DE102010017082A1 - Device and method for loading and unloading, in particular a coating device - Google Patents
Device and method for loading and unloading, in particular a coating device Download PDFInfo
- Publication number
- DE102010017082A1 DE102010017082A1 DE102010017082A DE102010017082A DE102010017082A1 DE 102010017082 A1 DE102010017082 A1 DE 102010017082A1 DE 102010017082 A DE102010017082 A DE 102010017082A DE 102010017082 A DE102010017082 A DE 102010017082A DE 102010017082 A1 DE102010017082 A1 DE 102010017082A1
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- Prior art keywords
- pallet
- gripper
- loading
- storage bag
- substrate holder
- Prior art date
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- 239000011248 coating agent Substances 0.000 title description 2
- 238000000576 coating method Methods 0.000 title description 2
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- 238000013459 approach Methods 0.000 description 2
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- BUHVIAUBTBOHAG-FOYDDCNASA-N (2r,3r,4s,5r)-2-[6-[[2-(3,5-dimethoxyphenyl)-2-(2-methylphenyl)ethyl]amino]purin-9-yl]-5-(hydroxymethyl)oxolane-3,4-diol Chemical compound COC1=CC(OC)=CC(C(CNC=2C=3N=CN(C=3N=CN=2)[C@H]2[C@@H]([C@H](O)[C@@H](CO)O2)O)C=2C(=CC=CC=2)C)=C1 BUHVIAUBTBOHAG-FOYDDCNASA-N 0.000 description 1
- TVEXGJYMHHTVKP-UHFFFAOYSA-N 6-oxabicyclo[3.2.1]oct-3-en-7-one Chemical compound C1C2C(=O)OC1C=CC2 TVEXGJYMHHTVKP-UHFFFAOYSA-N 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 210000000078 claw Anatomy 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000012636 effector Substances 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
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- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
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Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
- H01L21/681—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment using optical controlling means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67748—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber horizontal transfer of a single workpiece
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68764—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a movable susceptor, stage or support, others than those only rotating on their own vertical axis, e.g. susceptors on a rotating caroussel
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68771—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by supporting more than one semiconductor substrate
Abstract
Vorrichtung zum Be- und Entladen der in um eine Drehachse eines Substrathalters (1) angeordneten Lagertaschen (4) einliegenden, jeweils ein oder mehrere Substrate (3) tragenden Ladeplatten (2) einer Substratbehandlungseinrichtung, insbesondere einer Prozesskammer eines CVD-Reaktors mit einem Greifer (9), der von einem Positionierantrieb (13) verlagerbar ist, um in einer Entnahmeposition eine durch Drehen des Substrathalters (1) in eine Ladeplattenwechselstellung gebrachte Ladeplatte (2) aus der Lagertasche (4) zu entnehmen und anschließend in einer Beladeposition eine andere Ladeplatte (2) dort abzusetzen, und mit einer Zwischenablage, einem Magazin oder dergleichen zur Aufbewahrung mit beschichteten oder unbeschichteten Substraten versehener Ladeplatten (2), gekennzeichnet durch Lagebestimmungsmittel (16, 17, 18, 19, 20, 21, 22) zur Bestimmung der Relativlagen aus der Lagertasche (4) entnommenen und einer in die Lagertasche (4) abzusetzenden Ladeplatte (2) gegenüber dem Greifer (9), und eine Recheneinrichtung (27) zur Ermittlung der Abweichung der beiden Relativlagen voneinander und zur Berechnung der Beladestellung aus der ermittelten Abweichung.Device for loading and unloading the loading plates (2) of a substrate treatment device, in particular a process chamber of a CVD reactor with a gripper, which are arranged in storage pockets (4) arranged around an axis of rotation of a substrate holder (1) and each carry one or more substrates (3). 9), which can be displaced by a positioning drive (13) in order to remove a loading plate (2) brought into a loading plate change position by rotating the substrate holder (1) from the storage pocket (4) in a removal position and then another loading plate () in a loading position ( 2) to be deposited there, and with a clipboard, a magazine or the like for storage with coated or uncoated substrates loading plates (2), characterized by position determining means (16, 17, 18, 19, 20, 21, 22) for determining the relative positions removed from the storage pocket (4) and a loading plate (2) to be placed in the storage pocket (4) opposite the gripper (9), u nd a computing device (27) for determining the deviation of the two relative positions from one another and for calculating the loading position from the determined deviation.
