DE60024554D1 - System und Vorrichtung zur Übermittlung mit einer integrierten Schaltung - Google Patents

System und Vorrichtung zur Übermittlung mit einer integrierten Schaltung

Info

Publication number
DE60024554D1
DE60024554D1 DE60024554T DE60024554T DE60024554D1 DE 60024554 D1 DE60024554 D1 DE 60024554D1 DE 60024554 T DE60024554 T DE 60024554T DE 60024554 T DE60024554 T DE 60024554T DE 60024554 D1 DE60024554 D1 DE 60024554D1
Authority
DE
Germany
Prior art keywords
transmission
integrated circuit
integrated
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60024554T
Other languages
English (en)
Inventor
David Alan Edwards
Anthony Willis Rich
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics lnc USA
Original Assignee
STMicroelectronics lnc USA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics lnc USA filed Critical STMicroelectronics lnc USA
Application granted granted Critical
Publication of DE60024554D1 publication Critical patent/DE60024554D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Preventing errors by testing or debugging software
    • G06F11/362Software debugging
    • G06F11/3636Software debugging by tracing the execution of the program
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/319Tester hardware, i.e. output processing circuits
    • G01R31/31903Tester hardware, i.e. output processing circuits tester configuration
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Preventing errors by testing or debugging software
    • G06F11/362Software debugging
    • G06F11/3648Software debugging using additional hardware
    • G06F11/3656Software debugging using additional hardware using a specific debug interface
DE60024554T 1999-10-01 2000-09-25 System und Vorrichtung zur Übermittlung mit einer integrierten Schaltung Expired - Lifetime DE60024554D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/410,638 US6591369B1 (en) 1999-10-01 1999-10-01 System and method for communicating with an integrated circuit

Publications (1)

Publication Number Publication Date
DE60024554D1 true DE60024554D1 (de) 2006-01-12

Family

ID=23625591

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60024554T Expired - Lifetime DE60024554D1 (de) 1999-10-01 2000-09-25 System und Vorrichtung zur Übermittlung mit einer integrierten Schaltung

Country Status (3)

Country Link
US (1) US6591369B1 (de)
EP (1) EP1089174B1 (de)
DE (1) DE60024554D1 (de)

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CN103106172B (zh) * 2013-02-26 2015-08-12 龙迅半导体科技(合肥)有限公司 一种芯片及测试该芯片的方法
CN104133751A (zh) * 2014-08-06 2014-11-05 浪潮(北京)电子信息产业有限公司 一种对芯片进行调试的方法和芯片
US10110234B1 (en) * 2017-07-19 2018-10-23 Xilinx, Inc. Efficient system debug infrastructure for tiled architecture
US11258682B2 (en) * 2017-08-03 2022-02-22 Chicago Mercantile Exchange Inc. Compressed message tracing and parsing
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Also Published As

Publication number Publication date
EP1089174A2 (de) 2001-04-04
US6591369B1 (en) 2003-07-08
EP1089174B1 (de) 2005-12-07
EP1089174A3 (de) 2003-07-16

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