CN102059222A - Opening device for test handler - Google Patents
Opening device for test handler Download PDFInfo
- Publication number
- CN102059222A CN102059222A CN2010102866265A CN201010286626A CN102059222A CN 102059222 A CN102059222 A CN 102059222A CN 2010102866265 A CN2010102866265 A CN 2010102866265A CN 201010286626 A CN201010286626 A CN 201010286626A CN 102059222 A CN102059222 A CN 102059222A
- Authority
- CN
- China
- Prior art keywords
- plate
- open
- lifting module
- test handler
- action bars
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
- G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
Abstract
The invention relates to an opening device for a test handler. The opening device for the test handler comprises a lifting module, which is configured to be capable of ascending and descending and is equipped with an operation part; an opening plate, wherein a lower surface has an installation part and an upper surface has multiple opening pins which enable to open an insertion part of a carrier plate, the installation part is disposed at the upper side of the lifting module and is lifted up and down with the elevation of the lifting module, and according to the operation state of a manager on the operation part, the formation of the state of installation to the lifting module may enable to release the installation state; and a driving part providing a driving force for lifting the lifting module up and down. According to the invention, the installation which enables to easily assemble and disassemble the opening pate is disclosed, thereby making the replacement of the opening plate easier. In addition, the carrier plate and the opening plate are located at different level conditions, and a proper surface contact between the carrier plate and the opening plate is allowed, further preventing the damage to the insertion part.
Description
Technical field
The present invention relates to a kind of Test handler open system, relate in particular to a kind of Test handler open system of opening loading and unloading (desorption) technology of plate.
Background technology
For the test of electronic unit (particularly semiconductor element), need the test machine (tester) of the electronic unit that use test is electrically connected and electronic unit is connected electrically to the Test handler (testhandler) of test machine.
Test handler uses the disposable support plate (carrier board) that transports a plurality of semiconductor elements of the state that loads with the ranks form in order to increase the processing capacity.This support plate is provided with a plurality of insertion sections (insert) that the ranks form is arranged, and semiconductor element is loaded into support plate with the state that is inserted in the insertion section.
Usually, the semiconductor element of use test separator test is to provide under the state that is loaded into user tray (user tray).
The semiconductor element that is loaded into the state supply of user tray moves to support plate by pick and place device (pick and placeapparatus), and the semiconductor element of finishing test on the support plate moves to user tray by other pick and place device.And the support plate that loads semiconductor element moves and when arriving testing location, semiconductor element is connected electrically to the test jack (socket) of test machine with the state that is loaded into support plate along predetermined circulating path.
As previously mentioned, support plate is to move along circulating path to load the semiconductor element state, especially possesses the interval of moving under the state that makes the support plate vertical stand-up in side dock (side docking type) Test handler.Therefore, the insertion section of support plate need possess anti-disengaging device, to prevent the disengaging of semiconductor element.
But, because the insertion section of support plate possesses anti-disengaging device, so semiconductor element moves to support plate or when support plate moves to user tray from user tray, need to remove the anti-detachment state of anti-disengaging device and open insertion section (opening support plate), thereby Test handler need be joined open system in addition.
Fig. 1 is the front that existing open system 100 roughly is shown.
With reference to Fig. 1, existing open system 100 is made up of lifter plate 110, open plate 120, bolt (bolt) 130 and cylinder 140.
The upper surface of open plate 120 possesses a plurality of open pin p, to open the insertion section of support plate.
In addition, can change its kind often by the semiconductor element of Test handler test, at this moment also need to be replaced with can be to insertion section that should the semiconductor element physical specification in the insertion section of support plate.But, also will change if the replacing insertion section then is formed at the position of the anti-disengaging device of insertion section usually, so the open plate of open system also needs to change together.
But the upside tool using (screwdriver) that existing open system 100 needs at open system 100 is unscrewed or is tighted a bolt 130, after being used to unloading original open plate 120 new open plate is installed.Because open system 100 is arranged on the deep inside of Test handler, and its upside also possesses other devices.
