CN103479327B - Visual slit-lamp microscope correction device - Google Patents
Visual slit-lamp microscope correction device Download PDFInfo
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- CN103479327B CN103479327B CN201310445920.XA CN201310445920A CN103479327B CN 103479327 B CN103479327 B CN 103479327B CN 201310445920 A CN201310445920 A CN 201310445920A CN 103479327 B CN103479327 B CN 103479327B
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- graticle
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Abstract
The invention discloses a visual slit-lamp microscope correction device which comprises a collimator, a microscope large object lens module, a microscope small object lens module, a flat base and an image collection and analysis module. The collimator, the microscope large object lens module and the microscope small object lens module are mounted above the flat base, and the image collection and analysis module is positioned on the left side of the collimator. Through the above mode, by the visual slit-lamp microscope correction device, correction can be realized by using human eyes, and correction can be assisted by collecting, analyzing and comparing images; by using the device to correct a slit-lamp microscope, correction accuracy can be improved, correction errors can be reduced; the human eyes can be liberated to some extent, so that labor intensity is lowered, and working efficiency is improved.
Description
Technical field
The present invention relates to photoelectronic imaging field, particularly relate to a kind of visual slit-lamp microscope correction device.
Background technology
Slit-lamp microscope is as a kind of ophthalmology checking Instrument, observing effect should be clear bright, be beneficial to doctor to make the state of an illness and quick and precisely judging, this proposes higher requirement to the optical system imaging quality of instrument, and the high accuracy of optics of slit-lamp system needs high-level slit-lamp microscope means for correcting, traditional slit-lamp microscope correcting mode adopts eyepiece view mode, on the microscope being about to needs correction is placed on and rectifies an instrument, by the optics graticle alignment situation in the eyepiece optical viewer on instrument, if optics graticle alignment condition can not reach calibration standard, then adjust the optical mirror slip in microscope, graticle center is aimed at.
Traditional correcting mode relies on the alignment case of eye-observation graticle, and because eye-observation exists deviation unavoidably, and microscope is under low range, and human eye is difficult to tell position the most clearly, and the microscope that therefore this mode corrects exists the not high problem of precision.And long-time viewing microscope, can cause the visual fatigue of people, reduce the precision corrected further, therefore traditional correcting mode is badly in need of improving.
Summary of the invention
The technical problem that the present invention mainly solves is to provide a kind of visual slit-lamp microscope correction device, and correction accuracy is high, and error is little, and operating efficiency is high.
For solving the problems of the technologies described above, the technical scheme that the present invention adopts is: provide a kind of visual slit-lamp microscope correction device, comprise: the large objective lens module of parallel light tube, microscope, the little objective lens module of microscope, flat base and IMAQ analysis module, the large objective lens module of described parallel light tube, microscope and the little objective lens module of microscope are arranged on the top of flat base, and described IMAQ analysis module is positioned at the left side of parallel light tube.
In a preferred embodiment of the present invention, described flat base comprises one piece of base plate and parallel light tube support above thereof and objective lens module support.
In a preferred embodiment of the present invention, containing cross groove graticle and lighting device in described parallel light tube, lighting device is arranged on cross groove graticle side, the light that the cross groove graticle after being illuminated sends, after parallel light tube outgoing, become parallel rays.
In a preferred embodiment of the present invention, the large objective lens module of described microscope is positioned at the right side of parallel light tube, and it is inner containing many grades of zoom devices and large object lens mounting groove.
In a preferred embodiment of the present invention, the little objective lens module of described microscope is positioned at the right side of the large objective lens module of microscope, comprises little object lens mounting groove and eyepiece, and one piece of optics graticle is equipped with in described eyepiece inside, and optics graticle is carved with cross hairs.
The invention has the beneficial effects as follows: a kind of visual slit-lamp microscope correction device that the present invention points out, both can use human eye to correct, also can by the collection of image and auxiliary corrective of analysing and comparing, the present invention is used to correct slit-lamp microscope, not only can improve correction accuracy, reduce correction error, and can liberation human eye to a certain degree, reduce labour intensity, increase work efficiency.
Accompanying drawing explanation
In order to be illustrated more clearly in the technical scheme in the embodiment of the present invention, below the accompanying drawing used required in describing embodiment is briefly described, apparently, accompanying drawing in the following describes is only some embodiments of the present invention, for those of ordinary skill in the art, under the prerequisite not paying creative work, other accompanying drawing can also be obtained according to these accompanying drawings, wherein:
Fig. 1 is the structural representation of a kind of visual slit-lamp microscope correction device one of the present invention preferred embodiment;
In accompanying drawing, the mark of each parts is as follows: 1, parallel light tube, and 2, the large objective lens module of microscope, 3, the little objective lens module of microscope, 4, flat base, 5, IMAQ analysis module.
