CN102636739B - Multi-station positioning device for testing integrated circuits - Google Patents
Multi-station positioning device for testing integrated circuits Download PDFInfo
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- CN102636739B CN102636739B CN201210074593.7A CN201210074593A CN102636739B CN 102636739 B CN102636739 B CN 102636739B CN 201210074593 A CN201210074593 A CN 201210074593A CN 102636739 B CN102636739 B CN 102636739B
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- 238000012360 testing method Methods 0.000 title claims abstract description 194
- 230000007246 mechanism Effects 0.000 claims abstract description 108
- 230000007704 transition Effects 0.000 claims description 37
- 238000007599 discharging Methods 0.000 claims description 29
- 239000002994 raw material Substances 0.000 claims description 29
- 230000003028 elevating effect Effects 0.000 claims description 20
- 230000001737 promoting effect Effects 0.000 claims description 3
- 230000013011 mating Effects 0.000 claims description 2
- 238000004519 manufacturing process Methods 0.000 description 4
- 230000009471 action Effects 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 3
- 230000005484 gravity Effects 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 230000007812 deficiency Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000001387 multinomial test Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
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Abstract
The invention relates to the field of integrated circuit testing equipment, and aims to provide a multi-station positioning device for testing integrated circuits, which is high in integrated circuit testing efficiency. Testing contacts of the multi-station positioning device keep good contact with testing ends. The multi-station positioning device for testing the integrated circuits comprises a mounting seat, a feeding track, a plurality of testing contacts, a distributing mechanism, a distributing driving mechanism, a pushing mechanism and a pushing driving mechanism, the feeding track is fixedly connected with the mounting seat, the distributing mechanism is used for distributing the integrating circuits to the testing contacts, the pushing mechanism pushes the testing contacts to contact with testing ends of the integrated circuits, the distributing driving mechanism is respectively fixedly connected with the distributing mechanism and the mounting seat, and the pushing driving mechanism is respectively fixedly connected with the pushing mechanism and the mounting seat. The multi-station positioning device for testing the integrated circuits is high in integrated circuit testing efficiency, and the testing contacts keep good contact with the testing ends.
Description
Technical field
The present invention relates to integrated circuit testing apparatus field, between especially a kind of testing integrated circuits efficiency high and test contact and test cap, keep the integrated circuit testing multi-station positioning device of good contact.
Background technology
Integrated circuit is produced by batch and need to be carried out multinomial test, between workload very large and the test cap of integrated circuit and the test contact of proving installation, must contact well just can make to test accurate; The multinomial test of integrated circuit at present is often completed by multiple tracks test step, and integrated circuit need be made a detour between multiple tracks test step, and often testing in the socket with test contact of the test cap of integrated circuit insertion proving installation; Because integrated circuit process need in test is repeatedly made a detour and plugged, exist testing efficiency low and easily cause the deficiency of loose contact between test contact and test cap, therefore, design the integrated circuit testing multi-station positioning device that keeps good contact between a kind of testing integrated circuits efficiency high and test contact and test cap, become problem demanding prompt solution.
Summary of the invention
The object of the invention is in order to overcome current testing efficiency lowly and easily cause the deficiency of loose contact between test contact and test cap, the integrated circuit testing multi-station positioning device that keeps good contact between a kind of testing integrated circuits efficiency high and test contact and test cap is provided.
Concrete technical scheme of the present invention is:
A kind of integrated circuit testing multi-station positioning device, feeding track that described integrated circuit testing multi-station positioning device comprises mount pad, be fixedly connected with mount pad, several test contact, the pushing mechanism and the promotion driving mechanism that contact with integrated circuit testing termination for integrated circuit being distributed to gradation mechanism, gradation driving mechanism, the push to test contact at each test contact place; Described gradation driving mechanism is fixedly connected with mount pad with gradation mechanism respectively; Described promotion driving mechanism is fixedly connected with mount pad with pushing mechanism respectively.When this integrated circuit testing multi-station positioning device uses, integrated circuit in feeding track falls under Action of Gravity Field, gradation driving mechanism makes integrated circuit enter continuously several test bits by gradation mechanism to carry out different tests, and several test bits can be carried out different tests to several integrated circuit simultaneously; Enter after test bit when integrated circuit falls, promotion driving mechanism drives pushing mechanism to push down test contact and contacts with integrated circuit testing termination; Between this integrated circuit testing multi-station positioning device testing integrated circuits efficiency high and test contact and test cap, keep good contact.
