CN102368187A - Anti-interference processing method of single ITO (Indium Tin Oxide) layer - Google Patents

Anti-interference processing method of single ITO (Indium Tin Oxide) layer Download PDF

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Publication number
CN102368187A
CN102368187A CN2011102931112A CN201110293111A CN102368187A CN 102368187 A CN102368187 A CN 102368187A CN 2011102931112 A CN2011102931112 A CN 2011102931112A CN 201110293111 A CN201110293111 A CN 201110293111A CN 102368187 A CN102368187 A CN 102368187A
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China
Prior art keywords
ito
glass substrate
touch
gap
layer
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Pending
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CN2011102931112A
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Chinese (zh)
Inventor
樊永召
金莉
张开立
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Suzhou Pixcir Microelectronics Co Ltd
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Suzhou Pixcir Microelectronics Co Ltd
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Application filed by Suzhou Pixcir Microelectronics Co Ltd filed Critical Suzhou Pixcir Microelectronics Co Ltd
Priority to CN2011102931112A priority Critical patent/CN102368187A/en
Publication of CN102368187A publication Critical patent/CN102368187A/en
Pending legal-status Critical Current

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Abstract

The invention relates to an anti-interference processing method of a single ITO (Indium Tin Oxide) layer. The ITO layer comprises a plurality of touch electrode slabs which form a plurality of longitudinal rows and longitudinal columns and are distributed on a glass substrate uniformly. The anti-interference processing method comprises the following steps of: firstly, arranging the ITO layer in a gap between each lead led out of the electrode slabs and each peripheral position of the glass substrate; and then, earthing the ITO layer in the gap to achieve the aim of anti-interference processing. In the method provided by the invention, the other ITO layer different from the ITO layer composed of the electrode slabs is also filled at the peripheral position of the glass substrate, therefore, the anti-interference function is achieved.

