CN102221650B - Testing module for adapter element - Google Patents
Testing module for adapter element Download PDFInfo
- Publication number
- CN102221650B CN102221650B CN 201010151205 CN201010151205A CN102221650B CN 102221650 B CN102221650 B CN 102221650B CN 201010151205 CN201010151205 CN 201010151205 CN 201010151205 A CN201010151205 A CN 201010151205A CN 102221650 B CN102221650 B CN 102221650B
- Authority
- CN
- China
- Prior art keywords
- switching element
- order
- test
- test module
- pci
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Abstract
The invention relates to a testing module for an adapter element, which comprises an adapter element to be tested, an artificial card and a debugging plate. The artificial card is electrically connected with the adapter element; the debugging plate is respectively connected with the adapter element and the artificial card; moreover, a loops is formed between the debugging plate and the adapter element as well as the artificial card; and the debugging plate judges whether the adapter element is normal or not through a test signal transmitted in the loop.
Description
Technical field
The invention relates to a kind of test module, particularly relevant for a kind of test module of switching element.
Background technology
Fig. 1 illustrates the block schematic diagram of the test adaptor element of known technology.Since at present the connection specification of the PCI-E slot 800 of server as yet directly with the high-order PCI-E adapter 700(that supports action PCI Express module (Mobile PCI Express Module MXM) for example drawing adapter or the video graphics adapter card of high-order).Therefore high-order PCI-E adapter 700 need be plugged on the switching element 200, the PCI-E slot 800 of switching element 200 Connection Service devices thus again is as the bridge of high-order PCI-E adapter 700 with the server exchange signal.
Before the server shipment that is equipped with this kind high-order PCI-E adapter 700, all must guarantee the quality of switching element 200, avoid improving follow-up maintenance cost and after service cost.The products in kind that the test mode of present this kind switching element 200 is still a high-order PCI-E adapter 700 is mounted to a switching element 200 to be measured, switching element 200 to be measured is plugged in the PCI-E slot 800 of a testing server again.Wait to make that testing server could carry out the test of power supply and signal to switching element 200 to be measured after the testing server start, can learn just whether this switching element to be measured 200 is qualified.
Yet, when utilizing testing server to come that switching element carried out functional test, there is following shortcoming:
1, the collocation testing server exists a large amount of man-machine interaction test jobs when switching element is carried out functional test, and not only efficient is low, also the artificial error of judging of Chang Yinwei and cause test crash.
When 2, the collocation testing server carries out functional test to switching element, because each test all must be reinstalled high-order PCI-E adapter, switching element and PCI-E slot to be measured suitable labor intensive and time.
When 3, the collocation testing server carries out functional test to switching element, cooperate the startup of server, need a fixing on time, and then elongate the integrated testability time of switching element, and then influence production cost and product quality.
When 4, the products in kind of collocation high-order PCI-E adapter is carried out functional test to switching element, because high-order PCI-E adapter is powerful, therefore prices are rather stiff on market at present, therefore, when if above-mentioned switching element is defective products, tend to injure high-order PCI-E adapter or server, cause the loss of great value.
So, how developing a solution, can overcome above-mentioned all inconvenience and shortcoming, is a relevant dealer instant important topic at present in fact.
Summary of the invention
In view of this, the objective of the invention is to disclose a kind of test module of switching element.This kind test module comprises switching element, an artificial card and a debug plate to be measured.This switching element is suitable for transferring a high-order PCI-E adapter (Peripheral Component Interconnect Express) to the PCI-E connection slot of a server.Artificial card is inserted on the switching element versatilely, electrically connects switching element.The debug plate electrically connects switching element and artificial card respectively, and and switching element and artificial card between form a loop.Whether the debug plate is by being transmitted to the test signal in the loop, unusual to judge switching element.
In one embodiment of the invention, artificial card has a plurality of printed wires, and these a little printed wires are same as the circuit of this high-order PCI-E adapter.
In one embodiment of the invention, this test module also comprises a test computer, and test computer electrically connects the debug plate, tests in order to indicate the debug plate, and accepts the debug plate and pass whether unusual judged result of switching element back.
In one embodiment of the invention, this test module also comprises a supply power supply, and the supply power supply electrically connects switching element, in order to provide switching element required working power.