Description
Die Erfindung betrifft eine Vorrichtung zum Be- und Entladen der in um eine Drehachse eines Substrathalters angeordneten Lagertaschen einliegenden, jeweils ein oder mehrere Substrate tragenden Ladeplatten einer Substratbehandlungseinrichtung, insbesondere einer Prozesskammer eines CVD-Reaktors mit einem Greifer, der von einem Positionierantrieb verlagerbar ist, um in einer Entnahmeposition eine durch Drehen des Substrathalters in eine Ladeplattenwechselstellung gebrachte Ladeplatte aus der Lagertasche zu entnehmen und anschließend in einer Beladeposition eine andere Ladeplatte dort abzusetzen, und mit einer Zwischenablage, einem Magazin oder dergleichen zur Aufbewahrung mit beschichteten oder unbeschichteten Substraten versehener Ladeplatten.The invention relates to a device for loading and unloading in about a rotational axis of a substrate holder arranged bearing pockets, each one or more substrates supporting pallets of a substrate treatment device, in particular a process chamber of a CVD reactor with a gripper, which is displaced by a positioning, to to remove in a removal position brought by turning the substrate holder in a pallet changing position loading plate from the storage bag and then set off in a loading another loading plate there, and with a clipboard, a magazine or the like for storage with coated or uncoated substrates versehener pallets.
Die Erfindung betrifft darüber hinaus ein Verfahren zum Be- und Entladen der in um eine Drehachse eines Substrathalters angeordneten Lagertaschen einliegenden, jeweils ein oder mehrere Substrate tragenden Ladeplatten einer Substratbehandlungeinrichtung, insbesondere einer Prozesskammer eines CVD-Reaktors mittels eines Greifers, der von einem Positionierantrieb in eine Entnahmeposition verlagert wird, und dort aus einer durch Drehen des Substrathalters in eine Ladeplattenwechselstellung gebrachten Lagertasche eine Ladeplatte entnimmt, die Ladeplatte an einem anderen Ort, insbesondere in einem Magazin absetzt und von einem anderen Ort, insbesondere einem Magazin eine andere Ladeplatte aufnimmt und von dem Positionierantrieb in eine Beladeposition gebracht wird und dort die Ladeplatte in die Lagertasche absetzt.The invention further relates to a method for loading and unloading the arranged in a rotational axis of a substrate holder bearing pockets, each one or more substrates carrying pallets of a substrate treatment device, in particular a process chamber of a CVD reactor by means of a gripper, of a positioning drive in a Removed removal position, and there removes a pallet from a brought by turning the substrate holder in a pallet changing position a pallet, the pallet deposited at another location, in particular in a magazine and another place, in particular a magazine receives another pallet and from the positioning drive is brought into a loading position and there settles the pallet in the storage bag.
Eine gattungsgemäße Vorrichtung und ein gattungsgemäßes Verfahren beschreibt die
Die
Ein ähnliches Verfahren beschreibt die
Bei dem aus der
Die
Der Erfindung liegt die Aufgabe zugrunde, Maßnahmen anzugeben, mit denen Fehlpositionierungen beim Austausch von Ladeplatten vermieden werden können.The invention has for its object to provide measures with which Incorrect positioning when replacing pallets can be avoided.
