DE29810205U1 - Niederstrom-Pogo-Sondenkarte - Google Patents

Niederstrom-Pogo-Sondenkarte

Info

Publication number
DE29810205U1
DE29810205U1 DE29810205U DE29810205U DE29810205U1 DE 29810205 U1 DE29810205 U1 DE 29810205U1 DE 29810205 U DE29810205 U DE 29810205U DE 29810205 U DE29810205 U DE 29810205U DE 29810205 U1 DE29810205 U1 DE 29810205U1
Authority
DE
Germany
Prior art keywords
probe card
low current
pogo probe
current pogo
card
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE29810205U
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
FormFactor Beaverton Inc
Original Assignee
Cascade Microtech Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cascade Microtech Inc filed Critical Cascade Microtech Inc
Publication of DE29810205U1 publication Critical patent/DE29810205U1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06772—High frequency probes
DE29810205U 1997-06-10 1998-06-08 Niederstrom-Pogo-Sondenkarte Expired - Lifetime DE29810205U1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/871,609 US6034533A (en) 1997-06-10 1997-06-10 Low-current pogo probe card

Publications (1)

Publication Number Publication Date
DE29810205U1 true DE29810205U1 (de) 1998-09-17

Family

ID=25357776

Family Applications (1)

Application Number Title Priority Date Filing Date
DE29810205U Expired - Lifetime DE29810205U1 (de) 1997-06-10 1998-06-08 Niederstrom-Pogo-Sondenkarte

Country Status (3)

Country Link
US (10) US6034533A (de)
JP (1) JPH1126527A (de)
DE (1) DE29810205U1 (de)

Cited By (2)

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DE19945176A1 (de) * 1999-09-21 2001-05-10 Rosenberger Hochfrequenztech Anordnung von Federkontakten in einem vorbestimmten Raster
DE102007026589A1 (de) * 2007-03-28 2008-10-09 Nanya Technology Corporation, Kueishan Prüfgerät und Struktur der Prüfspitze desselben

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US7148714B2 (en) 2006-12-12
US7068057B2 (en) 2006-06-27
US6822467B2 (en) 2004-11-23
JPH1126527A (ja) 1999-01-29
US7323895B2 (en) 2008-01-29
US20050035779A1 (en) 2005-02-17
US7042241B2 (en) 2006-05-09
US20030117157A1 (en) 2003-06-26
US20050146345A1 (en) 2005-07-07
US20050151557A1 (en) 2005-07-14
US20070024302A1 (en) 2007-02-01
US20040027145A1 (en) 2004-02-12
US6856153B2 (en) 2005-02-15
US20040017214A1 (en) 2004-01-29
US6559668B1 (en) 2003-05-06
US20060164112A1 (en) 2006-07-27
US6034533A (en) 2000-03-07

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