Therefore, when existing open system 100 is changed open plates 120 operation very loaded down with trivial details, and waste a lot of times.
In addition, handle the anti-disengaging device of insertion section rightly for the open pin p that makes open plate 120, needing open plate 120 to form suitable face with support plate contacts, but if open plate 120 is different with the support plate level, then open pin p not only can't handle anti-disengaging device rightly, and may damage the insertion section.
Summary of the invention
The object of the present invention is to provide a kind of Test handler open system that does not use special instrument just can change open plate simply.
Even another object of the present invention is to provide a kind of open plate can't form identical level with support plate, also can form the Test handler open system of appropriate face contact.
To achieve these goals, Test handler according to the present invention comprises with open system: the lifting module, can lifting, and possess operating portion in the above; Open plate, lower surface possesses a plurality of open pin that installation portion and upper surface possess the insertion section that can open support plate, wherein said installation portion is arranged at the upside of described lifting module, and lifting along with the lifting of described lifting module, and according to the mode of operation of manager to described operating portion, formation is installed on the state of described lifting module or can removes installment state; And drive division, the driving force of the described lifting module of lifting is provided.
Described installation portion possesses outstanding clamping projection downwards, and described operating portion comprises: action bars according to rotation status, can articulate the state that articulates of described clamping projection or releasing clamping projection; And steady pin, can rotatably fix described action bars.
The top formation of described lifting module makes described clamping projection can insert the insertion groove of desired depth, and described action bars is arranged on the described insertion groove.
Described clamping projection comprises: outstanding downwards jag; And joint end, crooked and prolongation according to the mode of operation of described action bars, can be mounted on described action bars or releasing and articulate, and the end portion of described joint end projects upwards slightly from described jag along continuous straight runs.
Described action bars comprises: the operating side, and can be by the side operation of manager towards the pivot of setting by steady pin; And articulated end, when opposite side to described pivot is handled in described operating side, articulate described joint end or remove clamping.
Described operating portion also comprises the wave mode packing ring that described action bars is applied the elastic force of downward direction, and described articulated end possesses the inclined plane at described operating portion with the part that described joint end contacts, and when articulating described joint end, forms the appropriate operation that articulates.
Described lifting module comprises: lifter plate, directly accept the lifting power of described drive division; Installing plate is arranged in the upside of described lifter plate, and keeps predetermined space with described lifter plate, and described open plate can releasably be installed; And bonded block, be used in conjunction with described lifter plate and installing plate.
Described lifting module also comprises at least one elastomeric element, between described installing plate and lifter plate, produce mutual elasticity repulsion, so that described installing plate and lifter plate can be kept predetermined space, and the maximum of described predetermined space is subject to described bonded block.
Pick and place device according to the present invention has following effect.
The first, it is easy to open the replacing of plate, and reduces swap time, finally improves the utilization of capacity of Test handler.
Even second when open plate plate open with not the keeping identical level of support plate rises, support plate contacts with open plate, and finally make open plate and support plate be in identical level, so that the open pin of open plate is operated the anti-disengaging device of insertion section rightly, can prevent the breakage of insertion section etc. thus.
Description of drawings
Fig. 1 is the front elevation of existing Test handler with the summary of open system;
Fig. 2 a be according to an embodiment of the invention Test handler with the stereogram of open system;
Fig. 2 b to Fig. 2 d is the exploded perspective view of key diagram 2a open system reference or individual other part drawing;
Fig. 3 to Fig. 9 is the reference figure that is used for the characteristic action of key diagram 2a open system.
Symbol description to the accompanying drawing critical piece: 200 is open system, and 210 are the lifting module, and 211 is lifter plate, and 212 is installing plate, and 212a is an operating portion, and 212a-1 is action bars (lever), and 212a-1a is the operating side, and 212a-1b is an articulated end, S
1, S
2Be the inclined plane, 212a-2 is a steady pin, and 212a-3 is the wave mode packing ring, and 212c is for inserting groove, and 214 is spring, and 220 are open plate, and 221 are the clamping projection, and 221a is a jag, and 221b is a joint end, and P is a convex, and p is open pin, and 230 is cylinder.