In one embodiment of the invention, the debug plate has a microprocessing unit, microprocessing unit has one first universal input/output interface, in order to export a test signal to this switching element, one second universal input/output interface, in order to be received from a return path signal, the internal integrated circuit interface that this artificial card returns, can make carbon copies information and an emulation IO interface of ROM (read-only memory) in order to an electronics formula of erasing that reads this switching element, in order to read a power supply running status of this switching element.
In one embodiment of the invention, the debug plate has the connecting portion of one accord with PCI-E specification, and connecting portion is connected to switching element.
In sum, test module of the present invention sees through above-mentioned various information transmission interfaces can learn whether switching element is unusual, makes the switching element server of need not arranging in pairs or groups to test.So, the present invention has the following advantages:
1, simplified the man-machine interaction test job, and then raised the efficiency, also reduced the artificial error of judging and cause the probability of test crash.
2, shorten the integrated testability time that switching element is tested, and then improved production cost and product quality.
3, saved and obtain the required hardware acquisition cost of testing server and avoid injuring the entity products of high-order PCI-E adapter or the risk of server.
Description of drawings
For above and other objects of the present invention, feature, advantage and embodiment can be become apparent, being described in detail as follows of appended accompanying drawing:
Fig. 1 illustrates known technology with the block schematic diagram of server test switching element;
Fig. 2 illustrates the block schematic diagram of the test module of switching element of the present invention;
Fig. 3 illustrates the block schematic diagram of test module under an embodiment of switching element of the present invention;
Fig. 4 illustrates the process flow diagram of method under this embodiment of test adaptor element of the present invention.
[main element symbol description]
100: 430: the seven connecting portions of test module
200: switching element 440: microprocessing unit
Connecting portion 441 in 210: the first: the content measurement firmware
450: the first universal input/output interfaces of 220: the second connecting portions
230: the electronics formula of erasing can be made carbon copies 460: the second universal input/output interfaces of ROM (read-only memory)
300: artificial card 470: the internal integrated circuit interface
310: printed wire 480: the emulation IO interface
320: the three connecting portions 500: test computer
510: the eight connecting portions of 330: the four connecting portions
400: debug plate 600: the supply power supply
410: the five connecting portions 700: high-order PCI-E adapter
420: the six connecting portions 800: server PCI-E connects slot
401-406: step
Embodiment
Below will clearly demonstrate spirit of the present invention with accompanying drawing and detailed description, as the person skilled in the art after understanding embodiments of the invention, when can be by the technology of teachings of the present invention, change and modification, it does not break away from spirit of the present invention and scope.
Please refer to shown in Figure 2ly, Fig. 2 illustrates the block schematic diagram of the test module of switching element of the present invention.The present invention is the test module that discloses a kind of switching element, and test module 100 comprises switching element 200, an artificial card 300 and a debug plate 400 to be measured at least.Artificial card 300 electrically connects switching element 200.Debug plate 400 electrically connects switching element 200 and artificial card 300 respectively, and and this switching element to be measured 200 and this artificial card 300 between form a loop.So, owing to form a unidirectional circuit between debug plate 400, switching element 200 and the artificial card 300, when debug plate 400 is exported a test signal to switching element 200, whether debug plate 400 can return debug plate 400 through artificial card 300 by this test signal, perhaps whether change by the test signal of getting back to behind the debug plate 400, judge whether this switching element 200 takes place unusually.
Please refer to shown in Figure 3ly, Fig. 3 illustrates the block schematic diagram of test module under an embodiment of switching element of the present invention.
In one embodiment of the invention, this switching element 200 is transfer a high-order PCI-E adapter 700(for example drawing adapter or the video graphics adapter card of high-order in when work) connect on the slot 800 (as Fig. 1) to a PCI-E of a server.This switching element 200 has one first connecting portion 210, one second connecting portion 220 and an electronics formula of erasing can make carbon copies ROM (read-only memory) 230(Electrically-Erasable Programmable Read-Only Memory, EEPROM).
