von testantworten unter verwendung eines kompaktors - Google Patents

Komprimieren von testantworten unter verwendung eines kompaktors

Info

Publication number
DE602004014904D1
DE602004014904D1 DE602004014904T DE602004014904T DE602004014904D1 DE 602004014904 D1 DE602004014904 D1 DE 602004014904D1 DE 602004014904 T DE602004014904 T DE 602004014904T DE 602004014904 T DE602004014904 T DE 602004014904T DE 602004014904 D1 DE602004014904 D1 DE 602004014904D1
Authority
DE
Germany
Prior art keywords
compactor
test
values
circuit
test responses
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE602004014904T
Other languages
English (en)
Inventor
Janusz Rajski
Jerzy Tyszer
Chen Wang
Grzegorz Mrugalski
Artur Pogiel
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mentor Graphics Corp
Original Assignee
Mentor Graphics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mentor Graphics Corp filed Critical Mentor Graphics Corp
Publication of DE602004014904D1 publication Critical patent/DE602004014904D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318566—Comparators; Diagnosing the device under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318583—Design for test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/38—Response verification devices
    • G11C29/40—Response verification devices using compression techniques
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/48—Arrangements in static stores specially adapted for testing by means external to the store, e.g. using direct memory access [DMA] or using auxiliary access paths
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31703—Comparison aspects, e.g. signature analysis, comparators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/30—Accessing single arrays
    • G11C2029/3202—Scan chain
DE602004014904T 2003-02-13 2004-02-13 Komprimieren von testantworten unter verwendung eines kompaktors Expired - Lifetime DE602004014904D1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US44763703P 2003-02-13 2003-02-13
US50649903P 2003-09-26 2003-09-26
PCT/US2004/004271 WO2004072660A2 (en) 2003-02-13 2004-02-13 Compressing test responses using a compactor

Publications (1)

Publication Number Publication Date
DE602004014904D1 true DE602004014904D1 (de) 2008-08-21

Family

ID=32872039

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004014904T Expired - Lifetime DE602004014904D1 (de) 2003-02-13 2004-02-13 Komprimieren von testantworten unter verwendung eines kompaktors

Country Status (6)

Country Link
US (3) US7370254B2 (de)
EP (2) EP1595211B1 (de)
JP (1) JP4791954B2 (de)
AT (2) ATE400845T1 (de)
DE (1) DE602004014904D1 (de)
WO (1) WO2004072660A2 (de)

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EP1595211B1 (de) 2008-07-09
WO2004072660A2 (en) 2004-08-26
ATE400845T1 (de) 2008-07-15
JP2006518855A (ja) 2006-08-17
US7890827B2 (en) 2011-02-15
US20040230884A1 (en) 2004-11-18
EP1978446B1 (de) 2011-11-02
US7370254B2 (en) 2008-05-06
US7743302B2 (en) 2010-06-22
EP1595211A4 (de) 2005-11-30
EP1978446A1 (de) 2008-10-08
US20080133987A1 (en) 2008-06-05
ATE532133T1 (de) 2011-11-15
US20100257417A1 (en) 2010-10-07
EP1595211A2 (de) 2005-11-16
WO2004072660A3 (en) 2005-04-28

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