CN102095851A - Detection method for semi-quantitative quick-detecting electronic pen device of golden label test strip - Google Patents

Abstract

The invention discloses a detection method for a semi-quantitative quick-detecting electronic pen device of a golden label test strip, comprising the following steps: when the golden label test strip is inserted into an instrument, a bulge on the front end of the golden label test strip triggers an instrument switch, the instrument is started and begins timing for the first time; when the intensity value of the reflected light received by a D-size silicon photocell is less than or equal to a threshold value, the instrument is triggered to perform timing for the second time; when the intensity value of the reflected light received by the D-size silicon photocell is less than or equal to the threshold value, a second light emitting diode is triggered to glisten; when the intensity value of the reflected light received by the D-size silicon photocell and a C-size silicon photocell is more than the threshold value, a third light emitting diode is triggered by the instrument to glisten for ten times; when the intensity value of the reflected light received by the C-size silicon photocell is less than or equal to the threshold value, the instrument displays a positive result; when the intensity value of reflected light received by the C-size silicon photocell is more than the threshold value, the instrument displays a negative result; and the instrument is powered off after the result is displayed. The detection method has the advantages that the operation is simple, the error is small, and the measurement is accurate.

Description

Gold-marking test strip sxemiquantitative fast detecting electronic pen Device Testing method

Technical field

The present invention relates to a kind of gold-marking test strip sxemiquantitative fast detecting electronic pen Device Testing method.

Background technology

The method of the traditional detection onset of ovulation and early pregnancy is by range estimation what of shade, line relatively, judges the yin and yang attribute result, and the range estimation error is big, is subjected to light power and visual acuity affected, the test result out of true.

Summary of the invention

The objective of the invention is in order to overcome above deficiency, provide a kind of easy to operate, error is little, the test accurate gold-marking test strip sxemiquantitative fast detecting electronic pen Device Testing method.

Purpose of the present invention is achieved through the following technical solutions: a kind of gold-marking test strip sxemiquantitative fast detecting electronic pen Device Testing method may further comprise the steps:

A, when inserting golden standard gold mark strip in the instrument, gold-marking test strip front end bossing triggers instrument switch, the instrument start;

B, instrument begins timing for the first time, time is three minutes, in during the timing first time, first light emitting diode per ten seconds is once glittering, each glitteringly be continuously ten milliseconds, the glittering intensity of reflected light value that finishes one time No. one silicon photocell reception of back instrument judgement, compare with the corresponding threshold value that stores in the instrument single-chip microcomputer, during the intensity of reflected light that receives when silicon photocell＞threshold values, instrument judges that gold-marking test strip was for losing efficacy or not adding sample, show on LCD by the icon of setting, during the intensity of reflected light that receives when silicon photocell≤threshold values, trigger instrument and begin timework for the second time;

C, instrument begins timing for the second time, time is three minutes, first light emitting diode glittering ten times, each glitteringly be continuously ten milliseconds, be spaced apart ten milliseconds, after finishing for glittering ten times, instrument is judged the intensity of reflected light value of a silicon photocell reception, compare with the corresponding threshold value that stores in the instrument single-chip microcomputer, during the intensity of reflected light that receives when silicon photocell＞threshold values, instrument decision operation mistake or extract gold-marking test strip shows on LCD by the icon of setting, when the intensity of reflected light value≤threshold values of a silicon photocell reception, it is glittering to trigger second light emitting diode;

D, instrument triggers second light emitting diode glittering ten times, each glitteringly be continuously ten milliseconds, be spaced apart ten milliseconds, after finishing for glittering ten times, instrument is judged the intensity of reflected light value of a silicon photocell and No. two silicon photocell receptions simultaneously, compare with the corresponding threshold value that stores in the instrument single-chip microcomputer, intensity of reflected light≤threshold values when a silicon photocell and No. two silicon photocell receptions, instrument judges that gold-marking test strip polluted for losing efficacy or adding sample, show on LCD by the icon of setting, when the intensity of reflected light＞threshold values of a silicon photocell and No. two silicon photocell receptions, it is glittering to trigger the 3rd light emitting diode;

E, instrument trigger the 3rd light emitting diode glittering ten times, each glitteringly be continuously ten milliseconds, be spaced apart ten milliseconds, after finishing for glittering ten times, instrument judges that the intensity of reflected light value of No. two silicon photocell receptions and the interior corresponding threshold value that stores of instrument single-chip microcomputer compare, during the intensity of reflected light that receives when No. two silicon photocells≤threshold values, instrument shows positive findings, and during the intensity of reflected light that receives when No. two silicon photocells＞threshold values, instrument shows negative findings;

After F, result showed, the instrument meter shut down after one minute.

Embodiment:

In order to deepen the understanding of the present invention, the invention will be further described below in conjunction with embodiment, and this embodiment only is used to explain the present invention, do not constitute the qualification to protection domain of the present invention.