Mittels der Bestimmung der Relativlage der aus der Lagertasche entnommenen Ladeplatte zu einem Greifer ist es möglich, Rückschlüsse zu gewinnen über die tatsächliche Lage der Lagertasche in der jeweiligen Ladeplattenwechselstellung des Substrathalters. Hierzu wird ein Lagebestimmungsmittel verwendet, mit dem beispielsweise die Lage eines Referenzpunktes der Ladeplatte relativ zu einem Referenzpunkt des Greifers ermittelt wird. Die Relativlage ist von der Ist-Position der Lagertasche abhängig. Die Bestimmung der Relativlage der Ladeplatte kann über eine optische Messung erfolgen. Bevorzugt erfolgt dies unter Verwendung einer oder mehrerer Lichtschranken. Bevorzugt sind die Lichtschranken ortsfest an einem Gehäuse angeordnet. Ihre Strahlrichtung verläuft senkrecht zur Bewegungsbahn des Greifers. Der Greifer ist mit Positionsgebern ausgestattet, mit denen eine Steuereinrichtung zu jeder Zeit der Bewegung des Greifers dessen absolute Position gegenüber dem Gehäuse bestimmen kann. Der Greifer kann mehrgelenkig sein. Jedes Gelenk kann einen Drehwinkelgeber aufweisen. Mit den Lagebestimmungsmitteln kann der Rand der kreisrunden Ladeplatte abgetastet werden. Bei einer Lichtschranke wird hierzu die Ladeplatte an den Lichtstrahl der Lichtschranke herangeführt. Sobald der Lichtstrahl den Rand der Ladeplatte berührt, wird die Lichtschranke unterbrochen. Der Rand der Ladeplatte ist scharfkantig. Die Position des Greifers bei diesem Ereignis wird gespeichert. Bei einer Weiterverlagerung des Greifers bleibt die Lichtschranke so lange unterbrochen, bis der Lichtstrahl einen weiteren Randpunkt der Ladeplatte berührt. Bei diesem Ereignis wird die Lichtstrahlunterbrechung beendet. Die Position des Greifers bei diesem Ereignis wird gespeichert.By determining the relative position of the removed from the storage bag pallet to a gripper, it is possible to draw conclusions about the actual position of the bearing pocket in the respective pallet changing position of the substrate holder. For this purpose, a position determining means is used with which, for example, the position of a reference point of the loading plate is determined relative to a reference point of the gripper. The relative position depends on the actual position of the bearing pocket. The determination of the relative position of the pallet can be done via an optical measurement. This is preferably done using one or more light barriers. The light barriers are preferably arranged stationarily on a housing. Their beam direction is perpendicular to the trajectory of the gripper. The gripper is equipped with position encoders, with which a control device at any time of the movement of the gripper can determine its absolute position relative to the housing. The gripper can be multi-articulated. Each joint may have a rotary encoder. With the position determining means, the edge of the circular pallet can be scanned. In the case of a light barrier, the loading plate is brought to the light beam of the light barrier for this purpose. As soon as the light beam touches the edge of the pallet, the light barrier is interrupted. The edge of the pallet is sharp-edged. The position of the gripper at this event is saved. In a further displacement of the gripper, the light barrier remains interrupted until the light beam touches another edge point of the pallet. In this event, the light beam interruption is terminated. The position of the gripper at this event is saved.