Among this embodiment, test module 100 also comprises a test computer 500.Test computer 500 electrically connects debug plate 400.Test computer 500 indication debug plates 400 are tested, and accept debug plate 400 with this switching element 200 unusual test result whether.Particularly, test computer 500 has for example RS232 specification of one the 8th connecting portion 510().The 7th connecting portion 430 and the 8th connecting portion 510 are complementary, in order to electrically connect debug plate 400 and test computer 500.Among this embodiment, test module 100 also comprises a supply power supply 600.Supply power supply 600 provides switching element 200 required working power.
Particularly, debug plate 400 has a microprocessing unit 440.Microprocessing unit 440 has multiple information transmission interface, comprise one first universal input/output interface 450(General Purpose Input/Output, GPIO output port), one second universal input/output interface 460(General Purpose Input/Output, GPIO input port), a plurality of internal integrated circuit interface 470(Inter-Integrated Circuit System, I2C) and a plurality of emulation IO interface 480(analog input/output).
In addition, has a content measurement firmware 441 in the microprocessing unit 440.Because microprocessing unit 440 is not limit to possess and can be override characteristic and maybe can not override characteristic, this content measurement firmware 441 can be in advance by programming in microprocessing unit 440, or computing machine 500 is updated in the microprocessing unit 440 after tested.
When 440 pairs of switching elements 200 of microprocessing unit are tested, microprocessing unit 440 is according to the indication of this content measurement firmware 441, (1) exports the test signal of one accord with PCI-E specifications to switching element 200 by first universal input/output interface 450 through the 5th connecting portion 410 respectively, (2) read power supply (P12V/P3V3_STBY/P1.8V) running status of switching element 200 through the 5th connecting portion 410 by emulation IO interface 480, (3) see through signal (SMB_DTA by internal integrated circuit interface 470 through the 5th connecting portion 410, SMB_CLK) read the information that the electronics formula of erasing can be made carbon copies ROM (read-only memory) 230, and (4) are received from a return path signal of artificial card 300 passbacks through the 6th connecting portion 420 by second universal input/output interface 460.
So, the information of power supply (P12V/P3V3_STBY/P1.8V) running status that microprocessing unit 440 just can be by (1) switching element 200, the EEPROM of (2) switching element 200 and (3) are compared and are judged whether this switching element 200 can normally transmit signal between a high-order PCI-E adapter and a server from the return path signal of artificial card 300 passbacks, normally to have played the part of this high-order PCI-E adapter communication bridge between the server therewith.Afterwards, microprocessing unit 440 just can be by the 8th connecting portion 510 feedbacks one test result to test computer 500.
So, test module 100 of the present invention can replace above-mentioned server, sees through above-mentioned various information transmission interfaces and can learn whether switching element 200 is unusual, makes switching element 200 server of need not arranging in pairs or groups to test.
See also shown in Figure 4ly, Fig. 4 illustrates the process flow diagram of method under this embodiment of test adaptor element of the present invention.After artificial card 300, switching element 200 and debug plate 400 were installed in regular turn and electrically connected into a loop mutually, the step that test computer 500 indication microprocessing units 440 are tested was as follows:
Step (401) microprocessing unit 440 output one test signal is to switching element 200:
In this step, microprocessing unit 440 is exported the test signal of one accord with PCI-E forms to switching element 200 by first universal input/output interface 450.For example, the test signal of microprocessing unit 440 outputs one noble potential is to switching element 200.
Step (402) judges whether to be received from a return path signal of artificial card 300 passbacks:
In this step, microprocessing unit 440 needs to judge whether to receive a return path signal from artificial card 300 by second universal input/output interface 460, if, then carry out step (403), otherwise, because microprocessing unit 440 can't represent switching element 200 or artificial card 300 generations unusually by receiving a return path signal from artificial card 300.Yet the probability unusual owing to artificial card 300 generations is quite low, and therefore, but inference switching element 200 is defective, carries out step (406).
Step (403) judges whether return path signal is same as the test signal that microprocessing unit 440 is exported:
The same example when this return path signal also is the test signal of a noble potential, but then represents switching element 200 normal transmission signals between artificial card 300 and debug plate 400, then carries out step (404).Otherwise, then carry out step (406).
The power supply running status of step (404) test adaptor element 200:
In this step, microprocessing unit 440 reads power supply (P12V/P3V3_STBY/P1.8V) running status of switching element 200 by emulation IO interface 480, and whether normal, carry out step (405) if measuring the power supply running status of switching element 200.