Description

The jamproof disposal route of a kind of individual layer ITO
Technical field
the present invention relates to the method for ITO anti-interference process, refer in particular to the method for individual layer ITO anti-interference process.
Background technology
so-called ITO (indium tin oxide) is a kind of critical material that is used to produce LCD, and at present, it has all had in fields such as instrument and meter, computing machine, electronic watch, game machine and household electrical appliance very widely uses.The capacitive touch screen of big heat also is to utilize ITO to accomplish the action that detecting touches on the market in recent years; And the wiring of ITO generally is double-deck on the capacitance touch screen; Its cardinal principle is: utilize people's bulk electric field; When the user touched, the mutual capacitance (also claiming coupling capacitance) of the infall sensing unit of surface row or row can change, and finally can detect the particular location of touch point according to above-mentioned variation.
The structure of the double-deck ITO that are common is a diamond structure; Its double-deck ITO is laid in respectively on the ipsilateral of glass substrate; For fear of the mutual conduction between the electrode; So bridge contact need be set on glass substrate, so just can double-deck ITO be laid on the same side of glass substrate.Though said method has been realized the action that detecting touches, the touch screen structure of the double-deck ITO of this employing, not only complex process, and bridge joint place damages easily, and the product yield is low, causes cost to raise.In order to overcome above-mentioned shortcoming, manufacturers hope double-deck ITO is become individual layer ITO at present, so since, not only the thickness of touch-screen reduces, and is simpler on the technology, and improved the yield of product.So no matter be to consider that from the cost or the structure of touch-screen individual layer ITO all has more advantages.
present stage, smooth inadequately when problem of individual layer ITO ubiquity is rule exactly, even delay phenomenon occurs, its simulation drawing of Direct observation can see that the state of influence value is stable inadequately, so the instability when causing operating.
Above problem therefore need be solved for users provide a kind of method of individual layer ITO anti-interference process in .
Summary of the invention
The actual technical matters to be solved of the present invention be how to provide a kind of stable operation, can jamproof individual layer ITO disposal route.
are in order to realize above-mentioned purpose of the present invention; The invention provides the jamproof disposal route of a kind of individual layer ITO; Said ITO layer is made up of several touch-control electrode blocks, forms some stringers and file, and is evenly distributed on the glass substrate; Its step is following: at first, the lead of drawing on the said electrode block is laid one deck ITO respectively and in the gap between each peripheral place of said glass substrate; Then, with the ITO layer ground connection in the said gap, thereby realize jamproof processing intent.
The jamproof disposal route of individual layer ITO of the present invention has been filled the place, periphery of glass substrate with a kind of ITO layer that electrode block is formed that is different from again, so can play jamproof effect.When on this individual layer ITO, operating, line is smooth more, and the influence value that detects is more stable.
Description of drawings
Fig. 1 is the Butut synoptic diagram according to individual layer ITO according to the invention.
Embodiment
are further described the present invention below in conjunction with accompanying drawing and embodiment.
please refer to shown in Figure 1, and invention relates to the wire structures of individual layer ITO, and said ITO layer 1 is made up of several touch-control electrode blocks 10, forms some stringers and file, and promptly each stringer or file are formed by a plurality of touch-control electrode blocks 10; Said touch-control electrode block 10 all is laid on the glass substrate 11; Each touch-control electrode block 10 is all rectangular; The position of calculating touch points for ease; All be arranged to square, all electrode blocks 10 all are wired on the respective pins of the touch-control chip 12 on the circuit board (not shown) that fits with glass substrate 11.
When said individual layer ITO layer 1 scans, scan stringer and file one by one, scan two row or two row at every turn simultaneously, and obtain its difference.If individual layer ITO layer 1 has the capable B row of A; During scanning stringer earlier; At first respectively all touch-control electrode blocks 10 in first row and second row are arranged to the conducting form at chip internal; All electrode blocks 10 that are about in first row are arranged to the conducting form, then all electrode blocks 10 in second row are arranged to the conducting form.When scanning for the first time, if first row is set to the scanning end, second row that then order is adjacent successively is set to reference edge, all unsettled or ground connection of other electrode block 10 this moment; When scanning for the second time; Continue respectively all touch-control electrode blocks 10 in second row and the third line to be arranged to the conducting form at chip internal; If second row is set to the scanning end, the third line that then order is adjacent successively is a reference edge just, all unsettled or ground connection of other electrode block 10 this moment; Sequential scanning ends until scanning the A-1 behavior successively.Data according to the each scanning of above-mentioned scan method record back obtains just can be judged the position coordinates that touch object is touched said individual layer ITO.
have certain clearance because the lead branch of drawing on the said electrode block 10 is clipped to each peripheral place of glass substrate 11; The outermost lead of promptly drawing from said electrode block 10 all has the space with four orientation, upper and lower, left and right of said glass substrate 11 respectively, like the dash area among Fig. 1.In order to detect the position coordinates of touch points more accurately, can said gap location all be filled up one deck ITO, and said ITO is inequality with the ITO that is made up of touch-control electrode block 10, and makes its ground connection.It makes the concrete grammar of ITO ground connection following: from the ITO of said gap location draw a lead be connected to said circuit board on, saying so more specifically is connected on the ground wire of said circuit board.So, because the effect of gap location ITO layer makes that the operation on said glass substrate is smooth more and stable, thereby can play jamproof effect.
have been filled the place, periphery of glass substrate with a kind of ITO layer that electrode block is formed that is different from because the present invention has adopted again, so can play jamproof effect; Moreover, also can be more accurate when utilizing said method to judge the particular location of touch points, during operation, because the influence value that detects is more stable, so line is smooth more.

Claims (8)