Wird die Lichtschranke zweimal in unterschiedlichen Wegen durchfahren, oder sind zwei Lichtschranken vorhanden, die nacheinander oder etwa gleichzeitig durchfahren werden, so werden insgesamt vier Berührungspunkte gespeichert. Die Recheneinheit kann aus der Lage dieser Berührungspunkte die Relativlage der Ladeplatte gegenüber dem Greifer ermitteln. Bevorzugt weist die Ladeplatte die Form einer Kreisscheibe auf. Es reichen somit drei Messpunkte aus, um den Mittelpunkt der Ladeplatte zu ermitteln. Aus dem Versatz der tatsächlichen Lage der Ladeplatte bzw. deren Mittelpunkt in Bezug auf einen Referenzpunkt am Greifer, der der Solllage entspricht, kann der Versatz der tatsächlichen Lage der Lagertasche, aus der die Ladeplatte entnommen wird, zu ihrer Solllage ermittelt werden. Da der Substrathalter nicht exakt in die Ladeplattenwechselstellung gebracht werden kann, weicht die tatsächliche Lage der Lagertasche in der jeweiligen Ladeplattenwechselstellung von ihrer Solllage geringfügig ab. Soll nach dem Ablegen der aus der Lagertasche entnommenen Ladeplatte an einem anderen Ort, beispielsweise in einem Magazin, die Lagertasche mit einer neuen Ladeplatte bestückt werden, die beispielsweise zu behandelnde Substrate trägt, so kann der Greifer eine Position anfahren, in der die vom Greifer getragene Ladeplatte passgenau in der Lagertasche abgelegt wird. Hierzu wird nach der oben beschriebenen Methode die Relativlage der in der Lagertasche abzulegenden Ladeplatte gegenüber dem Greifer ermittelt. Der Recheneinrichtung stehen somit zwei Relativpositionen in Form von Abweichungen gegenüber einer Referenzposition zur Verfügung. Mit der Recheneinrichtung ist es somit möglich, die Abweichung des Mittelpunkts der aus der Lagertasche entnommenen Ladeplatte zur Lage des Mittelpunkts der in die Lagertasche abzusetzenden Ladeplatte zu ermitteln. Diese Abweichung entspricht im Wesentlichen einer gerichteten Strecke in der Bewegungsebene des Greifers, also einem Versatzvektor. Die Differenz zwischen den beiden Endpunkten dieses Versatzvektors ist das Maß, um das der Greifer versetzt werden muss, um seine Beladeposition anzufahren.If the light barrier is traversed twice in different ways, or if two light barriers are present, which are passed through successively or approximately simultaneously, a total of four points of contact are stored. The arithmetic unit can determine the relative position of the loading plate relative to the gripper from the position of these points of contact. The loading plate preferably has the shape of a circular disk. Thus, three measuring points are sufficient to determine the center of the pallet. From the offset of the actual position of the pallet or its center with respect to a reference point on the gripper, which corresponds to the desired position, the offset of the actual position of the bearing pocket, from which the pallet is removed, can be determined to their desired position. Since the substrate holder can not be brought exactly into the pallet changing position, the actual position of the bearing pocket in the respective pallet changing position deviates slightly from its desired position. If, after the removal of the removed from the storage bag pallet at another location, for example in a magazine, the storage bag to be equipped with a new pallet carrying, for example, to be treated substrates, the gripper can approach a position in which carried by the gripper Pallet is accurately placed in the storage bag. For this purpose, the relative position of the load plate to be deposited in the bearing pocket relative to the gripper is determined by the method described above. The computing device thus has two relative positions in the form of deviations from a reference position. With the computing device, it is thus possible to determine the deviation of the center point of the pallet removed from the storage bag to the position of the center of the pallet to be placed in the storage bag. This deviation essentially corresponds to a directed distance in the plane of movement of the gripper, ie an offset vector. The difference between the two endpoints of this offset vector is the amount by which the gripper must be offset to approach its loading position.
