CA2230979A1 - Split field-of-view uncooled infrared sensor - Google Patents

Split field-of-view uncooled infrared sensor

Info

Publication number
CA2230979A1
CA2230979A1 CA002230979A CA2230979A CA2230979A1 CA 2230979 A1 CA2230979 A1 CA 2230979A1 CA 002230979 A CA002230979 A CA 002230979A CA 2230979 A CA2230979 A CA 2230979A CA 2230979 A1 CA2230979 A1 CA 2230979A1
Authority
CA
Canada
Prior art keywords
sensor
view
primary
occupancy
sensors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA002230979A
Other languages
French (fr)
Other versions
CA2230979C (en
Inventor
Brian C. Krafthefer
Michael L. Rhodes
Thomas G. Stratton
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Honeywell Inc
Original Assignee
Honeywell Inc.
Brian C. Krafthefer
Michael L. Rhodes
Thomas G. Stratton
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Honeywell Inc., Brian C. Krafthefer, Michael L. Rhodes, Thomas G. Stratton filed Critical Honeywell Inc.
Publication of CA2230979A1 publication Critical patent/CA2230979A1/en
Application granted granted Critical
Publication of CA2230979C publication Critical patent/CA2230979C/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4228—Photometry, e.g. photographic exposure meter using electric radiation detectors arrangements with two or more detectors, e.g. for sensitivity compensation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/0252—Constructional arrangements for compensating for fluctuations caused by, e.g. temperature, or using cooling or temperature stabilization of parts of the device; Controlling the atmosphere inside a photometer; Purge systems, cleaning devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/04—Casings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/04—Casings
    • G01J5/041—Mountings in enclosures or in a particular environment
    • G01J5/045—Sealings; Vacuum enclosures; Encapsulated packages; Wafer bonding structures; Getter arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/08—Optical arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/08—Optical arrangements
    • G01J5/0875—Windows; Arrangements for fastening thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
    • G—PHYSICS
    • G08—SIGNALLING
    • G08B—SIGNALLING OR CALLING SYSTEMS; ORDER TELEGRAPHS; ALARM SYSTEMS
    • G08B13/00—Burglar, theft or intruder alarms
    • G08B13/18—Actuation by interference with heat, light, or radiation of shorter wavelength; Actuation by intruding sources of heat, light, or radiation of shorter wavelength
    • G08B13/189—Actuation by interference with heat, light, or radiation of shorter wavelength; Actuation by intruding sources of heat, light, or radiation of shorter wavelength using passive radiation detection systems
    • G08B13/19—Actuation by interference with heat, light, or radiation of shorter wavelength; Actuation by intruding sources of heat, light, or radiation of shorter wavelength using passive radiation detection systems using infrared-radiation detection systems
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S250/00—Radiant energy
    • Y10S250/01—Passive intrusion detectors

Abstract

An occupancy sensor (50) having a primary infrared radiation sensor (12) and a secondary infrared radiation sensor (14) in an integrated vacuum package having a window (52) that provides separate fields of view to the sensors, respectively. The primary sensor is fox monitoring occupancy of a selected space. The secondary sensor is for monitoring the background radiation of the space. Signals from the primary and secondary sensors are electronically processed and compared, and the occupancy level of the selected space is determined.
Temperature and visible light sensors may also be incorporated. Sensor information is used to control temperature, ventilation, lighting and other parameters of the selected space.
CA002230979A 1995-12-29 1996-12-13 Split field-of-view uncooled infrared sensor Expired - Lifetime CA2230979C (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US08/586,016 US5729019A (en) 1995-12-29 1995-12-29 Split field-of-view uncooled infrared sensor
US08/586,016 1995-12-29
PCT/US1996/019804 WO1997024589A1 (en) 1995-12-29 1996-12-13 Split field-of-view uncooled infrared sensor

Publications (2)

Publication Number Publication Date
CA2230979A1 true CA2230979A1 (en) 1997-07-10
CA2230979C CA2230979C (en) 2003-08-19

Family

ID=24343958

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002230979A Expired - Lifetime CA2230979C (en) 1995-12-29 1996-12-13 Split field-of-view uncooled infrared sensor

Country Status (6)

Country Link
US (1) US5729019A (en)
EP (1) EP0870182B1 (en)
JP (1) JP3811189B2 (en)
CA (1) CA2230979C (en)
DE (1) DE69622887T2 (en)
WO (1) WO1997024589A1 (en)

