CA2538304A1 - System and method for monitoring defects in structures - Google Patents
System and method for monitoring defects in structures Download PDFInfo
- Publication number
- CA2538304A1 CA2538304A1 CA002538304A CA2538304A CA2538304A1 CA 2538304 A1 CA2538304 A1 CA 2538304A1 CA 002538304 A CA002538304 A CA 002538304A CA 2538304 A CA2538304 A CA 2538304A CA 2538304 A1 CA2538304 A1 CA 2538304A1
- Authority
- CA
- Canada
- Prior art keywords
- potential drop
- monitoring area
- contact points
- measuring
- current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/28—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures
- G01B7/281—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures for measuring contour or curvature along an axis, e.g. axial curvature of a pipeline or along a series of feeder rollers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
- G01N27/20—Investigating the presence of flaws
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
Abstract
A system and method for monitoring defects in a structure are provided. The system (I 10) includes a power supply (112) for supplying an electric current to a monitoring area (118) of the structure (114) and a reference (116); a measurement circuit for measuring a potential drop across at least two contact points (126, 128) of the monitoring area (118) and at least two contact points (122, 124) of the reference (116); and a processor (112) adapted to determine a ratio of the monitoring area potential drop to the reference potential drop indicative of a percentage change in a thickness of the structure (114). The method includes the steps of supplying the current to the monitoring area (118) and the reference (116); measuring a first potential drop across the monitoring area (118) and the reference (116); and determining the ratio indicative of the percentage change in the thickness of the structure (114).
Claims (10)
1. A system (110) for monitoring defects in a structure (114), the system (110) comprising:
a power supply (202) for supplying an electric current to a monitoring area (118) of the structure (114) and a reference (116);
a measurement circuit (206) for measuring a potential drop across at least two contact points (126, 128) of the monitoring area (118) and at least two contact points (122, 124) of the reference (116); and a processor (212) adapted to determine a ratio of the monitoring area potential drop to the reference potential drop indicative of a percentage change in a thickness of the structure (114).
a power supply (202) for supplying an electric current to a monitoring area (118) of the structure (114) and a reference (116);
a measurement circuit (206) for measuring a potential drop across at least two contact points (126, 128) of the monitoring area (118) and at least two contact points (122, 124) of the reference (116); and a processor (212) adapted to determine a ratio of the monitoring area potential drop to the reference potential drop indicative of a percentage change in a thickness of the structure (114).
2. The system as in claim 1, wherein the reference (116) is electrically coupled to the structure (114).
3. The system as in claim 2, wherein the reference (116) includes a first current injection port (120) for coupling. the power supply (202) to the reference (116) and the structure (114) includes a second current injection port (130) for coupling the power supply (202) to the structure (114), wherein current will flow from the first current injection port (120) to the second current injection port (130).
4. The system as in claim 3, wherein the reference (116) includes a plurality of current injection ports (120) for coupling the power supply (202) to the reference (116) and the structure (114) includes a plurality of current injection ports (130) for coupling the power supply (202) to the structure (114), wherein a plurality of currents may be applied in different directions across the reference (116) and structure (114).
5. The system as in claim 1, wherein the monitoring area (118) includes a plurality of contact points arranged in a matrix for measuring a potential drop across any pair of contact points and the measuring circuit (206) measures the plurality of contact points simultaneously.
6. A method for monitoring defects in a structure, the method comprising the steps of:
supplying an electric current to a monitoring area of the structure and a reference (302);
measuring a first potential drop across at least two contact points of the monitoring area (306) and a first potential drop across at least two contact points of the reference (304); and determining a ratio of the monitoring area potential drop to the reference potential drop indicative of a percentage change in a thickness of the structure (318).
supplying an electric current to a monitoring area of the structure and a reference (302);
measuring a first potential drop across at least two contact points of the monitoring area (306) and a first potential drop across at least two contact points of the reference (304); and determining a ratio of the monitoring area potential drop to the reference potential drop indicative of a percentage change in a thickness of the structure (318).
7. The method of claim 6, wherein the measuring step includes measuring a second potential drop across the at least two contact points of the monitoring area (312) and a second potential drop across the at least two points of the reference with no current supplied (310).
8. The method of claim 7, wherein the measuring step includes the steps of:
calculating the monitoring area potential drop by subtracting the first monitoring area potential drop with the second monitoring area potential drop (316); and calculating the reference potential drop by subtracting the first reference potential drop with the second reference potential drop (314).
calculating the monitoring area potential drop by subtracting the first monitoring area potential drop with the second monitoring area potential drop (316); and calculating the reference potential drop by subtracting the first reference potential drop with the second reference potential drop (314).
9. The method as in claim 6, wherein the monitoring area of the structure includes a plurality of contact points and the measuring step includes measuring a potential drops across the plurality of contact points simultaneously.
10. The method as in claim 6, further comprising the steps of:
supplying the current in a plurality of paths sequentially; and measuring the potential drops across the at least two contact points of the monitoring area for each current path supplied.
supplying the current in a plurality of paths sequentially; and measuring the potential drops across the at least two contact points of the monitoring area for each current path supplied.