As preferably, described mount pad comprises base plate, fixed head and connecting link; Described base plate is provided with through hole; Described fixed head and feeding track lay respectively at the both sides at the through hole place place of base plate, and fixed head is fixedly connected with base plate by connecting link, and feeding track is fixedly connected with base plate; Described feeding track is provided with chute feeder and end tank along its length; The two side ends of described end tank connects with a side external surface of chute feeder and feeding track respectively.Mount pad is simple in structure.
As preferably, described integrated circuit testing multi-station positioning device also comprises cushion block and the cushion block elevating mechanism for padding integrated circuit testing end; Described cushion block elevating mechanism is fixedly connected with fixed head with cushion block respectively.Enter after test bit when integrated circuit falls, cushion block elevating mechanism drives cushion block to stretch out forward and pads integrated circuit testing termination; Cushion block pad firmly make between integrated circuit testing termination and test contact contact better.
As preferably, described cushion block elevating mechanism comprises lift cylinder and lifting buffer stopper; Described lift cylinder is positioned at the rear side of fixed head and is fixedly connected with fixed head, is provided with cushion block guide pillar guide pin bushing between described cushion block and fixed head; The lift cylinders bar of described lift cylinder is fixedly connected with cushion block with through hole through fixed head; Described lift cylinder is provided with cylinder bar after lifting; Described lifting buffer stopper is fixedly connected with cylinder bar after lifting.Elevating mechanism is that cylinder is simple and practical, and cushion block guide pillar guide pin bushing makes cushion block lifting steady, and lifting buffer stopper reduces the impact of cushion block to integrated circuit testing termination.
As preferably, described elevating mechanism is the first cylinder; The first described cylinder is fixedly connected with fixed head, is provided with the first guide pillar guide pin bushing between described cushion block and fixed head; The first cylinder bar of the first described cylinder is fixedly connected with cushion block with through hole through fixed head.Elevating mechanism is that cylinder is simple and practical.
As preferably, described gradation mechanism comprises test backing pin and the transition backing pin that header board, rear plate, transiting rod, discharging backing pin, the backing pin of getting the raw materials ready, number equate with test contact; The trailing flank of described feeding track is provided with the rear pin-and-hole that connects with chute feeder and mate with test backing pin and the backing pin of getting the raw materials ready, and the leading flank of feeding track is provided with the front pin-and-hole that connects and mate with transition backing pin and discharging backing pin with chute feeder; Described header board is positioned at the front side of feeding track, and rear plate is between the rear side and fixed head of feeding track, and transiting rod is through through hole, and the two ends of transiting rod are fixedly connected with front and rear panels respectively; The described backing pin of getting the raw materials ready, discharging backing pin and transition backing pin are arranged in order from top to bottom, and below and transition backing pin that test backing pin is positioned at transition backing pin are spaced; One end of described test backing pin is fixedly connected with rear plate respectively with one end of the backing pin of getting the raw materials ready, and the other end of test backing pin and the other end of the backing pin of getting the raw materials ready stretch into corresponding rear pin-and-hole; One end of described transition backing pin is fixedly connected with header board respectively with one end of discharging backing pin, and the other end of the other end of transition backing pin and discharging backing pin stretches into respectively corresponding front pin-and-hole; Between described rear plate and fixed head, be provided with gradation guide pillar guide pin bushing.Gradation mechanism is simple and reliable for structure, and gradation guide pillar guide pin bushing makes the lifting of gradation mechanism steady.
As preferably, described gradation driving mechanism comprises gradation cylinder and gradation buffer stopper; Gradation cylinder is provided with cylinder bar after gradation; Described gradation cylinder is positioned at the rear side of fixed head and is fixedly connected with fixed head; The gradation cylinder bar of described gradation cylinder is fixedly connected with rear plate through fixed head; Described gradation buffer stopper is fixedly connected with cylinder bar after gradation.Gradation driving mechanism is that cylinder is simple and practical, and gradation buffer stopper reduces the impact of gradation mechanism to feeding track and integrated electric drive test.
As preferably, described gradation driving mechanism is the second cylinder; The second described cylinder is fixedly connected with fixed head; The second cylinder bar of the second described cylinder is fixedly connected with rear plate through fixed head.Gradation driving mechanism is that cylinder is simple and practical.