Whether the information that step (405) the test electronics formula of erasing can be made carbon copies ROM (read-only memory) 230 is normal:
In this step, microprocessing unit 440 sees through signal (SMB_DTA by internal integrated circuit interface 470, SMB_CLK) read the information that the electronics formula of erasing can be made carbon copies ROM (read-only memory) 230, and whether the power supply running status of measurement switching element 200 is normal, carries out step (406).
Step (406) transmission one test result is to test computer 500:
In this step, microprocessing unit 440 just can be with the test result biography test computer 500 of step (402) to step (405), for user's interpretation.
In sum, the present invention need not use server that switching element is tested, and sees through test module of the present invention and can learn whether switching element produces unusually, and so, the present invention has the following advantages:
1, simplified the man-machine interaction test job, and then raised the efficiency, also reduced the artificial error of judging and cause the probability of test crash.
2, shorten the integrated testability time that switching element is tested, and then improved production cost and product quality.
3, saved the risk that obtains the required hardware acquisition cost of testing server and avoid injuring high-order PCI-E adapter entity products or server.
The present invention discloses among as above each embodiment; be not in order to limiting the present invention, any person skilled in the art, without departing from the spirit and scope of the present invention; when can being used for a variety of modifications and variations, so protection scope of the present invention is as the criterion when looking the scope that claims define.
Claims (8)
1. the test module of a switching element is characterized in that, this switching element be suitable for transferring PCI-E of high-order PCI-E adapter to a server connects on the slot, and it comprises:
One artificial card is inserted on this switching element versatilely, electrically connects this switching element;
One debug plate electrically connects this switching element and this artificial card respectively, and and this switching element and this artificial card between form a loop,
Whether wherein this debug plate is by being transmitted to the test signal in this loop, unusual to judge this switching element.
2. the test module of switching element according to claim 1 is characterized in that, this artificial card has a plurality of printed wires, and those printed wires are same as the circuit of this high-order PCI-E adapter.
3. the test module of switching element according to claim 1 is characterized in that, also comprises:
One test computer electrically connects this debug plate, tests in order to indicate this debug plate, and accepts this debug plate and pass whether unusual judged result of this switching element back.
4. the test module of switching element according to claim 1 is characterized in that, also comprises:
One supply power supply electrically connects this switching element, in order to provide this switching element required working power.
5. the test module of switching element according to claim 1, it is characterized in that, this debug plate has a microprocessing unit, this microprocessing unit has one first universal input/output interface and one second universal input/output interface, this first universal input/output interface is in order to export a test signal to this switching element, and this second universal input/output interface is in order to be received from the return path signal that this artificial card returns.
6. the test module of switching element according to claim 1, it is characterized in that, this debug plate has a microprocessing unit, this microprocessing unit has an internal integrated circuit interface, and this internal integrated circuit interface can be made carbon copies the information of ROM (read-only memory) in order to an electronics formula of erasing that reads this switching element.
7. the test module of switching element according to claim 1, it is characterized in that, this debug plate has a microprocessing unit, and this microprocessing unit has an emulation IO interface, and this emulation IO interface is in order to read a power supply running status of this switching element.