1. jamproof disposal route of individual layer ITO, said ITO layer is made up of several touch-control electrode blocks, forms some stringers and file, and is evenly distributed on the glass substrate, and its step is following:
The lead of at first, drawing on the said electrode block respectively and between each peripheral place of said glass substrate between
Lay one deck ITO in the crack;
Then, with the ITO layer ground connection in the said gap, thereby realize jamproof processing intent.
2. the method for claim 1 is characterized in that: said gap be meant the outermost lead of drawing on the said electrode block respectively with the space at the place, four orientation, upper and lower, left and right of said glass substrate.
3. according to claim 1 or claim 2 method, it is characterized in that: the lead of drawing on the said electrode block is connected on the respective pins of the touch-control chip on the circuit board that fits with said glass substrate.
4. the method for claim 1 is characterized in that: when said individual layer ITO scans, scan stringer and file one by one, scan two row or two row at every turn simultaneously, and obtain its difference.
5. the method for claim 1 is characterized in that: the ITO that ITO in the said gap and touch-control electrode are formed is inequality.
6. the method for claim 1, it is characterized in that: the concrete grammar of said ITO layer ground connection is following: from the ITO of said gap location draw a lead be connected to said circuit board on.
7. method as claimed in claim 6 is characterized in that: draw a lead on the ITO of said gap location and be connected on the ground wire with said circuit board.
8. the method for claim 1 is characterized in that: said touch-control electrode block all is square.
CN2011102931112A 2011-09-30 2011-09-30 Anti-interference processing method of single ITO (Indium Tin Oxide) layer Pending CN102368187A (en)

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CN2011102931112A CN102368187A (en) 2011-09-30 2011-09-30 Anti-interference processing method of single ITO (Indium Tin Oxide) layer

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Application Number Priority Date Filing Date Title
CN2011102931112A CN102368187A (en) 2011-09-30 2011-09-30 Anti-interference processing method of single ITO (Indium Tin Oxide) layer

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Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103257761A (en) * 2012-02-17 2013-08-21 元太科技工业股份有限公司 Touch Sensing Module
CN103543863A (en) * 2012-07-16 2014-01-29 林志忠 Touch control unit
CN104281341A (en) * 2013-07-05 2015-01-14 三星显示有限公司 Capacitive type touch sensing device
CN105320320A (en) * 2014-06-30 2016-02-10 晨星半导体股份有限公司 Touch sensing device
CN105930005A (en) * 2016-04-25 2016-09-07 上海天马微电子有限公司 Touch apparatus
CN107632739A (en) * 2017-10-18 2018-01-26 曾胜 A kind of anti-interference solution of novel capacitance screen

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070008299A1 (en) * 2005-07-08 2007-01-11 Harald Philipp Two-Dimensional Position Sensor
CN201402456Y (en) * 2009-04-20 2010-02-10 深圳市汇顶科技有限公司 Capacitance-type touch panel with single-side wiring and touch screen terminal
CN201465086U (en) * 2009-07-03 2010-05-12 深圳市汇顶科技有限公司 Anti-interference capacitive touch screen and electronic device
CN102073430A (en) * 2011-01-24 2011-05-25 苏州瀚瑞微电子有限公司 Method for capacitive screen to automatically adjust induction value

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070008299A1 (en) * 2005-07-08 2007-01-11 Harald Philipp Two-Dimensional Position Sensor
CN201402456Y (en) * 2009-04-20 2010-02-10 深圳市汇顶科技有限公司 Capacitance-type touch panel with single-side wiring and touch screen terminal
CN201465086U (en) * 2009-07-03 2010-05-12 深圳市汇顶科技有限公司 Anti-interference capacitive touch screen and electronic device
CN102073430A (en) * 2011-01-24 2011-05-25 苏州瀚瑞微电子有限公司 Method for capacitive screen to automatically adjust induction value

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103257761A (en) * 2012-02-17 2013-08-21 元太科技工业股份有限公司 Touch Sensing Module
CN103257761B (en) * 2012-02-17 2016-05-11 元太科技工业股份有限公司 Touch Sensing Module
CN103543863A (en) * 2012-07-16 2014-01-29 林志忠 Touch control unit
CN104281341A (en) * 2013-07-05 2015-01-14 三星显示有限公司 Capacitive type touch sensing device
US10088959B2 (en) 2013-07-05 2018-10-02 Samsung Display Co., Ltd. Capacitive type touch sensing device
CN105320320A (en) * 2014-06-30 2016-02-10 晨星半导体股份有限公司 Touch sensing device
CN105930005A (en) * 2016-04-25 2016-09-07 上海天马微电子有限公司 Touch apparatus
CN105930005B (en) * 2016-04-25 2018-10-30 上海天马微电子有限公司 A kind of touch device
CN107632739A (en) * 2017-10-18 2018-01-26 曾胜 A kind of anti-interference solution of novel capacitance screen

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Application publication date: 20120307