The specific embodiment
Describe the preferred embodiments of the present invention in detail with reference to accompanying drawing, succinct for what illustrate, omit as much as possible or compress for the explanation of explanation that repeats or known techniques.
Fig. 2 a is the stereogram according to open system 200 of the present invention, and Fig. 2 b is the exploded perspective view of the open system 200 of Fig. 2 a.
Comprising lifting module 210, open plate 220, cylinder 230 etc. according to the open system 200 of present embodiment constitutes.
Installing plate 212 is identical rectangular shapes with lifter plate 211, and is arranged in the upside of lifter plate 211, and possesses operating portion 212a, so that open plate 220 releasably to be installed.And the both sides of installing plate 212 form through hole 212b corresponding to the position of two screwed hole 211a, and the insertion groove 212c of the top formation reservation shape of installing plate 212 and location guide projection 212d-1,212d-2.The open plate 220 of location guide projection 212d-1,212d-2 guiding is installed on the tram of installing plate 212.Though accompanying drawing has omitted its structure, obviously following the and location guide projection 212d-1 of open plate 220, position that 212d-2 is corresponding be formed with can insertion position guide protrusion 212d-1,212d-2 guiding groove
Two bolts 213 are incorporated into the thread groove 211a of lifter plate 211 respectively as being used for providing in conjunction with the bonded block of installing plate 212 and lifter plate 211 by the through hole 212b screw thread of installing plate 212.
The corner part of four springs 214 between lifter plate 211 and installing plate 212 is as produce mutual elasticity repulsion between installing plate 212 and lifter plate 211, so that installing plate 212 and lifter plate 211 can be kept the elastomeric element of preset space length s.At this, the lifter plate 211 that produces by the elasticity repulsion of spring 214 for restriction and the maximum (state that the lifting module does not rise of the preset space length between the installing plate 212, spacing when promptly open plate is not contacted with the support plate state) with for keeping certain spacing between the lifter plate 211 that makes each corner part and the installing plate 212, the upper end of the installation position of bolt 213 should form compares the bigger cylindrical shape of thread groove 211a.Obviously, the length of the barrel portion of each bolt 213 should be identical.
Clamping projection 221 is to be inserted in the part of inserting groove 212c, is down
Shape, and constitute by outstanding downwards jag 221a and the joint end 221b that prolongs to the horizontal direction bending at jag 221a.Joint end 221b is according to the mode of operation of manager to operating portion 212a, become state that is installed on lifting module 210 (the more specifically installing plate of is-symbol 212) or the part of removing from the state of installing, upwards show slightly outstanding convex P in its end portion formation.
And the top formation of open plate 220 can be opened a plurality of open pin p of the insertion section of support plate.
In addition, the operating portion 212a that is arranged in installing plate 212 comprises action bars 212a-1, steady pin 212a-2 and wave mode packing ring 212a-3 etc.
Articulated end 212a-1b is arranged at the opposite side of pivot, and prolongs from the crooked predetermined angular of operating side 212a-1a (about 120 degree angles).This articulated end 212a-1b rotates with operating side 212a-1a interlock when manager's rotary manipulation operating side 212a-1a, articulates joint end 221b thus or removes articulating joint end 221b.And shown in Fig. 2 d, two corner sides of the contact-making surface of articulated end 212a-1b and joint end 221b have inclined plane S
1, S
2, to be used for when articulating joint end 221b or releasing by rotation and articulate, can stride across the outstanding convex P of joint end 21 easily, realizes appropriate articulating operation or releasing articulates operation.
And, be formed with the through hole 212a-1c that steady pin 212a-2 is passed through between the operating side 212a-1a of action bars 212a-1 and the articulated end 212a-1b.