As preferably, described pushing mechanism comprises the front holder that rear holder and number equate with test contact; Described rear fixed seating is in the feeding track place of base plate side, and the rear end of rear holder is fixedly connected with base plate, and front holder is fixedly connected with the front end of rear holder, and test contact is fixedly connected with rear holder; Described promotion driving mechanism comprises promotion cylinder and the pusher head that number equates with test contact; Described promotion cylinder is fixedly connected with front holder, and pusher head is fixedly connected with the promotion cylinder bar that promotes cylinder and is relative with test contact.Driving driving mechanism is that cylinder is simple and practical; Pushing mechanism is simple in structure.
As preferably, described front holder comprises fixed mount, slide block, cover plate and set screw; The front end face of described fixed mount is provided with the groove mating with slide block, and the dual-side of slide block is slidably connected with the relative dual-side of groove by guide rail respectively; Described cover plate is fixedly connected with the front end of fixed mount, and set screw is threaded with slide block through cover plate; Described promotion cylinder is fixedly connected with slide block.Before rotation, the set screw of holder drives adjusting slider to make pusher head push down integrated circuit testing termination to keep suitable pressure.
Compared with prior art, the invention has the beneficial effects as follows: one. between this integrated circuit testing multi-station positioning device testing integrated circuits efficiency high and test contact and test cap, keep good contact.Two. mount pad is simple in structure.Three. elevating mechanism is that cylinder is simple and practical, and cushion block guide pillar guide pin bushing makes cushion block lifting steady, and lifting buffer stopper reduces the impact of cushion block to integrated circuit testing termination, cushion block pad firmly make between integrated circuit testing termination and test contact contact better.Four. gradation mechanism is simple and reliable for structure, and gradation guide pillar guide pin bushing makes the lifting of gradation mechanism steady, and gradation driving mechanism is that cylinder is simple and practical, and gradation buffer stopper reduces the impact of gradation mechanism to feeding track and integrated electric drive test.Five. driving driving mechanism is that cylinder is simple and practical; Pushing mechanism is simple in structure; Before rotation, the set screw of holder drives adjusting slider to make pusher head push down integrated circuit testing termination to keep suitable pressure.
Brief description of the drawings
Fig. 1 is the schematic diagram of the embodiment of the present invention 1;
Fig. 2 is the right view of Fig. 1;
Fig. 3 is that the A of Fig. 2 is to view;
Fig. 4 is the schematic diagram of the embodiment of the present invention 2;
Fig. 5 is the right view of Fig. 4;
Fig. 6 is that the A of Fig. 5 is to view.
In figure: test contact-1, cushion block-2, feeding track-3, chute feeder-31, end tank-32, rear pin-and-hole-33, front pin-and-hole-34, mount pad-4, base plate-41, fixed head-42, connecting link-43, through hole-44, cushion block guide pillar guide pin bushing-45, lift cylinder-5, lift cylinders bar-51, cylinder bar-52 after lifting, gradation cylinder-6, gradation cylinder bar-61, cylinder bar-62 after gradation, front holder-7, fixed mount-71, slide block-72, cover plate-73, set screw-74, groove-75, guide rail-76, promote cylinder-8, promote cylinder bar-81, the first cylinder-9, the first cylinder bar-91, the second cylinder-10, the second cylinder bar-101, lifting buffer stopper-11, header board-12, rear plate-13, transiting rod-14, discharging backing pin-15, backing pin-16 of getting the raw materials ready, test backing pin-17, transition backing pin-18, gradation guide pillar guide pin bushing-19, gradation buffer stopper-20, rear holder 21, pusher head-22.
Embodiment
Below in conjunction with shown in accompanying drawing, the present invention is described further.
Embodiment 1; as shown in accompanying drawing 1, accompanying drawing 2, accompanying drawing 3: a kind of integrated circuit testing multi-station positioning device, the feeding track 3 that comprise mount pad 4, is fixedly connected with mount pad 4, four test contact 1, for integrated circuit being distributed to pushing mechanism that gradation mechanism, gradation driving mechanism, the push to test contact 1 at each test contact 1 place contact with integrated circuit testing termination, promote driving mechanism, for padding cushion block 2 and the cushion block elevating mechanism of integrated circuit testing end.
