CN103323468A - Single-surface multi-point non-contact pattern test method - Google Patents
Single-surface multi-point non-contact pattern test method Download PDFInfo
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- CN103323468A CN103323468A CN2013101853670A CN201310185367A CN103323468A CN 103323468 A CN103323468 A CN 103323468A CN 2013101853670 A CN2013101853670 A CN 2013101853670A CN 201310185367 A CN201310185367 A CN 201310185367A CN 103323468 A CN103323468 A CN 103323468A
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Abstract
The invention scheme discloses a solution scheme of a single-surface multi-point non-contact pattern test method. The solution scheme of the single-surface multi-point non-contact pattern test method comprises the following steps: introducing CAD graphics into AOI automatic optical inspection machine, and calling out test procedures; placing graphics products having photoresist after etching into a test platform, and shifting in with the platform; entering linear CCD scan tests in which a machine automatically compares calculation results with standard test procedures and at the same time defect detection operations are carried out; displaying detection results to a man-machine interface by programs, recording unqualified parts, marking or printing out, and shifting out with the platform; taking out, by people, objects to be tested; and sending defective products to a rework station for short-circuit repair. Through use of the method of the solution scheme, the problem in the single-surface multi-point non-contact pattern test method can be solved, and the product detection efficiency can be improved. At the same time, the problem that the AOI automatic optical inspection machine has difficulties in high penetration to ITO graphics can be avoided, and the bottleneck problem in product processes can be broken through.
Description
Technical field
The present invention relates to utilize the automatic optical detecting system field, be specifically related to the method for testing of the contactless pattern of a kind of single face multiple spot.
Background technology
Capacitive touch screen is the afterwards market-oriented touch-screen of a new generation of relay resistive touch-screen, he has had qualitative leap by the product than previous generation on performance, not only reflection is sensitive, and supports multi-point touch, and the playability of touch-control product and operability are improved greatly.The capacitive touch screen tradition adopts the tool test aircraft to carry out short out of circuit test, and the OGS product of a new generation is the new developing direction of capacitive touch screen, from technological layer, the OGS technology is simple in structure, light, thin than the G/G touch technology of present main flow, light transmission is good; Owing to saving a slice glass substrate and bonding process, being beneficial to and reducing production costs, improve product yield.But in the research and development production run of reality, it is complicated that this technology is faced with again the OGS figure, detects the short mode hard problem that opens circuit, and the traditional detection method debug time is long, and probe is too close, is difficult to like this improve detection efficiency.So retrieve for OGS test pattern problem, do not have preferably solution.Automatic optical detecting system (AOI) successfully is used in mounting on the production line of printed circuit board (PCB) (PCB) at present.AOI is take optical system as main detection system, mainly contains: 1, powerful detectability; 2, powerful mathematics is built library facility; 3, powerful function of statistic analysis; 4, high ease for use.Advantage is that test speed is fast, the defective catch rate is high, and programming time shortens, and rate of false alarm is extremely low.Utilize the AOI automatic optical checking machine that the OGS figure is detected and greatly improved efficient and product yield.
Summary of the invention
Product test exists problems to solve to purpose of the present invention to OGS for existing test aircraft, propose the method for testing of the contactless pattern of single face multiple spot that a kind of AOI of utilization automatic optical checking machine detects the OGS figure, made and originally just utilize the equipment that mounts production line at printed circuit board (PCB) (PCB) also can carry out the OGS graph testing method.
Technical scheme of the present invention is:
The method of testing of the contactless pattern of a kind of single face multiple spot is characterized in that, its main test process may further comprise the steps:
(1) selects an AOI automatic optical checking machine, the AOI automatic optical checking machine includes detection platform, the one end middle part of detection platform is fixed with strut, be fixed with crossbeam on the strut, be fixed with the CCD camera towards detection platform on the crossbeam, the CCD camera connects computing machine, external connection of computer man-machine interface;
(2) the CAD figure with single face multipoint mode figure imports the AOI automatic optical checking machine, accesses the trace routine that needs by study guide;
(3) detection platform of AOI automatic optical checking machine, the contraposition of manually keeping to the side will be put into after the etching with the graphic product of photoresist; After the affirmation, microscope carrier moves into;
(4) entering linear CCD scanning detects; During continuous detecting, computing machine compares result of calculation and standard detection program automatically, carries out simultaneously the defect detection computing;
(5) program shows testing result to man-machine interface, and underproof part is recorded, and makes marks or prints, and microscope carrier shifts out;
(6) personnel take out determinand, and defective product are delivered to reprocess the station and carry out short circuit and repair.
Advantage of the present invention is:
The AOI automatic optical checking machine detects by the extraction of algorithm to Characteristic of Image point, has that test speed is fast, the defective catch rate is high.Mainly contain the following aspects:
1. can greatly shorten programming time.2. provide the defects detection of pinpoint accuracy＜hi-Fix technology 〉.3. extremely low rate of false alarm is provided.
With after the etching with the product test of photoresist, be not easy to occur dirty, glue-line and ITO and scratch and cause product bad.
5. scan with the graphic product with photoresist after the etching, solved the high thoroughly hard problem of AOI automatic optical checking machine.
Description of drawings
Fig. 1 is the process flow diagram that the present invention program detects single face multiple spot figure.