Wave mode packing ring 212a-3 is arranged between the head H and action bars 212a-1 of steady pin 212a-2, as the elastomeric element that action bars is applied the downward direction elastic force.
Then, to as above the loading and unloading and the open operation of the open plate 220 of the open system 200 of structure describe.
Because the replacing of the semiconductor element of opening the unusual of plate 220 or will testing; in the time of existing open plate 220 need being replaced by new open plate; with reference to as can be known as the plane of Fig. 3, the manager with hand with the operating side 212a-1a thruster to the right of action bars 212a-1 so that action bars 212a-1 along the counter clockwise direction rotary manipulation.With reference to Fig. 4, because this operation, to being rotated counterclockwise, articulated end 212a-1b removes articulating of joint end 221b according to action bars 212a-1.At this moment, because the inclined plane S of articulated end 212a-1b
1With the effect of wave mode packing ring 212a-3, articulated end 212a-1b can pass through the convex P part of joint end 221b swimmingly.
Promptly, when masterpiece vertical and horizontal direction is used for action bars, keep predetermined space with action bars and the only local wave mode packing ring 212a-3 that contacts with action bars is stressed, making the articulated end 212a-1b of action bars is that benchmark is inclined upwardly in level with steady pin 212a-2, thus can be by the convex P part of joint end 221b.
Articulated end 212a-1b removes articulating of joint end 221b, when open plate 220 releasings are installed on installing plate 212 states, the manager removes after the existing open plate 200, as shown in Figure 5, the new clamping projection 221 of open plate is inserted in inserts groove 212c (particularly, being inserted in the part of inserting in the groove further to lower recess).
With reference to Fig. 6, be inserted under the state that inserts groove 212c in clamping projection 221, when open plate 220 placed the upside of installing plate 212, this time the manager promoted the operating side 212a-1a of action bars 212a-1 towards the left side, so that action bars 212a-1 is rotated in a clockwise direction.Under this operation, as shown in Figure 7, action bars 212a-1 rotates to clockwise direction, finishes the installation of open plate 220 so that articulated end 212a-1b articulates joint end 221b.Identical therewith, because the inclined plane S of articulated end 212a-1b
2With the effect of wave mode packing ring 212a-3, articulated end 212a-1b can pass through the part of the convex P of joint end 221b swimmingly.And, wave mode packing ring 212a-3 articulates joint end 221b at articulated end 212a-1b and finishes under the state of installation of open plate 220, articulated end 212a-1b is routinely applied the elastic force of downward direction, articulated end 212a-1b realizes locking action, so that can keep the state that articulates of joint end 221b before being subjected to other externally applied forces effect.
The restriction of representing owing to drawing among Fig. 3 to Fig. 7, have only the part of opening the clamping projection 221 of plate 220 is represented with pectinate line, for easy, the symbol that articulates projection of the new open plate among Fig. 5 to Fig. 7 is identical with the symbol of the clamping projection of the existing open plate of Fig. 3 and Fig. 4.
As everyone knows, contact, at this moment, can produce the situation of support plate (level of insertion section that perhaps is arranged at support plate is bad slightly) inequality with opening plate 220 levels for the insertion section of open support plate need make open plate 220 and support plate carry out face.
Even such situation, operation cylinder 230 is so that rising lifting module 210 and open plate 220 are shown in Figure 8 as what exaggerate, and the side part (left part among the figure) of open plate 220 contacts with support plate CB earlier.Under the state as shown in Figure 8, by lifting module 210 and open plate 220 slightly and the rising that continues, the spring 214 that is contacted with the side part of support plate CB earlier is compressed, as shown in Figure 9, support plate CB and open the plate 220 perfect face of formation each other contact.Thus, open the insertion section that pin p can open support plate CB rightly of opening of plate 220.