Detailed description of the invention
Be clearly and completely described to the technical scheme in the embodiment of the present invention below, obviously, described embodiment is only a part of embodiment of the present invention, instead of whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art, not making other embodiments all obtained under creative work prerequisite, belong to the scope of protection of the invention.
Refer to Fig. 1, the embodiment of the present invention comprises:
A kind of visual slit-lamp microscope correction device, comprise: the little objective lens module 3 of the large objective lens module of parallel light tube 1, microscope 2, microscope, flat base 4 and IMAQ analysis module 5, described parallel light tube 1, the large objective lens module of microscope 2 and the little objective lens module 3 of microscope are arranged on the top of flat base 4, and described IMAQ analysis module 5 is positioned at the left side of parallel light tube 1.
Further, described flat base 4 comprises one piece of base plate and parallel light tube support above thereof and objective lens module support.
Further, containing cross groove graticle and lighting device in described parallel light tube 1, lighting device is arranged on cross groove graticle side, the light that the cross groove graticle after being illuminated sends, and after parallel light tube 1 outgoing, becomes parallel rays.
Further, the large objective lens module 2 of described microscope is positioned at the right side of parallel light tube 1, and it is inner containing many grades of zoom devices and large object lens mounting groove.
Further, the little objective lens module of described microscope 3 is positioned at the right side of the large objective lens module 2 of microscope, comprises little object lens mounting groove and eyepiece, and one piece of optics graticle is equipped with in described eyepiece inside, and optics graticle is carved with cross hairs.
Further, described IMAQ analysis module 5 comprises CCD camera, connecting line, computer and correction software, and writing of correction software employs gradient energy method and image autocorrelation performance, automatic discrimination image definition.
The visual correction of slit-lamp microscope is divided into two large divisions, i.e. the correction of the little object lens of microscope and the large object lens of microscope.Part I is the correction of the little object lens of microscope, first large for microscope object lens part is taken off, the little object lens of microscope are arranged on above the little objective lens module 3 of microscope, cross groove graticle in parallel light tube 1 is after lighting device illuminates, light ray parallel penetrates, converge through the little objective lens module 3 of microscope, the cross groove on cross groove graticle is imaged on the optics graticle place in eyepiece.According to the reversible principle of light path, the cross groove at optics graticle place is imaged on cross groove graticle place equally, CCD camera designed by the present invention is positioned at the left side of parallel light tube 1, the image at cross groove graticle place is by CCD camera, image is presented on computer monitor, can clear observation two graticle imaging contexts by display, if two graticle centers are separated, then need by adjusting little object lens position, graticle center is aimed at, if two graticle centers are aimed at, then represent little object lens in tram without the need to correct, Part I has corrected.Eyepiece and little objection lens portion divide and keep motionless, load onto the large object lens part of microscope, carry out Part II correction, different gear images imaging contexts is over the display observed respectively by computer monitor, if two graticle centers are aimed at all under different gear, then represent that large object lens part has all been on tram, without the need to correcting, if two graticle centers are separated, the gear be then separated for center adjusts the object lens position of its gear, graticle center is aimed at, and after the graticle center of whole gear is all aimed at, slit-lamp microscope has corrected.
Relatively traditional microscope bearing calibration, a kind of visual slit-lamp microscope correction device that the present invention points out has clear superiority: first improve microscope correction accuracy, conventional microscope correcting mode is by eye-observation, because human eye is difficult to tell clear picture position under low range, and work long hours and easily occur visual fatigue, therefore, there is very large correction error in this traditional correcting mode, and then cause the microscope performance of correction uneven, and the present invention uses CCD camera observational record, image is more clear, and employ image gradient energy method and autocorrelation performance in own software to differentiate image definition, greatly improve microscope correction accuracy, next improves operating efficiency, and relative to traditional eye-observation, CCD camera observation does not need human eye to observe with aiming at of eyepiece, and primary calibration can use continuously, and efficiency is higher, again reduce labour intensity, traditional correcting mode, need human eye to be positioned at fixing microscope exit pupil position, and different people eye pupil is apart from different, microscope ocular often need adjust interpupillary distance, and labour intensity is larger, use CCD camera to observe and then avoid these problems, reduce labour intensity.
The foregoing is only embodiments of the invention; not thereby the scope of the claims of the present invention is limited; every utilize description of the present invention to do equivalent structure or equivalent flow process conversion; or be directly or indirectly used in other relevant technical field, be all in like manner included in scope of patent protection of the present invention.