Ein Ausführungsbeispiel der Erfindung wird nachfolgend beschrieben. Es zeigen:An embodiment of the invention will be described below. Show it:
Das Ausführungsbeispiel betrifft eine Substratbehandlungseinrichtung mit zugehöriger Be- und Entladeeinrichtung. Die Substratbehandlungseinrichtung besitzt einen Reaktor mit einer Prozesskammer, die in den Zeichnungen lediglich angedeutet ist. Letztere besitzt eine Außenwand, die eine Beladeöffnung
Die Ladeplatte
Außerhalb der Prozesskammer befindet sich ein Positionierantrieb
Mit der Steuerungseinrichtung
In der Beladeöffnung
Die Fotodioden
Die Recheneinrichtung
Die Recheneinrichtung
Aus den vier gemessenen Berührungspunkten
Bei einer Beladung der Lagertasche
Die Funktionsweise der Be- und Entladeeinrichtung ist somit die Folgende:
Nach Beendigung eines Substratbehandlungsprozesses werden die in Lagertaschen
Upon completion of a substrate treatment process, they are stored in
Aus den vier gemessenen Positionen des Greifers
Da die Absolutlage des Referenzpunktes
Diese Bestimmung der Absolutlage des Mittelpunktes der Lagertasche
Die aus der Lagertasche
Aus dem Wert dieses Versatzes und der ermittelten Ist-Position der Lagertasche
Die Ist-Position der Lagertasche
Das Messsystem ist in der Lage, ein Transfersystem mit Endeffektor anzusteuern, um zunächst eine Standardzielposition anzulaufen. In dieser Standardzielposition liegt ein Körper unbestimmter Lage vor, der bevorzugt kreisrund ist. Es handelt sich um einen flachen Körper, der aber auch polygonförmig gestaltet sein kann. Die Dicke des Körpers ist weitestgehend beliebig. Bevorzugt ist der Körper
Die Lichtquellen
Alle offenbarten Merkmale sind (für sich) erfindungswesentlich. In die Offenbarung der Anmeldung wird hiermit auch der Offenbarungsinhalt der zugehörigen/beigefügten Prioritätsunterlagen (Abschrift der Voranmeldung) vollinhaltlich mit einbezogen, auch zu dem Zweck, Merkmale dieser Unterlagen in Ansprüche vorliegender Anmeldung mit aufzunehmen. Die Unteransprüche charakterisieren in ihrer fakultativ nebengeordneten Fassung eigenständige erfinderische Weiterbildung des Standes der Technik, insbesondere um auf Basis dieser Ansprüche Teilanmeldungen vorzunehmen.All disclosed features are essential to the invention. The disclosure of the associated / attached priority documents (copy of the prior application) is hereby also incorporated in full in the disclosure of the application, also for the purpose of including features of these documents in claims of the present application. The subclaims characterize in their optional sibling version independent inventive development of the prior art, in particular to make on the basis of these claims divisional applications.
BezugszeichenlisteLIST OF REFERENCE NUMBERS
- 11
- Substrathaltersubstrate holder
- 22
- Ladeplattepallet
- 2'2 '
- Randedge
- 33
- Substratsubstratum
- 44
- Lagertaschebearing pocket
- 55
- Ringnutring groove
- 66
- Stützflächesupport surface
- 77
- Kanalchannel
- 88th
- MittelpunktFocus
- 99
- Greifergrab
- 1010
- Greifarmclaw arm
- 1111
- Referenzpunktreference point
- 1212
- Armpoor
- 1313
- Positionierantriebpositioning
- 1414
- Drehwinkelgeber (Gelenk)Rotary encoder (joint)
- 14'14 '
- DrehwinkelgeberRotary encoder
- 1515
- DrehwinkelgeberRotary encoder
- 1616
- Fotodiodephotodiode
- 1717
- Lichtschranke, LichtstrahlPhotocell, light beam
- 1818
- Fotodiodephotodiode
- 1919
- Lichtschranke, LichtstrahlPhotocell, light beam
- 2020
- Leuchtdiodeled
- 2121
- Berührungspunktpoint of contact
- 2222
- Berührungspunktpoint of contact
- 2323
- Berührungspunktpoint of contact
- 2424
- Berührungspunktpoint of contact
- 2525
- Rahmen, GehäuseFrame, housing
- 2626
- Steuereinrichtungcontrol device
- 2727
- Recheneinrichtungcomputing device
- 2828
- Beladeöffnungloading opening
ZITATE ENTHALTEN IN DER BESCHREIBUNG QUOTES INCLUDE IN THE DESCRIPTION
Diese Liste der vom Anmelder aufgeführten Dokumente wurde automatisiert erzeugt und ist ausschließlich zur besseren Information des Lesers aufgenommen. Die Liste ist nicht Bestandteil der deutschen Patent- bzw. Gebrauchsmusteranmeldung. Das DPMA übernimmt keinerlei Haftung für etwaige Fehler oder Auslassungen.This list of the documents listed by the applicant has been generated automatically and is included solely for the better information of the reader. The list is not part of the German patent or utility model application. The DPMA assumes no liability for any errors or omissions.