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/664,196 | 2003-09-17 | ||
| US10/664,196 US6922641B2 (en) | 2003-09-17 | 2003-09-17 | System and method for monitoring defects in structures |
| PCT/US2004/025880 WO2005036152A1 (en) | 2003-09-17 | 2004-08-10 | System and method for monitoring defects in structures |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CA2538304A1 true CA2538304A1 (en) | 2005-04-21 |
| CA2538304C CA2538304C (en) | 2010-12-14 |
Family
ID=34393338
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA2538304A Expired - Fee Related CA2538304C (en) | 2003-09-17 | 2004-08-10 | System and method for monitoring defects in structures |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US6922641B2 (en) |
| EP (1) | EP1678487A1 (en) |
| JP (1) | JP4740855B2 (en) |
| KR (1) | KR101143730B1 (en) |
| CN (1) | CN100504368C (en) |
| CA (1) | CA2538304C (en) |
| WO (1) | WO2005036152A1 (en) |
Families Citing this family (38)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007003235A (en) * | 2005-06-21 | 2007-01-11 | Atlus:Kk | Non-destructive inspection method of change in wall thickness of measuring target |
| US20070120572A1 (en) * | 2005-11-30 | 2007-05-31 | Weiguo Chen | Smart coupon for realtime corrosion detection |
| US7402999B2 (en) * | 2005-11-30 | 2008-07-22 | General Electric Company | Pulsed eddy current pipeline inspection system and method |
| US7647206B2 (en) * | 2006-09-15 | 2010-01-12 | The Boeing Company | System and method for monitoring structures for damage using nondestructive inspection techniques |
| US7590507B2 (en) * | 2007-05-17 | 2009-09-15 | International Business Machines Corporation | Structure and method for monitoring variation within an active region of a semiconductor device using scaling |
| CN101398369A (en) * | 2007-09-30 | 2009-04-01 | 通用电气公司 | Device and method for monitoring surface corrosion |
| NO330882B1 (en) * | 2009-07-03 | 2011-08-08 | Roxar Flow Measurement As | Method and apparatus for monitoring a zone of a metal structure |
| CN102971485B (en) | 2010-04-30 | 2016-01-13 | S.P.M.流量控制股份有限公司 | Machine, system, the computer-implemented method of test and certification oil and natural gas equipment |
| CN102768228B (en) * | 2011-03-16 | 2014-10-29 | 深圳格鲁森科技有限公司 | Online pipeline corrosion measuring method |
| GB2498207A (en) | 2012-01-06 | 2013-07-10 | Teledyne Ltd | Monitoring a conductive fluid conduit |
| USD713825S1 (en) | 2012-05-09 | 2014-09-23 | S.P.M. Flow Control, Inc. | Electronic device holder |
| EP3511515A1 (en) | 2012-05-25 | 2019-07-17 | S.P.M. Flow Control, Inc. | Apparatus and methods for evaluating systems associated with wellheads |
| CN103267723B (en) * | 2013-04-16 | 2016-12-28 | 四川大学 | Metallic conduit based on field fingerprinting, container pitting corrosion detection method |
| EP2843401A1 (en) * | 2013-08-30 | 2015-03-04 | Nederlandse Organisatie voor toegepast -natuurwetenschappelijk onderzoek TNO | System and method for defect monitoring |
| GB2544671A (en) | 2014-07-30 | 2017-05-24 | Spm Flow Control Inc | Band with RFID chip holder and identifying component |
| USD750516S1 (en) | 2014-09-26 | 2016-03-01 | S.P.M. Flow Control, Inc. | Electronic device holder |
| CN104568629B (en) * | 2014-12-19 | 2017-07-11 | 上海交通大学 | The sample and method of speed is thinned in a kind of on-line checking metal |
| CN104820134A (en) * | 2015-04-29 | 2015-08-05 | 业成光电（深圳）有限公司 | Line detection device and method and applied line thereof |
| CA2986233A1 (en) | 2015-05-21 | 2016-11-24 | Texas Nameplate Company, Inc. | Method and system for securing a tracking device to a component |
| WO2017030870A1 (en) | 2015-08-14 | 2017-02-23 | S.P.M. Flow Control, Inc. | Carrier and band assembly for identifying and managing a component of a system associated with a wellhead |
| CN105115410B (en) * | 2015-09-10 | 2018-02-13 | 沈阳中科韦尔腐蚀控制技术有限公司 | A kind of compression joint type measuring electrode device in electric field matrix thickness measuring system |
| DE102015118232B4 (en) * | 2015-10-26 | 2023-09-14 | Truedyne Sensors AG | System and method for monitoring a channel, in particular a MEMS channel |
| US10196928B2 (en) | 2016-03-02 | 2019-02-05 | General Electric Company | Method and system for piping failure detection in a gas turbine bleeding air system |
| CN105758289B (en) * | 2016-04-12 | 2018-08-21 | 广东盈动高科自动化有限公司 | A kind of electric current range unit and its distance measuring method of use |