As mentioned above, the embodiment that specifies by the reference accompanying drawing of the present invention is carried out, but the foregoing description only is the preferred embodiments of the present invention, the invention is not restricted to the foregoing description, interest field of the present invention should be the claim atmosphere narrated previously with and equivalents.
Claims (8)
1. Test handler open system is characterized in that comprising:
The lifting module, being arranged to can lifting, and possesses operating portion in the above;
Open plate, lower surface possesses a plurality of open pin that installation portion and upper surface possess the insertion section that can open support plate, wherein said installation portion is arranged at the upside of described lifting module, and lifting along with the lifting of described lifting module, and according to the mode of operation of manager to described operating portion, formation is installed on the state of described lifting module or can removes installment state; And
Drive division provides the driving force of the described lifting module of lifting.
2. Test handler open system as claimed in claim 1 is characterized in that described installation portion possesses outstanding clamping projection downwards,
Described operating portion comprises:
Action bars according to rotation status, can articulate described clamping projection or releasing and articulate state; And
Steady pin can rotatably be fixed described action bars.
3. Test handler open system as claimed in claim 2 is characterized in that the top formation of described lifting module makes described clamping projection can insert the insertion groove of desired depth,
Described action bars is arranged on the described insertion groove.
4. Test handler open system as claimed in claim 2 is characterized in that described clamping projection comprises:
Jag is to lower process; And
Joint end, crooked and prolongation according to the mode of operation of described action bars, can be mounted on described action bars or releasing and articulate from described jag along continuous straight runs,
And the end portion of described joint end projects upwards slightly.
5. Test handler open system as claimed in claim 4 is characterized in that described action bars comprises:
The operating side can be by the side operation of manager towards the pivot of setting by steady pin; And
When articulated end, described operating side are handled opposite side to described pivot, articulate described joint end or remove clamping.
6. Test handler open system as claimed in claim 5, it is characterized in that described operating portion also comprises the wave mode packing ring that described action bars is applied the elastic force of downward direction, and described articulated end possesses the inclined plane in the part that contacts with described joint end, with connecing end when articulating described joint end, form the appropriate operation that articulates.
7. Test handler open system as claimed in claim 1 is characterized in that described lifting module comprises:
Lifter plate is directly accepted the lifting power of described drive division;
Installing plate is arranged in the upside of described lifter plate, and keeps predetermined space with described lifter plate, and described open plate can releasably be installed; And
Bonded block is used in conjunction with described lifter plate and installing plate.
8. Test handler open system as claimed in claim 7, it is characterized in that described lifting module also comprises at least one elastomeric element, described installing plate and lifter plate between described installing plate and lifter plate, produce mutual elasticity repulsion, so that can be kept predetermined space
And the maximum of described predetermined space is confined to described bonded block.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2009-0110630 | 2009-11-17 | ||
| KR20090110630 | 2009-11-17 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102059222A true CN102059222A (en) | 2011-05-18 |
| CN102059222B CN102059222B (en) | 2014-06-25 |
Family
ID=43994833