Zitierte PatentliteraturCited patent literature
- DE 10232731 A1 [0003] DE 10232731 A1 [0003]
- US 4819167 [0004] US 4819167 [0004]
- US 5452521 [0005] US 5452521 [0005]
- US 5513948 [0006] US 5513948 [0006]
- US 6198976 B1 [0007] US 6198976 B1 [0007]
Claims (7)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102010017082A DE102010017082A1 (en) | 2010-05-26 | 2010-05-26 | Device and method for loading and unloading, in particular a coating device |
PCT/EP2011/058457 WO2011147820A1 (en) | 2010-05-26 | 2011-05-24 | Apparatus and method for loading and unloading, more particularly of a coating device |
KR1020127033463A KR101802893B1 (en) | 2010-05-26 | 2011-05-24 | Apparatus and method for loading and unloading, more particularly of a coating device |
TW100118448A TW201218310A (en) | 2010-05-26 | 2011-05-26 | Apparatus and method for loading and unloading, more particularly of a coating device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102010017082A DE102010017082A1 (en) | 2010-05-26 | 2010-05-26 | Device and method for loading and unloading, in particular a coating device |
Publications (1)
Publication Number | Publication Date |
---|---|
DE102010017082A1 true DE102010017082A1 (en) | 2011-12-01 |
Family
ID=44211956
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE102010017082A Pending DE102010017082A1 (en) | 2010-05-26 | 2010-05-26 | Device and method for loading and unloading, in particular a coating device |
Country Status (4)
Country | Link |
---|---|
KR (1) | KR101802893B1 (en) |
DE (1) | DE102010017082A1 (en) |
TW (1) | TW201218310A (en) |
WO (1) | WO2011147820A1 (en) |
Cited By (5)
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DE102012111167A1 (en) * | 2012-11-20 | 2014-05-22 | Aixtron Se | Device for aligning a wafer on a wafer carrier |
DE102013111165A1 (en) | 2013-10-09 | 2015-04-09 | Aixtron Se | Apparatus and method for determining the rotational position of a susceptor in a process chamber |
ITCO20130073A1 (en) * | 2013-12-19 | 2015-06-20 | Lpe Spa | REACTION CHAMBER OF AN EPITAXIAL GROWTH REACTOR SUITABLE FOR USE WITH A LOADING / UNLOADING AND REACTOR DEVICE |
WO2015173102A1 (en) | 2014-05-13 | 2015-11-19 | Aixtron Se | Device for aligning a wafer on a wafer carrier |
US10211085B2 (en) | 2014-07-03 | 2019-02-19 | Lpe S.P.A. | Tool for manipulating substrates, manipulation method and epitaxial reactor |
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CN104617028B (en) * | 2013-11-04 | 2017-09-15 | 沈阳芯源微电子设备有限公司 | The compatible location structure of a kind of square substrate and circular substrate |
CN105789075B (en) * | 2014-12-16 | 2019-02-19 | 北京北方华创微电子装备有限公司 | Pedestal rotation whether the method for normal monitoring method and loading and unloading substrate |
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DE102012111167A1 (en) * | 2012-11-20 | 2014-05-22 | Aixtron Se | Device for aligning a wafer on a wafer carrier |
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ITCO20130073A1 (en) * | 2013-12-19 | 2015-06-20 | Lpe Spa | REACTION CHAMBER OF AN EPITAXIAL GROWTH REACTOR SUITABLE FOR USE WITH A LOADING / UNLOADING AND REACTOR DEVICE |
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US10211085B2 (en) | 2014-07-03 | 2019-02-19 | Lpe S.P.A. | Tool for manipulating substrates, manipulation method and epitaxial reactor |
Also Published As
Publication number | Publication date |
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KR20130111235A (en) | 2013-10-10 |
TW201218310A (en) | 2012-05-01 |
WO2011147820A1 (en) | 2011-12-01 |
KR101802893B1 (en) | 2017-11-29 |
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