Fig. 2 is the schematic diagram that the present invention program AOI automatic optical checking machine detects single face multiple spot figure.
Embodiment
As shown in Figure 1, 2, the method for testing of the contactless pattern of a kind of single face multiple spot, its main test process may further comprise the steps:
(1) selects an AOI automatic optical checking machine, the AOI automatic optical checking machine includes detection platform 1, the one end middle part of detection platform 1 is fixed with strut 2, be fixed with crossbeam 3 on the strut 2, be fixed with the CCD camera 4 towards detection platform 1 on the crossbeam 3, CCD camera 4 connects computing machine 5, computing machine 5 external man-machine interfaces 6;
(2) the CAD figure with single face multipoint mode figure imports the AOI automatic optical checking machine, accesses the trace routine that needs by study guide;
(3) detection platform 1 of AOI automatic optical checking machine, the contraposition of manually keeping to the side will be put into after the etching with the graphic product of photoresist; After the affirmation, microscope carrier moves into;
(4) entering linear CCD scanning detects; During continuous detecting, computing machine 5 compares result of calculation and standard detection program automatically, carries out simultaneously the defect detection computing;
(5) program shows testing result to man-machine interface 6, and underproof part is recorded, and makes marks or prints, and microscope carrier shifts out;
(6) personnel take out determinand 7, and defective product are delivered to reprocess the station and carry out short circuit and repair.
Table one: AOI automatic optical checking machine parameter list:
Claims (1)
1. the method for testing of the contactless pattern of single face multiple spot is characterized in that, its main test process may further comprise the steps:
(1) selects an AOI automatic optical checking machine, the AOI automatic optical checking machine includes detection platform, the one end middle part of detection platform is fixed with strut, be fixed with crossbeam on the strut, be fixed with the CCD camera towards detection platform on the crossbeam, the CCD camera connects computing machine, external connection of computer man-machine interface;
(2) the CAD figure with single face multipoint mode figure imports the AOI automatic optical checking machine, accesses the trace routine that needs by study guide;
(3) detection platform of AOI automatic optical checking machine, the contraposition of manually keeping to the side will be put into after the etching with the graphic product of photoresist; After the affirmation, microscope carrier moves into;
(4) entering linear CCD scanning detects; During continuous detecting, computing machine compares result of calculation and standard detection program automatically, carries out simultaneously the defect detection computing;
(5) program shows testing result to man-machine interface, and underproof part is recorded, and makes marks or prints, and microscope carrier shifts out;
(6) personnel take out determinand, and defective product are delivered to reprocess the station and carry out short circuit and repair.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2013101853670A CN103323468A (en) | 2013-05-20 | 2013-05-20 | Single-surface multi-point non-contact pattern test method |
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| Application Number | Priority Date | Filing Date | Title |
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| CN2013101853670A CN103323468A (en) | 2013-05-20 | 2013-05-20 | Single-surface multi-point non-contact pattern test method |
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| CN103323468A true CN103323468A (en) | 2013-09-25 |
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| CN2013101853670A Pending CN103323468A (en) | 2013-05-20 | 2013-05-20 | Single-surface multi-point non-contact pattern test method |
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Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5506793A (en) * | 1994-01-14 | 1996-04-09 | Gerber Systems Corporation | Method and apparatus for distortion compensation in an automatic optical inspection system |
| US7009163B2 (en) * | 2001-06-22 | 2006-03-07 | Orbotech Ltd. | High-sensitivity optical scanning using memory integration |
| CN201266177Y (en) * | 2008-04-18 | 2009-07-01 | 深超光电（深圳）有限公司 | Combined automatic optical detection equipment |
| CN102495071A (en) * | 2011-12-19 | 2012-06-13 | 景旺电子（深圳）有限公司 | AOI (Automated Optic Inspection) system and inspection method thereof |
| CN202693490U (en) * | 2012-07-13 | 2013-01-23 | 晶彩科技股份有限公司 | Panel detecting and defect displaying and cleaning operation system |
| CN102928441A (en) * | 2012-10-25 | 2013-02-13 | 渭南师范学院 | Scanning type automatic optical detecting system |
-
2013
- 2013-05-20 CN CN2013101853670A patent/CN103323468A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5506793A (en) * | 1994-01-14 | 1996-04-09 | Gerber Systems Corporation | Method and apparatus for distortion compensation in an automatic optical inspection system |
| US7009163B2 (en) * | 2001-06-22 | 2006-03-07 | Orbotech Ltd. | High-sensitivity optical scanning using memory integration |
| CN201266177Y (en) * | 2008-04-18 | 2009-07-01 | 深超光电（深圳）有限公司 | Combined automatic optical detection equipment |
| CN102495071A (en) * | 2011-12-19 | 2012-06-13 | 景旺电子（深圳）有限公司 | AOI (Automated Optic Inspection) system and inspection method thereof |
| CN202693490U (en) * | 2012-07-13 | 2013-01-23 | 晶彩科技股份有限公司 | Panel detecting and defect displaying and cleaning operation system |
| CN102928441A (en) * | 2012-10-25 | 2013-02-13 | 渭南师范学院 | Scanning type automatic optical detecting system |
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Application publication date: 20130925 |