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201010286626.5A Active CN102059222B (en) | 2009-11-17 | 2010-09-17 | Opening device for test handler |
Country Status (3)
| Country | Link |
|---|---|
| KR (1) | KR101505955B1 (en) |
| CN (1) | CN102059222B (en) |
| TW (1) | TWI413773B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109807084A (en) * | 2017-11-21 | 2019-05-28 | 泰克元有限公司 | Electronic component sorting machine open system |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101664220B1 (en) * | 2011-11-29 | 2016-10-11 | (주)테크윙 | Test handler and method for operating the same |
| KR102327772B1 (en) * | 2015-09-08 | 2021-11-19 | (주)테크윙 | Opener of handler for testing semiconductor |
| KR20170078209A (en) * | 2015-12-29 | 2017-07-07 | (주)테크윙 | Handler for testing semiconductor |
| KR102637464B1 (en) * | 2016-11-17 | 2024-02-16 | 세메스 주식회사 | Apparatus for opening latches of insert assemblies |
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| CN2476373Y (en) * | 2001-04-05 | 2002-02-13 | 霖城机械股份有限公司 | Track-type die opening device |
| US6441630B1 (en) * | 1999-08-09 | 2002-08-27 | Tokyo Electron Limited | Probing apparatus and head plate opening/closing force-reducing mechanism |
| US20030034280A1 (en) * | 2001-08-01 | 2003-02-20 | Samsung Electronics Co., Ltd. | Semiconductor device loading apparatus for test handlers |
| US6586925B2 (en) * | 2001-04-09 | 2003-07-01 | St Assembly Test Services Ltd. | Method and apparatus for establishing quick and reliable connection between a semiconductor device handler plate and a semiconductor device test head plate |
| CN2899976Y (en) * | 2006-05-15 | 2007-05-16 | 常州市天宁天达电子设备有限公司 | Electric brush lifter of thin film capacitor test sorter |
| KR20080110424A (en) * | 2007-06-15 | 2008-12-18 | (주)테크윙 | Test handler |
| CN101366109A (en) * | 2006-02-10 | 2009-02-11 | 泰克元有限公司 | Test handler |
| KR20090077400A (en) * | 2008-01-11 | 2009-07-15 | (주)테크윙 | Opener for test handler |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR200173203Y1 (en) | 1997-08-04 | 2000-04-01 | 옥순봉 | Jig for pcb assay test |
| US6547571B2 (en) * | 2001-06-21 | 2003-04-15 | Maxim Integrated Products, Inc. | Low cost, high performance flexible tester handler docking interface |
| KR100813235B1 (en) | 2007-04-02 | 2008-03-13 | (주)테크윙 | Test handler |
| KR100958272B1 (en) * | 2008-02-04 | 2010-05-19 | 에버테크노 주식회사 | Loading and unloading apparatus of solid state disk test handler |
-
2010
- 2010-08-11 KR KR1020100077195A patent/KR101505955B1/en active IP Right Grant
- 2010-09-17 CN CN201010286626.5A patent/CN102059222B/en active Active
- 2010-11-08 TW TW099138377A patent/TWI413773B/en active
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6441630B1 (en) * | 1999-08-09 | 2002-08-27 | Tokyo Electron Limited | Probing apparatus and head plate opening/closing force-reducing mechanism |
| CN2476373Y (en) * | 2001-04-05 | 2002-02-13 | 霖城机械股份有限公司 | Track-type die opening device |
| US6586925B2 (en) * | 2001-04-09 | 2003-07-01 | St Assembly Test Services Ltd. | Method and apparatus for establishing quick and reliable connection between a semiconductor device handler plate and a semiconductor device test head plate |
| US20030034280A1 (en) * | 2001-08-01 | 2003-02-20 | Samsung Electronics Co., Ltd. | Semiconductor device loading apparatus for test handlers |
| CN101366109A (en) * | 2006-02-10 | 2009-02-11 | 泰克元有限公司 | Test handler |
| CN2899976Y (en) * | 2006-05-15 | 2007-05-16 | 常州市天宁天达电子设备有限公司 | Electric brush lifter of thin film capacitor test sorter |
| KR20080110424A (en) * | 2007-06-15 | 2008-12-18 | (주)테크윙 | Test handler |
| KR20090077400A (en) * | 2008-01-11 | 2009-07-15 | (주)테크윙 | Opener for test handler |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109807084A (en) * | 2017-11-21 | 2019-05-28 | 泰克元有限公司 | Electronic component sorting machine open system |
| CN109807084B (en) * | 2017-11-21 | 2022-01-04 | 泰克元有限公司 | Opening device for electronic component sorting machine |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI413773B (en) | 2013-11-01 |
| CN102059222B (en) | 2014-06-25 |
| KR101505955B1 (en) | 2015-03-27 |
| KR20110055361A (en) | 2011-05-25 |
| TW201118380A (en) | 2011-06-01 |
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