Described mount pad 4 comprises base plate 41, fixed head 42 and connecting link 43; Connecting link 43 has four, and base plate 41 has through hole 44; Fixed head 42 and feeding track 3 lay respectively at the both sides at the through hole 44 place places of base plate 41, and fixed head 42 welds by connecting link 43 and base plate 41, and feeding track 3 is connected with base plate 41 screws; Feeding track 3 has chute feeder 31 and end tank 32 along its length; The two side ends of end tank 32 connects with a side external surface of chute feeder 31 and feeding track 3 respectively.
Described elevating mechanism comprises lift cylinder 5 and lifting buffer stopper 11; Described cushion block elevating mechanism is fixedly connected with fixed head 42 with cushion block 2 respectively; In the present embodiment, lift cylinder 5 is positioned at the rear side of fixed head 42 and is connected with fixed head 42 screws, has cushion block guide pillar guide pin bushing 45 between cushion block 2 and fixed head 42; The lift cylinders bar 51 of lift cylinder 5 is threaded with cushion block 2 through fixed head 42 and through hole 44; Lift cylinder 5 has cylinder bar 52 after lifting; The material of lifting buffer stopper 11 is rubber, and lifting buffer stopper 11 is threaded with cylinder bar 52 after lifting.
Described gradation mechanism comprises four test backing pins 17 and four the transition backing pins 18 that header board 12, rear plate 13, transiting rod 14, discharging backing pin 15, the backing pin 16 of getting the raw materials ready, number equate with test contact 1; The trailing flank of feeding track 3 have connect with chute feeder 31 and with the rear pin-and-hole 33 of test backing pin 17 and backing pin 16 clearance fit of getting the raw materials ready, the leading flank of feeding track 3 have connect with chute feeder 31 and with the front pin-and-hole 34 of transition backing pin 18 and discharging backing pin 15 clearance fit; Header board 12 is positioned at the front side of feeding track 3, and rear plate 13 is between the rear side and fixed head 42 of feeding track 3, and transiting rod 14 is through through hole 44, and weld with header board 12 and rear plate 13 respectively at the two ends of transiting rod 14; Get the raw materials ready backing pin 16, discharging backing pin 15 and transition backing pin 18 is arranged in order from top to bottom, and below and transition backing pin 18 that test backing pin 17 is positioned at transition backing pin 18 are spaced; One end of test backing pin 17 and one end of the backing pin 16 of getting the raw materials ready are threaded with rear plate 13 respectively, and the other end of test backing pin 17 and the other end of the backing pin 16 of getting the raw materials ready stretch into corresponding rear pin-and-hole 33; One end of one end of transition backing pin 18 and discharging backing pin 15 is threaded with header board 12 respectively, and the other end of the other end of transition backing pin 18 and discharging backing pin 15 stretches into respectively corresponding front pin-and-hole 34; Between rear plate 13 and fixed head 42, there is gradation guide pillar guide pin bushing 19.
Described gradation driving mechanism comprises gradation cylinder 6 and gradation buffer stopper 20; Gradation cylinder 6 has cylinder bar 62 after gradation; Described gradation driving mechanism is fixedly connected with mount pad 4 with gradation mechanism respectively; In the present embodiment, gradation cylinder 6 is positioned at the rear side of fixed head 42 and is connected with fixed head 42 screws; The gradation cylinder bar 61 of gradation cylinder 6 is threaded with rear plate 13 through fixed head 42; The material of gradation buffer stopper 20 is rubber, and gradation buffer stopper 20 is threaded with cylinder bar 62 after gradation.
Described pushing mechanism comprises four front holders 7 that rear holder 21 and number equate with test contact 1; Rear holder 21 is positioned at the feeding track 3 place sides of base plate 41, and the rear end of rear holder 21 is connected with base plate 41 screws, and front holder 7 is connected with the front end screw of rear holder 21, and test contact 1 is connected with rear holder 21 screws; Described promotion driving mechanism comprises four promotion cylinders 8 and four pusher head 22 that number equates with test contact 1.
Described front holder 7 comprises fixed mount 71, slide block 72, cover plate 73 and set screw 74; The front end face of fixed mount 71 is provided with the groove 75 with slide block 72 clearance fit, and the dual-side of slide block is slidably connected with the relative dual-side of groove 75 by guide rail 76 respectively; Cover plate 73 is connected with the front end screw of fixed mount 71, and set screw 74 is threaded with slide block 72 through cover plate 73; Described promotion driving mechanism is fixedly connected with mount pad 4 with pushing mechanism respectively; In the present embodiment, described promotion cylinder 8 is connected with slide block 72 screws of front holder 7, and pusher head 22 is threaded with the promotion cylinder bar 81 that promotes cylinder 8 and is relative with test contact.