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DE19737761A1 (en) * 1997-08-29 1999-03-04 Abb Patent Gmbh Motion and direction selective motion detector
US6036872A (en) 1998-03-31 2000-03-14 Honeywell Inc. Method for making a wafer-pair having sealed chambers
US6359333B1 (en) * 1998-03-31 2002-03-19 Honeywell International Inc. Wafer-pair having deposited layer sealed chambers
US6444983B1 (en) * 1999-10-07 2002-09-03 Infrared Solutions, Inc. Microbolometer focal plane array with controlled bias
US6953932B2 (en) * 1999-10-07 2005-10-11 Infrared Solutions, Inc. Microbolometer focal plane array with temperature compensated bias
JP2001147156A (en) * 1999-11-19 2001-05-29 Murata Mfg Co Ltd Heat absorbing material for infrared sensor and its forming method
US7411489B1 (en) 1999-12-29 2008-08-12 Cooper Wiring Devices, Inc. Self-adjusting dual technology occupancy sensor system and method
US6465785B1 (en) 2000-05-05 2002-10-15 Infrared Solutions, Inc. Apparatus and method for compensating for pixel non-uniformity in a bolometer
US6686653B2 (en) 2000-06-28 2004-02-03 Institut National D'optique Miniature microdevice package and process for making thereof
CA2312646A1 (en) * 2000-06-28 2001-12-28 Institut National D'optique Hybrid micropackaging of microdevices
US6541772B2 (en) 2000-12-26 2003-04-01 Honeywell International Inc. Microbolometer operating system
US7365326B2 (en) * 2000-12-26 2008-04-29 Honeywell International Inc. Camera having distortion correction
US6559447B2 (en) 2000-12-26 2003-05-06 Honeywell International Inc. Lightweight infrared camera
US6631287B2 (en) 2001-04-03 2003-10-07 Welch Allyn, Inc. Infrared thermometer
EP1249690A1 (en) * 2001-04-13 2002-10-16 Francesco Porzio Thermal detector
US7105821B1 (en) * 2003-12-15 2006-09-12 Raytheon Company Thermally stabilized radiation detector utilizing temperature controlled radiation filter
DE102004010499A1 (en) * 2004-03-04 2005-09-22 Robert Bosch Gmbh Microstructured sensor
US7385199B2 (en) * 2005-09-26 2008-06-10 Teledyne Licensing, Llc Microbolometer IR focal plane array (FPA) with in-situ mirco vacuum sensor and method of fabrication
US7486193B2 (en) * 2006-02-06 2009-02-03 Cooper Technologies Company Occupancy sensor network
US7777632B2 (en) * 2006-02-06 2010-08-17 Cooper Technologies Company Acoustic occupancy sensor
US7541924B2 (en) * 2006-02-06 2009-06-02 Cooper Technologies Company Infrared occupancy sensor
FR2904910B1 (en) * 2006-08-14 2009-02-06 Ulis Soc Par Actions Simplifie INFRARED RADIATION DETECTOR AND DEVICE FOR ASSISTING DRIVING OR STEERING INCLUDING SUCH A DEVICE
US8431263B2 (en) * 2007-05-02 2013-04-30 Gary Stephen Shuster Automated composite battery
DE102007024903B4 (en) * 2007-05-29 2009-05-07 Pyreos Ltd. Device with sandwich structure for the detection of heat radiation, method for producing and using the device
US7786440B2 (en) * 2007-09-13 2010-08-31 Honeywell International Inc. Nanowire multispectral imaging array
US9307912B2 (en) 2012-08-08 2016-04-12 Welch Allyn, Inc. Temperature measurement system
JP6773089B2 (en) * 2013-02-21 2020-10-21 株式会社リコー device
US9386665B2 (en) 2013-03-14 2016-07-05 Honeywell International Inc. System for integrated lighting control, configuration, and metric tracking from multiple locations
US9347834B2 (en) * 2013-11-04 2016-05-24 Redwood Systems, Inc. Infrared sensor array based temperature monitoring systems for data centers and related methods
EP3114657B1 (en) * 2014-03-07 2019-05-29 Carrier Corporation Door and window sensors using ambient infrared radiation
US11475757B1 (en) * 2021-05-18 2022-10-18 Stmicroelectronics S.R.L. Context-aware system and method for IR sensing

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US4614938A (en) * 1984-05-21 1986-09-30 Pittway Corporation Dual channel pyroelectric intrusion detector
US5450053A (en) * 1985-09-30 1995-09-12 Honeywell Inc. Use of vanadium oxide in microbolometer sensors
CA1308283C (en) * 1987-02-25 1992-10-06 Mitsubishi Denki Kabushiki Kaisha Infrared detector
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Also Published As

Publication number Publication date
CA2230979C (en) 2003-08-19
WO1997024589A1 (en) 1997-07-10
JP2000502798A (en) 2000-03-07
JP3811189B2 (en) 2006-08-16
US5729019A (en) 1998-03-17
EP0870182A1 (en) 1998-10-14
DE69622887D1 (en) 2002-09-12
DE69622887T2 (en) 2003-03-27
EP0870182B1 (en) 2002-08-07

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Effective date: 20161213