Claims (5)
1. a visual slit-lamp microscope correction device, it is characterized in that, comprise: the large objective lens module of parallel light tube, microscope, the little objective lens module of microscope, flat base and IMAQ analysis module, the large objective lens module of described parallel light tube, microscope and the little objective lens module of microscope are arranged on the top of flat base, and described IMAQ analysis module is positioned at the left side of parallel light tube.
2. a kind of visual slit-lamp microscope correction device according to claim 1, is characterized in that, described flat base comprises one piece of base plate and parallel light tube support above thereof and objective lens module support.
3. a kind of visual slit-lamp microscope correction device according to claim 2, it is characterized in that, containing cross groove graticle and lighting device in described parallel light tube, lighting device is arranged on cross groove graticle side, the light that cross groove graticle after being illuminated sends, after parallel light tube outgoing, become parallel rays.
4. a kind of visual slit-lamp microscope correction device according to claim 3, is characterized in that, the large objective lens module of described microscope is positioned at the right side of parallel light tube, and it is inner containing many grades of zoom devices and large object lens mounting groove.
5. a kind of visual slit-lamp microscope correction device according to claim 4, it is characterized in that, the little objective lens module of described microscope is positioned at the right side of the large objective lens module of microscope, comprise little object lens mounting groove and eyepiece, one piece of optics graticle is equipped with in described eyepiece inside, and optics graticle is carved with cross hairs.
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| CN201310445920.XA CN103479327B (en) | 2013-09-27 | 2013-09-27 | Visual slit-lamp microscope correction device |
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| CN201310445920.XA CN103479327B (en) | 2013-09-27 | 2013-09-27 | Visual slit-lamp microscope correction device |
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| CN103479327A CN103479327A (en) | 2014-01-01 |
| CN103479327B true CN103479327B (en) | 2015-04-29 |
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Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN104122661B (en) * | 2014-08-19 | 2017-03-01 | 重庆奥特光学仪器有限责任公司 | Optics in Microscope image infinity parfocalization correcting unit and bearing calibration |
| CN107121137A (en) * | 2017-05-26 | 2017-09-01 | 苏州迅威光电科技有限公司 | A kind of apparatus and method of optical device crosshair fine sight |
| CN107741636A (en) * | 2017-11-07 | 2018-02-27 | 苏州西默医疗科技有限公司 | A kind of visual school positive system for becoming inclination angle binocular lens tube and its bearing calibration |
| CN108717247A (en) * | 2018-05-22 | 2018-10-30 | 李景超 | A kind of camera lens ignores not good enough adjustment instrument and not good enough method is ignored in determination |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2316630Y (en) * | 1997-12-29 | 1999-04-28 | 中国人民解放军国防科学技术大学 | High-precision automatic angle measurer |
| US5954711A (en) * | 1993-12-28 | 1999-09-21 | Nidek Co., Ltd. | Laser treatment apparatus |
| CN2667481Y (en) * | 2003-12-29 | 2004-12-29 | 中国人民解放军总装备部军械技术研究所 | Pulse laser distance-measuring equipment optical axis parallel automatic detecting apparatus |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2850802B2 (en) * | 1995-08-01 | 1999-01-27 | 日本電気株式会社 | Back focus adjustment device for flying object mounted camera |
| JP2004089216A (en) * | 2002-08-29 | 2004-03-25 | Nidek Co Ltd | Ophthalmoscopic apparatus |
| CN102288137B (en) * | 2011-07-06 | 2012-12-26 | 中国兵器工业第二0五研究所 | Device for calibrating multi-spectral axis calibrator with discrete optical axis |
| CN103292981A (en) * | 2013-05-22 | 2013-09-11 | 中国科学院上海光学精密机械研究所 | Measuring device and calibration method for optical lens distortion |
-
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Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5954711A (en) * | 1993-12-28 | 1999-09-21 | Nidek Co., Ltd. | Laser treatment apparatus |
| CN2316630Y (en) * | 1997-12-29 | 1999-04-28 | 中国人民解放军国防科学技术大学 | High-precision automatic angle measurer |
| CN2667481Y (en) * | 2003-12-29 | 2004-12-29 | 中国人民解放军总装备部军械技术研究所 | Pulse laser distance-measuring equipment optical axis parallel automatic detecting apparatus |
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Address after: 215000 4 / F, building 7, No. 168, Weixin Road, Suzhou Industrial Park, Jiangsu Province Patentee after: Wanling Bangqiao medical equipment (Suzhou) Co., Ltd Address before: 215000, Jiangsu province Suzhou Industrial Park, only Town, Zhang Jing community Fumin standard workshop H building, 2 floor Patentee before: SUZHOU BANGQIAO MEDICAL EQUIPMENT Co.,Ltd. |