When this integrated circuit testing multi-station positioning device uses, integrated circuit in feeding track falls under Action of Gravity Field, first integrated circuit is blocked by discharging backing pin 15, the gradation cylinder bar 61 of gradation cylinder 6 stretches out forward, through header board 12, transiting rod 14 and after plate 13, drive discharging backing pin 15, the backing pin 16 of getting the raw materials ready, test backing pin 17 and transition backing pin 18 to travel forward, the backing pin 16 of getting the raw materials ready inserts the fabrication hole of second integrated circuit, and first integrated circuit falls by first test backing pin 17 and blocks and enter the first test bit; Gradation cylinder bar 61 is retracted backward, through header board 12, transiting rod 14 and after plate 13, drive discharging backing pin 15, the backing pin 16 of getting the raw materials ready, test backing pin 17 and transition backing pin 18 to move backward, the backing pin 16 of getting the raw materials ready exits the fabrication hole of second integrated circuit, second integrated circuit falls to being blocked by discharging backing pin 15, and first integrated circuit falls by first transition backing pin 18 and blocks and enter First Transition position; The like, can make integrated circuit carry out different tests four test bits continuously, four test bits can be carried out different tests to four integrated circuit simultaneously; Block and enter after test bit when integrated circuit falls tested backing pin 17, the lift cylinders bar 51 of lift cylinder 5 drives cushion block 2 to stretch out forward and pads integrated circuit testing termination; Promoting the promotion cylinder bar 81 of cylinder 8 drives pusher head 22 to stretch out backward to push down test contact 1 and contacts with integrated circuit testing termination; Before rotation, the set screw 74 of holder 7 drives adjusting slider 72 to make pusher head 22 push down integrated circuit testing termination to keep suitable pressure.
This beneficial effect of the invention is: between this integrated circuit testing multi-station positioning device testing integrated circuits efficiency high and test contact and test cap, keep good contact.Mount pad is simple in structure.Elevating mechanism is that cylinder is simple and practical, and cushion block guide pillar guide pin bushing makes cushion block lifting steady, and lifting buffer stopper reduces the impact of cushion block to integrated circuit testing termination, cushion block pad firmly make between integrated circuit testing termination and test contact contact better.Gradation mechanism is simple and reliable for structure, and gradation guide pillar guide pin bushing makes the lifting of gradation mechanism steady, and gradation driving mechanism is that cylinder is simple and practical, and gradation buffer stopper reduces the impact of gradation mechanism to feeding track and integrated electric drive test.Driving driving mechanism is that cylinder is simple and practical; Pushing mechanism is simple in structure; Before rotation, the set screw of holder drives adjusting slider to make pusher head push down integrated circuit testing termination to keep suitable pressure.
Embodiment 2; as shown in accompanying drawing 4, accompanying drawing 5, accompanying drawing 6: a kind of integrated circuit testing multi-station positioning device, the feeding track 3 that comprise mount pad 4, is fixedly connected with mount pad 4, four test contact 1, for integrated circuit being distributed to pushing mechanism that gradation mechanism, gradation driving mechanism, the push to test contact 1 at each test contact 1 place contact with integrated circuit testing termination, promote driving mechanism, for padding cushion block 2 and the cushion block elevating mechanism of integrated circuit testing end.
Described mount pad 4 comprises base plate 41, fixed head 42 and connecting link 43; Connecting link 43 has four, and base plate 41 has through hole 44; Fixed head 42 and feeding track 3 lay respectively at the both sides at the through hole 44 place places of base plate 41, and fixed head 42 welds by connecting link 43 and base plate 41, and feeding track 3 is connected with base plate 41 screws; Feeding track 3 has chute feeder 31 and end tank 32 along its length; The two side ends of end tank 32 connects with a side external surface of chute feeder 31 and feeding track 3 respectively.