8. the test module of switching element according to claim 1 is characterized in that, this debug plate has the connecting portion of one accord with PCI-E specification, and this connecting portion connects this switching element.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201010151205 CN102221650B (en) | 2010-04-13 | 2010-04-13 | Testing module for adapter element |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201010151205 CN102221650B (en) | 2010-04-13 | 2010-04-13 | Testing module for adapter element |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102221650A CN102221650A (en) | 2011-10-19 |
| CN102221650B true CN102221650B (en) | 2013-08-28 |
Family
ID=44778253
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201010151205 Expired - Fee Related CN102221650B (en) | 2010-04-13 | 2010-04-13 | Testing module for adapter element |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102221650B (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103033714B (en) * | 2012-12-24 | 2015-05-13 | 北京铁路信号有限公司 | Detecting device for vehicle-mounted bus adapter |
| CN105334450A (en) * | 2015-11-30 | 2016-02-17 | 英业达科技有限公司 | Signal detection device and method |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7392437B2 (en) * | 2005-01-20 | 2008-06-24 | Qlogic, Corporation | Method and system for testing host bus adapters |
| CN201152973Y (en) * | 2008-01-10 | 2008-11-19 | 佛山市顺德区顺达电脑厂有限公司 | Extension card |
| CN201159878Y (en) * | 2008-01-25 | 2008-12-03 | 深圳市蓝韵实业有限公司 | PCIE card slot adapter |
| CN201159893Y (en) * | 2008-03-04 | 2008-12-03 | 浪潮电子信息产业股份有限公司 | PCI-E adapter card |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8838865B2 (en) * | 2008-10-10 | 2014-09-16 | Nuon, Inc. | Hot plug ad hoc computer resource allocation |
-
2010
- 2010-04-13 CN CN 201010151205 patent/CN102221650B/en not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7392437B2 (en) * | 2005-01-20 | 2008-06-24 | Qlogic, Corporation | Method and system for testing host bus adapters |
| CN201152973Y (en) * | 2008-01-10 | 2008-11-19 | 佛山市顺德区顺达电脑厂有限公司 | Extension card |
| CN201159878Y (en) * | 2008-01-25 | 2008-12-03 | 深圳市蓝韵实业有限公司 | PCIE card slot adapter |
| CN201159893Y (en) * | 2008-03-04 | 2008-12-03 | 浪潮电子信息产业股份有限公司 | PCI-E adapter card |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102221650A (en) | 2011-10-19 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US11041907B2 (en) | Method and system for acquisition of test data | |
| CN101546285B (en) | Device for testing USB interface I/O board | |
| CN103198033A (en) | Apparatus and method of identifying a USB or an MHL device | |
| CN211427190U (en) | Server circuit and mainboard based on Feiteng treater 2000+ | |
| CN103631688A (en) | Method and system for testing interface signal | |
| CN102221650B (en) | Testing module for adapter element | |
| CN102455965A (en) | Electronic device test system and method | |
| CN201984469U (en) | Main board basic input / output system (BIOS) fault debugging card | |
| CN102411528A (en) | MXM (Mobile PCI-Express Module)-interface testing-connecting card and testing system provided with same | |
| CN103365735A (en) | Transmission interface and method for determining transmission signal | |
| CN100511172C (en) | Inter-board transparent transmission bus test device and method thereof | |
| CN103995765B (en) | A kind of LED control card Auto-Test System and method | |
| CN213365381U (en) | Main board | |
| CN115303203A (en) | Debugging board of vehicle-mounted controller, vehicle-mounted controller mainboard and vehicle | |
| CN115129552A (en) | Method, device, equipment and storage medium for monitoring transmission state of I2C bus | |
| CN201489526U (en) | Adapter card, computer device and single computer mainboard | |
| CN116340220A (en) | USB communication interface adapter | |
| CN203520383U (en) | Fitec mainboard fault display circuit and display card | |
| CN112231258A (en) | Switching device and switching method for debugging interface circuit | |
| CN206353307U (en) | Mobile terminal for debugging peripheral hardware | |
| CN102479129B (en) | Detecting device for states of peripheral components | |
| CN114443404B (en) | Board card for OCP interface test, test system and test method | |
| CN204117136U (en) | Processor module pick-up unit and system | |
| CN101452415A (en) | Auxiliary device and method for testing embedded system | |
| CN112579366A (en) | Hard disk in-place detection system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20170810 Address after: Room 8, building 805, sunshine times, Fenghuang Road, Fenghuang County, Shangrao, Jiangxi, Shangrao Co-patentee after: Zhang Kaijun Patentee after: Jiangxi union Speed Technology Co.,Ltd. Address before: Qingnian Road Taiwan Wanhua District of Taipei city China No. 184 3 2 floor Patentee before: Fucheng International Machinery Co.,Ltd. Effective date of registration: 20170810 Address after: Qingnian Road Taiwan Wanhua District of Taipei city China No. 184 3 2 floor Patentee after: Fucheng International Machinery Co.,Ltd. Address before: Taipei City, Taiwan Chinese Shilin District Hougang Street No. sixty-six Patentee before: Yingda Co.,Ltd. |
|
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130828 Termination date: 20180413 |