| NO344047B1 (en) * | 2016-09-28 | 2019-08-26 | Roxar Flow Measurement As | Improved FSM corrosion measurement |
| EP3545290A4 (en) | 2016-11-16 | 2020-06-10 | 3M Innovative Properties Company | Suppressing thermally induced voltages for verifying structural integrity of materials |
| WO2018093863A2 (en) * | 2016-11-16 | 2018-05-24 | 3M Innovative Properties Company | Verifying structural integrity of materials using reactive parameter measurements |
| WO2018093889A1 (en) | 2016-11-16 | 2018-05-24 | 3M Innovative Properties Company | Temperature-independent verifying of structural integrity of materials using electrical properties |
| WO2018093882A1 (en) * | 2016-11-16 | 2018-05-24 | 3M Innovative Properties Company | Verifying structural integrity of materials using one or more current injection points and multiple current extraction points |
| EP3542154A4 (en) | 2016-11-16 | 2020-06-10 | 3M Innovative Properties Company | Verifying structural integrity of materials |
| WO2018093859A1 (en) | 2016-11-16 | 2018-05-24 | 3M Innovative Properties Company | Electrode placement for verifying structural integrity of materials |
| US10816495B2 (en) | 2016-12-16 | 2020-10-27 | 3M Innovative Properties Company | Verifying structural integrity of materials |
| EP3555607A2 (en) | 2016-12-16 | 2019-10-23 | 3M Innovative Properties Company | Verifying structural integrity of materials |
| WO2018112311A1 (en) | 2016-12-16 | 2018-06-21 | 3M Innovative Properties Company | Verifying structural integrity of materials using reference impedance |
| US11016047B2 (en) | 2017-08-25 | 2021-05-25 | 3M Innovative Properties Company | Temperature-corrected control data for verifying of structural integrity of materials |
| US20190064095A1 (en) | 2017-08-31 | 2019-02-28 | Teledyne Limited | Integrity Monitoring Spool |
| US20220128609A1 (en) * | 2020-10-27 | 2022-04-28 | Analog Devices, Inc. | Wireless integrity sensing acquisition module |
| JP7058451B1 (en) * | 2020-11-06 | 2022-04-22 | 株式会社岡崎製作所 | Crack detector |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2476943A (en) * | 1948-06-09 | 1949-07-19 | Branson Instr | Electrical apparatus for measuring metal thicknesses |
| US4425193A (en) * | 1982-03-01 | 1984-01-10 | General Electric Company | Electrochemical prediction of corrosion susceptibility of zirconium-base alloys |
| NO150136C (en) * | 1982-04-19 | 1985-02-08 | Sentralinst For Ind Forskning | PROCEDURE AND DEVICE FOR MONITORING OF LARGE METAL CONSTRUCTIONS |
| EP0175257A2 (en) * | 1984-09-21 | 1986-03-26 | INTERATOM Gesellschaft mit beschränkter Haftung | Method for structural inspection by measurement of electrical quantities, and apparatus and measuring head for carrying out the method |
| JP3488559B2 (en) * | 1995-11-01 | 2004-01-19 | 応用地質株式会社 | Multi-channel electric prospecting system by capacitor method |
| GB0005946D0 (en) * | 2000-03-14 | 2000-05-03 | British Nuclear Fuels Plc | Improvements in and relating to investigating corrosion |
| WO2001069223A2 (en) | 2000-03-14 | 2001-09-20 | British Nuclear Fuels Plc | Method and apparatus for investigating corrosion |
| WO2002039102A1 (en) | 2000-11-09 | 2002-05-16 | British Nuclear Fuels Plc | Monitoring of corrosion induced loss of material by means of a plurality of electrical resistance measurements (field signature method, electrical resistance tomography) |
-
2003
- 2003-09-17 US US10/664,196 patent/US6922641B2/en not_active Expired - Fee Related
-
2004
- 2004-08-10 WO PCT/US2004/025880 patent/WO2005036152A1/en active Application Filing
- 2004-08-10 KR KR1020067005293A patent/KR101143730B1/en not_active IP Right Cessation
- 2004-08-10 CN CNB2004800333339A patent/CN100504368C/en not_active Expired - Fee Related
- 2004-08-10 CA CA2538304A patent/CA2538304C/en not_active Expired - Fee Related
- 2004-08-10 JP JP2006526894A patent/JP4740855B2/en not_active Expired - Fee Related
- 2004-08-10 EP EP04780676A patent/EP1678487A1/en not_active Withdrawn
Also Published As
| Publication number | Publication date |
|---|---|
| KR101143730B1 (en) | 2012-05-10 |
| EP1678487A1 (en) | 2006-07-12 |
| CA2538304C (en) | 2010-12-14 |
| JP2007506096A (en) | 2007-03-15 |
| CN1879015A (en) | 2006-12-13 |
| CN100504368C (en) | 2009-06-24 |
| JP4740855B2 (en) | 2011-08-03 |
| US6922641B2 (en) | 2005-07-26 |
| WO2005036152A1 (en) | 2005-04-21 |
| US20050075800A1 (en) | 2005-04-07 |
| KR20060080204A (en) | 2006-07-07 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EEER | Examination request | ||
| MKLA | Lapsed |
Effective date: 20140812 |