Described elevating mechanism is the first cylinder 9; Described cushion block elevating mechanism is fixedly connected with mount pad 4 with cushion block 2 respectively; In the present embodiment, the first described cylinder 9 is connected with fixed head 42 screws, has cushion block guide pillar guide pin bushing 45 between described cushion block 2 and fixed head 42; The first cylinder bar 91 of the first described cylinder 9 is threaded with cushion block 2 through fixed head 42 and through hole 44.
Described gradation mechanism comprises four test backing pins 17 and four the transition backing pins 18 that header board 12, rear plate 13, transiting rod 14, discharging backing pin 15, the backing pin 16 of getting the raw materials ready, number equate with test contact 1; The trailing flank of feeding track 3 have connect with chute feeder 31 and with the rear pin-and-hole 33 of test backing pin 17 and backing pin 16 clearance fit of getting the raw materials ready, the leading flank of feeding track 3 have connect with chute feeder 31 and with the front pin-and-hole 34 of transition backing pin 18 and discharging backing pin 15 clearance fit; Header board 12 is positioned at the front side of feeding track 3, and rear plate 13 is between the rear side and fixed head 42 of feeding track 3, and transiting rod 14 is through through hole 44, and weld with header board 12 and rear plate 13 respectively at the two ends of transiting rod 14; Get the raw materials ready backing pin 16, discharging backing pin 15 and transition backing pin 18 is arranged in order from top to bottom, and below and transition backing pin 18 that test backing pin 17 is positioned at transition backing pin 18 are spaced; One end of test backing pin 17 and one end of the backing pin 16 of getting the raw materials ready are threaded with rear plate 13 respectively, and the other end of test backing pin 17 and the other end of the backing pin 16 of getting the raw materials ready stretch into corresponding rear pin-and-hole 33; One end of one end of transition backing pin 18 and discharging backing pin 15 is threaded with header board 12 respectively, and the other end of the other end of transition backing pin 18 and discharging backing pin 15 stretches into respectively corresponding front pin-and-hole 34; Between rear plate 13 and fixed head 42, there is gradation guide pillar guide pin bushing 19.
Described described gradation driving mechanism is the second cylinder 10; Described gradation driving mechanism is fixedly connected with mount pad 4 with gradation mechanism respectively; In the present embodiment, the second described cylinder 10 is connected with fixed head 42 screws; The second cylinder bar 101 of the second cylinder 10 is threaded with rear plate 13 through fixed head 42.
Described pushing mechanism comprises four front holders 7 that rear holder 21 and number equate with test contact 1; Rear holder 21 is positioned at the feeding track 3 place sides of base plate 41, and the rear end of rear holder 21 is connected with base plate 41 screws, and front holder 7 is connected with the front end screw of rear holder 21, and test contact 1 is connected with rear holder 21 screws; Described promotion driving mechanism comprises four promotion cylinders 8 and four pusher head 22 that number equates with test contact; Promote cylinder 8 and four pusher head 22;
Described front holder 7 comprises fixed mount 71, slide block 72, cover plate 73 and set screw 74; The front end face of fixed mount 71 has the groove 75 with slide block 72 clearance fit, and the dual-side of slide block is slidably connected with the relative dual-side of groove 75 by guide rail 76 respectively; Cover plate 73 is connected with the front end screw of fixed mount 71, and set screw 74 is threaded with slide block 72 through cover plate 73; Described promotion driving mechanism is fixedly connected with mount pad 4 with pushing mechanism respectively; In the present embodiment, described promotion cylinder 8 is connected with slide block 72 screws of front holder 7, and pusher head 22 is threaded with the promotion cylinder bar 81 that promotes cylinder 8 and is relative with test contact
When this integrated circuit testing multi-station positioning device uses, integrated circuit in feeding track falls under Action of Gravity Field, first integrated circuit is blocked by discharging backing pin 15, the second cylinder bar 101 of the second cylinder 10 stretches out forward, through header board 12, transiting rod 14 and after plate 13, drive discharging backing pin 15, the backing pin 16 of getting the raw materials ready, test backing pin 17 and transition backing pin 18 to travel forward, the backing pin 16 of getting the raw materials ready inserts the fabrication hole of second integrated circuit, and first integrated circuit falls by first test backing pin 17 and blocks and enter the first test bit; The second cylinder bar 101 is retracted backward, through header board 12, transiting rod 14 and after plate 13, drive discharging backing pin 15, the backing pin 16 of getting the raw materials ready, test backing pin 17 and transition backing pin 18 to move backward, the backing pin 16 of getting the raw materials ready exits the fabrication hole of second integrated circuit, second integrated circuit falls to being blocked by discharging backing pin 15, and first integrated circuit falls by first transition backing pin 18 and blocks and enter First Transition position; The like, can make integrated circuit carry out different tests four test bits continuously, four test bits can be carried out different tests to four integrated circuit simultaneously; Block and enter after test bit when integrated circuit falls tested backing pin 17, the first cylinder bar 91 of the first cylinder 9 drives cushion block 2 to stretch out forward and pads integrated circuit testing termination; Promoting the promotion cylinder bar 81 of cylinder 8 drives pusher head 22 to stretch out backward to push down test contact 1 and contacts with integrated circuit testing termination; Before rotation, the set screw 74 of holder 7 drives adjusting slider 72 to make pusher head 22 push down integrated circuit testing termination to keep suitable pressure.