A kind of embodiment of gold-marking test strip sxemiquantitative fast detecting electronic pen Device Testing method of the present invention may further comprise the steps:

A, when inserting golden standard gold mark strip in the instrument, gold-marking test strip front end bossing triggers instrument switch, the instrument start;

B, instrument begins timing for the first time, time is three minutes, in during the timing first time, first light emitting diode per ten seconds is once glittering, each glitteringly be continuously ten milliseconds, the glittering intensity of reflected light value that finishes one time No. one silicon photocell reception of back instrument judgement, compare with the corresponding threshold value that stores in the instrument single-chip microcomputer, during the intensity of reflected light that receives when silicon photocell＞threshold values, instrument judges that gold-marking test strip was for losing efficacy or not adding sample, show on LCD by the icon of setting, during the intensity of reflected light that receives when silicon photocell≤threshold values, trigger instrument and begin timework for the second time;

C, instrument begins timing for the second time, time is three minutes, first light emitting diode glittering ten times, each glitteringly be continuously ten milliseconds, be spaced apart ten milliseconds, after finishing for glittering ten times, instrument is judged the intensity of reflected light value of a silicon photocell reception, compare with the corresponding threshold value that stores in the instrument single-chip microcomputer, during the intensity of reflected light that receives when silicon photocell＞threshold values, instrument decision operation mistake or extract gold-marking test strip shows on LCD by the icon of setting, when the intensity of reflected light value≤threshold values of a silicon photocell reception, it is glittering to trigger second light emitting diode;

D, instrument triggers second light emitting diode glittering ten times, each glitteringly be continuously ten milliseconds, be spaced apart ten milliseconds, after finishing for glittering ten times, instrument is judged the intensity of reflected light value of a silicon photocell and No. two silicon photocell receptions simultaneously, compare with the corresponding threshold value that stores in the instrument single-chip microcomputer, intensity of reflected light≤threshold values when a silicon photocell and No. two silicon photocell receptions, instrument judges that gold-marking test strip polluted for losing efficacy or adding sample, show on LCD by the icon of setting, when the intensity of reflected light＞threshold values of a silicon photocell and No. two silicon photocell receptions, it is glittering to trigger the 3rd light emitting diode;

E, instrument trigger the 3rd light emitting diode glittering ten times, each glitteringly be continuously ten milliseconds, be spaced apart ten milliseconds, after finishing for glittering ten times, instrument judges that the intensity of reflected light value of No. two silicon photocell receptions and the interior corresponding threshold value that stores of instrument single-chip microcomputer compare, during the intensity of reflected light that receives when No. two silicon photocells≤threshold values, instrument shows positive findings, and during the intensity of reflected light that receives when No. two silicon photocells＞threshold values, instrument shows negative findings;

After F, result showed, the instrument meter shut down after one minute.

That the present invention has is easy to operate, error is little, test accurate advantage.

Claims (1)

1. gold-marking test strip sxemiquantitative fast detecting electronic pen Device Testing method is characterized in that: may further comprise the steps:

A, when inserting golden standard gold mark strip in the instrument, gold-marking test strip front end bossing triggers instrument switch, the instrument start;

B, instrument begins timing for the first time, time is three minutes, in during the timing first time, first light emitting diode per ten seconds is once glittering, each glitteringly be continuously ten milliseconds, the glittering intensity of reflected light value that finishes one time No. one silicon photocell reception of back instrument judgement, compare with the corresponding threshold value that stores in the instrument single-chip microcomputer, during the intensity of reflected light that receives when silicon photocell＞threshold values, instrument judges that gold-marking test strip was for losing efficacy or not adding sample, show on LCD by the icon of setting, during the intensity of reflected light that receives when silicon photocell≤threshold values, trigger instrument and begin timework for the second time;

C, instrument begins timing for the second time, time is three minutes, first light emitting diode glittering ten times, each glitteringly be continuously ten milliseconds, be spaced apart ten milliseconds, after finishing for glittering ten times, instrument is judged the intensity of reflected light value of a silicon photocell reception, compare with the corresponding threshold value that stores in the instrument single-chip microcomputer, during the intensity of reflected light that receives when silicon photocell＞threshold values, instrument decision operation mistake or extract gold-marking test strip shows on LCD by the icon of setting, when the intensity of reflected light value≤threshold values of a silicon photocell reception, it is glittering to trigger second light emitting diode;

D, instrument triggers second light emitting diode glittering ten times, each glitteringly be continuously ten milliseconds, be spaced apart ten milliseconds, after finishing for glittering ten times, instrument is judged the intensity of reflected light value of a silicon photocell and No. two silicon photocell receptions simultaneously, compare with the corresponding threshold value that stores in the instrument single-chip microcomputer, intensity of reflected light≤threshold values when a silicon photocell and No. two silicon photocell receptions, instrument judges that gold-marking test strip polluted for losing efficacy or adding sample, show on LCD by the icon of setting, when the intensity of reflected light＞threshold values of a silicon photocell and No. two silicon photocell receptions, it is glittering to trigger the 3rd light emitting diode;

E, instrument trigger the 3rd light emitting diode glittering ten times, each glitteringly be continuously ten milliseconds, be spaced apart ten milliseconds, after finishing for glittering ten times, instrument judges that the intensity of reflected light value of No. two silicon photocell receptions and the interior corresponding threshold value that stores of instrument single-chip microcomputer compare, during the intensity of reflected light that receives when No. two silicon photocells≤threshold values, instrument shows positive findings, and during the intensity of reflected light that receives when No. two silicon photocells＞threshold values, instrument shows negative findings;

After F, result showed, the instrument meter shut down after one minute.