This beneficial effect of the invention is: between this integrated circuit testing multi-station positioning device testing integrated circuits efficiency high and test contact and test cap, keep good contact.Mount pad is simple in structure.Elevating mechanism is that cylinder is simple and practical, and cushion block guide pillar guide pin bushing makes cushion block lifting steady, cushion block pad firmly make between integrated circuit testing termination and test contact contact better.Gradation mechanism is simple and reliable for structure, and gradation guide pillar guide pin bushing makes the lifting of gradation mechanism steady, and gradation driving mechanism is that cylinder is simple and practical.Driving driving mechanism is that cylinder is simple and practical; Pushing mechanism is simple in structure; Before rotation, the set screw of holder drives adjusting slider to make pusher head push down integrated circuit testing termination to keep suitable pressure.
It is apparent to one skilled in the art that the present invention can change into various ways, and such change is not thought and departed from the scope of the present invention.All so apparent amendments of the technician to described field, within being included in the scope of this claim.
Claims (9)
1. an integrated circuit testing multi-station positioning device, is characterized in that: feeding track that described integrated circuit testing multi-station positioning device comprises mount pad, be fixedly connected with mount pad, several test contact, for integrated circuit being distributed to the pushing mechanism that gradation mechanism, gradation driving mechanism, the push to test contact at each test contact place contact with integrated circuit testing termination and promoting driving mechanism; Described gradation driving mechanism is fixedly connected with mount pad with gradation mechanism respectively; Described promotion driving mechanism is fixedly connected with mount pad with pushing mechanism respectively; Described mount pad comprises base plate, fixed head and connecting link; Described base plate is provided with through hole; Described fixed head and feeding track lay respectively at the both sides at the through hole place place of base plate, and fixed head is fixedly connected with base plate by connecting link, and feeding track is fixedly connected with base plate; Described feeding track is provided with chute feeder and end tank along its length; The two side ends of described end tank connects with a side external surface of chute feeder and feeding track respectively.
2. integrated circuit testing multi-station positioning device according to claim 1, is characterized in that: described integrated circuit testing multi-station positioning device also comprises cushion block and the cushion block elevating mechanism for padding integrated circuit testing end; Described cushion block elevating mechanism is fixedly connected with fixed head with cushion block respectively.
3. integrated circuit testing multi-station positioning device according to claim 2, is characterized in that: described cushion block elevating mechanism comprises lift cylinder and lifting buffer stopper; Described lift cylinder is positioned at the rear side of fixed head and is fixedly connected with fixed head, is provided with cushion block guide pillar guide pin bushing between described cushion block and fixed head; The lift cylinders bar of described lift cylinder is fixedly connected with cushion block with through hole through fixed head; Described lift cylinder is provided with cylinder bar after lifting; Described lifting buffer stopper is fixedly connected with cylinder bar after lifting.
4. integrated circuit testing multi-station positioning device according to claim 2, is characterized in that: described elevating mechanism is the first cylinder; The first described cylinder is fixedly connected with fixed head, is provided with the first guide pillar guide pin bushing between described cushion block and fixed head; The first cylinder bar of the first described cylinder is fixedly connected with cushion block with through hole through fixed head.
5. integrated circuit testing multi-station positioning device according to claim 3, is characterized in that: described gradation mechanism comprises test backing pin and the transition backing pin that header board, rear plate, transiting rod, discharging backing pin, the backing pin of getting the raw materials ready, number equate with test contact; The trailing flank of described feeding track is provided with the rear pin-and-hole that connects with chute feeder and mate with test backing pin and the backing pin of getting the raw materials ready, and the leading flank of feeding track is provided with the front pin-and-hole that connects and mate with transition backing pin and discharging backing pin with chute feeder; Described header board is positioned at the front side of feeding track, and rear plate is between the rear side and fixed head of feeding track, and transiting rod is through through hole, and the two ends of transiting rod are fixedly connected with front and rear panels respectively; The described backing pin of getting the raw materials ready, discharging backing pin and transition backing pin are arranged in order from top to bottom, and below and transition backing pin that test backing pin is positioned at transition backing pin are spaced; One end of described test backing pin is fixedly connected with rear plate respectively with one end of the backing pin of getting the raw materials ready, and the other end of test backing pin and the other end of the backing pin of getting the raw materials ready stretch into corresponding rear pin-and-hole; One end of described transition backing pin is fixedly connected with header board respectively with one end of discharging backing pin, and the other end of the other end of transition backing pin and discharging backing pin stretches into respectively corresponding front pin-and-hole; Between described rear plate and fixed head, be provided with gradation guide pillar guide pin bushing.
6. integrated circuit testing multi-station positioning device according to claim 5, is characterized in that: described gradation driving mechanism comprises gradation cylinder and gradation buffer stopper; Gradation cylinder is provided with cylinder bar after gradation; Described lift cylinder is positioned at the rear side of fixed head and is fixedly connected with fixed head; The gradation cylinder bar of described gradation cylinder is fixedly connected with rear plate through fixed head; Described gradation buffer stopper is fixedly connected with cylinder bar after gradation.
7. integrated circuit testing multi-station positioning device according to claim 5, is characterized in that: described gradation driving mechanism is the second cylinder; The second described cylinder is fixedly connected with fixed head; The second cylinder bar of the second described cylinder is fixedly connected with rear plate through fixed head.
8. according to the integrated circuit testing multi-station positioning device described in claim 2 or 3, it is characterized in that: described pushing mechanism comprises the front holder that rear holder and number equate with test contact; Described rear fixed seating is in the feeding track place of base plate side, and the rear end of rear holder is fixedly connected with base plate, and front holder is fixedly connected with the front end of rear holder, and test contact is fixedly connected with rear holder; Described promotion driving mechanism comprises promotion cylinder and the pusher head that number equates with test contact; Described promotion cylinder is fixedly connected with front holder, and pusher head is fixedly connected with the promotion cylinder bar that promotes cylinder and is relative with test contact.
9. integrated circuit testing multi-station positioning device according to claim 8, is characterized in that: described front holder comprises fixed mount, slide block, cover plate and set screw; The front end face of described fixed mount is provided with the groove mating with slide block, and the dual-side of slide block is slidably connected with the relative dual-side of groove by guide rail respectively; Described cover plate is fixedly connected with the front end of fixed mount, and set screw is threaded with slide block through cover plate; Described promotion cylinder is fixedly connected with slide block.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210074593.7A CN102636739B (en) | 2012-03-20 | 2012-03-20 | Multi-station positioning device for testing integrated circuits |
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| CN103091622B (en) * | 2013-01-18 | 2015-09-30 | 宁波三星智能电气有限公司 | FCT multistation proving installation |
| CN103630827B (en) * | 2013-11-27 | 2016-07-06 | 杭州友旺电子有限公司 | Integrated circuit automatic testing device |
| CN104502641B (en) * | 2014-12-31 | 2018-11-02 | 杭州友旺电子有限公司 | Chip automatic testing equipment |
| CN105251700B (en) * | 2015-09-28 | 2017-07-18 | 杭州长川科技股份有限公司 | The grade distance regulating mechanism of automatic separation equipment |
| CN106428838B (en) * | 2016-09-25 | 2020-01-31 | 协丰万佳科技(深圳)有限公司 | Separation device for integrated circuit board packaging line |
| CN108061829B (en) * | 2017-11-16 | 2020-01-14 | 浙江凯耀照明股份有限公司 | Testing device and testing method for strip line driver |
| CN113655243A (en) * | 2021-07-16 | 2021-11-16 | 深圳市鑫信腾科技股份有限公司 | Multi-station test system |
| CN113484734A (en) * | 2021-07-28 | 2021-10-08 | 王雪莲 | Digital integrated circuit test system |
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